Number | Name | Date | Kind |
---|---|---|---|
5173906 | Dreibel-bis et al. | Dec 1992 | |
5233161 | Farwell et al. | Aug 1993 | |
5309090 | Lipp | May 1994 | |
5341096 | Yamamura | Aug 1994 | |
5406212 | Hashinaga et al. | Apr 1995 | |
5471429 | Lee et al. | Nov 1995 | |
5473259 | Takeda | Dec 1995 | |
5498971 | Turnbull et al. | Mar 1996 | |
5582235 | Hamilton | Dec 1996 | |
5723998 | Saito | Mar 1998 | |
5798667 | Herbert | Aug 1998 |
Entry |
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Self-Heating Test Chip For Reliability Life Test; vol. 25; No. 7B; Dec. 1982 C.C. Yu . |
Generic Burn-In For Locst Chips;vol. 32; No. 4A; Sep. 1989. |
Technique For A "Dynamic" Burn-In Test; vol. 32; No. 8B; Jan. 1990. |
Self-Stress Pattern Generator; vol. 27; No. 7A; Dec. 1984; B. Coene. |