Number | Name | Date | Kind |
---|---|---|---|
4204633 | Goel | May 1980 | |
4228537 | Henckels et al. | Oct 1980 | |
4236246 | Skilling | Nov 1980 | |
4527249 | Van Brunt | Jul 1985 | |
4727545 | Glackemeyer et al. | Feb 1988 | |
4763289 | Barzilai et al. | Aug 1988 | |
4847795 | Baker et al. | Jul 1989 | |
4862399 | Freeman | Aug 1989 | |
4903267 | Arai et al. | Feb 1990 | |
4964125 | Kim | Oct 1990 | |
5001714 | Stark et al. | Mar 1991 | |
5010552 | Dias et al. | Apr 1991 | |
5043987 | Stark et al. | Aug 1991 | |
5084876 | Welham et al. | Jan 1992 | |
5090014 | Polich et al. | Feb 1992 | |
5161158 | Chakravarty et al. | Nov 1992 | |
5202841 | Tani | Apr 1993 | |
5214653 | Elliott, Jr. et al. | May 1993 | |
5351247 | Dow et al. | Sep 1994 |
Entry |
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Ferguson et al., "A CMOS Fault Extractor for Inductive Fault Analysis", IEEE Trans. on CAD, vol. 7, No. 11 Nov. 1988, pp. 1181-1194. |
Maly et al., "Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells", 1984 IEEE International Test Conference, pp. 390-399. |
Ferguson et al., "Test Pattern Generation for Realistic Bridge Faults in CMOS ICs", 1991 IEEE International Test Conference, pp. 492-499. |