The present invention relates to a chip resistor, and more particularly to a low-resistance chip resistor that is used, for instance, for current detection in an electronic circuit.
Chip resistors are structured so that a resistive element made, for instance, of ruthenium oxide is positioned between a pair of electrode sections. However, a chip resistor used, for instance, for electronic circuit current detection needs to have a resistance value of not higher than 1Ω. A technology that uses a resistive element made mainly of copper to obtain such a low-resistance chip resistor has long been known (refer, for instance, to Patent Document 1).
When the chip resistor 1 configured as described above is to be mounted on a circuit board 30, the pair of end-face electrodes 6, which are extended over both longitudinal ends of the lower surface of the ceramic substrate 2, are placed on the associated solder land 31a of a wiring pattern 31 of the circuit board 30 and subjected to a solder connection process so that the plating layers 7, 8 covering the end-face electrodes 6 are connected with solder 32 to the solder land 31a to establish an electrical and mechanical connection. The copper-nickel alloy has a small temperature coefficient of resistance (TCR). Therefore, when the resistive element 3 is made mainly of a copper-nickel alloy, it is possible to obtain a low-resistance, low-TCR chip resistor having a resistance value setting of not higher than 1Ω. Patent Document 1: Japanese Patent Application Laid-Open Publication No. H10-144501 (pages 4 and 5, FIG. 1)
As described above, a low-resistance, low-TCR chip resistor can be obtained when the resistive element is made mainly of a copper-nickel alloy. However, when the conventional chip resistor 1 shown in
This type of chip resistor is manufactured by subjecting a large-size, multi-chip substrate to primary division to obtain strip-shaped substrates and then subjecting the strip-shaped substrates to secondary division to obtain individual pieces. In the case of the aforementioned chip resistor 1, however, the resistive element 3, which is made mainly of a copper/nickel alloy, is formed across a primary division break groove in the large-size substrate. Therefore, the work performed to divide the large-size substrate into strips along the break groove is troubled. Consequently, the manufacturing yield is adversely affected.
The present invention has been made in view of the conventional technology described above. An object of the present invention is to provide a chip resistor that readily lowers its resistance and exhibits excellent manufacturing yield.
In accomplishing the above object, according to one aspect of the present invention, there is provided a chip resistor including: a ceramic substrate shaped like a rectangular parallelepiped; a resistive element that is placed on the lower surface of the ceramic substrate, positioned within a region inside the peripheral border of the lower surface, and made mainly of copper; a pair of first electrode layers that are positioned in regions covering both longitudinal ends of the resistive element; a pair of second electrode layers that are positioned in regions covering the first electrode layers; an insulating protective layer that is positioned to cover the resistive element exposed between the second electrode layers; a pair of end-face electrodes that are positioned on both longitudinal end faces of the ceramic substrate with the lower end closely attached to the second electrode layers; and a plating layer that covers the second electrode layers and the end-face electrodes; wherein the plating layer is soldered to a wiring pattern on a circuit board with the first and second electrode layers positioned on the wiring pattern to mount the chip resistor on the circuit board.
The chip resistor configured as described above has a resistive element made of a low-resistance, low-TCR material. Further, when it is face-down mounted, that is, mounted with the resistive element side facing the component side of the circuit board, it can distribute power to the resistive element while bypassing the end-face electrodes. Furthermore, the electrode section of the resistive element includes two layers, that is, the first and second electrode layers, to provide increased film thickness. Therefore, an extremely small inductance setting can be employed for the electrode section. Consequently, the chip resistor can readily lower its resistance and improve TCR characteristics. In addition, the resistive element is placed on the lower surface of the ceramic substrate and positioned within a region inside the peripheral border of the lower surface. Therefore, the resistive element does not enter the primary division break groove in the large-size substrate during the manufacture of the chip resistor. This makes it possible to smoothly perform primary division work and achieve excellent manufacturing yield. Although the end-face electrodes of the chip resistor do not constitute an electrical contribution, they create a solder fillet when they are mounted on and soldered to the wiring pattern of the circuit board. Therefore, the end-face electrodes considerably increase the mounting strength prevailing after mounting.
According to another aspect of the present invention, there is provided the chip resistor as described in the above aspect, wherein the first and second electrode layers are of the same shape and overlap with each other. In this instance, the initial cost decreases because the electrode layers can be formed through the use of the same equipment.
The chip resistor according to the present invention includes a resistive element that is made of a low-resistance, low-TCR material. Further, when it is face-down mounted, it can distribute power to the resistive element while bypassing the end-face electrodes. Furthermore, the electrode section of the resistive element includes two layers, that is, the first and second electrode layers, and permits the use of an extremely small inductance setting. Consequently, the chip resistor can readily lower its resistance and improve TCR characteristics. In addition, the resistive element does not enter the primary division break groove in the large-size substrate when the chip resistor is manufactured. Therefore, even when the resistive element is made of a highly-ductile material containing copper, the chip resistor generates no burrs. Consequently, the primary division work can be smoothly performed to achieve excellent manufacturing yield. Moreover, when the chip resistor is mounted on a circuit board, the end-face electrodes create a solder fillet. This makes it easy to obtain required mounting strength.
Embodiments of the present invention will now be described with reference to the accompanying drawings.
The chip resistor 10 shown in the above figures is of a low-resistance, low-TCR type and is to be face-down mounted on a circuit board 30. This chip resistor 10 includes a ceramic substrate 11 that is shaped like a rectangular parallelepiped. Mounted on the lower surface of the ceramic substrate 11 are a resistive element 12 that is made mainly of a copper-nickel alloy, first and second electrode layers 13, 14 that form a two-layer structure and cover both longitudinal ends of the resistive element 12, and an insulating protective layer 15 for covering the resistive element 12 within a region that is not covered by the electrode layers 13, 14. The chip resistor 10 also includes upper electrodes 16 that are placed on both longitudinal ends of the upper surface of the ceramic substrate 11. End-face electrodes 17 bridge both electrode layers 13, 14 and upper electrodes 16 that are in the corresponding positions. Further, the second electrode layers 14 and both electrodes 16, 17 are covered by four plating layers 18-21.
The ceramic substrate 11 is an alumina substrate, which is one of a large number of substrates obtained by dividing a large-size substrate (not shown) vertically and horizontally. The resistive element 12 is provided in all regions except the peripheral border of the lower surface of the ceramic substrate 11. Both longitudinal ends of the resistive element 12 are covered by a pair of first electrode layers 13. The first electrode layers 13 are covered respectively by the second electrode layers 14. The first electrode layers 13 and second electrode layers 14 are of the same shape and overlap with each other. The first and second electrode layers 13, 14 form an electrode section for the resistive element 12. The first and second electrode layers 13, 14 are both made of a copper-based (or silver-based) highly conductive material and equal in film thickness. The protective layer 15 is made of insulating resin such as epoxy-based resin. Both ends of the protective layer 15 overlap with each second electrode layer 14. Although a pair of upper electrodes 16 and a pair of end-face electrodes 17 do not actually function as electrodes, they serve as a foundation layer for the plating layers 18-21, thereby contributing toward solder connection strength enhancement. The upper electrodes 16 are made of a copper-based (or silver-based) highly conductive material, whereas the end-face electrodes 17 are made of a nickel-chrome-based highly conductive material. As shown in
The manufacturing process for the chip resistor 10, which is configured as described above, will now be described mainly with reference to
First of all, copper-based (or silver-based) conductive paste is printed onto one surface of a large-size, multi-chip substrate (the upper surface of the ceramic substrate 11) and baked to form the upper electrodes 16 on both longitudinal ends of each chip area (the area enclosed by a two-dot chain line in
Subsequently, copper-based (or silver-based) conductive paste is printed onto a region covering both longitudinal ends of each resistive element 12 and baked to form the first electrode layers 13 as shown in
Next, as shown in
Next, the large-size substrate is divided into strips along a primary division break groove. Nickel chrome is then sputtered onto the exposed division surfaces of each substrate strip to form the end-face electrodes 17 whose both ends are closely attached to the first and second electrode layers 13, 14 and upper electrodes 16 as shown in
Subsequently, the substrate strips are divided into individual pieces along a secondary division break groove. The individual pieces are then sequentially subjected to electrolytic plating to form the four plating layers 18-21 as shown in
The chip resistor 10 manufactured as described above is face-down mounted with the first and second electrode layers 13, 14 placed on the wiring pattern 31 of the circuit board 30. Therefore, the protective layer 15, which covers the resistive element 12, faces the component side of the circuit board 30, and the tin-plating layer 21, which is the outermost layer of the chip resistor 10, is connected with solder 32 to a solder land 31a of the wiring pattern 31 to establish an electrical and mechanical connection. In this instance, the end-face electrodes 17, which are erect above the solder land 31a, form a solder fillet 32a. This sufficiently increases the mounting strength of the chip resistor 10 relative to the circuit board 30, thereby providing adequate reliability.
As described above, the chip resistor 10 according to the present embodiment includes a low-resistance, low-TCR resistive element 12. Further, when face-down mounted, this chip resistor 10 can distribute power to the resistive element 12 while bypassing the end-face electrodes 17. Furthermore, the electrode section for the resistive element 12 has a two-layer structure, which includes the first and second electrode layers 13, 14, to provide increased film thickness. Therefore, an extremely small inductance setting can be employed for the electrode section. Consequently, the chip resistor 10 can readily lower its resistance and improve TCR characteristics.
In addition, the resistive element 12 for the chip resistor 10 is placed on the lower surface of the ceramic substrate 11 and positioned within a region inside the peripheral border of the lower surface. Therefore, the resistive element 12 does not enter the primary division break groove in the large-size substrate during the manufacture of the chip resistor. Moreover, the first and second electrode layers 13, 14 are printed in such a manner that they do not enter the division break groove in the large-size substrate. Therefore, the chip resistor 10 makes it possible to smoothly perform primary division work and secondary division work and achieve excellent manufacturing yield.
Number | Date | Country | Kind |
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2005-274231 | Sep 2005 | JP | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/JP2006/318737 | 9/21/2006 | WO | 00 | 3/14/2008 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2007/034874 | 3/29/2007 | WO | A |
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4829553 | Shindo et al. | May 1989 | A |
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6356184 | Doi et al. | Mar 2002 | B1 |
6982624 | Saito et al. | Jan 2006 | B2 |
7098768 | Doi | Aug 2006 | B2 |
Number | Date | Country |
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10-144501 | May 1998 | JP |
2000-36401 | Feb 2000 | JP |
2002-353001 | Dec 2002 | JP |
Number | Date | Country | |
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20090108986 A1 | Apr 2009 | US |