Marginal testing

Industry

CPC
G01R31/30

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/30Marginal testing

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Motorized chuck stage controlling method
- Patent number 12,196,808
- Issue date Jan 14, 2025
- MPI CORPORATION
- Sebastian Giessmann
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor inspection device and method for inspecting semicondu...
- Patent number 12,196,802
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- G01 - MEASURING TESTING
Information Patent Grant
Near field wireless communication system for mother to package and...
- Patent number 12,196,807
- Issue date Jan 14, 2025
- Intel Corporation
- Zhen Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method, arrangement, and computer program product for organizing th...
- Patent number 12,182,612
- Issue date Dec 31, 2024
- Minima Processor Oy
- Lauri Koskinen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Fault isolation analysis method and computer-readable storage medium
- Patent number 12,174,265
- Issue date Dec 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yuanjie Xu
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive body biasing or voltage regulation using slack sensors
- Patent number 12,169,221
- Issue date Dec 17, 2024
- Dolphin Design
- Sebastien Genevey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring circuit, integrated circuit including the same, and oper...
- Patent number 12,158,501
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Yongwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Classifying comparators based on comparator offsets
- Patent number 12,134,713
- Issue date Nov 5, 2024
- Microchip Technology Incorporated
- Zhi-Yuan Zou
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Modular multilevel converter system and voltage detection method an...
- Patent number 12,119,741
- Issue date Oct 15, 2024
- Delta Electronics (Shanghai) Co., Ltd.
- Peng Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment for testing a device under test having an antenna
- Patent number 12,099,088
- Issue date Sep 24, 2024
- Advantest Corporation
- Jan Hesselbarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 12,072,376
- Issue date Aug 27, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power leakage testing
- Patent number 12,072,394
- Issue date Aug 27, 2024
- Nordic Semiconductor ASA
- Esa Korhonen
- G01 - MEASURING TESTING
Information Patent Grant
Sensing apparatus and method of operation thereof
- Patent number 12,066,379
- Issue date Aug 20, 2024
- CAMBRIDGE BATTERY RESEARCH LIMITED
- Hatice Munevver Tuncer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active optical plug to optically or electrically test a photonics p...
- Patent number 12,061,230
- Issue date Aug 13, 2024
- Intel Corporation
- Todd R. Coons
- G01 - MEASURING TESTING
Information Patent Grant
In-line electrical detection of defects at wafer level
- Patent number 12,061,229
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Hsuan Huang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test circuit, test assembly and method for testing an in...
- Patent number 12,055,587
- Issue date Aug 6, 2024
- Infineon Technologies AG
- Tobias Kilian
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 12,055,584
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testbenches for electronic systems with automatic insertion of veri...
- Patent number 12,055,588
- Issue date Aug 6, 2024
- ARTERIS, INC.
- Benoit Lafage
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device examination method and semiconductor device ex...
- Patent number 12,044,729
- Issue date Jul 23, 2024
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Integrated impedance measurement device and impedance measurement m...
- Patent number 12,038,463
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Random pulse generator and memory
- Patent number 12,040,801
- Issue date Jul 16, 2024
- SK Hynix Inc.
- Hong Ki Moon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 12,038,476
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Clock conversion device, test system having the same, and method of...
- Patent number 12,032,019
- Issue date Jul 9, 2024
- Samsung Electronics Co., Ltd.
- Yongjeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing antenna-in-package modules and method for using...
- Patent number 12,025,657
- Issue date Jul 2, 2024
- Ohmplus Technology Inc.
- Hsi-Tseng Chou
- G01 - MEASURING TESTING
Information Patent Grant
Circuit structure to measure outliers of process variation effects
- Patent number 12,025,658
- Issue date Jul 2, 2024
- Bitmain Development Inc.
- Christos Vezyrtzis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 12,020,897
- Issue date Jun 25, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...
- Publication number 20250012855
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Dongchi YU
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250004047
- Publication date Jan 2, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL INTEGRITY MONITORING SYSTEM
- Publication number 20240410943
- Publication date Dec 12, 2024
- Synopsys, Inc.
- Firooz MASSOUDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20240393390
- Publication date Nov 28, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL
- Publication number 20240361381
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hsuan Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE
- Publication number 20240353462
- Publication date Oct 24, 2024
- Northrop Grumman Systems Corporation
- ERIC A. IMHOF
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...
- Publication number 20240353485
- Publication date Oct 24, 2024
- ams-OSRAM International GmbH
- Stefan Kerscher
- G01 - MEASURING TESTING
Information Patent Application
Integrated Impedance Measurement Device and Impedance Measurement M...
- Publication number 20240345146
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE
- Publication number 20240337685
- Publication date Oct 10, 2024
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE
- Publication number 20240337689
- Publication date Oct 10, 2024
- QRT Co., Ltd.
- Young Boo KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20240329128
- Publication date Oct 3, 2024
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT
- Publication number 20240319266
- Publication date Sep 26, 2024
- LAPIS Technology Co., Ltd.
- Takahiro YONEDA
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE TESTING STRUCTURE AND LEAKAGE TESTING METHOD
- Publication number 20240319267
- Publication date Sep 26, 2024
- CANSEMI TECHNOLOGY INC.
- Zeyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20240304414
- Publication date Sep 12, 2024
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLDER MASK FAULT FIBER OPTICS SENSOR
- Publication number 20240284590
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Chan H. Yoo
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION DEVICE, VOLTAGE DETECTION METHOD, AND COMPUTER-READAB...
- Publication number 20240265799
- Publication date Aug 8, 2024
- Huawei Technologies Co., Ltd
- Dian XU
- G08 - SIGNALLING
Information Patent Application
Sample Inspection Apparatus
- Publication number 20240255556
- Publication date Aug 1, 2024
- Hitachi High-Tech Corporation
- Tomoko SHIMAMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240230718
- Publication date Jul 11, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR...
- Publication number 20240230748
- Publication date Jul 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- G01 - MEASURING TESTING
Information Patent Application
SAVING AND RESTORING SCAN STATES
- Publication number 20240230758
- Publication date Jul 11, 2024
- Atmosic Technologies, Inc.
- Mohsen Shaaban
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
- Publication number 20240219460
- Publication date Jul 4, 2024
- Xianghong TONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGUL...
- Publication number 20240219459
- Publication date Jul 4, 2024
- TEXAS INSTRUMENTS INCORPORATED
- HARSH PATEL
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR DETERIORATION DETECTION DEVICE AND CONVERTER SYSTEM
- Publication number 20240223070
- Publication date Jul 4, 2024
- FANUC Corporation
- Yuya Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20240192270
- Publication date Jun 13, 2024
- Teraview Limited
- Brian Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC EQUIPMENT
- Publication number 20240183899
- Publication date Jun 6, 2024
- Total Quality Systems
- Bryan Steadman
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING
- Publication number 20240175919
- Publication date May 30, 2024
- TouchNetix AS
- Steinar MYREN
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE DETECTION DEVICE AND VOLTAGE PROTECTION METHOD
- Publication number 20240168088
- Publication date May 23, 2024
- SigmaStar Technology Ltd.
- Wei-Ping WANG
- G01 - MEASURING TESTING
Information Patent Application
CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVER
- Publication number 20240168090
- Publication date May 23, 2024
- NXP B.V.
- Lucas Pieter Lodewijk van Dijk
- G01 - MEASURING TESTING

Marginal testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Motorized chuck stage controlling method

Semiconductor inspection device and method for inspecting semicondu...

Near field wireless communication system for mother to package and...

Method, arrangement, and computer program product for organizing th...

Apparatus for performing multiple tests on a device under test

Fault isolation analysis method and computer-readable storage medium

Adaptive body biasing or voltage regulation using slack sensors

Monitoring circuit, integrated circuit including the same, and oper...

Semiconductor doping characterization method using photoneutralizat...

Classifying comparators based on comparator offsets

Interface to full and reduced pin JTAG devices

Modular multilevel converter system and voltage detection method an...

Test equipment for testing a device under test having an antenna

Die-to-die connectivity monitoring

Power leakage testing

Sensing apparatus and method of operation thereof

Active optical plug to optically or electrically test a photonics p...

In-line electrical detection of defects at wafer level

Integrated test circuit, test assembly and method for testing an in...

Systems, methods, and devices for high-speed input/output margin te...

Testbenches for electronic systems with automatic insertion of veri...

Semiconductor device examination method and semiconductor device ex...

Integrated impedance measurement device and impedance measurement m...

Random pulse generator and memory

Systems, devices, and methods for performing a non-contact electric...

Clock conversion device, test system having the same, and method of...

Semiconductor doping characterization method using photoneutralizat...

System for testing antenna-in-package modules and method for using...

Circuit structure to measure outliers of process variation effects

Systems, devices, and methods for aligning a particle beam and perf...

Patents Applicationslast 30 patents

SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...

SIGNAL INTEGRITY MONITORING SYSTEM

DIE-TO-DIE CONNECTIVITY MONITORING

IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL

ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE

MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...

Integrated Impedance Measurement Device and Impedance Measurement M...

SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...

TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE

RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

INTEGRATED CIRCUIT

LEAKAGE TESTING STRUCTURE AND LEAKAGE TESTING METHOD

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

SOLDER MASK FAULT FIBER OPTICS SENSOR

COMMUNICATION DEVICE, VOLTAGE DETECTION METHOD, AND COMPUTER-READAB...

Sample Inspection Apparatus

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR...

SAVING AND RESTORING SCAN STATES

ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...

METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGUL...

CAPACITOR DETERIORATION DETECTION DEVICE AND CONVERTER SYSTEM

TEST SYSTEM

TESTING OF ELECTRONIC EQUIPMENT

INTEGRATED CIRCUIT TESTING

VOLTAGE DETECTION DEVICE AND VOLTAGE PROTECTION METHOD

CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVER