Number | Name | Date | Kind |
---|---|---|---|
4503537 | McAnney | Mar 1985 | |
4513418 | Bardell et al. | Apr 1985 | |
4519078 | Komonytsky | May 1985 | |
4698588 | Hwang et al. | Oct 1987 | |
4724380 | Burrows et al. | Feb 1988 | |
4754215 | Kawai | Jun 1988 | |
4764926 | Knight et al. | Aug 1988 | |
4855669 | Mahoney | Aug 1989 | |
4875003 | Burke | Oct 1989 | |
4945536 | Hancu | Jul 1990 |
Entry |
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F. Beenker, "Systematic and Structured Methods for Digital Board Testing," IEEE International Conference, 1/1985, pp. 380-385. |
L. Whetsel, "A Standard Test Bus and Boundary Scan Architecture", Tl Tech. Journal, 7/1988, pp. 48-59. |
C. Gloster, "Boundary Scan with Built-In Self-Test" IEEE Design & Test, 2/1989, pp. 36-44. |