The field of invention relates generally to nano-fabrication of structures. More particularly, the present invention is directed to a method for improving contact imprinting employed in imprint lithographic processes.
Nano-scale fabrication involves the fabrication of very small structures, e.g., having features on the order of one nanometer or more. A promising process for use in nano-scale fabrication is known as imprint lithography. Exemplary imprint lithography processes are described in detail in numerous publications, such as United States published patent application 2004/0065976 filed as U.S. patent application Ser. No. 10/264,960, entitled “Method and a Mold to Arrange Features on a Substrate to Replicate Features having Minimal Dimensional Variability”; United States published patent application 2004-0065252 filed as U.S. patent application Ser. No. 10/264,926, entitled “Method of Forming a Layer on a Substrate to Facilitate Fabrication of Metrology Standards”; and U.S. Pat. No. 6,936,194, entitled “Method and a Mold to Arrange Features on a Substrate to Replicate Features having Minimal Dimensions Variability”; all of which are assigned to the assignee of the present invention.
Referring to
Typically, polymerizable material 24 is disposed upon substrate 12 before the desired volume is defined between mold 16 and substrate 12. However, polymerizable material 24 may fill the volume after the desired volume has been obtained. After the desired volume is filled with polymerizable material 24, source 26 produces energy 28, which causes polymerizable material 24 to solidify and/or cross-link, forming polymeric material conforming to the shape of the substrate surface 25 and mold surface 18. Control of this process is regulated by processor 32 that is in data communication with stage 11 imprint head 20, fluid dispense system 22, and source 26, operating on a computer-readable program stored in memory 34.
An important characteristic with accurately forming the pattern in polymerizable material 24 is to ensure that the dimensions of the features formed in the polymerizable material 24 are controlled. Otherwise, distortions in the features etched into the underlying substrate may result.
A need exists, therefore, to improve the imprinting technique employed in contact lithographic processes.
The present invention provides a method for spreading a conformable material between a substrate and a template having a mold. The method comprises positioning the mold to be in superimposition with the substrate defining a volume therebetween. A first sub-portion of the volume is charged with the conformable material through capillary action between the conformable material and one of the mold and the substrate. A second sub-portion of the volume is filled with the conformable material by creating a deformation in the mold. These and other embodiments are described herein.
Referring to
Referring to both
Specifically, the pattern recorded in the imprinting material is produced, in part, by interaction with mold 36, e.g., electrical interaction, magnetic interaction, thermal interaction, mechanical interaction or the like. In the present example, mold 36 comes into mechanical contact with the imprinting material, spreading droplets 46, so as to generate a contiguous layer of the imprinting material over surface 44 that is solidified into a formation 50. Formation 50 includes projections 52 and recessed regions 34. A height thickness t1 of formation 50 is defined by projections 52. Recessed region 54 defines a residual thickness t2 of formation 50. In one embodiment, distance “d” is reduced to allow imprinting material to ingress into and fill recessions 38. To facilitate filling of recessions 38, before contact between mold 36 and droplets 46, the atmosphere between mold 36 and droplets 46 is saturated with helium or is completely evacuated or is a partially evacuated atmosphere of helium.
Referring to
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Referring to
As a result of the flexibility of mold 136, control of thicknesses t1 and t2, is achieved so that thickness t1 is within a specified tolerance ±δt1, referred to as being substantially uniform. Similarly thickness t2 is substantially uniform in that the same is within a specified tolerance ±δt2. The tolerance results from the distortion in the features that result from the mold 136 conforming to surface 44. It was determined, however, that by maintaining δt1 and δt2 to be less than or equal to 5 nanometers over a 25 millimeter area that the distortions that result from the conformableness of mold 136 are acceptable. Specifically, after a break-through-etch of formation 250, regions 162 over the entire area of substrate 42 are exposed. Thereafter, patterning of the entire surface of substrate may occur, shown as recessions 164. In this manner, the entire substrate 42 may be patterned, thereby overcoming the problems associated with thickness t1 having, as well as thickness t2, varying, over an area of substrate 42 to be patterned.
Referring to both
Referring to both
Referring to
At step 506, fluid pressure is applied to side 115 to attenuate, if not abrogate, variations among thickness t1 of the area of formation 150 and variations among thickness t2 over the area of formation 150. Specifically, side 115 is subjected to a sufficient magnitude of fluid pressure to compress imprinting material between mold 236 and substrate 42 to the state whereby the imprinting material can no longer undergo compression. In this condition, the imprinting material demonstrates visco-elastic properties in that the same behaves as a solid. Further, in the visco-elastic state the imprinting material conforms fully with surface 44 so that a side of the imprinting material facing mold 236 has the same shape as surface 44. Mold 236 is established to be more compliant than the imprinting material in a visco-elastic state and, therefore, fully conforms to the shape of the side of the imprinting material facing mold 236. At step 508, imprinting material is exposed to actinic radiation to solidify the same so as to conform to a shape of the mold 236 and surface 44 of substrate 42. At step 510, mold 236 is separated from the solidified imprinting material.
Referring to
Referring again to
It should be understood that throughway 542 may extend between second side 524 and first recess 532, as well. Similarly, throughway 544 may extend between second side 524 and second recess 534. What is desired is that throughways 542 and 544 facilitate placing recesses 532 and 534, respectively, in fluid communication with a pressure control system, such a pump system 546.
Pump system 546 may include one or more pumps to control the pressure proximate to recesses 532 and 534, independently of one another. Specifically, when mounted to chuck body 520, template 136 rests against first 536 and second 538 support regions, covering first 532 and second 534 recesses. First recess 532 and a portion 548 of template 136 in superimposition therewith define a first chamber 550. Second recess 534 and a portion 552 of template 136 in superimposition therewith define a second chamber 554. Pump system 546 operates to control a pressure in first 550 and second 554 chambers. Specifically, the pressure is established in first chamber 550 to maintain the position of the template 214 with the chuck body 520 and reduce, if not avoid, separation of template 214 from chuck body 520 under force of gravity {right arrow over (g)}. The pressure in second chamber 554 may differ from the pressure in first chamber 548 to reduce, inter alia, distortions in the pattern generated by template 214 during imprinting, by modulating a shape of template 214. For example, pump system 546 may apply a positive pressure in chamber 554 for the reasons discussed above. Pump system 546 is operated under control of processor 32, shown in
Referring to
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Inner frame 560 has a central throughway 570, and outer frame 562 has a central opening 572 in superimposition with central throughway 570. Flexure ring 564 has an annular shape, e.g., circular or elliptical, and is coupled to inner frame 560 and outer frame 562 and lies outside of both central throughway 570 and central opening 572. Specifically, flexure ring 564 is coupled to inner frame 560 at regions 574, 576 and 578, and outer frame 562 at regions 580, 582 and 584 using any suitable means, such as threaded fasteners (not shown). Region 580 is disposed between regions 574 and 576 and disposed equidistant therefrom; region 582 is disposed between regions 576 and 58 and disposed equidistant therefrom; and region 584 is disposed between regions 574 and 58 and disposed equidistant therefrom. In this manner, flexure ring 564 surrounds flexure 556, body 520, and template 214 and fixedly attaches inner frame 560 to outer frame 562.
It should be understood that the components of orientation system 558 and flexure 556 may be formed from any suitable material, e.g., aluminum, stainless steel and the like. Additionally, flexure 556 may be coupled to orientation system 558 using any suitable means. In the present example, flexure 556 is coupled to surface 45 employing threaded fasteners (not shown) located at the four corners 586.
Referring to
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Increasing the distance between inner frame 560 and outer frame 562 along axes Z2 and Z3 and decreasing the distance therebetween along axis Z1, angular motion about tilt axis T2 occurs in a second direction opposite to the first direction. In a similar manner angular movement about axis T1 may occur by varying the distance between inner frame 560 and outer frame 562 by movement of inner frame 560 along axes Z1 and Z2 in the same direction and magnitude while moving of the inner frame 560 along axis Z3 in a direction opposite and twice to the movement along axes Z1 and Z2. Similarly, angular movement about axis T3 may occur by varying the distance between inner frame 560 and outer frame 562 by movement of inner frame 560 along axes Z1 and Z3 in the same direction and magnitude while moving of inner frame 560 along axis Z2 in direction opposite and twice to the movement along axes Z1 and Z3. Actuators 588, 590 and 592 may have a maximum operational force of ±200 N. Orientation System 558 may provide a range of motion of approximately ±0.15° about axes T1, T2, and T3.
Actuators 588, 590 and 592 are selected to minimize mechanical parts and, therefore, minimize uneven mechanical compliance, as well as friction, which may cause particulates. Examples of actuators 588, 590 and 592 include voice coil actuators, piezo actuators, and linear actuators. An exemplary embodiment for actuators 588, 590 and 592 is available from BEI Technologies of Sylmar, Calif. under the trade name LA24-20-000A and are coupled to inner frame 560 using any suitable means, e.g., threaded fasteners. Additionally, actuators 588, 590 and 592 are coupled between inner frame 560 and outer frame 562 so as to be symmetrically disposed thereabout and lie outside of central throughway 570 and central opening 572. With this configuration an unobstructed throughway between outer frame 562 to flexure 556 is configured. Additionally, the symmetrical arrangement minimizes dynamic vibration and uneven thermal drift, thereby providing fine-motion correction of inner frame 560.
The combination of the inner frame 560, outer frame 562, flexure ring 564 and actuators 588, 590 and 592 provides angular motion of flexure 556 and, therefore, body 520 and template 214 about tilt axes T1, T2 and T3. It is desired, however, that translational motion be imparted to template 214 along axes that lie in a plane extending transversely, if not orthogonally, to axes Z1, Z2, and Z3. This is achieved by providing flexure 556 with the functionality to impart angular motion upon template 214 about one or more of a plurality of compliance axes, shown as C1 and C2, which are spaced—part from tilt axes T1, T2 and T3 and exist on the surface of the template when the template, the template chuck, and the compliant device are assembled.
Another embodiment of the present invention facilitates separation of mold 236 from the solidified imprinting material which forms, for example, formation 50. This is based upon the finding that localizing initial separation to a relatively small area of the interface between mold 236 and the solidified imprinting material reduces the magnitude of upwardly forces imparted upon mold 236 by orientation system 558 necessary to achieve separation. A desirable result is that the probability of separation between substrate 42 and stage 11 is reduced.
Referring to
The upwardly force required to separate template 214 from formation 50 is reduced by creating localized separation between mold 236 and formation 50 at a region proximate to a periphery of mold 236. To that end, for mold 236 having an area substantially coextensive with substrate 42, mold 236 will have a maximum area to ensure that a perimeter 237 thereof is spaced-apart from an edge 222 of substrate 42 approximately 1 millimeter, shown as distance R. Localized separation is obtained by initiating separation of mold 236 from the solidified imprinting material employing pump system 546 pressurizing chamber 554 to approximately 20 kPa. This distorts the shape of a region 217 of template 214 that surrounds mold 236. A first portion 219 of the surface template 214 in region 217 is displaced downwardly away from a neutral position Np toward substrate 42, with the nadir of portion 219 being approximately 1 micrometer below surface 43 of substrate 42. As a result, the distortion afforded to template 214 by pump system 546 should be sufficient to allow nadir portion 219 to extend from the neutral position NP a magnitude that is greater than the thickness t1, shown in
Referring again to
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The embodiments of the present invention described above are exemplary. Many changes and modifications may be made to the disclosure recited above, while remaining within the scope of the invention. The scope of the invention should not, therefore, be limited by the above description, but instead should be determined with reference to the appended claims along with their full scope of equivalents.
The present application is a divisional patent application of U.S. patent application Ser. No. 11/292,568, filed Dec. 1, 2005 and entitled “Technique for Separating a Mold from Solidified Imprinting Material,” and listing Mahadevan GanapathiSubramanian, Byung-Jin Choi, Michael N. Miller, and Nicholas A. Stacey as inventors, the entirety of which is incorporated by reference herein.
Number | Name | Date | Kind |
---|---|---|---|
2124711 | Rowell | Jul 1938 | A |
3503538 | Barnes | Mar 1970 | A |
4022855 | Hamblen | May 1977 | A |
4070116 | Frosch et al. | Jan 1978 | A |
4208240 | Latos | Jun 1980 | A |
4364971 | Sack et al. | Dec 1982 | A |
4440804 | Milgram | Apr 1984 | A |
4512848 | Deckman et al. | Apr 1985 | A |
4521445 | Nablo et al. | Jun 1985 | A |
4552832 | Blume et al. | Nov 1985 | A |
4576900 | Chiang | Mar 1986 | A |
4637904 | Rounds | Jan 1987 | A |
4676868 | Riley et al. | Jun 1987 | A |
4707218 | Giammarco et al. | Nov 1987 | A |
4731155 | Napoli et al. | Mar 1988 | A |
4737425 | Lin et al. | Apr 1988 | A |
4848911 | Uchida et al. | Jul 1989 | A |
4857477 | Kanamori | Aug 1989 | A |
4862019 | Ashmore, Jr. | Aug 1989 | A |
4866307 | Ashmore, Jr. | Sep 1989 | A |
4908298 | Hefferon et al. | Mar 1990 | A |
4909151 | Fukui et al. | Mar 1990 | A |
4919748 | Bredbenner et al. | Apr 1990 | A |
4921778 | Thackeray et al. | May 1990 | A |
4932358 | Studley et al. | Jun 1990 | A |
4936465 | Zold | Jun 1990 | A |
4957663 | Zwiers et al. | Sep 1990 | A |
4959252 | Bonnebat et al. | Sep 1990 | A |
4964945 | Calhoun | Oct 1990 | A |
4980316 | Huebner | Dec 1990 | A |
5003062 | Yen | Mar 1991 | A |
5028361 | Fujimoto | Jul 1991 | A |
5028366 | Harakal et al. | Jul 1991 | A |
5053318 | Gulla et al. | Oct 1991 | A |
5073230 | Maracas et al. | Dec 1991 | A |
5110514 | Soane | May 1992 | A |
5124089 | Ohkoshi et al. | Jun 1992 | A |
5126006 | Cronin et al. | Jun 1992 | A |
5148037 | Suda et al. | Sep 1992 | A |
5151754 | Ishibashi et al. | Sep 1992 | A |
5212147 | Sheats | May 1993 | A |
5232874 | Rhodes et al. | Aug 1993 | A |
5240550 | Boehnke et al. | Aug 1993 | A |
5240878 | Fitzsimmons et al. | Aug 1993 | A |
5244818 | Jokerst et al. | Sep 1993 | A |
5246880 | Reele et al. | Sep 1993 | A |
5250472 | Chen et al. | Oct 1993 | A |
5259926 | Kuwabara et al. | Nov 1993 | A |
5277749 | Griffith et al. | Jan 1994 | A |
5288436 | Liu et al. | Feb 1994 | A |
5324683 | Fitch et al. | Jun 1994 | A |
5328810 | Lowrey et al. | Jul 1994 | A |
5330881 | Sidman et al. | Jul 1994 | A |
5357122 | Okubora et al. | Oct 1994 | A |
5362606 | Hartney et al. | Nov 1994 | A |
5362940 | MacDonald et al. | Nov 1994 | A |
5364222 | Akimoto et al. | Nov 1994 | A |
5366851 | Novembre | Nov 1994 | A |
5371822 | Horwitz et al. | Dec 1994 | A |
5374327 | Imahashi et al. | Dec 1994 | A |
5376810 | Hoenk et al. | Dec 1994 | A |
5422295 | Choi et al. | Jun 1995 | A |
5424549 | Feldman | Jun 1995 | A |
5425848 | Haisma et al. | Jun 1995 | A |
5431777 | Austin et al. | Jul 1995 | A |
5434107 | Paranjpe | Jul 1995 | A |
5445195 | Kim | Aug 1995 | A |
5449117 | Muderlak et al. | Sep 1995 | A |
5451435 | Yu | Sep 1995 | A |
5453157 | Jeng | Sep 1995 | A |
5458520 | DeMercurio et al. | Oct 1995 | A |
5468542 | Crouch | Nov 1995 | A |
5480047 | Tanigawa et al. | Jan 1996 | A |
5512131 | Kumar et al. | Apr 1996 | A |
5542605 | Campau | Aug 1996 | A |
5545367 | Bae et al. | Aug 1996 | A |
5601641 | Stephens | Feb 1997 | A |
5612068 | Kempf et al. | Mar 1997 | A |
5628917 | MacDonald et al. | May 1997 | A |
5643364 | Zhao et al. | Jul 1997 | A |
5654238 | Cronin et al. | Aug 1997 | A |
5669303 | Maracas et al. | Sep 1997 | A |
5736424 | Prybyla et al. | Apr 1998 | A |
5753014 | Van Rijn | May 1998 | A |
5772905 | Chou | Jun 1998 | A |
5776748 | Singhvi et al. | Jul 1998 | A |
5804474 | Sakaki et al. | Sep 1998 | A |
5812629 | Clauser | Sep 1998 | A |
5817579 | Ko et al. | Oct 1998 | A |
5820769 | Chou | Oct 1998 | A |
5843363 | Mitwalsky et al. | Dec 1998 | A |
5849209 | Kindt-Larsen et al. | Dec 1998 | A |
5849222 | Jen et al. | Dec 1998 | A |
5858580 | Wang et al. | Jan 1999 | A |
5888650 | Calhoun et al. | Mar 1999 | A |
5895263 | Carter et al. | Apr 1999 | A |
5900160 | Whitesides et al. | May 1999 | A |
5907782 | Wu | May 1999 | A |
5926690 | Toprac et al. | Jul 1999 | A |
5948470 | Harrison et al. | Sep 1999 | A |
5948570 | Kornblit et al. | Sep 1999 | A |
5956216 | Chou | Sep 1999 | A |
5974150 | Kaish et al. | Oct 1999 | A |
5983906 | Zhao et al. | Nov 1999 | A |
6046056 | Parce et al. | Apr 2000 | A |
6048799 | Prybyla | Apr 2000 | A |
6067144 | Murouchi | May 2000 | A |
6074827 | Nelson et al. | Jun 2000 | A |
6150680 | Eastman et al. | Nov 2000 | A |
6180239 | Whitesides et al. | Jan 2001 | B1 |
6218316 | Marsh | Apr 2001 | B1 |
6242363 | Zhang | Jun 2001 | B1 |
6245213 | Olsson et al. | Jun 2001 | B1 |
6274294 | Hines | Aug 2001 | B1 |
6309580 | Chou | Oct 2001 | B1 |
6326627 | Putvinski et al. | Dec 2001 | B1 |
6329256 | Ibok | Dec 2001 | B1 |
6334960 | Willson et al. | Jan 2002 | B1 |
6337262 | Pradeep et al. | Jan 2002 | B1 |
6348999 | Summersgill et al. | Feb 2002 | B1 |
6355198 | Kim et al. | Mar 2002 | B1 |
6376379 | Quek et al. | Apr 2002 | B1 |
6383928 | Eissa | May 2002 | B1 |
6387330 | Bova et al. | May 2002 | B1 |
6387783 | Furukawa et al. | May 2002 | B1 |
6388253 | Su | May 2002 | B1 |
6391217 | Schaffer et al. | May 2002 | B2 |
6391798 | DeFelice et al. | May 2002 | B1 |
6423207 | Heidari et al. | Jul 2002 | B1 |
6482742 | Chou | Nov 2002 | B1 |
6495907 | Jain et al. | Dec 2002 | B1 |
6498640 | Ziger | Dec 2002 | B1 |
6503829 | Kim et al. | Jan 2003 | B2 |
6514672 | Young et al. | Feb 2003 | B2 |
6517977 | Resnick et al. | Feb 2003 | B2 |
6517995 | Jacobson et al. | Feb 2003 | B1 |
6518189 | Chou | Feb 2003 | B1 |
6521536 | Robinson | Feb 2003 | B1 |
6534418 | Plat et al. | Mar 2003 | B1 |
6541360 | Plat et al. | Apr 2003 | B1 |
6565928 | Sakamoto et al. | May 2003 | B2 |
6580172 | Mancini et al. | Jun 2003 | B2 |
6586268 | Kopola et al. | Jul 2003 | B1 |
6593240 | Page | Jul 2003 | B1 |
6621960 | Wang et al. | Sep 2003 | B2 |
6623579 | Smith et al. | Sep 2003 | B1 |
6627544 | Izumi et al. | Sep 2003 | B2 |
6629292 | Corson et al. | Sep 2003 | B1 |
6632742 | Yang et al. | Oct 2003 | B2 |
6635581 | Wong | Oct 2003 | B2 |
6646662 | Nebashi et al. | Nov 2003 | B1 |
6665014 | Assadi et al. | Dec 2003 | B1 |
6677252 | Marsh | Jan 2004 | B2 |
6678038 | Binnard | Jan 2004 | B2 |
6696220 | Bailey et al. | Feb 2004 | B2 |
6713238 | Chou et al. | Mar 2004 | B1 |
6719915 | Willson et al. | Apr 2004 | B2 |
6776094 | Whitesides et al. | Aug 2004 | B1 |
6809356 | Chou | Oct 2004 | B2 |
6828244 | Chou | Dec 2004 | B2 |
6833325 | Huang et al. | Dec 2004 | B2 |
6842229 | Sreenivasan et al. | Jan 2005 | B2 |
6849558 | Schaper | Feb 2005 | B2 |
6870301 | Choi et al. | Mar 2005 | B2 |
6871558 | Choi et al. | Mar 2005 | B2 |
6873087 | Choi et al. | Mar 2005 | B1 |
6879162 | Aguero et al. | Apr 2005 | B2 |
6900881 | Sreenivasan et al. | May 2005 | B2 |
6908861 | Sreenivasan et al. | Jun 2005 | B2 |
6916584 | Sreenivasan et al. | Jul 2005 | B2 |
6916585 | Sreenivasan et al. | Jul 2005 | B2 |
6926929 | Watts et al. | Aug 2005 | B2 |
6932934 | Choi et al. | Aug 2005 | B2 |
6946360 | Chou | Sep 2005 | B2 |
6955767 | Chen | Oct 2005 | B2 |
6964793 | Willson et al. | Nov 2005 | B2 |
6980282 | Choi et al. | Dec 2005 | B2 |
6990870 | Choi et al. | Jan 2006 | B2 |
7019819 | Choi et al. | Mar 2006 | B2 |
7036389 | Choi et al. | May 2006 | B2 |
7071088 | Watts et al. | Jul 2006 | B2 |
7077992 | Sreenivasan et al. | Jul 2006 | B2 |
7090716 | McMackin et al. | Aug 2006 | B2 |
7105452 | Sreenivasan | Sep 2006 | B2 |
7117583 | Dinan et al. | Oct 2006 | B2 |
7128875 | Cubicciotti | Oct 2006 | B2 |
7214624 | Fujita et al. | May 2007 | B2 |
7244386 | Sreenivasan et al. | Jul 2007 | B2 |
7252715 | Watts et al. | Aug 2007 | B2 |
7270533 | McMackin et al. | Sep 2007 | B2 |
7281919 | Shackleton et al. | Oct 2007 | B2 |
7298456 | Cherala et al. | Nov 2007 | B2 |
7316554 | Choi et al. | Jan 2008 | B2 |
7338275 | Choi et al. | Mar 2008 | B2 |
20010023829 | Olsson et al. | Sep 2001 | A1 |
20020038916 | Chiu et al. | Apr 2002 | A1 |
20020042027 | Chou et al. | Apr 2002 | A1 |
20020094496 | Choi et al. | Jul 2002 | A1 |
20020110992 | Ho | Aug 2002 | A1 |
20020111036 | Zhu et al. | Aug 2002 | A1 |
20020132482 | Chou | Sep 2002 | A1 |
20020167117 | Chou | Nov 2002 | A1 |
20020168578 | Wang et al. | Nov 2002 | A1 |
20020170880 | Chen | Nov 2002 | A1 |
20020191141 | Liao | Dec 2002 | A1 |
20030017424 | Park et al. | Jan 2003 | A1 |
20030025895 | Binnard | Feb 2003 | A1 |
20030034329 | Chou | Feb 2003 | A1 |
20030062334 | Lee et al. | Apr 2003 | A1 |
20030080471 | Chou | May 2003 | A1 |
20030080472 | Chou | May 2003 | A1 |
20030081193 | White et al. | May 2003 | A1 |
20030092261 | Kondo et al. | May 2003 | A1 |
20030129542 | Shih et al. | Jul 2003 | A1 |
20030137494 | Tulbert | Jul 2003 | A1 |
20030151714 | Takahashi et al. | Aug 2003 | A1 |
20030174435 | Dinan et al. | Sep 2003 | A1 |
20030179354 | Araki et al. | Sep 2003 | A1 |
20030184917 | Chang et al. | Oct 2003 | A1 |
20030186140 | Fries | Oct 2003 | A1 |
20030197312 | Hougham et al. | Oct 2003 | A1 |
20030224116 | Chen et al. | Dec 2003 | A1 |
20040029041 | Shih et al. | Feb 2004 | A1 |
20040036201 | Chou et al. | Feb 2004 | A1 |
20040038552 | Watts et al. | Feb 2004 | A1 |
20040046288 | Chou | Mar 2004 | A1 |
20040065252 | Sreenivasan et al. | Apr 2004 | A1 |
20040065976 | Sreenivasan et al. | Apr 2004 | A1 |
20040110856 | Young et al. | Jun 2004 | A1 |
20040118809 | Chou et al. | Jun 2004 | A1 |
20040131718 | Chou et al. | Jul 2004 | A1 |
20040137734 | Chou et al. | Jul 2004 | A1 |
20040146792 | Nimmakayala et al. | Jul 2004 | A1 |
20040156108 | Chou et al. | Aug 2004 | A1 |
20040163563 | Sreenivasan et al. | Aug 2004 | A1 |
20040192041 | Jeong et al. | Sep 2004 | A1 |
20040197843 | Chou et al. | Oct 2004 | A1 |
20040201890 | Crosby | Oct 2004 | A1 |
20040250945 | Zheng et al. | Dec 2004 | A1 |
20050037143 | Chou et al. | Feb 2005 | A1 |
20050056963 | McCutcheon | Mar 2005 | A1 |
20050061773 | Choi et al. | Mar 2005 | A1 |
20050072757 | McMackin et al. | Apr 2005 | A1 |
20050106321 | McMackin et al. | May 2005 | A1 |
20050189676 | Sreenivasan | Sep 2005 | A1 |
20050236739 | Willson et al. | Oct 2005 | A1 |
20050276919 | Truskett et al. | Dec 2005 | A1 |
20050284886 | Penciu | Dec 2005 | A1 |
20060017876 | Watts | Jan 2006 | A1 |
20060062867 | Choi et al. | Mar 2006 | A1 |
20060063112 | Sreenivasan | Mar 2006 | A1 |
20060068120 | Sreenivasan et al. | Mar 2006 | A1 |
20060076717 | Sreenivasan et al. | Apr 2006 | A1 |
20060077374 | Sreenivasan et al. | Apr 2006 | A1 |
20060113697 | Sreenivasan | Jun 2006 | A1 |
20060115999 | Sreenivasan et al. | Jun 2006 | A1 |
20060121728 | McMackin et al. | Jun 2006 | A1 |
20060177532 | Fletcher et al. | Aug 2006 | A1 |
20060177535 | McMackin et al. | Aug 2006 | A1 |
20070063384 | Choi et al. | Mar 2007 | A1 |
20070126156 | Mahadevan et al. | Jun 2007 | A1 |
20070132152 | Choi et al. | Jun 2007 | A1 |
20070170617 | Choi et al. | Jul 2007 | A1 |
20070228609 | Sreenivasan et al. | Oct 2007 | A1 |
20070228610 | Sreenivasan et al. | Oct 2007 | A1 |
20070231981 | Sreenivasan et al. | Oct 2007 | A1 |
20070243655 | Schmid et al. | Oct 2007 | A1 |
Number | Date | Country |
---|---|---|
0398589 | Apr 1998 | EP |
2677043 | Dec 1992 | FR |
3-32888 | Feb 1981 | JP |
58-129074 | Aug 1983 | JP |
1-196749 | Aug 1989 | JP |
02-24848 | Jan 1990 | JP |
02-92603 | Apr 1990 | JP |
02192045 | Jul 1990 | JP |
4-70379 | May 1992 | JP |
WO 8702935 | May 1987 | WO |
WO 9810121 | Mar 1998 | WO |
WO 9905724 | Feb 1999 | WO |
WO 9945753 | Sep 1999 | WO |
WO 0021689 | Apr 2000 | WO |
WO 0147003 | Jun 2001 | WO |
WO 0163361 | Aug 2001 | WO |
WO 0169317 | Sep 2001 | WO |
WO 0179589 | Oct 2001 | WO |
WO 0179933 | Oct 2001 | WO |
WO 0222916 | Mar 2002 | WO |
WO 0224977 | Mar 2002 | WO |
Number | Date | Country | |
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20070126150 A1 | Jun 2007 | US |
Number | Date | Country | |
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Parent | 11292568 | Dec 2005 | US |
Child | 11303777 | US |