Measuring capacitance

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CPC
G01R27/2605

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2605Measuring capacitance

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Touch screen sensor
- Patent number 12,366,942
- Issue date Jul 22, 2025
- 3M Innovative Properties Company
- Matthew H. Frey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interference detection and mitigation in inductive sensor applicati...
- Patent number 12,366,932
- Issue date Jul 22, 2025
- Cirrus Logic Inc.
- Gregory C. Yancey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device that includes a MEMS tunable filter and a method for operati...
- Patent number 12,360,147
- Issue date Jul 15, 2025
- UNISPECTRAL LTD.
- Peleg Levin
- G02 - OPTICS
Information Patent Grant
Capacitance measurement circuit
- Patent number 12,352,794
- Issue date Jul 8, 2025
- Guangzhou University
- Yanhan Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and substrate inspection method
- Patent number 12,352,808
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sekye Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Drift suppression method, proximity sensor and wireless device
- Patent number 12,332,092
- Issue date Jun 17, 2025
- Semtech Corporation
- Chaouki Rouaissia
- G01 - MEASURING TESTING
Information Patent Grant
Display substrates, display apparatuses and methods of detecting cr...
- Patent number 12,326,412
- Issue date Jun 10, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Tingliang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining gate capacitance
- Patent number 12,313,663
- Issue date May 27, 2025
- Microsoft Technology Licensing, LLC
- Jonne Verneri Koski
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance measurement circuit
- Patent number 12,313,664
- Issue date May 27, 2025
- ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC.
- Yi-Chou Huang
- G01 - MEASURING TESTING
Information Patent Grant
Measuring DC link capacitance in power conversion systems
- Patent number 12,306,266
- Issue date May 20, 2025
- Rockwell Automation Technologies, Inc.
- Zhongyuan Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of tissue viability
- Patent number 12,290,377
- Issue date May 6, 2025
- BBI Medical Innovations, LLC
- Martin F. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Noise measurements with a capacitance sensor
- Patent number 12,287,940
- Issue date Apr 29, 2025
- Cirque Corporation
- Brian Monson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for determination of capacitive and resistive characteris...
- Patent number 12,276,686
- Issue date Apr 15, 2025
- Micron Technology, Inc.
- Dan Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Inductive broad-band sensors for electromagnetic waves
- Patent number 12,272,532
- Issue date Apr 8, 2025
- COMET Technologies USA, Inc.
- Stephen E. Savas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip capacitance measurement method and apparatus
- Patent number 12,265,108
- Issue date Apr 1, 2025
- Qorvo US, Inc.
- Alexandru Aurelian Ciubotaru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Nano-power capacitance-to-digital converter
- Patent number 12,254,155
- Issue date Mar 18, 2025
- Cypress Semiconductor Corporation
- Paul M. Walsh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuits and methods to calibrate mirror displacement
- Patent number 12,253,356
- Issue date Mar 18, 2025
- Texas Instruments Incorporated
- Robert Floyd Payne
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Zero excess energy storage transformer
- Patent number 12,249,981
- Issue date Mar 11, 2025
- QUANTUM POWER TRANSFORMATION LIMITED
- Robert William Gwynne
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Determination of an unbalanced load in a high-voltage system and re...
- Patent number 12,248,006
- Issue date Mar 11, 2025
- MERCEDES-BENZ GROUP AG
- Tobias Aurand
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor measurement
- Patent number 12,241,946
- Issue date Mar 4, 2025
- STMicroelectronics S.r.l.
- Davide Argento
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit, appliance and control method
- Patent number 12,235,298
- Issue date Feb 25, 2025
- Guangdong Midea White Home Appliance Technology Innovation Center Co., Ltd.
- Kunren Yin
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive-sensing rotary encoder
- Patent number 12,228,432
- Issue date Feb 18, 2025
- Texas Instruments Incorporated
- Lichang Cheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method of measuring capacitance of device-under-test
- Patent number 12,228,598
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Mao-Hsuan Chou
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance detection circuit and method, and electronic device
- Patent number 12,224,745
- Issue date Feb 11, 2025
- Tencent Technology (Shenzhen) Company Limited
- Yuan Dai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring instrument and measuring method
- Patent number 12,222,379
- Issue date Feb 11, 2025
- Tokyo Electron Limited
- Takayuki Hatanaka
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensors
- Patent number 12,216,049
- Issue date Feb 4, 2025
- Drager Safety AG & Co. KGaA
- Håkon Sagberg
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device having a testing method for determining defects i...
- Patent number 12,216,144
- Issue date Feb 4, 2025
- Samsung Display Co., Ltd.
- Eunsol Seo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Piezoelectric device having a support with a neutral fiber
- Patent number 12,209,913
- Issue date Jan 28, 2025
- TDK ELECTRONICS AG
- Sandro Kappert
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Deriving a capacitance-ratio information, device and method
- Patent number 12,196,793
- Issue date Jan 14, 2025
- NXP B.V.
- Harish Kundur Subramaniyan
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a sensor, and electronic circuit
- Patent number 12,189,016
- Issue date Jan 7, 2025
- Robert Bosch GmbH
- Domenico Tangredi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CAPACITANCE MEASUREMENT METHOD FOR A CAPACITIVE DEVICE
- Publication number 20250216431
- Publication date Jul 3, 2025
- United Microelectronics Corp.
- Pei Chieh Chiu
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR AND METHOD FOR OPERATING A CAPACITIVE SENSOR
- Publication number 20250199041
- Publication date Jun 19, 2025
- ROBERT BOSCH GmbH
- David Slogsnat
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PIXELATED CAPACITOR SENSOR CHARGE SHARING READOUT SYSTEM
- Publication number 20250198961
- Publication date Jun 19, 2025
- NXP B.V.
- Alphons Litjes
- G01 - MEASURING TESTING
Information Patent Application
Circuit arrangement for evaluating an output signal, and sensor device
- Publication number 20250189611
- Publication date Jun 12, 2025
- Balluff GmbH
- Marton Palmann
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT
- Publication number 20250189291
- Publication date Jun 12, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Robert Floyd Payne
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Component with one or more electrically conductive patterns for an...
- Publication number 20250185170
- Publication date Jun 5, 2025
- JET METAL TECHNOLOGIES
- Samuel Paul Henry STREMSDOERFER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVELY ENHANCING THE RESONANCE FREQUENCY AND QUALITY FACTORY O...
- Publication number 20250174399
- Publication date May 29, 2025
- Dell Products L.P.
- Tejinder Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING IMPEDANCE OF CONVERTER OUTPUT ELEMENT
- Publication number 20250164534
- Publication date May 22, 2025
- POSTECH Research and Business Development Foundation
- Suyong CHAE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PARAMETER EXTRACTION OF SENSITIVE PROBE AND DEGREE-OF-FR...
- Publication number 20250155482
- Publication date May 15, 2025
- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Hong Ma
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF TISSUE VIABILITY
- Publication number 20250152089
- Publication date May 15, 2025
- BBI MEDICAL INNOVATIONS, LLC
- Martin F. BURNS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BATTERY MONITORING SYSTEMS WITH DIRECT ELECTRICAL CONNECTION FOR CA...
- Publication number 20250158254
- Publication date May 15, 2025
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Michael P. BALOGH
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
- Publication number 20250155483
- Publication date May 15, 2025
- RENESAS ELECTRONICS CORPORATION
- Takehiro UEDA
- G01 - MEASURING TESTING
Information Patent Application
FERROELECTRIC SENSOR
- Publication number 20250146880
- Publication date May 8, 2025
- TDK Electronics AG
- Sandro Kappert
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST
- Publication number 20250147086
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- MAO-HSUAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE HAVING A TESTING METHOD FOR DETERMINING DEFECTS I...
- Publication number 20250138070
- Publication date May 1, 2025
- SAMSUNG DISPLAY CO., LTD.
- EUNSOL SEO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS
- Publication number 20250130260
- Publication date Apr 24, 2025
- ROBERT BOSCH GmbH
- Alice Lanniel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SENSOR CONTROLLER, ELECTRONIC DEVICE, AND CONTROL METHOD OF SENSOR...
- Publication number 20250123708
- Publication date Apr 17, 2025
- WACOM CO., LTD.
- Kenichi ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOLAR CELL TEST METHOD, SOLAR CELL TEST DEVICE AND COMPUTER-READABL...
- Publication number 20250112591
- Publication date Apr 3, 2025
- WAVELABS SOLAR METROLOGY SYSTEMS GMBH
- Donald Andrew Locker CLUGSTON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CIRCUIT AND METHOD FOR MEASURING CAPACITANCE AND CAPACITANCE-VOLTAG...
- Publication number 20250085322
- Publication date Mar 13, 2025
- CENTRAL CHINA NORMAL UNIVERSITY
- Yingqing Xia
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE MEASUREMENT CIRCUIT
- Publication number 20250060398
- Publication date Feb 20, 2025
- Elite Semiconductor Microelectronics Technology Inc.
- Yi-Chou Huang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING HIGH VOLTAGE DEVICES USING A CORREC...
- Publication number 20250044374
- Publication date Feb 6, 2025
- Megger Sweden AB
- Peter WERELIUS
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE
- Publication number 20250038054
- Publication date Jan 30, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qianqian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...
- Publication number 20250035689
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Masayoshi HIRAO
- G01 - MEASURING TESTING
Information Patent Application
Capacitance Measurement Circuitry for a Resonant Tank
- Publication number 20250035688
- Publication date Jan 30, 2025
- Apple Inc.
- Timo W. Gossmann
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...
- Publication number 20250020751
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xiaoming LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A CAPACITANCE OF A CAPACITOR, CAPACITOR MONI...
- Publication number 20250004029
- Publication date Jan 2, 2025
- SKELETON TECHNOLOGIES GMBH
- Bertram SCHEMEL
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER CAPACITOR SENSOR ARRAY
- Publication number 20250003772
- Publication date Jan 2, 2025
- Raytheon Company
- Krishna Shivaram
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE SENSING SYSTEMS AND METHODS
- Publication number 20240426884
- Publication date Dec 26, 2024
- Advanced Energy Industries, Inc.
- Donald Enzinna
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY MEASUREMENT USING BALANCED CAPACITY TARGETS
- Publication number 20240427253
- Publication date Dec 26, 2024
- ASML NETHERLANDS B.V.
- Henricus Petrus Maria PELLEMANS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DC LINK CAPACITANCE IN POWER CONVERSION SYSTEMS
- Publication number 20240402260
- Publication date Dec 5, 2024
- Rockwell Automation Technologies, Inc.
- Zhongyuan Cheng
- G01 - MEASURING TESTING

Measuring capacitance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Touch screen sensor

Interference detection and mitigation in inductive sensor applicati...

Device that includes a MEMS tunable filter and a method for operati...

Capacitance measurement circuit

Substrate inspection apparatus and substrate inspection method

Drift suppression method, proximity sensor and wireless device

Display substrates, display apparatuses and methods of detecting cr...

Method and apparatus for determining gate capacitance

Capacitance measurement circuit

Measuring DC link capacitance in power conversion systems

Measurement of tissue viability

Noise measurements with a capacitance sensor

Apparatus for determination of capacitive and resistive characteris...

Inductive broad-band sensors for electromagnetic waves

On-chip capacitance measurement method and apparatus

Nano-power capacitance-to-digital converter

Circuits and methods to calibrate mirror displacement

Zero excess energy storage transformer

Determination of an unbalanced load in a high-voltage system and re...

Capacitor measurement

Detection circuit, appliance and control method

Capacitive-sensing rotary encoder

System and method of measuring capacitance of device-under-test

Capacitance detection circuit and method, and electronic device

Measuring instrument and measuring method

Gas sensors

Electronic device having a testing method for determining defects i...

Piezoelectric device having a support with a neutral fiber

Deriving a capacitance-ratio information, device and method

Method for testing a sensor, and electronic circuit

Patents Applicationslast 30 patents

CAPACITANCE MEASUREMENT METHOD FOR A CAPACITIVE DEVICE

CAPACITIVE SENSOR AND METHOD FOR OPERATING A CAPACITIVE SENSOR

PIXELATED CAPACITOR SENSOR CHARGE SHARING READOUT SYSTEM

Circuit arrangement for evaluating an output signal, and sensor device

CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT

Component with one or more electrically conductive patterns for an...

SELECTIVELY ENHANCING THE RESONANCE FREQUENCY AND QUALITY FACTORY O...

METHOD AND DEVICE FOR ESTIMATING IMPEDANCE OF CONVERTER OUTPUT ELEMENT

METHOD FOR PARAMETER EXTRACTION OF SENSITIVE PROBE AND DEGREE-OF-FR...

MEASUREMENT OF TISSUE VIABILITY

BATTERY MONITORING SYSTEMS WITH DIRECT ELECTRICAL CONNECTION FOR CA...

SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD

FERROELECTRIC SENSOR

SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST

ELECTRONIC DEVICE HAVING A TESTING METHOD FOR DETERMINING DEFECTS I...

CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS

SENSOR CONTROLLER, ELECTRONIC DEVICE, AND CONTROL METHOD OF SENSOR...

SOLAR CELL TEST METHOD, SOLAR CELL TEST DEVICE AND COMPUTER-READABL...

CIRCUIT AND METHOD FOR MEASURING CAPACITANCE AND CAPACITANCE-VOLTAG...

CAPACITANCE MEASUREMENT CIRCUIT

METHOD AND DEVICE FOR MEASURING HIGH VOLTAGE DEVICES USING A CORREC...

TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE

MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...

Capacitance Measurement Circuitry for a Resonant Tank

METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...

METHOD FOR DETERMINING A CAPACITANCE OF A CAPACITOR, CAPACITOR MONI...

LOW POWER CAPACITOR SENSOR ARRAY

CAPACITANCE SENSING SYSTEMS AND METHODS

OVERLAY MEASUREMENT USING BALANCED CAPACITY TARGETS

MEASURING DC LINK CAPACITANCE IN POWER CONVERSION SYSTEMS