Marginal testing

Industry

CPC
G01R31/30

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/30Marginal testing

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detection of counterfeit parts, compromise...
- Patent number 12,366,604
- Issue date Jul 22, 2025
- Palitronica Inc.
- Carlos Moreno
- G01 - MEASURING TESTING
Information Patent Grant
In-line device electrical property estimating method and test struc...
- Patent number 12,360,153
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Chen-Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of creating an electronically readable optical fingerprint t...
- Patent number 12,360,158
- Issue date Jul 15, 2025
- Raytheon Company
- Peter A. Bellus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pluggable load module to test a voltage regulator
- Patent number 12,345,775
- Issue date Jul 1, 2025
- LOGIICDEV GMBH
- Deepak V Katkoria
- G01 - MEASURING TESTING
Information Patent Grant
Radio frequency conduction test method and related apparatus withou...
- Patent number 12,345,761
- Issue date Jul 1, 2025
- HONOR DEVICE CO., LTD.
- Wei Zhai
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 12,345,762
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor inspecting method and semiconductor inspecting device
- Patent number 12,340,504
- Issue date Jun 24, 2025
- Hamamatsu Photonics K.K.
- Akira Shimase
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of failure analysis for semiconduct...
- Patent number 12,339,321
- Issue date Jun 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Wei Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system
- Patent number 12,332,297
- Issue date Jun 17, 2025
- Tera View Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for testing PLP capacitors
- Patent number 12,332,710
- Issue date Jun 17, 2025
- Kioxia Corporation
- Paul Abrahams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,332,305
- Issue date Jun 17, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Leakage testing structure and leakage testing method
- Patent number 12,313,679
- Issue date May 27, 2025
- CANSEMI TECHNOLOGY INC.
- Zeyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Saving and restoring scan states
- Patent number 12,306,249
- Issue date May 20, 2025
- Atmosic Technologies, Inc.
- Mohsen Shaaban
- G01 - MEASURING TESTING
Information Patent Grant
Leakage current detection circuit
- Patent number 12,298,344
- Issue date May 13, 2025
- SK hynix Inc.
- Jong Seok Jung
- G01 - MEASURING TESTING
Information Patent Grant
GaN HEMT device for irradiation damage detection and detection and...
- Patent number 12,287,360
- Issue date Apr 29, 2025
- Nanjing University
- Feng Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Benchmark device and method for evaluating a semiconductor wafer
- Patent number 12,270,854
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Lan-Chou Cho
- G02 - OPTICS
Information Patent Grant
Signal integrity monitoring system
- Patent number 12,270,857
- Issue date Apr 8, 2025
- Synopsys, Inc.
- Firooz Massoudi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Over the air test chamber with optimized air circulation
- Patent number 12,259,426
- Issue date Mar 25, 2025
- Rohde & Schwarz GmbH & Co. KG
- Ralf Meissner
- G01 - MEASURING TESTING
Information Patent Grant
Adhesive composition and methods of forming the same
- Patent number 12,258,495
- Issue date Mar 25, 2025
- Saint-Gobain Performance Plastics Corporation
- Nicky Chan
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Semiconductor chip and test method of the same
- Patent number 12,248,018
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Diode test module for monitoring leakage current and its method the...
- Patent number 12,248,019
- Issue date Mar 11, 2025
- Amazing Microelectronic Corp.
- Chih-Ting Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting defective logic devices
- Patent number 12,248,022
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit margin measurement for structural testing
- Patent number 12,241,933
- Issue date Mar 4, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Estimation of unknown electronic load
- Patent number 12,241,939
- Issue date Mar 4, 2025
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Grant
Current shunt probe
- Patent number 12,235,291
- Issue date Feb 25, 2025
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation of optically isolated probe
- Patent number 12,228,607
- Issue date Feb 18, 2025
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,216,159
- Issue date Feb 4, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CONTINUOUSLY VARIABLE ELECTRONIC LOAD TESTER FOR USE WITH NUCLEAR I...
- Publication number 20250237698
- Publication date Jul 24, 2025
- Westinghouse Electric Company LLC
- Shawn C. Stafford
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE, AND SYSTEM FOR PROCESSING TRANSMISSION LINE PULSE DATA
- Publication number 20250231230
- Publication date Jul 17, 2025
- AIP Technology Corporation
- Tung-Yang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20250224445
- Publication date Jul 10, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A PACKAGING SUBSTRATE
- Publication number 20250216451
- Publication date Jul 3, 2025
- Applied Materials, Inc.
- Bernhard G. MUELLER
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20250208205
- Publication date Jun 26, 2025
- WaveFidelity Inc.
- Ike Lin
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD
- Publication number 20250203730
- Publication date Jun 19, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Systems, Methods, and Devices of Droop Detector Circuitry
- Publication number 20250199062
- Publication date Jun 19, 2025
- ARM Limited
- El Mehdi Boujamaa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUSES FOR IDENTIFYING DEFECTIVE ELECTRICAL CONNEC...
- Publication number 20250201634
- Publication date Jun 19, 2025
- Applied Materials, Inc.
- Bernhard G. MUELLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCHMARK DEVICE AND METHOD FOR EVALUATING A SEMICONDUCTOR WAFER
- Publication number 20250199063
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- LAN-CHOU CHO
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING CHARACTERIZATION OF A SAMPLE
- Publication number 20250189605
- Publication date Jun 12, 2025
- ONTO INNOVATION INC.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME
- Publication number 20250188326
- Publication date Jun 12, 2025
- SAINT-GOBAIN PERFORMANCE PLASTICS CORPORATION
- Nicky CHAN
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
DETECTION PANEL FOR DETECTING LIGHT-EMITTING UNIT AND DETECTION DEV...
- Publication number 20250180641
- Publication date Jun 5, 2025
- Industrial Technology Research Institute
- Fu-An Tu
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20250164553
- Publication date May 22, 2025
- ROHDE &SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- G01 - MEASURING TESTING
Information Patent Application
PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR
- Publication number 20250164575
- Publication date May 22, 2025
- LOGIICDEV GMBH
- Deepak V KATKORIA
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME...
- Publication number 20250147067
- Publication date May 8, 2025
- MPI Corporation
- PO-YI TING
- G01 - MEASURING TESTING
Information Patent Application
NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...
- Publication number 20250093413
- Publication date Mar 20, 2025
- Intel Corporation
- Zhen ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING APPARATUS
- Publication number 20250085335
- Publication date Mar 13, 2025
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Systems and Methods
- Publication number 20250076373
- Publication date Mar 6, 2025
- The Boeing Company
- Mark Edward Nowakowski
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20250076377
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...
- Publication number 20250067805
- Publication date Feb 27, 2025
- Samsung Electronics Co., Ltd.
- Yongwoo KIM
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS
- Publication number 20250059414
- Publication date Feb 20, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Zhi-Yuan Zou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VOLTAGE GLITCH DETECTORS
- Publication number 20250060409
- Publication date Feb 20, 2025
- Silicon Laboratories Inc.
- Timothy Thomas Rueger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE F...
- Publication number 20250044352
- Publication date Feb 6, 2025
- Tektronix, Inc.
- Christopher N. White
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND...
- Publication number 20250027990
- Publication date Jan 23, 2025
- ASML NETHERLANDS B.V.
- Datong ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE
- Publication number 20250027985
- Publication date Jan 23, 2025
- STMicroelectronics International N.V.
- Emanuele Moretti
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST METHOD
- Publication number 20250027991
- Publication date Jan 23, 2025
- GENERAL TEST SYSTEMS INC.
- Wei YU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...
- Publication number 20250012855
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Dongchi YU
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250004047
- Publication date Jan 2, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING

Marginal testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for detection of counterfeit parts, compromise...

In-line device electrical property estimating method and test struc...

Method of creating an electronically readable optical fingerprint t...

Pluggable load module to test a voltage regulator

Radio frequency conduction test method and related apparatus withou...

Built-in self-test circuit and temperature measurement circuit incl...

Semiconductor inspecting method and semiconductor inspecting device

Semiconductor device and method of failure analysis for semiconduct...

Test system

Techniques for testing PLP capacitors

Circuit and method to measure simulation to silicon timing correlation

Electron spectroscopy based techniques for determining various chem...

Leakage testing structure and leakage testing method

Saving and restoring scan states

Leakage current detection circuit

GaN HEMT device for irradiation damage detection and detection and...

Benchmark device and method for evaluating a semiconductor wafer

Signal integrity monitoring system

Over the air test chamber with optimized air circulation

Adhesive composition and methods of forming the same

Semiconductor chip and test method of the same

Diode test module for monitoring leakage current and its method the...

Method and apparatus for detecting defective logic devices

Wafer metrology technologies

Integrated circuit margin measurement for structural testing

Estimation of unknown electronic load

Current shunt probe

Temperature compensation of optically isolated probe

On-die aging measurements for dynamic timing modeling

Circuit and method to measure simulation to silicon timing correlation

Patents Applicationslast 30 patents

CONTINUOUSLY VARIABLE ELECTRONIC LOAD TESTER FOR USE WITH NUCLEAR I...

METHOD, DEVICE, AND SYSTEM FOR PROCESSING TRANSMISSION LINE PULSE DATA

INSPECTION APPARATUS

METHOD AND APPARATUS FOR TESTING A PACKAGING SUBSTRATE

TESTING SYSTEM AND TESTING METHOD

TEST DEVICE AND TEST METHOD

Systems, Methods, and Devices of Droop Detector Circuitry

METHODS AND APPARATUSES FOR IDENTIFYING DEFECTIVE ELECTRICAL CONNEC...

BENCHMARK DEVICE AND METHOD FOR EVALUATING A SEMICONDUCTOR WAFER

SYSTEM AND METHOD FOR PERFORMING CHARACTERIZATION OF A SAMPLE

ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME

DETECTION PANEL FOR DETECTING LIGHT-EMITTING UNIT AND DETECTION DEV...

MEASUREMENT SYSTEM

PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR

WAFER METROLOGY TECHNOLOGIES

PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME...

NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...

TESTING APPARATUS

Diagnostic Systems and Methods

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...

CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS

VOLTAGE GLITCH DETECTORS

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE F...

CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND...

STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE

TEST SYSTEM AND TEST METHOD

SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...