This disclosure relates to bulk transfer of storage devices to and from storage device testing systems and transfer stations for storage device testing systems.
Storage device manufacturers typically test manufactured storage devices for compliance with a collection of requirements. Test equipment and techniques exist for testing large numbers of storage devices serially or in parallel. Manufacturers tend to test large numbers of storage devices simultaneously. Storage device testing systems typically include one or more racks having multiple test slots that receive storage devices for testing.
Current storage device testing systems use an operator, a robotic arm, or a conveyer belt to individually feed storage devices to a transfer location for loading into the testing system for testing. Other current storage device testers use a tote or a mobile tote to load or unload multiple storage devices to a transfer location at the same time. A robotic arm of the testing system retrieves the storage devices individually or in small batches from the transfer location and loads them in test slots for testing.
In general, this disclosure relates to the bulk transfer of storage devices using manual loading.
In one aspect, a storage device transfer station is provided for transferring storage devices from a human operator to automated machinery for testing. The storage device transfer station includes a plurality of slots each capable of holding a storage device. The plurality of slots is arranged in at least one field arranged between two parallel planes. Each slot has a first open end and a second open end, such that each open end is accessible for loading and unloading a storage device. The first open ends are accessible at a first plane of the two parallel planes and the second open ends are accessible at a second plane of the two parallel planes.
In another aspect, a storage device testing system is provided for testing storage devices. The storage device testing system includes a storage device transfer station for transferring storage devices from a human operator to automated machinery. The storage device transfer station includes a plurality of slots each capable of holding a storage device. The plurality of slots is arranged in at least one field arranged between two parallel planes. Each slot has a first open end and a second open end, such that each open end is accessible for loading and unloading a storage device. The first open ends are accessible at a first plane of the two parallel planes and the second open ends are accessible at a second plane of the two parallel planes. The storage device testing system also includes automated machinery configured to access the second open end of at least one of the plurality of slots.
According to another aspect, a method of testing storage devices includes manually loading a plurality of storage devices into a plurality of slots of a storage device transfer station; actuating automated machinery to transfer a plurality of the storage devices between the plurality of slots of the storage device transfer station and the plurality of slots of the storage device transfer station; and manually unloading a plurality of storage devices from a plurality of slots of the storage device transfer station.
Embodiments of the disclosed methods, systems and devices may include one or more of the following features.
The storage device transfer station can include at least one door covering at least a portion of the first plane. The door can be capable of locking and unlocking, including automatic locking and unlocking. At least one of the slots can have a stop, and the door can include resilient material or another mechanism arranged to push a storage device against the stop when the door is closed. The slots could be arranged to align a storage device in the horizontal or vertical directions.
In some implementations, the storage device transfer station has multiple doors covering the first plane.
In some embodiments, the plurality of slots could be arranged to receive a storage device at the first plane from a human operator, and the plurality of slots could be arranged to provide a storage device at the second plane to automated machinery.
In some configurations, the at least one field has at least 125 slots. In some configurations, the field has one or more vertically stacked rows. The slot could be arranged to prevent contact between a human operator and the automated machinery. In some embodiments, the storage device transfer station could have a door covering a portion of the first plane and configured to signal the automated machinery to restrict its movement while the door is open.
Methods can be carried out such that the automated machinery's movement is restricted while the plurality of storage devices is being manually loaded or unloaded. Methods can be carried out such that the manual loading of a plurality of storage devices into a plurality of slots of a storage device transfer station includes loading the storage devices into a subset of the slots of a storage device transfer station. Methods can include sorting the plurality of storage devices to group storage devices with substantially similar test results together.
Embodiments can include one or more of the following advantages.
Embodiments of the disclosed systems, methods, and devices can help to reduce human operator wait time associated with loading and unloading storage devices into/from a storage device testing system. For example, in some embodiments, a bulk load/unload transfer station can allow a human operator to load/unload many storage devices into a testing system at once, thereby freeing the operator to perform other tasks between load/unload operations.
A bulk load and/or unload system can also afford more opportunity to improve the handling of storage devices. For example, if one human operator loads many storage devices at once, e.g., sequentially during a single loading operation of limited duration, the number of opportunities to introduce storage device presentation errors is reduced as compared to loading storage devices continuously over an extended period of time.
A bulk load and/or unload system can also improve the efficiency of automated machinery, by allowing the automated machinery to load or unload storage devices to/from many transfer station slots, without waiting for a human operator to remove or present a storage device to the automated machinery.
A bulk load and/or unload system can also allow for automated sorting of output storage devices into different fields, queues or containers.
In some embodiments, the disclosed systems, methods, and devices can allow a large number of storage devices to be queued for input and/or output.
Some embodiments do not require the use of any custom containers or totes to carry the storage devices. The cost of registering the storage devices in space and making the storage device presentation compatible with automated machinery is only incurred in the feeding station, and not in every tote.
In some embodiments, the disclosed systems, methods, and devices provide means of achieving many of the benefits of a fully automated factory (e.g., reliability, repeatability, and density) using a manual, yet bulk oriented input/output station.
Bulk feeding of storage devices can help to provide for increased throughput by reducing the amount of human intervention.
Bulk feeding of storage devices can help to provide for increased throughput by limiting the amount of human intervention to discrete and spaced apart intervals of time. This can help to reduce presentation error by reducing the likelihood that an operator will lose attention or focus over time, e.g., as compared to a system in which an operator continuously feeds storage devices into the system (or removes storage devices therefrom) over an extended period of time.
In some embodiments, many storage devices may be accessed at the same time. This makes the load/unload time very fast. In some embodiments, multiple operators could load and unload, further increasing efficiency.
In some embodiments, sorting or binning of storage devices is possible by the use of multiple doors. One door may enclose all passed storage devices while another encloses all failed storage devices. Any number of doors could be used.
Bulk feeding of storage devices in transfer stations is very space-efficient because no internal transport mechanisms are required. The depth of a transfer station can be as little as the depth of a storage device. The lack of transport mechanisms also improves the reliability of a transfer station compared to transfer stations with automated transport mechanisms.
Some embodiments use no moving parts.
Other aspects, features, and advantages are in the description, drawings, and claims.
Like reference symbols in the various drawings indicate like elements.
System Overview
A storage device, as used herein, includes disk drives, solid state drives, memory devices, and any device that benefits from asynchronous processes in manufacturing or test. A disk drive is generally a non-volatile storage device that stores digitally encoded data on rapidly rotating platters with magnetic surfaces. A solid-state drive (SSD) is a data storage device that uses solid-state memory to store persistent data. An SSD using SRAM or DRAM (instead of flash memory) is often called a RAM-drive. The term solid-state generally distinguishes solid-state electronics from electromechanical devices.
Referring to
The automated transporter 200 is configured to independently service each test slot 310 to provide a continuous flow of storage devices 500 through the testing system 100. A continuous flow of individual storage devices 500 through the testing system 100 allows varying start and stop times for each storage device 500, whereas other systems that require batches of storage devices 500 to be run all at once must all have the same start and end times. Therefore, with continuous flow, storage devices 500 of different capacities can be run at the same time and serviced (loaded/unloaded) as needed.
Referring to
In some implementations, a collection 600 may take the form of one or more vertically stacked rows of storage device receptacles 620. The number of storage device receptacles 620, and corresponding storage devices 500, could be as few as one or as many as 125 (e.g. 25 vertically stacked rows of 5) or more. In the example where the number of drives in the collection 600 is 125, an operator could load or unload the entire collection of drives in about ten minutes.
In some examples, an operator manually loads a plurality of storage devices 500 into the collection 600 in the transfer station 400. The robotic arm 200 may continuously unload the storage devices 500 and place them into test slots 310 for testing, and may also continuously transfer tested storage devices 500 from test slots 310 to storage device transfer station receptacles 620. During this time, the operator can leave and engage in other tasks, e.g., loading and unloading other storage devices 500 in a different transfer station 400 or testing system 100. Once a quantity of storage devices 500 have been tested and placed back into the transfer station 400, the operator can return to the transfer station 400 and unload the storage devices 500.
In the example shown in
In some implementations, multiple access ports 410 are available in proximity to each other. For example, multiple access ports 410 can be arranged in a vertical column 414, as shown, or arranged in a different configuration, such as a horizontal row, a combination of rows or columns, or another configuration of access ports 410. In implementations where an access port 410 provides access to a portion of a collection 600, the combination of multiple access ports 410 may provide access to the entire collection 600.
In some implementations, the access ports 410 are arranged to be accessible to a human operator 640. The human operator can load and unload storage devices 500 directly into the storage device receptacles 620 of the collection 600 of storage devices. The access ports 410 can be arranged to be suitable for human use, for example, arranged to account for ergonomic factors. For example, the access ports 410 can be arranged within the field of reach of a human operator 640. For example, the in the exemplary configuration of a vertical column 414 of access ports 410, the lower edge 416 of the lowest access port could be a height 630 of about 50 centimeters off of the ground. The upper edge 418 of the highest access port could be a height 632 of about 200 centimeters off of the ground.
In some implementations, more than one human operator 640 can access the same access port 410 simultaneously, for example, to speed up workflow and load or unload more storage devices 500 in a shorter amount of time.
In some implementations, the size and construction of the collection 600 and the storage device receptacles 620 is such that a robotic arm 200 does not come in contact with a human operator 640. For example, the storage device receptacles 620 can be long enough to provide a buffer of space between the portion accessible to the robotic arm 200 and the portion accessible to the human operator 640.
An access port 410 may have an optional door 412 that can be opened and closed by a human operator 640.
In some implementations, the status of the door 412 can determine actions of the robotic arm 200. For example, the robotic arm 200 can be configured to refrain from loading or unloading storage devices 500 from the portion of the collection 600 associated with the door 412 when the door is open, indicating that a human operator 640 is in the process of loading or unloading some of the storage devices. Similarly, the robotic arm 200 can be configured to resume loading and unloading storage devices 500 when the door 412 is closed. Alternatively, the robotic arm 200 can be configured to cease all motion while the door 412 is open.
In some implementations, the door 412 can also be locked and unlocked. For example, the locking capability can be used to control access to the collection 600 associated with the door. For example, all doors may be kept locked until such time that the collection 600 associated with a door 412 is ready for service by a human operator. For example, a collection behind a particular door 412 may contain untested storage devices 500. In such a case, the door 412 may be kept locked until all storage devices 500 have been transferred to test slots 310. When all storage devices 500 have been transferred, the door 412 may be automatically unlocked by the system, to allow a human operator 640 to load new untested storage devices 500. In another example, the collection 600 associated with a door 412 may contain tested storage devices 500 that have passed a functionality test. When a human operator 640 requests access to passed storage devices, the system may unlock only that door 412 covering the part of the collection 600 that consists of passed storage devices. This prevents the human operator 640 from inadvertently removing storage devices from some other part of the collection 600.
The status indicators 430 may take the form of lights (e.g. light-emitting diodes) that light up or flash, for example. In some implementations, the status indicators may be part of an alphanumeric display, for example, a liquid-crystal display.
In some implementations, the door 412 may have a display screen 432 instead of or in addition to the status indicators 430. The display screen 432 may provide additional information or more details than would be relayed by the status indicators 430 (if present). For example, the display screen 432 may allow a human operator 640 to access or modify the configuration of the transfer station 400 or the entire testing system. The display screen 432 may be a touch screen, for example, or may have another type of associated control system such as a keyboard and mouse.
In some implementations, the transfer station 400 has a master status indicator 434 that indicates general information to one or more human operators 640 in the vicinity, for example, whether the transfer station 400 or the storage device testing system 100 have encountered errors requiring human intervention or repair.
In some implementations, the door 412, the storage device receptacle 620, or another element of the testing system 100 may have one or more detectors configured to detect the presence and absence of storage devices 500 within the storage device receptacles 620 of the collection 600. For example, the detector could be integrated with the stop 626, or the detector may be a separate component. The information supplied by the detector may be used by the status indicators 430 or display screen 432 to indicate the presence or absence of the storage devices 500. In some implementations, the robotic arm 200 may incorporate functionality to detect the presence or absence of a storage device 500 within the storage device receptacles 620, for example a camera, bar code scanner, or laser rangefinder.
As shown in
In implementations that employ storage device transporters 550 for manipulating storage devices 500, as shown in
The test slot 310, shown in
With the storage device 500 in place within the frame 560 of the storage device transporter 550, the storage device transporter 550 and the storage device 500 together can be moved by the automated transporter 200 for placement within one of the test slots 310, as shown in
A detailed description of the robotic arm 200, test slots 310 and other details and features combinable with those described herein may be found in the following U.S. patent applications, entitled “Disk Drive Testing”, having assigned Ser. No. 11/958,817, entitled “Bulk Feeding Disk Drives To Disk Drive Testing Systems”, having assigned Ser. No. 12/104,869, and entitled “Bulk Transfer of Storage Devices Using Manual Loading”, having assigned Ser. No. 61/316,667, the entire contents of the aforementioned applications are hereby incorporated by reference.
Other embodiments are within the scope of the following claims.
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Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Transferring Disk Drives Within Disk Drive Testing Systems”, inventors: Polyakov et al, and having assigned U.S. Appl. No. 12/727,150. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/104,536. Revised as of May 27, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Transferring Storage Devices Within Storage Device Testing Systems”, inventors: John P. Toscano et al., and having assigned U.S. Appl. No. 12/727,201. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/424,980. Revised as of Jan. 4, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Processing Storage Devices”, inventors: Richard W. Slocum III., and having assigned U.S. Appl. No. 12/727,619. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/474,388. Revised as of Jan. 5, 2009. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Bulk Feeding Disk Drives to Disk Drive Testing Systems”, inventors: Noble et al., and having assigned U.S. Appl. No. 12/726,856. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/104,869. Revised as of Jan. 15, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Dependent Temperature Control Within Disk Drive Testing Systems”, inventors: Merrow et al., and having assigned U.S. Appl. No. 12/727,207. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/105,069. Revised as of Jan. 13, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Test Slot Cooling System for a Storage Device Testing System”, inventors: Merrow et al., and having assigned U.S. Appl. No. 12/727,700. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/503,567. Revised as of Jan. 13, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Storage Device Testing System Cooling”, inventors: Brian S. Merrow and having assigned U.S. Appl. No. 12/775,560. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/698,575. Revised as of Feb. 17, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Conductive Heating” inventors: Brian S. Merrow et al., and having assigned U.S. Appl. No. 12/760,164. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/503,593. Revised as of Jan. 6, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Storage Device Temperature Sensing”, inventors: Brian S. Merrow et al., and having assigned U.S. Appl. No. 12/760,305. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/503,687. Revised as of Jan. 7, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Solid State Temperature Control of Hard Drive Tester”, inventors: Brian S. Merrow and having assigned U.S. Appl. No. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/105,103. Revised as of Jan. 14, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Vibration Isolation Within Disk Drive Testing Systems”, inventors: Brian S. Merrow and having assigned U.S. Appl. No. 12/767,142. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/105,105. Revised as of Jan. 12, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Disk Drive Clamping Transport and Testing”, inventors: Brian S. Merrow et al., and having assigned U.S. Appl. No. 12/766,680. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 11/959,133. Revised as of Jan. 14, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Chilled Water Temp Control of Disk Drive Tester”, inventors: Brian S. Merrow and having assigned U.S. Appl. No. 12/766,680. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/105,061. Revised as of Feb. 18, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Vibration Isolation Within Disk Drive Testing Systems,” inventors: Brian S. Merrow and having assigned U.S. Appl. No. 12/767,142. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 12/105,105. Revised as of Mar. 30, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Disk Drive Clamping Transport and Testing,” inventors: Brian S. Merrow et al., and having assigned U.S. Appl. No. 12/767,113. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 11/959,133. Revised as of Apr. 4, 2010. |
Cardinal Intellectual Property's search report including the results of a search for the features of the claims included in the U.S. patent application entitled “Disk Drive Clamping Transport and Testing,” inventors: Brian S. Merrow et al., and having assigned U.S. Appl. No. 12/766,680. The foregoing U.S. patent application is a continuation of U.S. Appl. No. 11/959,133. Revised as of Apr. 1, 2010. |
Exhibit 1 in Xyratex Technology, Ltd v. Teradyne, Inc.; Newspaper picture that displays the CSO tester; 1990. |
Exhibit 2 in Xyratex Technology, Ltd v. Teradyne, Inc.; Photos of the CSO tester obtained from Hitachi; 1990. |
Exhibit 1326 in Xyratex Technology, Ltd v. Teradyne, Inc.; Image of the back of Exhibit 1 and Exhibit 2 photos, which display the photos' dates; 1990. |
Exhibit 1314 in Xyratex Technology, Ltd. v. Teradyne, Inc.; Case, “Last products of Disk-File Development at Hursley and Millbrook,” IBM, Oct. 12, 1990. |
Exhibit 1315 in Xyratex Technology, Ltd. v. Teradyne, Inc.; Case, “History of Disk-File Development at Hursley and Millbrook,” IBM, Oct. 17, 1990. |
Xyratex Technology, Ltd. v. Teradyne, Inc., Teradyne, Inc's Prior Art Notice Pursuant to 35 U.S.C. Section 282. Case No. CV 08-04545 SJO (PLAx), Oct. 16, 2009. |
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International Search Report and Written Opinion dated Feb. 9, 2012 issued in international application No. PCT/US2011/043864. |
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Number | Date | Country | |
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20120023370 A1 | Jan 2012 | US |