E. I. Cole, Jr., C. R. Bagnell, Jr., B. G. Davies, A. M. Neacsu, W. V. Oxford, and R. H. Propst, "Advanced Scanning Electron Microscopy Methods and Applications to Integrated Circuit Failure Analysis," Scanning Microscopy, vol. 2, pp. 133-150, 1988, (month unavailable). |
W. Reiners, K. D. Herrmann, and E. Kubalek, "Electron Beam Testing of Passivated Devices, via Capacitive Coupling Voltage Contrast," Scanning Microscopy, vol. 2, pp. 161-175, 1988, (month unavailable). |
J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, A. D. Romig, Jr., C. E. Lyman, C. Fiori, and E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis, (Plenum Press, New York, 1992) pp. 107-111 and 249-255, 1992, (month unavailable). |
E. I. Cole, Jr. and R. E. Anderson, "Rapid Localization of IC Open Conductors using Charge-Induced Voltage Alteration (CIVA)," in 30th Annual Proceedings Reliability Physics 1992 (IEEE, Piscataway, NJ, 1992), pp. 288-298, 1992 , (month unavailable). |
L. Reimer, Image Formation in Low-Voltage Scanning Electron Microscopy, (SPIE Optical Engineering Press, Bellingham, WA, 1993), pp. 71-88, 1993, (month unavailable). |
J. M. Soden and R. E. Anderson, "IC Failure Analysis: Techniques and Tools for Quality and Reliability Improvement," Proceedings of the IEEE,vol. 81, pp. 703-715, May 1993. |
E. I. Cole, Jr., J. M. Soden, B. A. Dodd, and C. L. Henderson, "Low Electron Beam Energy CIVA Analysis of Passivated ICs," in Proceedings of the International Symposium for Testing and Failure Analysis, pp. 23-32, Nov., 1994. |