Chip electronic component and board having the same

Information

  • Patent Grant
  • 11626233
  • Patent Number
    11,626,233
  • Date Filed
    Thursday, August 13, 2020
    3 years ago
  • Date Issued
    Tuesday, April 11, 2023
    a year ago
Abstract
There are provided a chip electronic component and a board having the same. The chip electronic component includes: a substrate; a first internal coil part disposed on one surface of the substrate; a second internal coil part disposed on the other surface of the substrate opposing one surface thereof; a via penetrating through the substrate to connect the first and second internal coil parts to each other; and first and second via pads disposed on one surface and the other surface of the substrate, respectively, to cover the via, wherein the first and second via pads are extended in a direction toward portions of the first and second internal coil parts adjacent thereto.
Description
BACKGROUND

The present disclosure relates to a chip electronic component and a board having the same.


An inductor, a chip electronic component, is a representative passive element configuring an electronic circuit, together with a resistor and a capacitor to remove noise. Such an inductor is commonly combined with a capacitor in consideration of respective electromagnetic characteristics thereof to configure a resonance circuit amplifying a signal in a specific frequency band, a filter circuit, or the like.


Recently, as information technology (IT) devices such as communications devices, display devices, and the like, have been increasingly thinned and miniaturized, research into technologies facilitating the miniaturizing and thinning of various elements such as inductors, capacitors, transistors, and the like, used in such IT devices, has been continuously undertaken.


In this regard, inductors have been rapidly replaced by chips having a small size and high density, capable of being automatically surface-mounted, and a thin film type inductor in which coil patterns formed of a mixture of a magnetic powder and a resin are formed on upper and lower surfaces of a thin film insulating substrate by plating have been developed.


The thin film type inductor as described above may be manufactured by forming a coil pattern on a substrate and then covering an the exterior thereof with a magnetic material.


Meanwhile, in order to thin and miniaturize inductors, limitations in shape of existing connection portions between coil patterns must be overcome.


More specifically, in a substrate plating process for forming the coil pattern of the inductor, a conductive coil pattern may be formed on one surface of the substrate and on the other surface of the substrate.


The conductive coil patterns formed on one surface and the other surface of the substrate may be electrically connected to each other by a via electrode formed in the substrate.


The via electrode and the conductive coil pattern are generally positioned in a linear manner, and relatively large pads are formed to prevent defects caused by misalignment of a via portion, causing a problem in manufacturing an inductor having a small size and high inductance.


In addition, as the pad may be positioned to be adjacent to a core forming inductance, an internal core area may be decreased, such that there may be significant limitations in miniaturization.


Therefore, there remains a need to design an inductor capable of securing a sufficient amount of inductance while having a small size.


RELATED ART DOCUMENT



  • (Patent Document 1) Japanese Patent Laid-Open Publication No. 2007-067214



SUMMARY

An aspect of the present disclosure may provide a chip electronic component in which a loss of inductance due to an area of a via pad is prevented through altering a shape and a position of the via pad.


According to an aspect of the present disclosure, a chip electronic component may include: a substrate; a first internal coil part disposed on one surface of the substrate; a second internal coil part disposed on the other surface of the substrate opposing one surface of the substrate; a via penetrating through the substrate to connect the first and second internal coil parts to each other; and first and second via pads disposed on one surface and the other surface of the substrate, respectively, to cover the via, wherein portions of the first and second via pads are extended in a direction toward first and second internal coil parts adjacent thereto.


According to another aspect of the present disclosure, a board having a chip electronic component may include: a printed circuit board on which first and second electrode pads are provided; and the chip electronic component as described above, mounted on the printed circuit board.





BRIEF DESCRIPTION OF DRAWINGS

The above and other aspects, features and advantages of the present disclosure will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:



FIG. 1 is a schematic perspective view of a chip electronic component including internal coil parts according to an exemplary embodiment of the present disclosure;



FIG. 2 is a cross-sectional view taken along line I-I′ of FIG. 1;



FIGS. 3A and 3B are schematic plan views of via pads according to an exemplary embodiment of the present disclosure;



FIG. 4 is a cross-sectional view taken along line II-IP of FIG. 1; and



FIG. 5 is a perspective view showing a board in which the chip electronic component of FIG. 1 is mounted on a printed circuit board.





DETAILED DESCRIPTION

Exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings.


The disclosure may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.


In the drawings, the shapes and dimensions of elements may be exaggerated for clarity, and the same reference numerals will be used throughout to designate the same or like elements.


Chip Electronic Component


Hereinafter, a chip electronic component according to an exemplary embodiment of the present disclosure will be described. Particularly, a thin film type inductor will be described, but the present disclosure is not limited thereto.



FIG. 1 is a schematic perspective view showing a chip electronic component including internal coil parts according to an exemplary embodiment of the present disclosure.


Referring to FIG. 1, as an example of the chip electronic component, a thin film type inductor used in a power line of a power supply circuit is disclosed.


The chip electronic component 100 according to an exemplary embodiment of the present disclosure may include a magnetic body 50, internal coil parts 41 and 42 buried in the magnetic body 50, and first and second external electrodes 81 and 82 disposed on an outer portion of the magnetic body 50 to thereby be electrically connected to the internal coil parts 41 and 42.


In the chip electronic component 100 according to an exemplary embodiment of the present disclosure, a ‘length’ direction refers to an ‘L’ direction of FIG. 1, a ‘width’ direction refers to a ‘W’ direction of FIG. 1, and a ‘thickness’ direction refers to a ‘I’ direction of FIG. 1.


The magnetic body 50 may form the exterior of the chip electronic component 100 and may be formed of any material capable of exhibiting magnetic characteristics. For example, the magnetic body 50 may be formed by filling ferrite or magnetic metal powder.


Examples of the ferrite may include Mn—Zn based ferrite, Ni—Zn based ferrite, Ni—Zn—Cu based ferrite, Mn—Mg based ferrite, Ba based ferrite, Li based ferrite, or the like.


The magnetic metal powder may contain any one or more selected from the group consisting of Fe, Si, Cr, Al, and Ni. For example, the magnetic metal powder may contain Fe—Si—B—Cr-based amorphous metal, but the present disclosure is not necessarily limited thereto.


The magnetic metal powder may have a particle diameter of 0.1 μm to 30 μM and be contained in a form in which the magnetic metal powder is dispersed in a thermosetting resin such as an epoxy resin, polyimide, or the like.


A first internal coil part 41 having a coil shape may be formed in one surface of a substrate 20 disposed in the magnetic body 50, and a second internal coil part 42 having a coil shape may be formed on the other surface opposing one surface of the substrate 20.


The first and second internal coil parts 41 and 42 may be formed in a spiral shape and be formed by performing an electroplating method.


Examples of the substrate 20 may include a polypropylene glycol (PPG) substrate, a ferrite substrate, a metal-based soft magnetic substrate, and the like.


A central portion of the substrate 20 may be penetrated to thereby form a hole, and the hole is filled with a magnetic material to thereby form a core part 55.


As the core part 55 filled with the magnetic material is formed, inductance Ls may be improved.



FIG. 2 is a cross-sectional view taken along line □-□′ of FIG. 1.


Referring to FIG. 2, the first and second internal coil parts 41 and 42 formed on one surface and the other surface of the substrate 20 may be connected to a via 45 penetrating through the substrate 20.


First and second via pads 43 and 44 may be formed on one surface and the other surface of the substrate 20, respectively, to cover the via 45.


The first via pad 43 may be formed by extending one end portion of the first internal coil part 41, and the second via pad 44 may be formed by extending one end portion of the second internal coil part 42.


The first and second via pads 43 and 44 may be formed by performing an electroplating method similarly to the first and second internal coil parts 41 and 42.


In general, a via is positioned on a straight line with an internal coil portion, and an open defect due to misalignment of the via may occur.


In the case of forming a via pad in order to prevent the open defect as described above, there is a tendency to increase an area of the via pad, which limits implementation of miniaturization and high inductance of a chip electronic component.


Meanwhile, as the via pad having a large area as described above is also disposed in a direction toward a core implementing inductance (Ls), an area of an internal core part is decreased, such that inductance may be decreased in a process of miniaturizing the chip electronic component.


That is, as the area of the via pad is increased, the area of the core part may be decreased, and a magnetic material filled in the core part may be decreased, such that inductance (Ls) characteristics may be decreased.


According to an exemplary embodiment of the present disclosure, in order to solve the above-mentioned problems, the first and second via pads 43 and 44 may be extended in a direction toward portions of the first and second internal coil parts 41 and 42 adjacent thereto.



FIGS. 3A and 3B are schematic plan views showing the via pads according to an exemplary embodiment of the present disclosure.


Referring to FIGS. 3A and 3B, it may be appreciated that the first and second via pads 43 and 44 are extended in the direction toward the portions of first and second internal coil parts 41 and 42 adjacent thereto.


Shapes of the first and second via pads 43 and 44 are not limited, but generally, the first and second via pads 43 and 44 may have a circular shape to be equal to a shape of the via.


The first and second via pads 43 and 44 may be disposed to be biased towards the first and second internal coil parts 41 and 42, unlike a disposition shape of a general product.


Since the first and second via pads 43 and 44 are disposed as described above, the area of the core part 45 may be increased as compared to the related art, and the magnetic material filled in the core part is increased, such that inductance (Ls) characteristics may be improved.


In addition, the open defect that electric connection is cut due to the via 45 and the via pads 43 and 44 that are not aligned to coincide with each other but are misaligned may be prevented, and the area of the core part 55 in which the magnetic material is filled may be secured as much as possible, such that high inductance (Ls) may be secured.


The portions of the first and second internal coil parts 41 and 42 adjacent to the first and second via pads 43 and 44 are formed as recessed portions to be insulated from the first and second via pads 43 and 44.


That is, according to an exemplary embodiment of the present disclosure, the first and second via pads 43 and 44 are extended in the direction toward the portions of the first and second internal coil parts 41 and 42 adjacent thereto in order to implement high inductance (Ls) of the chip electronic component, such that a short-circuit defect may occur. Therefore, in order to prevent the short-circuit defect, the recessed portions may be formed in the portions of the first and second internal coil parts 41 and 42 adjacent to the first and second via pads 43 and 44.


The shapes of the recessed portions are not particularly limited as long as the recessed portions are formed to insulate the first and second internal coil parts 41 and 42 and the first and second via pads 43 and 44 from each other.


According to an exemplary embodiment of the present disclosure, the centers of the recessed portions and the centers of the first and second via pads 43 and 44 may coincide with each other.


That is, the recessed portions may have a shape in which the recessed portions are equally divided based on the first and second via pads 43 and 44.


Meanwhile, according to an exemplary embodiment of the present disclosure, an interval d between the first and second via pads 43 and 44 and the first and second internal coil parts 41 and 42 adjacent thereto may be 3 μm or more, but is not necessarily limited thereto.


The first and second internal coil parts 41 and 42 adjacent to the first and second via pads 43 and 44 may be insulated from the first and second via pads 43 and 44 by adjusting the interval d between the first and second via pads 43 and 44 and the first and second internal coil parts 41 and 42 adjacent thereto to be 3 μm or more.


In the case in which the interval d between the first and second via pads 43 and 44 and the first and second internal coil parts 41 and 42 adjacent thereto is less than 3 μm, a short-circuit defect may occur.


According to an exemplary embodiment of the present disclosure, since the first and second via pads 43 and 44 are disposed to be biased toward the first and second internal coil parts 41 and 42, the area of the core part 55 may be increased as compared to the related art, and accordingly, the magnetic material filled in the core part may be increased, thereby improving inductance (Ls) characteristics.


That is, even though the chip electronic component is miniaturized, the area of the core part may be secured to be large due to the disposition of the via pad as described above, such that the filled magnetic material may be increased, and accordingly, high inductance chip electronic component may be implemented.


The first and second internal coil parts 41 and 42, the via 45, and the first and second via pads 43 and 44 may be formed of a metal having excellent electric conductivity. For example, the first and second internal coil parts 41 and 42, the via 45, and the first and second via pads 43 and 44 may be formed of silver (Ag), palladium (Pd), aluminum (Al), nickel (Ni), titanium (Ti), gold (Au), copper (Cu), platinum (Pt), an alloy thereof, or the like.



FIG. 4 is a cross-sectional view taken along line □-□′ of FIG. 1.


Referring to FIG. 4, the other end portion of the first internal coil part 41 may be extended to forma first lead portion 46 exposed to one end surface of the magnetic body 50 in the length (L) direction, and the other end portion of the second internal coil part 42 may be extended to form a second lead portion 47 exposed to the other end surface of the magnetic body 50 in the length (L) direction.


However, the present disclosure is not necessarily limited thereto, but the first and second lead portions 46 and 47 may be exposed to at least one surface of the magnetic body 50.


The first and second external electrodes 81 and 82 may be disposed on both end surfaces of the magnetic body 50 in the length (L) direction to be connected to the first and second lead portions 46 and 47 exposed to both end surfaces of the magnetic body 50 in the length (L) direction, respectively.


The first and second external electrodes 81 and 82 may be formed of a metal having excellent electric conductivity. For example, the first and second external electrodes 81 and 82 may be formed of one of nickel (Ni), copper (Cu), tin (Sn), silver (Ag), and the like, an alloy thereof, or the like.


Board Having Chip Electronic Component



FIG. 5 is a perspective view of a board in which the chip electronic component of FIG. 1 is mounted on a printed circuit board.


Referring to FIG. 5, a board 200 having a chip electronic component 100 according to the present exemplary embodiment may include a printed circuit board 210 on which the chip electronic component 100 is mounted and first and second electrode pads 211 and 212 formed on the printed circuit board 210 to be spaced apart from each other.


In this case, the chip electronic component 100 may be electrically connected to the printed circuit board 210 by solders 230 in a state in which first and second external electrodes 81 and 82 are positioned on the first and second electrode pads 211 and 212 to contact the first and second electrode pads 221 and 222, respectively.


Internal coil parts 41 and 42 of the mounted chip electronic component 100 may be disposed horizontally with respect to amounting surface of the printed circuit board 210.


Except for the description described above, a description of features overlapped with those of the above-mentioned chip electronic component according to an exemplary embodiment of the present disclosure will be omitted.


As set forth above, according to exemplary embodiments of the present disclosure, the area of the core may be sufficiently secured by disposing the via pad in the direction toward the coil adjacent to the via, such that a loss of the inductance caused by the area of the via pad may be prevented.


While exemplary embodiments have been shown and described above, it will be apparent to those skilled in the art that modifications and variations could be made without departing from the scope of the present invention as defined by the appended claims.

Claims
  • 1. A coil component comprising: a body;a substrate embedded in the body;a coil including first and second coil parts each disposed on a respective surface among opposing surfaces of the substrate, and a via extending through the substrate to electrically connect the first and second coil parts; andfirst and second external electrodes disposed on at least one surface of the body and connected to respective ends of the coil,wherein each of the first and second coil parts has a coil shaped conductor and a via pad overlapping the via,the coil shaped conductor of each of the first and second coil parts has a width that is reduced in a region adjacent to the via pad and increased widths in respective regions on opposing sides of said region adjacent to the via pad,the coil shaped conductor of each of the first and second coil parts has an innermost winding where there is no winding inside the innermost winding, andan outer surface of a part of the innermost winding that contacts and extends from the via pad adjacent one side of the via pad is closer to a center of the body than an inner surface of a part of the innermost winding adjacent to the via pad.
  • 2. The coil component of claim 1, wherein the regions of the coil shaped conductors of the first and second coil parts having the reduced widths overlap with each other on the opposing surfaces of the substrate.
  • 3. The coil component of claim 1, wherein the coil shaped conductor of each of the first and second coil parts forms a plurality of coil windings, and only one winding from among each plurality of coil windings has the reduced width in the region adjacent to the via pad.
  • 4. The coil component of claim 3, wherein the coil shaped conductor of each of the first and second coil parts has a substantially constant width outside of the region of the one winding having the reduced width.
  • 5. The coil component of claim 4, wherein the via pad of each of the first and second coil parts has a width greater than the substantially constant width of the coil shaped conductor outside of the region adjacent to the via pad.
  • 6. The coil component of claim 1, wherein the region of the coil shaped conductor of each of the first and second coil parts adjacent to the via pad has a recess extending in a side thereof facing the via pad.
  • 7. The coil component of claim 1, further comprising: an insulating layer disposed in a spiral pattern between adjacent turns of the coil shaped conductor of each of the first and second coil parts,wherein the insulating layer deviates from the spiral pattern at a position adjacent to the via pad.
  • 8. A coil component comprising: a substrate;a coil including a plurality of winding turns disposed about a central axis on the substrate, and a via extending through the substrate from an end thereof; andan insulating layer disposed on the substrate in a spiral pattern between adjacent windings of the coil,wherein the insulating layer deviates from the spiral pattern at a position adjacent to the via where the coil has a reduced width, and returns to the spiral pattern at a position beyond the via where the coil has an increased width,the coil has an innermost winding closest to the central axis and an outer winding adjacent the innermost winding, andan outer surface of a portion of the innermost winding that contacts and extends from the via adjacent one side of the via pad is closer to the central axis than an inner surface of a portion of the innermost winding adjacent to the via pad.
  • 9. The coil component of claim 8, wherein the coil further includes a via pad disposed at an end thereof overlapping the via, and a conductor forming at least one winding turn adjacent to the via pad, among the plurality of winding turns, has a section adjacent to and radially outward from the via pad having a reduced conductor width.
  • 10. The coil component of claim 9, wherein at least another winding turn of the conductor has a conductor width that is smaller than a width of the via pad and larger than the reduced conductor width.
  • 11. The coil component of claim 8, wherein the coil includes a first plurality of winding turns disposed on one surface of substrate, a second plurality of winding turns disposed on another surface of substrate opposite the one surface, and the via extends through the substrate to connect the first and second plurality of winding turns to each other.
  • 12. The coil component of claim 11, wherein the insulating layer is disposed on the one surface of the substrate in a spiral pattern between adjacent windings of the first plurality of winding turns, and disposed on the other surface of the substrate in a spiral pattern between adjacent windings of the second plurality of winding turns, and the insulating layer deviates from the spiral patterns at positions overlapping each other on the opposite surfaces of the substrate.
Priority Claims (1)
Number Date Country Kind
10-2014-0138590 Oct 2014 KR national
CROSS-REFERENCE TO RELATED APPLICATION

This application is the continuation application of U.S. patent application Ser. No. 16/730,399, filed on Dec. 30, 2019, which is the continuation application of U.S. patent application Ser. No. 16/212,541, filed on Dec. 6, 2018, now U.S. Pat. No. 10,553,338, which is the continuation application of U.S. patent application Ser. No. 14/691,285, filed on Apr. 20, 2015, now abandoned, which in turn claims the priority and benefit of Korean Patent Application No. 10-2014-0138590 filed on Oct. 14, 2014, the disclosures of which are incorporated herein by reference.

US Referenced Citations (68)
Number Name Date Kind
4613843 Esper Sep 1986 A
4873757 Williams Oct 1989 A
4904967 Morii et al. Feb 1990 A
5321380 Godek Jun 1994 A
5337063 Takahira Aug 1994 A
5353001 Meinel et al. Oct 1994 A
5398400 Breen Mar 1995 A
5515022 Tashiro May 1996 A
5929733 Anzawa et al. Jul 1999 A
6000128 Umeno et al. Dec 1999 A
6073339 Levin Jun 2000 A
6091607 McKeown et al. Jul 2000 A
6342681 Goldberger et al. Jan 2002 B1
6388551 Morikawa May 2002 B2
6618929 Kitamura Sep 2003 B2
6710694 Matsuta et al. Mar 2004 B2
6727571 Sugiyama Apr 2004 B2
6914508 Ferencz et al. Jul 2005 B2
7046114 Sakata May 2006 B2
7362205 Ito et al. Apr 2008 B2
7378931 Odahara et al. May 2008 B2
7551052 Jow et al. Jun 2009 B2
7646304 Cote et al. Jan 2010 B2
7876572 Sota Jan 2011 B2
7974103 Lim et al. Jul 2011 B2
8093996 Heurtier Jan 2012 B2
8334747 Matsumoto Dec 2012 B2
8339802 Lotfi et al. Dec 2012 B2
9027229 Thorslund May 2015 B2
9035740 Washizaki et al. May 2015 B2
9076585 Yang Jul 2015 B2
9875837 Jeong Jan 2018 B2
9960176 Wu May 2018 B2
10123420 Lee Nov 2018 B2
10147540 Tonoyama Dec 2018 B2
10170229 Jeong Jan 2019 B2
10256032 Jeong Apr 2019 B2
10515750 Jeong Dec 2019 B2
10956032 Valade Mar 2021 B2
11217381 Li Jan 2022 B2
20030076211 Matsuta et al. Apr 2003 A1
20030098496 Sugiyama May 2003 A1
20060214759 Kawari Sep 2006 A1
20070238245 Cote et al. Oct 2007 A1
20080180206 Fouquet et al. Jul 2008 A1
20080278275 Fouquet et al. Nov 2008 A1
20090160719 Kato et al. Jun 2009 A1
20090231139 Heurtier Sep 2009 A1
20090243782 Fouquet et al. Oct 2009 A1
20090243783 Fouquet et al. Oct 2009 A1
20090251131 Myers et al. Oct 2009 A1
20100020448 Ng et al. Jan 2010 A1
20100025682 Lee et al. Feb 2010 A1
20100090327 Ogata Apr 2010 A1
20110095620 Fouquet et al. Apr 2011 A1
20120112866 Matsumoto May 2012 A1
20130120095 Weatherspoon et al. May 2013 A1
20130222101 Ito et al. Aug 2013 A1
20130249664 Tonoyama et al. Sep 2013 A1
20130265131 Yang Oct 2013 A1
20130289412 Corl Oct 2013 A1
20130300529 Chang Nov 2013 A1
20160104565 Nishiyama Apr 2016 A1
20160111194 Jeong Apr 2016 A1
20160111195 Nishyama Apr 2016 A1
20160268039 Park Sep 2016 A1
20160307689 Jeong Oct 2016 A1
20180204663 Lee Jul 2018 A1
Foreign Referenced Citations (12)
Number Date Country
103366920 Oct 2013 CN
103645451 Mar 2014 CN
203596265 May 2014 CN
H05-198439 Aug 1993 JP
H07-086755 Mar 1995 JP
H11-204337 Jul 1999 JP
2003-133135 May 2003 JP
2005-005298 Jan 2005 JP
2007-067214 Mar 2007 JP
10-2014-0089595 Jul 2014 KR
2011010491 Jan 2011 WO
2013070371 May 2013 WO
Non-Patent Literature Citations (10)
Entry
Final Office Action dated Sep. 11, 2018 issued in U.S. Appl. No. 14/691,285.
Non-Final Office Action dated Feb. 16, 2018 issued in U.S. Appl. No. 14/691,285.
Notice of Office Action issued in corresponding Korean Patent Application No. 10-2014-0138590, dated May 22, 2017, with English translation.
Non-Final Office Action dated Jul. 17, 2017 issued in U.S. Appl. No. 14/691,285.
First Office Action issued in Chinese Patent Application No. 20150536862.0 dated Feb. 21, 2017, with English translation.
Final Office Action dated Feb. 23, 2017 issued in U.S. Appl. No. 14/691,285.
Non-Final Office Action dated Jul. 20, 2016 issued in U.S. Appl. No. 14/691,285.
Notice of Allowance issued in U.S. Appl. No. 16/212,541 dated Oct. 3, 2019.
Non-Final Office Action issued in U.S. Appl. No. 16/212,541 dated Apr. 11, 2019.
U.S. Office Action dated Jan. 21, 2022 issued in U.S. Appl. No. 16/730,399.
Related Publications (1)
Number Date Country
20200373055 A1 Nov 2020 US
Continuations (3)
Number Date Country
Parent 16730399 Dec 2019 US
Child 16992329 US
Parent 16212541 Dec 2018 US
Child 16730399 US
Parent 14691285 Apr 2015 US
Child 16212541 US