Number | Name | Date | Kind |
---|---|---|---|
4992740 | Wakasugi | Feb 1991 | |
5216373 | Wakamatsu et al. | Jun 1993 | |
5463323 | Wakamatsu | Oct 1995 | |
5532590 | Yamanaka | Jul 1996 | |
5633801 | Bottman | May 1997 |
Entry |
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Baumann, A.; "Measuring device input impedance on Teradyne A500 series test system"; Texas Instruments Technical Journal; pp. 95-105, 1996. |