Marginal testing

Industry

CPC
G01R31/30

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/30Marginal testing

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Over the air test chamber with optimized air circulation
- Patent number 12,259,426
- Issue date Mar 25, 2025
- Rohde & Schwarz GmbH & Co. KG
- Ralf Meissner
- G01 - MEASURING TESTING
Information Patent Grant
Adhesive composition and methods of forming the same
- Patent number 12,258,495
- Issue date Mar 25, 2025
- Saint-Gobain Performance Plastics Corporation
- Nicky Chan
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Semiconductor chip and test method of the same
- Patent number 12,248,018
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Diode test module for monitoring leakage current and its method the...
- Patent number 12,248,019
- Issue date Mar 11, 2025
- Amazing Microelectronic Corp.
- Chih-Ting Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting defective logic devices
- Patent number 12,248,022
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit margin measurement for structural testing
- Patent number 12,241,933
- Issue date Mar 4, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Estimation of unknown electronic load
- Patent number 12,241,939
- Issue date Mar 4, 2025
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Grant
Current shunt probe
- Patent number 12,235,291
- Issue date Feb 25, 2025
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation of optically isolated probe
- Patent number 12,228,607
- Issue date Feb 18, 2025
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,216,159
- Issue date Feb 4, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for parallel testing of electronic device
- Patent number 12,203,982
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Grant
Motorized chuck stage controlling method
- Patent number 12,196,808
- Issue date Jan 14, 2025
- MPI CORPORATION
- Sebastian Giessmann
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor inspection device and method for inspecting semicondu...
- Patent number 12,196,802
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- G01 - MEASURING TESTING
Information Patent Grant
Near field wireless communication system for mother to package and...
- Patent number 12,196,807
- Issue date Jan 14, 2025
- Intel Corporation
- Zhen Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method, arrangement, and computer program product for organizing th...
- Patent number 12,182,612
- Issue date Dec 31, 2024
- Minima Processor Oy
- Lauri Koskinen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Fault isolation analysis method and computer-readable storage medium
- Patent number 12,174,265
- Issue date Dec 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yuanjie Xu
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive body biasing or voltage regulation using slack sensors
- Patent number 12,169,221
- Issue date Dec 17, 2024
- Dolphin Design
- Sebastien Genevey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring circuit, integrated circuit including the same, and oper...
- Patent number 12,158,501
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Yongwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Classifying comparators based on comparator offsets
- Patent number 12,134,713
- Issue date Nov 5, 2024
- Microchip Technology Incorporated
- Zhi-Yuan Zou
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Modular multilevel converter system and voltage detection method an...
- Patent number 12,119,741
- Issue date Oct 15, 2024
- Delta Electronics (Shanghai) Co., Ltd.
- Peng Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment for testing a device under test having an antenna
- Patent number 12,099,088
- Issue date Sep 24, 2024
- Advantest Corporation
- Jan Hesselbarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 12,072,376
- Issue date Aug 27, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power leakage testing
- Patent number 12,072,394
- Issue date Aug 27, 2024
- Nordic Semiconductor ASA
- Esa Korhonen
- G01 - MEASURING TESTING
Information Patent Grant
Sensing apparatus and method of operation thereof
- Patent number 12,066,379
- Issue date Aug 20, 2024
- CAMBRIDGE BATTERY RESEARCH LIMITED
- Hatice Munevver Tuncer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active optical plug to optically or electrically test a photonics p...
- Patent number 12,061,230
- Issue date Aug 13, 2024
- Intel Corporation
- Todd R. Coons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...
- Publication number 20250093413
- Publication date Mar 20, 2025
- Intel Corporation
- Zhen ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING APPARATUS
- Publication number 20250085335
- Publication date Mar 13, 2025
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Systems and Methods
- Publication number 20250076373
- Publication date Mar 6, 2025
- The Boeing Company
- Mark Edward Nowakowski
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20250076377
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...
- Publication number 20250067805
- Publication date Feb 27, 2025
- Samsung Electronics Co., Ltd.
- Yongwoo KIM
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS
- Publication number 20250059414
- Publication date Feb 20, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Zhi-Yuan Zou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VOLTAGE GLITCH DETECTORS
- Publication number 20250060409
- Publication date Feb 20, 2025
- Silicon Laboratories Inc.
- Timothy Thomas Rueger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE F...
- Publication number 20250044352
- Publication date Feb 6, 2025
- Tektronix, Inc.
- Christopher N. White
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND...
- Publication number 20250027990
- Publication date Jan 23, 2025
- ASML NETHERLANDS B.V.
- Datong ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE
- Publication number 20250027985
- Publication date Jan 23, 2025
- STMicroelectronics International N.V.
- Emanuele Moretti
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST METHOD
- Publication number 20250027991
- Publication date Jan 23, 2025
- GENERAL TEST SYSTEMS INC.
- Wei YU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...
- Publication number 20250012855
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Dongchi YU
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250004047
- Publication date Jan 2, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL INTEGRITY MONITORING SYSTEM
- Publication number 20240410943
- Publication date Dec 12, 2024
- Synopsys, Inc.
- Firooz MASSOUDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20240393390
- Publication date Nov 28, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL
- Publication number 20240361381
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hsuan Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE
- Publication number 20240353462
- Publication date Oct 24, 2024
- Northrop Grumman Systems Corporation
- ERIC A. IMHOF
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...
- Publication number 20240353485
- Publication date Oct 24, 2024
- ams-OSRAM International GmbH
- Stefan Kerscher
- G01 - MEASURING TESTING
Information Patent Application
Integrated Impedance Measurement Device and Impedance Measurement M...
- Publication number 20240345146
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE
- Publication number 20240337685
- Publication date Oct 10, 2024
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE
- Publication number 20240337689
- Publication date Oct 10, 2024
- QRT Co., Ltd.
- Young Boo KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20240329128
- Publication date Oct 3, 2024
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT
- Publication number 20240319266
- Publication date Sep 26, 2024
- LAPIS Technology Co., Ltd.
- Takahiro YONEDA
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE TESTING STRUCTURE AND LEAKAGE TESTING METHOD
- Publication number 20240319267
- Publication date Sep 26, 2024
- CANSEMI TECHNOLOGY INC.
- Zeyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20240304414
- Publication date Sep 12, 2024
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLDER MASK FAULT FIBER OPTICS SENSOR
- Publication number 20240284590
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Chan H. Yoo
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION DEVICE, VOLTAGE DETECTION METHOD, AND COMPUTER-READAB...
- Publication number 20240265799
- Publication date Aug 8, 2024
- Huawei Technologies Co., Ltd
- Dian XU
- G08 - SIGNALLING

Marginal testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Over the air test chamber with optimized air circulation

Adhesive composition and methods of forming the same

Semiconductor chip and test method of the same

Diode test module for monitoring leakage current and its method the...

Method and apparatus for detecting defective logic devices

Wafer metrology technologies

Integrated circuit margin measurement for structural testing

Estimation of unknown electronic load

Current shunt probe

Temperature compensation of optically isolated probe

On-die aging measurements for dynamic timing modeling

Circuit and method to measure simulation to silicon timing correlation

System and method for parallel testing of electronic device

Motorized chuck stage controlling method

Semiconductor inspection device and method for inspecting semicondu...

Near field wireless communication system for mother to package and...

Method, arrangement, and computer program product for organizing th...

Apparatus for performing multiple tests on a device under test

Fault isolation analysis method and computer-readable storage medium

Adaptive body biasing or voltage regulation using slack sensors

Monitoring circuit, integrated circuit including the same, and oper...

Semiconductor doping characterization method using photoneutralizat...

Classifying comparators based on comparator offsets

Interface to full and reduced pin JTAG devices

Modular multilevel converter system and voltage detection method an...

Test equipment for testing a device under test having an antenna

Die-to-die connectivity monitoring

Power leakage testing

Sensing apparatus and method of operation thereof

Active optical plug to optically or electrically test a photonics p...

Patents Applicationslast 30 patents

NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...

TESTING APPARATUS

Diagnostic Systems and Methods

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...

CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS

VOLTAGE GLITCH DETECTORS

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE F...

CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND...

STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE

TEST SYSTEM AND TEST METHOD

SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...

SIGNAL INTEGRITY MONITORING SYSTEM

DIE-TO-DIE CONNECTIVITY MONITORING

IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL

ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE

MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...

Integrated Impedance Measurement Device and Impedance Measurement M...

SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...

TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE

RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

INTEGRATED CIRCUIT

LEAKAGE TESTING STRUCTURE AND LEAKAGE TESTING METHOD

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

SOLDER MASK FAULT FIBER OPTICS SENSOR

COMMUNICATION DEVICE, VOLTAGE DETECTION METHOD, AND COMPUTER-READAB...