by capacitive pick-up

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G01P15/125

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GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT G01P15/00Measuring acceleration Measuring deceleration Measuring shock

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G01P15/125by capacitive pick-up

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Signal processing device, inertial sensor, signal processing method...
- Patent number 12,203,955
- Issue date Jan 21, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keisuke Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical component for a pressure and inertial sensor device
- Patent number 12,181,356
- Issue date Dec 31, 2024
- Robert Bosch GmbH
- Lars Tebje
- G01 - MEASURING TESTING
Information Patent Grant
MEMS sensor with compensation of residual voltage
- Patent number 12,174,215
- Issue date Dec 24, 2024
- Invensense, Inc.
- Giacomo Gafforelli
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Circuit for operating a capacitive sensor and associated sensor device
- Patent number 12,163,812
- Issue date Dec 10, 2024
- Robert Bosch GmbH
- Alice Lanniel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor module, measurement system, and vehicle
- Patent number 12,153,066
- Issue date Nov 26, 2024
- Seiko Epson Corporation
- Taketo Chino
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical inertial sensor
- Patent number 12,153,063
- Issue date Nov 26, 2024
- Robert Bosch GmbH
- Klaus Petzold
- G01 - MEASURING TESTING
Information Patent Grant
3-axis angular accelerometer
- Patent number 12,153,065
- Issue date Nov 26, 2024
- Analog Devices, Inc.
- Xin Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity sensor, physical quantity sensor device, and iner...
- Patent number 12,153,064
- Issue date Nov 26, 2024
- Seiko Epson Corporation
- Satoru Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise multi-axis accelerometers and related methods
- Patent number 12,146,893
- Issue date Nov 19, 2024
- Analog Devices, Inc.
- Xin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical sensor device with improved stability to stress
- Patent number 12,139,396
- Issue date Nov 12, 2024
- STMicroelectronics S.r.l.
- Francesco Rizzini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mems device, electronic apparatus, and vehicle
- Patent number 12,130,303
- Issue date Oct 29, 2024
- Seiko Epson Corporation
- Fumiya Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mems inertial sensor with high resistance to stiction
- Patent number 12,117,464
- Issue date Oct 15, 2024
- STMicroelectronics S.r.l.
- Gabriele Gattere
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor device
- Patent number 12,117,466
- Issue date Oct 15, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Hideki Ueda
- G01 - MEASURING TESTING
Information Patent Grant
MEMS-based rotation sensor for seismic applications and sensor unit...
- Patent number 12,111,434
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Maxime Projetti
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer having an over travel stop with a stop gap less than...
- Patent number 12,105,114
- Issue date Oct 1, 2024
- NXP USA, INC.
- Aaron A. Geisberger
- G01 - MEASURING TESTING
Information Patent Grant
Sensing an ICMFB output to detect functional state of a mems sensor
- Patent number 12,092,653
- Issue date Sep 17, 2024
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical sensor device and corresponding production method
- Patent number 12,077,429
- Issue date Sep 3, 2024
- Robert Bosch GmbH
- Lars Tebje
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Suspension for a mems vibration sensor
- Patent number 12,072,350
- Issue date Aug 27, 2024
- Knowles Electronics, LLC
- Faisal Zaman
- G01 - MEASURING TESTING
Information Patent Grant
Method for lithography process
- Patent number 12,066,756
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Hung Liao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS inertial sensor with high resilience to the phenomenon of stic...
- Patent number 12,038,454
- Issue date Jul 16, 2024
- STMicroelectronics S.r.l.
- Francesco Rizzini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Two-wire interface reference accelerometer with integrated mechanic...
- Patent number 12,025,633
- Issue date Jul 2, 2024
- Vibration Measurement Solutions, Inc.
- George V. Zusman
- G01 - MEASURING TESTING
Information Patent Grant
MEMS accelerometer
- Patent number 12,013,414
- Issue date Jun 18, 2024
- AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
- Shitao Yan
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical acceleration sensor system
- Patent number 12,013,413
- Issue date Jun 18, 2024
- Robert Bosch GmbH
- Amin Jemili
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Seesaw accelerometer
- Patent number 11,977,094
- Issue date May 7, 2024
- Murata Manufacturing Co., Ltd.
- Matti Liukku
- G01 - MEASURING TESTING
Information Patent Grant
Closed-loop microelectromechanical accelerometer with compensation...
- Patent number 11,965,906
- Issue date Apr 23, 2024
- STMicroelectronics S.r.l.
- Gabriele Gattere
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis resonant accelerometer with improved-performance detection s...
- Patent number 11,933,810
- Issue date Mar 19, 2024
- STMicroelectronics S.r.l.
- Valentina Zega
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensor
- Patent number 11,933,809
- Issue date Mar 19, 2024
- Sensortek Technology Corp.
- Shih-Wei Lee
- G01 - MEASURING TESTING
Information Patent Grant
Cross-beam axial accelerometer
- Patent number 11,933,812
- Issue date Mar 19, 2024
- Agency for Defense Development
- Wonyoung Uhm
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensor and method of inertial sensing with tuneable mode c...
- Patent number 11,913,808
- Issue date Feb 27, 2024
- SILICON MICROGRAVITY LIMITED
- Xin Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 11,915,924
- Issue date Feb 27, 2024
- Denso Corporation
- Megumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Sensor Module, Measurement System, And Vehicle
- Publication number 20250020686
- Publication date Jan 16, 2025
- SEIKO EPSON CORPORATION
- Taketo CHINO
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE AND METHOD FOR PRODUCING MEMS DEVICE
- Publication number 20250019226
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Toma FUJITA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS DEVICE
- Publication number 20250019225
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Daisuke Nishinohara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20250012829
- Publication date Jan 9, 2025
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACCELERATION SENSOR
- Publication number 20250011159
- Publication date Jan 9, 2025
- Rohm Co., Ltd.
- Martin Wilfried HELLER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMPOSITE SENSOR
- Publication number 20250003750
- Publication date Jan 2, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Kazufumi NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
MEMS STRAIN SENSITIVITY CALIBRATION
- Publication number 20240426867
- Publication date Dec 26, 2024
- InvenSense, Inc.
- Matthew Julian Thompson
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL MEMS DEVICE INTEGRATING A WAKE-UP ELEMENT, INERTIAL MEMS S...
- Publication number 20240425352
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Luca SEGHIZZI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROMECHANICAL DEVICE WITH A MECHANICAL STOP
- Publication number 20240425356
- Publication date Dec 26, 2024
- ROBERT BOSCH GmbH
- Jochen Reinmuth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS SENSOR FOR IMPROVED MEASUREMENT OF ACCELERATIONS
- Publication number 20240426868
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Francesco RIZZINI
- G01 - MEASURING TESTING
Information Patent Application
THREE SEISMIC MASS Z-AXIS ACCELEROMETER AND MANUFACTURING METHOD TH...
- Publication number 20240418743
- Publication date Dec 19, 2024
- MiraMEMS Sensing Technology Co., Ltd
- Li-Tien TSENG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TRANSLATIONAL MASS ACCELEROMETER
- Publication number 20240410914
- Publication date Dec 12, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER INCLUDING PROOF MASS
- Publication number 20240410915
- Publication date Dec 12, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER STUCK CONDITION COMPENSATION FOR DEVICES WITH MULTIPL...
- Publication number 20240401978
- Publication date Dec 5, 2024
- STMicroelectronics International N.V.
- Federico RIZZARDINI
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE AND METHOD FOR MANUFACTURING MEMS DEVICE
- Publication number 20240400374
- Publication date Dec 5, 2024
- Rohm Co., Ltd.
- Toma FUJITA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYMMETRIC DIFFERENTIAL TRANSDUCER
- Publication number 20240393114
- Publication date Nov 28, 2024
- Murata Manufacturing Co., Ltd.
- Mikko PARTANEN
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensor Module And Electronic Apparatus
- Publication number 20240393113
- Publication date Nov 28, 2024
- SEIKO EPSON CORPORATION
- Masayasu SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL ACCELEROMETER WITH FORCE FEEDBACK LOOP
- Publication number 20240391757
- Publication date Nov 28, 2024
- STMicroelectronics International N.V.
- Marco GARBARINO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS DEVICE
- Publication number 20240383742
- Publication date Nov 21, 2024
- Zhunmao (Hangzhou) Technology Co.
- Haitao Ding
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL ACCELERATION SENSOR, AND METHOD FOR OPERATIN...
- Publication number 20240385211
- Publication date Nov 21, 2024
- ROBERT BOSCH GmbH
- Zsombor Cseke
- G01 - MEASURING TESTING
Information Patent Application
MEMBRANE SENSOR FOR COMPENSATING FOR AN ACCELERATION, AND METHOD FO...
- Publication number 20240369435
- Publication date Nov 7, 2024
- ROBERT BOSCH GmbH
- Johannes Classen
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE BOOST CIRCUIT AND SENSOR DEVICE
- Publication number 20240356435
- Publication date Oct 24, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Masaaki Nagai
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MICRO-ELECTRICAL-MECHANICAL-SYSTEMS (MEMS) ACCELEROMETER SYSTEMS
- Publication number 20240345124
- Publication date Oct 17, 2024
- Atlantic Inertial Systems Inc.
- Richard A. Hull
- G01 - MEASURING TESTING
Information Patent Application
SENSING CIRCUIT OF A MICRO-ELECTROMECHANICAL SENSOR
- Publication number 20240345125
- Publication date Oct 17, 2024
- InvenSense, Inc.
- Joseph Seeger
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ACCELEROMETER
- Publication number 20240345127
- Publication date Oct 17, 2024
- AAC Kaitai Technologies (Wuhan) CO., LTD
- Shitao Yan
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensor And Inertial Measurement Apparatus
- Publication number 20240337676
- Publication date Oct 10, 2024
- SEIKO EPSON CORPORATION
- Tomonaga KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION DETECTION DEVICE AND ACCELERATION SENSOR
- Publication number 20240327198
- Publication date Oct 3, 2024
- Rohm Co., Ltd.
- Martin Wilfried HELLER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS DEVICE AND METHOD OF MANUFACTURING MEMS DEVICE
- Publication number 20240317574
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Martin Wilfried HELLER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS SENSOR, AND METHOD FOR MANUFACTURING MEMS SENSOR
- Publication number 20240317579
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Daisuke KAMINISHI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SENSOR AND ELECTRONIC DEVICE
- Publication number 20240310406
- Publication date Sep 19, 2024
- Kabushiki Kaisha Toshiba
- Kei MASUNISHI
- G01 - MEASURING TESTING

by capacitive pick-up

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Signal processing device, inertial sensor, signal processing method...

Micromechanical component for a pressure and inertial sensor device

MEMS sensor with compensation of residual voltage

Circuit for operating a capacitive sensor and associated sensor device

Sensor module, measurement system, and vehicle

Micromechanical inertial sensor

3-axis angular accelerometer

Physical quantity sensor, physical quantity sensor device, and iner...

Low-noise multi-axis accelerometers and related methods

Microelectromechanical sensor device with improved stability to stress

Mems device, electronic apparatus, and vehicle

Mems inertial sensor with high resistance to stiction

Sensor device

MEMS-based rotation sensor for seismic applications and sensor unit...

Accelerometer having an over travel stop with a stop gap less than...

Sensing an ICMFB output to detect functional state of a mems sensor

Micromechanical sensor device and corresponding production method

Suspension for a mems vibration sensor

Method for lithography process

MEMS inertial sensor with high resilience to the phenomenon of stic...

Two-wire interface reference accelerometer with integrated mechanic...

MEMS accelerometer

Microelectromechanical acceleration sensor system

Seesaw accelerometer

Closed-loop microelectromechanical accelerometer with compensation...

Z-axis resonant accelerometer with improved-performance detection s...

Inertial sensor

Cross-beam axial accelerometer

Inertial sensor and method of inertial sensing with tuneable mode c...

Semiconductor device and method for manufacturing the same

Patents Applicationslast 30 patents

Sensor Module, Measurement System, And Vehicle

MEMS DEVICE AND METHOD FOR PRODUCING MEMS DEVICE

MEMS DEVICE

MEMS Device, Electronic Apparatus, And Vehicle

ACCELERATION SENSOR

COMPOSITE SENSOR

MEMS STRAIN SENSITIVITY CALIBRATION

INERTIAL MEMS DEVICE INTEGRATING A WAKE-UP ELEMENT, INERTIAL MEMS S...

MICROMECHANICAL DEVICE WITH A MECHANICAL STOP

MEMS SENSOR FOR IMPROVED MEASUREMENT OF ACCELERATIONS

THREE SEISMIC MASS Z-AXIS ACCELEROMETER AND MANUFACTURING METHOD TH...

TRANSLATIONAL MASS ACCELEROMETER

ACCELEROMETER INCLUDING PROOF MASS

ACCELEROMETER STUCK CONDITION COMPENSATION FOR DEVICES WITH MULTIPL...

MEMS DEVICE AND METHOD FOR MANUFACTURING MEMS DEVICE

SYMMETRIC DIFFERENTIAL TRANSDUCER

Inertial Sensor Module And Electronic Apparatus

MICROELECTROMECHANICAL ACCELEROMETER WITH FORCE FEEDBACK LOOP

MEMS DEVICE

MICROELECTROMECHANICAL ACCELERATION SENSOR, AND METHOD FOR OPERATIN...

MEMBRANE SENSOR FOR COMPENSATING FOR AN ACCELERATION, AND METHOD FO...

VOLTAGE BOOST CIRCUIT AND SENSOR DEVICE

MICRO-ELECTRICAL-MECHANICAL-SYSTEMS (MEMS) ACCELEROMETER SYSTEMS

SENSING CIRCUIT OF A MICRO-ELECTROMECHANICAL SENSOR

ACCELEROMETER

Inertial Sensor And Inertial Measurement Apparatus

ACCELERATION DETECTION DEVICE AND ACCELERATION SENSOR

MEMS DEVICE AND METHOD OF MANUFACTURING MEMS DEVICE

MEMS SENSOR, AND METHOD FOR MANUFACTURING MEMS SENSOR

SENSOR AND ELECTRONIC DEVICE