Number | Name | Date | Kind |
---|---|---|---|
5117377 | Finman | May 1992 | |
5442296 | Schiek et al. | Aug 1995 | |
5548538 | Grace et al. | Aug 1996 | |
5608330 | Heuermann et al. | Mar 1997 |
Entry |
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Barr, J.T., Jr. and Pervere, M.J., A Generalized Vector Network Analyzer Calibration Technique, pp. 51-60, Hewlett Packard Network Measurements Division, Santa Rosa, California (no date). |
Eul, H.J. and Schiek, B., Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer Calibration, pp. 908-914, Proc. 18th European Microwave Conference, 1988. |