Micro-electro-mechanical systems (MEMS) are well known in the art. MEMS is the technology of the very small, and merges at the nano-scale into nano-electro-mechanical systems (NEMS) and nanotechnology. MEMS are also referred to as micro machines, or Micro Systems Technology (MST). MEMS generally range in size from a micrometer (a millionth of a meter) to a millimeter (a thousandth of a meter).
MEMS technology is finding its way into sensors and is utilized in a number of ways each and every day by electronic and mechanical systems. These systems may determine location, speed, vibration, stress, acceleration, temperature, and a number of other characteristics. Currently, it is common practice to obtain discrete components to determine each of the characteristics the operator or system may wish to measure. Many applications in consumer electronics, automotive electronics, audio/video, camcorders, cameras, cell phones, games/toys, watches, PDAs (personal digital assistant), GPS (global positioning system) handheld devices, medical devices, power supply on/off systems, navigation systems, and other electronic devices may require multiple sensors. Often MEMS sensors are utilized to meet these needs.
MEMS sensors operate under a number of principles utilizing various means to measure properties. There are several physical principles for sensing displacement of mechanical elements, including piezoresistive, capacitive, and piezoelectric methods. To sense displacement of a controlled hot air mass for accelerometry, thermal detection has been used. Inertial sensors have utilized capacitive sensing, as it has generally provided the best displacement resolution with virtually no power dissipated in the transducer element. In capacitive inertial sensors, the motional sensing elements usually take the form of sidewall parallel-plate capacitors oriented in the vertical (perpendicular to substrate) direction, or of sidewall parallel-plate capacitors (also called vertical-axis comb fingers) oriented in the lateral (in-plane to substrate) direction. The sidewall capacitors are usually formed from interdigitated beam fingers (combs), to increase the capacitance in a given layout area. For capacitive sensing the most used principle is the fully differential capacitive bridge
Additional examples of sensing methodologies include hall effect, magneto-resistive, and piezoelectric sensors. An example of magnetic sensors may be found in the article by Beverly Eyre, Kristopher S. J. Pister and William Kaiser, entitled, “Resonant Mechanical Magnetic Sensor In Standard CMOS”. A second example of magnetic sensors may be found in an article by Zsolt Kádár, Andre Bossche and Jeff Mollinger entitled, “Integrated Resonant Magnetic-Field Sensor”.
Sensors based upon the capacitive sensing technique may be strain-based sensors, where the displacement of a capacitor electrode due an inertial movement or another force can change the sensing capacitance. A typical configuration is shown in
The outputs 160 and 165 are also shown connected to capacitors 150 and 155 respectively. The capacitors 150 and 155 represent the parasitic capacitance and are connected to a ground 105. The voltage differential from outputs 160 and 165 provides the output voltage (Vout) to a signal conditioning circuit, which is not pictured in
To calculate acceleration for a sensor as depicted in
Vout is the voltage differential from outputs 160 and 165. aext is the external acceleration of the sensor. ωr=2πfr where fr is the modulation frequency of Vm and ωr is the un-damped mechanical resonant frequency. The variable d is the gap between the parallel plates of the capacitive bridge when the proof mass is not displaced, and x is the displacement of the proof mass. Cp is the parasitic capacitance of the system represented by capacitors 150 and 155. Finally, C1 represents capacitive sensor 110, C2 represents capacitive sensor 120, C3 represents capacitive sensor 130, and C4 represents capacitive sensor 140. A more detailed explanation of the operation of capacitive bridge sensors may be found in chapters 3 and 11 of the “Advanced Micro and Nanosystems, Volume 2 CMOS-MEMS” Edited by H. Balters, O. Brand, G. K. Fedder, C. Hierold, J. Korvink, and O. Tabata. The inventors have determined that there is a need for a capacitive integrated MEMS multi-sensor for consumer electronics that is able to perform multiple measurements, for example, acceleration, magnetic field, and pressure, based on the capacitive principle. In one embodiment, a packaged multi-sensing one-chip device, may contain, on the same substrate: a three-axis accelerometer, a three-axis magnetic sensor, and a pressure sensor. An advantage of one or more embodiments based on capacitive sensors may include minimal voltage use and reduced size of a sensor system. In one embodiment, all of these sensors may be coupled on the same chip with the use of differential capacitive detection and an application-specific integrated circuit (ASIC). The ASIC may contain signal conditioning circuitry, Electrically Erasable Programmable Read-Only Memory (EEPROM) memory, and an electronic temperature sensor. An external humidity sensor may also be added. In one embodiment, the sensing device may be used in the consumer electronics and automotive electronics applications mentioned above. Low voltage drive and low cost are two important features, which represent a great advantage of this device.
ASIC 200 may include a plurality of sensors. The sensors may include an x-axis magnetic sensor 210, a y-axis magnetic sensor 212, and a z-axis magnetic sensor 214. The sensors may also include an x-axis acceleration sensor 211, a y-axis acceleration sensor 213, and a z-axis acceleration sensor 215.
The ASIC 200 may also include a surface micro-machined capacitive absolute pressure sensor 219. The absolute pressure sensor 219 may be used to detect the absolute atmospheric pressure. As result, an altitude may be calculated from the difference of the known terrestrial atmospheric pressure data of fixed points and the measured pressure.
Each of the sensors 210, 211, 212, 213, 214, 215, and 219 are connected to signal conditioning circuits 220, 221, 222, 223, 224, 225, and 229 respectively. An example of a signal conditioning circuit may be found in
The digital signal processor 230 selects which sensor is energized and which output is provided with selection signal 265 provided to the multiplexer 240. When selection signal 265 is applied the switches are closed for a specific sensor such that AC voltage sources 270 and 275 are applied to a sensor and the signal conditioning circuit for the sensor is connected to the amplifier 250. Operational software may be maintained in the EEPROM 235. The operational software in EEPROM 235 and the signal conditioning circuits 220, 221, 222, 223, 224, 225, and 229 may provide for sensor measurement functions that allow users to receive information from each of the individual sensors without having to know the control methods and arithmetic algorithms involved for various sensors such as magnetic or geomagnetic vector, acceleration, tilt angle, atmospheric pressure, humidity, or temperature. In addition, EEPROM 235 may be programmed to adjust measurements of the properties measured based on other property measurements. For example, by measuring acceleration, a truer magnetic reading may be obtained.
Each of the sensors 411, 412, 413, 414, 415, 416 and 419 are connected to a multiplexer 440. A switch network such as multiplexer 440 selectively provides an AC voltage source 470 and an AC voltage source 475 to energize a selected sensor. At the same time, multiplexer 440 provides outputs 462 and 464 from one of the sensors 411, 412, 413, 414, 415, 416 and 419 to signal conditioning circuit 420. Multiplexer 440 receives an input 465 from digital signal processor 430 to determine which sensor 411, 412, 413, 414, 415, 416 or 419 is activated. Signal conditioning circuit 420 is connected to a switch 452, which may provide the conditioned output from signal conditioning circuit 420 to an analog-to-digital converter (ADC) 454. Switch 452 may also provide an output from a temperature sensor 458 to the ADC 454. The output of the ADC 454 is provided to digital signal processor 430.
The digital signal processor 430 selects which sensor is energized and which output is provided with selection signal 465 provided to the multiplexer 440. When selection signal 465 is applied the switches are closed for a specific sensor such that AC voltage sources 470 and 475 are applied to a sensor and the output of that sensor is provided to the signal conditioning circuit 420. Operational software may be maintained in an EEPROM 435. The operational software in EEPROM 435 and the signal conditioning circuit 420 may provide for sensor measurement functions. This will allow users to receive information from each of the individual sensors without having to know the control methods and arithmetic algorithms involved for various sensors such as magnetic or geomagnetic vector, acceleration, tilt angle, atmospheric pressure, humidity, or temperature. In addition, EEPROM 435 may be programmed to adjust measurements of the measured properties based on other property measurements. For example, by measuring acceleration, a truer magnetic reading may be obtained. In addition, digital signal processor 430 may also be connected to a humidity sensor 480 that may be external to the ASIC 400.
System 500 may also include a cellular receiver/transmitter 540 connected to an antenna 545. The cellular receiver/transmitter 540 may be connected to processor 530. System 500 may also include a memory 550 to store data from ASIC 510, as well as a video display 560 to display information derived by ASIC 510. Memory 550 may be located on the same substrate as ASIC 510. In addition, system 500 may include a microphone 570 and a speaker 580 to permit voice control or inputs to and from processor 530. For example, if system 500 were a cellular phone, ASIC 510 may be useful in determining the location of system 500.
The Abstract of the Disclosure is provided to comply with 37 C.F.R. §1.72(b), requiring an abstract that will allow the reader to quickly ascertain the nature of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. The above description and figures illustrate embodiments of the invention to enable those skilled in the art to practice the embodiments of the invention. Thus, the following claims are hereby incorporated into the Detailed Description, with each claim standing on its own as a separate embodiment.