Referring to
A software LS-DYNA is used for simulating stress distribution on the tin balls 30 when the PCB 10 suffers an impact. The simulating condition is set as follows: the semiconductor chip 20 is jointed on the center of the PCB 10; the initial velocity of the PCB 10 is 4.86 meters/second when the PCB 10 suffers an impact. An acceleration curve (shown in
According to the above table, the tin ball A at the corner of the array suffers maximal stress. The stress on the tin balls 30 significantly decreases through a second diagonal row of tin balls 30 away from the corner, and even more in third and fourth diagonal rows. When the semiconductor chip 20 is disposed on other places of the PCB 10, results of simulated impacts are generally same as aforesaid. That is, tin balls 30 located in corners of rectangular areas are easiest to be damaged when the PCB 10 suffers an impact. Therefore, in the design process of the semiconductor chip 20 in accordance with the embodiment of the present invention, solder spots 21 of the corners of the array are configured not to act as transmission conduits. Solder spots 21 of the second and/or third diagonal rows may be so configured as well. Thus, should the PCB 10 suffer an impact, chances that transmitting channels between the semiconductor chip 20 and the PCB 10 suffer damage are minimized or possibly eliminated.
Referring also to
It is to be understood, however, that even though numerous characteristics and advantages have been set forth in the foregoing description of preferred embodiments, together with details of the structures and functions of the preferred embodiments, the disclosure is illustrative only, and changes may be made in detail, especially in matters of shape, size, and arrangement of parts within the principles of the invention to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.