Number | Name | Date | Kind |
---|---|---|---|
5109190 | Sakashita et al. | Apr 1992 | |
5387862 | Parker et al. | Feb 1995 | |
5428624 | Blair et al. | Jun 1995 | |
5448575 | Hashizume | Sep 1995 | |
5450415 | Kamada | Sep 1995 |
Entry |
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IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture, Institute of Electrical and Electronics Engineers, Inc., (May 21, 1990), Chapter 1, pp. 1-1 to 1-5. |