computer-aided

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G01R31/318307

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/318307computer-aided

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device under test synchronization with automated test equipment che...
- Patent number 12,140,632
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yongkang Hu
- G01 - MEASURING TESTING
Information Patent Grant
Multiple clock and clock cycle selection for x-tolerant logic built...
- Patent number 12,117,488
- Issue date Oct 15, 2024
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid solver for integrated circuit diagnostics and testing
- Patent number 12,038,478
- Issue date Jul 16, 2024
- Xerox Corporation
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tests for integrated circuit (IC) chips
- Patent number 11,994,559
- Issue date May 28, 2024
- Texas Instruments Incorporated
- Lakshmanan Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic tester and testing method
- Patent number 11,971,450
- Issue date Apr 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture for electronic circuits, corresponding device and...
- Patent number 11,940,492
- Issue date Mar 26, 2024
- STMicroelectronics S.r.l.
- Lorenzo Re Fiorentin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and system for debugging solid-state disk (SSD) device
- Patent number 11,933,847
- Issue date Mar 19, 2024
- Silicon Motion, Inc.
- Han-Chih Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Motor emulator
- Patent number 11,901,846
- Issue date Feb 13, 2024
- PLECKO CO., LTD.
- Seung-Ki Sul
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Vision system for an automated test system
- Patent number 11,867,749
- Issue date Jan 9, 2024
- Teradyne, Inc.
- Jianfa Pei
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic data latency in serializer/deserializer-based design...
- Patent number 11,860,751
- Issue date Jan 2, 2024
- Synopsys, Inc.
- Abhijeet Samudra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,816,410
- Issue date Nov 14, 2023
- Siemens Electronic Design Automation Gmbh
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compiler-based code generation for post-silicon validation
- Patent number 11,796,593
- Issue date Oct 24, 2023
- Synopsys, Inc.
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable scan chain debug technique
- Patent number 11,754,624
- Issue date Sep 12, 2023
- Seagate Technology LLC
- Bharat Londhe
- G01 - MEASURING TESTING
Information Patent Grant
Transition fault testing of functionally asynchronous paths in an i...
- Patent number 11,709,203
- Issue date Jul 25, 2023
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic stellar built-in self test
- Patent number 11,555,854
- Issue date Jan 17, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Yingdi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a digital electronic circuit to be tested, corre...
- Patent number 11,531,064
- Issue date Dec 20, 2022
- STMicroelectronics S.r.l.
- Matteo Brivio
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 11,519,962
- Issue date Dec 6, 2022
- Realtek Semiconductor Corporation
- Jeong-Fa Sheu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,520,963
- Issue date Dec 6, 2022
- OneSpin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for efficient testing of digital integrated circuits
- Patent number 11,494,537
- Issue date Nov 8, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Disaggregated distributed measurement analysis system using dynamic...
- Patent number 11,442,105
- Issue date Sep 13, 2022
- Tektronix, Inc.
- Sriram Mandyam Krishnakumar
- G01 - MEASURING TESTING
Information Patent Grant
Timed transition cell-aware ATPG using fault rule files and SDF for...
- Patent number 11,435,401
- Issue date Sep 6, 2022
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,415,628
- Issue date Aug 16, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment using an on-chip-system test controller
- Patent number 11,385,285
- Issue date Jul 12, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible test systems and methods
- Patent number 11,334,459
- Issue date May 17, 2022
- Advantest Corporation
- Michael Bautista
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transistion fault testing of funtionally asynchronous paths in an i...
- Patent number 11,300,615
- Issue date Apr 12, 2022
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit design modification for localization of scan cha...
- Patent number 11,288,428
- Issue date Mar 29, 2022
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Voltage driver circuit
- Patent number 11,119,155
- Issue date Sep 14, 2021
- Teradyne, Inc.
- Jan Paul Anthonie van der Wagt
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing high-power electronic components
- Patent number 11,067,629
- Issue date Jul 20, 2021
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED-CIRCUIT CHIP FOR RETENTION CELL TESTING
- Publication number 20240418776
- Publication date Dec 19, 2024
- NORDIC SEMICONDUCTOR ASA
- Ashraf MOHAMMED
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369615
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Method and System of Developing and Executing Test Program for Veri...
- Publication number 20240337683
- Publication date Oct 10, 2024
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST PATTERN GENERATION FOR TESTING DESIGN REDACTING RECO...
- Publication number 20240201257
- Publication date Jun 20, 2024
- University of Florida Research Foundation, Incorporated
- Greg M. Stitt
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING-BASED MLCC STACKED ALIGNMENT INSPECTION SYSTEM AND ME...
- Publication number 20240103076
- Publication date Mar 28, 2024
- Korea University of Technology and Education Industry-University Cooperation...
- Heung-Seon OH
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...
- Publication number 20240094287
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
IP CORE TESTING APPARATUS
- Publication number 20240012048
- Publication date Jan 11, 2024
- INFINEON TECHNOLOGIES AG
- Rajendra Prasad Manchikalapati
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SOLVER FOR INTEGRATED CIRCUIT DIAGNOSTICS AND TESTING
- Publication number 20240003970
- Publication date Jan 4, 2024
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...
- Publication number 20230341447
- Publication date Oct 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...
- Publication number 20230314498
- Publication date Oct 5, 2023
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
IN-FIELD LATENT FAULT MEMORY AND LOGIC TESTING USING STRUCTURAL TEC...
- Publication number 20230314508
- Publication date Oct 5, 2023
- Intel Corporation
- Elik Haran
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC TESTER AND TESTING METHOD
- Publication number 20230176124
- Publication date Jun 8, 2023
- Rohde& Schwarz GmbH & Co. KG
- Yi JIN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION
- Publication number 20230152374
- Publication date May 18, 2023
- Advantest Corporation
- Matthias SAUER
- G01 - MEASURING TESTING
Information Patent Application
TESTS FOR INTEGRATED CIRCUIT (IC) CHIPS
- Publication number 20230143500
- Publication date May 11, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lakshmanan Balasubramanian
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS
- Publication number 20220414306
- Publication date Dec 29, 2022
- Onespin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND SYSTEM FOR DEBUGGING SOLID-STATE DISK (SSD) DEVICE
- Publication number 20220413048
- Publication date Dec 29, 2022
- SILICON MOTION, INC.
- Han-Chih TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...
- Publication number 20220390515
- Publication date Dec 8, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION
- Publication number 20220381824
- Publication date Dec 1, 2022
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS
- Publication number 20220365136
- Publication date Nov 17, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE FOR ELECTRONIC CIRCUITS, CORRESPONDING DEVICE AND...
- Publication number 20220317186
- Publication date Oct 6, 2022
- STMicroelectronics S.r.l
- Lorenzo Re Fiorentin
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...
- Publication number 20220196738
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- PRAKASH NARAYANAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHE...
- Publication number 20220155370
- Publication date May 19, 2022
- Synopsys, Inc.
- Yongkang HU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A DIGITAL ELECTRONIC CIRCUIT TO BE TESTED, CORRE...
- Publication number 20220137131
- Publication date May 5, 2022
- STMicroelectronics S.r.l
- Matteo Brivio
- G01 - MEASURING TESTING
Information Patent Application
VISION SYSTEM FOR AN AUTOMATED TEST SYSTEM
- Publication number 20220128622
- Publication date Apr 28, 2022
- Teradyne, Inc.
- Jianfa Pei
- G01 - MEASURING TESTING
Information Patent Application
DETERMINISTIC STELLAR BUILT-IN SELF TEST
- Publication number 20210373077
- Publication date Dec 2, 2021
- Yingdi Liu
- G01 - MEASURING TESTING
Information Patent Application
Vector Eyes
- Publication number 20210223314
- Publication date Jul 22, 2021
- Richard C. Carmichael
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSTIC TOOL FOR TRAFFIC CAPTURE WITH KNOWN SIGNATURE DATABASE
- Publication number 20210173010
- Publication date Jun 10, 2021
- Linden HSU
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...
- Publication number 20210132147
- Publication date May 6, 2021
- Realtek Semiconductor Corp.
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PATH CALIBRATION OF A HARDWARE SETTING IN A TEST AND MEASURE...
- Publication number 20210063488
- Publication date Mar 4, 2021
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING

computer-aided

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device under test synchronization with automated test equipment che...

Multiple clock and clock cycle selection for x-tolerant logic built...

Hybrid solver for integrated circuit diagnostics and testing

Tests for integrated circuit (IC) chips

Electronic tester and testing method

Test architecture for electronic circuits, corresponding device and...

Apparatus and system for debugging solid-state disk (SSD) device

Automated test equipment for testing one or more devices under test...

Motor emulator

Vision system for an automated test system

Deterministic data latency in serializer/deserializer-based design...

System and method for formal fault propagation analysis

Compiler-based code generation for post-silicon validation

Parameter space reduction for device testing

Programmable scan chain debug technique

Transition fault testing of functionally asynchronous paths in an i...

Deterministic stellar built-in self test

Method for testing a digital electronic circuit to be tested, corre...

Test circuit

System and method for formal fault propagation analysis

Method and system for efficient testing of digital integrated circuits

Disaggregated distributed measurement analysis system using dynamic...

Timed transition cell-aware ATPG using fault rule files and SDF for...

Automated test equipment for testing one or more devices under test...

Automated test equipment using an on-chip-system test controller

Flexible test systems and methods

Transistion fault testing of funtionally asynchronous paths in an i...

Integrated circuit design modification for localization of scan cha...

Voltage driver circuit

Automated test equipment for testing high-power electronic components

Patents Applicationslast 30 patents

INTEGRATED-CIRCUIT CHIP FOR RETENTION CELL TESTING

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

Method and System of Developing and Executing Test Program for Veri...

AUTOMATED TEST PATTERN GENERATION FOR TESTING DESIGN REDACTING RECO...

DEEP LEARNING-BASED MLCC STACKED ALIGNMENT INSPECTION SYSTEM AND ME...

LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...

IP CORE TESTING APPARATUS

HYBRID SOLVER FOR INTEGRATED CIRCUIT DIAGNOSTICS AND TESTING

METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...

TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...

IN-FIELD LATENT FAULT MEMORY AND LOGIC TESTING USING STRUCTURAL TEC...

ELECTRONIC TESTER AND TESTING METHOD

AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION

TESTS FOR INTEGRATED CIRCUIT (IC) CHIPS

SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS

APPARATUS AND SYSTEM FOR DEBUGGING SOLID-STATE DISK (SSD) DEVICE

GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...

COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS

TEST ARCHITECTURE FOR ELECTRONIC CIRCUITS, CORRESPONDING DEVICE AND...

TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...

DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHE...

METHOD FOR TESTING A DIGITAL ELECTRONIC CIRCUIT TO BE TESTED, CORRE...

VISION SYSTEM FOR AN AUTOMATED TEST SYSTEM

DETERMINISTIC STELLAR BUILT-IN SELF TEST

Vector Eyes

DIAGNOSTIC TOOL FOR TRAFFIC CAPTURE WITH KNOWN SIGNATURE DATABASE

TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...

SIGNAL PATH CALIBRATION OF A HARDWARE SETTING IN A TEST AND MEASURE...