Clock signal and supply voltage variation tracking

Information

  • Patent Grant
  • 10193558
  • Patent Number
    10,193,558
  • Date Filed
    Tuesday, June 20, 2017
    7 years ago
  • Date Issued
    Tuesday, January 29, 2019
    5 years ago
Abstract
Embodiments disclosed herein provide an apparatus comprising a clock generation circuit configured to generate a first signal for a first time period and a second signal for a second time period, a charge pump circuit coupled to the clock generation circuit and configured to generate a first voltage and a second voltage based, at least in part, on the first time period and the second time period, and a comparison circuit coupled to the charge pump circuit, the comparison circuit configured to compare a difference between the first voltage and the second voltage with a threshold value and generate an active tracking enablement signal in response to determining that the difference between the first and second voltages exceeds the threshold value.
Description
BACKGROUND

Many synchronous semiconductor memories, such as dynamic random access memory (“DRAM”), operate using an input supply voltage and input system clock signal. When the system clock enters into the memory, the clock signal is typically delayed by the internal components of the memory. In order to compensate for the inherent delay in the memory, the memory must synchronize the internal, delayed clock signal with the system clock. Memories typically employ a clock circuit such as a delay locked loop (“DLL”) or a phase locked loop (“PLL”). The clock circuit adjusts the timing of internal clock relative to the external clock to account for the internal delay of the memory and ensures that the internal dock of the memory has a timing relative to the external clock so that memory operations, such providing data, receiving data, and receiving commands and address information, is in phase with the external clock of the system. Additionally, typical memories also include a duty cycle correction circuit (“DCC”) for generating an internal clock signal with a duty cycle of approximately 50%.


In ideal systems, where the external clock signal and the supply voltage are constant in time, a phase detector in the DLL compares the internal clock phase with the external clock phase in order to determine the proper phase delay to apply in providing the internal clock. In the ideal situation, the DLL could discontinue comparing the internal and external clock cycles once a lock is achieved and continue to apply the determined delay in order to lock the internal and external docks. The process of comparison and determining the necessary delay is typically known as “tracking.” However, external clocks are not ideal clocks because the frequency and duty cycle of the external clock are subject to change over time. Moreover, the magnitude of the supply voltage may also vary over time, causing circuit performance of circuits in the memory to vary as well. The result of these variations is that a determined delay which achieved a lock at one point in time may be insufficient or excessive to achieve a lock at a later point in time.


One way to compensate for the variations in the external clock is to leave DLL tracking on at all times. This method ensures that the internal and external clocks are always locked but is costly in terms of power consumption. Another approach would be to periodically enable DLL tracking based on the activity of the device. For example, DLL tracking may be enabled only when a read event occurs in the device. Periodic DLL tracking represents a lower power alternative to tracking all of the time, but this type of tracking is largely speculative and may enable DLL tracking when no tracking is needed or may fail to enable tracking even when the external clock or system power supply is particularly volatile.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a functional block diagram of a DLL tracking enablement circuit based on voltage variations, according to an embodiment of the invention.



FIG. 2 is a functional block diagram of a DLL tracking enablement circuit based on dock frequency variations, according to an embodiment of the invention.



FIG. 3 is a functional block diagram of a DCC tracking enablement circuit based on duty cycle variations, according to an embodiment of the invention.



FIG. 4 is a functional block diagram of a combination DLL and DCC tracking enablement circuit according to an embodiment of the invention.



FIG. 5 is a schematic diagram of a frequency divider according to an embodiment of the invention for use in a DLL and/or DCC tracking enablement circuit.



FIG. 6 is a schematic diagram of a non-overlapping clock generation circuit according to an embodiment of the invention for use in a DLL and/or DCC tracking enablement circuit.



FIG. 7 is a schematic diagram of a sense amplifier according to an embodiment of the invention for use in a DLL and/or DCC tracking enablement circuit.



FIG. 8 is a schematic diagram of a comparator circuit according to an embodiment of the invention for use in a DLL and/or DCC tracking enablement circuit.



FIG. 9 is a block diagram of a memory, according to an embodiment of the invention





DETAILED DESCRIPTION

Certain details are set forth below to provide a sufficient understanding of embodiments of the invention. However, it will be clear to one skilled in the art that embodiments of the invention may be practiced without these particular details. Moreover, the particular embodiments of the present invention described herein are provided by way of example and should not be used to limit the scope of the invention to these particular embodiments. In other instances, well-known circuits, control signals, timing protocols, and software operations have not been shown in detail in order to avoid unnecessarily obscuring the invention.


Embodiments of the disclosed circuits disclose low power DLL and/or DCC tracking circuits that monitor the signal clock and supply voltage for variations, for example, clock frequency, duty cycle, and/or supply voltage variations, and enable DLL and DCC tracking based on the variations. Enabling DLL and/or DCC tracking means that a DLL circuit and/or a DCC circuit is actively monitoring and modifying the dock signal in order to correct for phase and/or duty cycle distortion.


Embodiments of the present invention will now be described in detail with respect to the several drawings. FIG. 1 illustrates an apparatus 100 (e.g., an integrated circuit, a memory device, a memory system, an electronic device or system, a smart phone, a tablet, a computer, a server, etc.) according to an embodiment of the disclosure. Apparatus 100 includes a DLL tracking enablement circuit, generally designated 100, in accordance with an embodiment of the present invention. The DLL tracking enablement circuit 100 generally includes a clock generation circuit 102, a charge pump 104, and a comparison circuit 106.


In the embodiment of FIG. 1, the clock generation circuit 102 includes a non-overlapping clock generator 110. The non-overlapping clock generator 110 is an electronic circuit that receives a single clock signal as an input and outputs two discrete clock signals that are non-overlapping. That is, the output signals of the non-overlapping clock generator 110 do not have the same dock level (i.e., a high clock level, or a low clock level) at the same time. In various embodiments, the non-overlapping clock generator 110 receives the system clock, XCLK 108, as an input clock signal. The non-overlapping clock generator 110 outputs two non-overlapping clock signals, CLKA 112 and CLKB 114. An example non-overlapping clock generator is discussed in further detail below with respect to FIG. 6.


The charge pump 104 is an electronic circuit that outputs two signals, SensA 124 and SensB 126, which depend on the input clock signals, CLKA 112 and CLKB 114, and variations in a supply voltage 116. The charge pump 104 includes two parallel charging circuits, one for each of the non-overlapping clock signals CLKA 112 and CLKB 114. Each charging circuit includes a pass gate (e.g., pass gate 118A or 118B), a first capacitor (e.g., capacitor 120A or 120B), and a second capacitor (e.g., capacitor 122A or 122B). The first capacitor 120 and the second capacitor 122 of a charging circuit may be coupled as capacitor divider circuit. A supply voltage 116 is provided to each charging circuit. The supply voltage 116 may be the supply voltage for a memory, such as a DRAM. The pass gates 118A and 118B may be, for example, transistors that act as switches with CLKA 112 and CLKB 114 providing the control signals, respectively. The charging circuits are active when the respective non-overlapping clock signal CLKA 112 and CLKB 114 is at a high clock level. In various embodiments, the capacitors 120A and 120B have the same capacitance. Similarly, the capacitors 122A and 122B may have the same capacitance. Various embodiments may include greater or fewer capacitors. For each charging circuit, the supply voltage 116 is provided to a pass gate (i.e., pass gate 118A or pass gate 118B), which is coupled to a first capacitor (i.e., capacitor 120A or capacitor 120B). Capacitors 120A and 120B may each be coupled to a second capacitor (i.e., capacitors 122A and 122B, respectively), which may then be fed to ground.


When CLKA 112 is at a high clock level, the charging circuit including capacitors 120A and 122A is active, and the pass gate 118A forms a closed switch which allows current to flow from the supply voltage 116 and charge the capacitors 120A and 122A. As the capacitors charge, an output voltage signal SensA 124 is generated by the charging circuit. The output voltage signal SensA 124 is proportional to the supply voltage 116 during the time that the charging circuit is active. Similarly, when CLKB 114 is at a high clock level, the charging circuit including capacitors 120B and 122B is active, and the pass gate 118B forms a closed switch which allows current to flow from the supply voltage 116, charging the capacitors 120B and 122B. As the capacitors charge, an output voltage signal SensB 126 is generated by the charging circuit. The output voltage signal SensB 126 is proportional to the supply voltage 116 during the time that the charging circuit is active. As previously discussed, CLKA 112 and CLKB 114 are non-overlapping clock signals. As a result, SensA 124 and SensB 126 represent signals that are proportional to the supply voltage 116 taken over non-overlapping time periods. Accordingly, if the supply voltage 116 varies between the time period during which SensA 124 is generated and the time period during which SensB 126 is generated, that variation will be manifested as a voltage differential between SensA 124 and SensB 126.


In the embodiment of FIG. 1, the comparison circuit 106 receives as inputs SensA 124 and SensB 126. The comparison circuit 106 is configured to determine a voltage difference between the input signals, and compare the voltage difference to a threshold value in order to determine whether DLL tracking should be enabled. In the embodiment of FIG. 1, the comparison circuit 106 includes a sense amplifier 128, comparators 134A and 134B, a NOR gate 138 and an inverter 140. The sense amplifier 128 may be any type of sense amplifier capable of proportionally amplifying the voltages of SensA 124 and SensB 126 relative to one another. The sense amplifier 128 may output two amplified voltage signals VAH 130 and VBH 132, which are proportional to SensA 124 and SensB 126, respectively.


The comparators 134A and 134B may be any comparison circuits capable of determining a difference between two voltages (e.g., VAH 130 and VBH 132) and determining whether the difference between the two voltages exceeds a predetermined threshold value. The comparators 134A and 134B may include static or adaptive hysteresis which may encourage or discourage the enablement or disablement of DLL tracking depending on past states of the comparator. As will be appreciated by one skilled in the art, in embodiments in which comparators 134A and 134B have adaptive hysteresis, a hysteresis control signal 136 may be used to control the hysteresis. For example, hysteresis control signal 136 may provide an analog or digital weighting factor which can favor or disfavor the activation or deactivation of tracking enablement 142 by altering the threshold value. In the embodiment of FIG. 1, the comparison circuit 106 includes two comparators 134A and 134B. The comparators 134A and 134B may each receive as inputs VAH 130 and VBH 132. One of the comparators (e.g., comparator 134A) may compare the voltage difference of VAH 130 subtracted from VBH 132 with the threshold value. If the comparator 134A determines that the difference between VBH 132 and VAH 130 is greater than the threshold value, then the comparator 134A may output a signal indicating that DLL tracking should be enabled. The second comparator (e.g., comparator 134B) may compare the voltage difference of VBH 132 subtracted from VAH 130 with the threshold value. If comparator 134B determines that the difference between VAH 130 and VBH 132 is greater than the threshold value, then the comparator 134B outputs a signal indicating that DLL tracking should be enabled. By comparing the differences between VAH 130 and VBH 132 with two parallel comparators as described above, the comparison circuit 106 can ensure that DLL tracking is enabled in the event of a positive or negative voltage variation exceeding the threshold value. An example comparator circuit is discussed in more detail below with respect to FIG. 8.


The NOR gate 138 and the inverter 140 are used to provide a tracking enable signal 142 that may be used to enable tracking in response to receiving a signal indicating that the one of the differences between the signals VAH 130 and VBH 132 exceeds the threshold value. Accordingly, DLL tracking is enabled when the comparison circuit 106 determines that the supply voltage 116 has drifted a sufficient (greater than the threshold value) amount over a certain time period determined by CLKA 112 and CLKB 114. When tracking enable signal 142 is active, DLL tracking is enabled and actively monitors and modifies the clock signal in order to account for phase variations in the input clock signal. Tracking enable signal 142 may be provided to, for example, a DLL control circuit which may provide control information to the DLL and manage the delay applied to an input clock signal.



FIG. 2 is a functional block diagram of a DLL tracking enablement circuit according to an embodiment of the invention, generally designated 200, based on clock frequency variations. The DLL tracking enablement circuit 200 may generally include a clock generation circuit 202, a charge pump 204, and a comparison circuit 206.


The clock generation circuit 202 may include a frequency divider 244 and a non-overlapping clock generator 210. The clock generation circuit 202 receives a dock signal XCLK 208, which may be, for example, the external system clock of a DRAM device. In various embodiments, XCLK 208 may be implemented in similar ways as XCLK 108 as described above with respect to FIG. 1. The frequency divider 244 is an electronic circuit that receives XCLK 208 as an input and outputs a periodic clock signal to the non-overlapping clock generator 210. In various embodiments, the dock signal output by the frequency divider 244 has a frequency that is less than the frequency of XCLK 208. In various embodiments, the frequency divider 244 may be, for example, a configurable 2N divider. In general, the frequency divider 244 may be any integer divider, and may include a duty cycle correction circuit if the frequency divider 244 divides XCLK 208 by an odd integer. The non-overlapping clock generator 210 may be implemented in the same manner as the non-overlapping clock generator 110 as described above with respect to FIG. 1. The non-overlapping dock generator 210 receives the frequency divided clock signal from the frequency divider 244 and generates non-overlapping clock signals CLKA 212 and CLKB 214. A sample non-overlapping clock generation circuit is discussed in further detail below with respect to FIG. 6.


In the embodiment of FIG. 2, the frequency divider 244 reduces the frequency of XCLK 208. Accordingly, a single clock cycle output by the frequency divider 244 corresponds to an integer multiple of XCLK 208 clock cycles. As noted above, the exact frequency of clock cycles of XCLK 208 may vary with time. Such variations are included in the clock cycle output by the frequency divider 244. Therefore, CLKA 212 and CLKB 214 generated by the non-overlapping clock generator 210 represent the time for multiple cycles of XCLK 208 taken at different points in time. For example, one cycle of CLKA 212 may represent the time that passed during 2N cycles of XCLK 208 beginning at a time t1. Similarly, one cycle of CLKB 214 may represent the time that passed during 2N cycles of XCLK 208 beginning at time t2. Because CLKA 212 and CLKB 214 represent the same number of cycles of XCLK 208 and the frequency of XCLK 208 is variable with time, the periods of CLKA 212 and CLKB 214 may be different. That is, CLKA 212 and CLKB 214 have different periods because the frequency of XCLK 208 may have changed between and/or during the times that divider 244 generated the divided clock signal.


The charge pump 204 is an electronic circuit for providing two comparable signals whose voltages depend on CLKA 212 and CLKB 214. The charge pump 204 receives CLKA 212 and CLKB 214 as input signals and outputs two signals SensA 224 and SensB 226 with voltages proportional to the periods of CLKA 212 and CLKB 214, respectively. In various embodiments, charge pump 204 includes two charging circuits. Each charging circuit includes a constant current source 216 coupled to a pass gate (i.e., pass gate 218A or 218B). The pass gates 218A and 218B may be coupled to capacitors 220A and 220B, respectively. Capacitors 220A and 220B may be coupled to capacitors 222A and 222B, respectively, which are coupled to ground. Output signals SensA 224 and SensB 226 may be generated between capacitors 220A and 222A and between capacitors 220B and 222B, respectively.


Each charging circuit generates an output signal (e.g., SensA 224 or SensB 226) during the time period that the respective input signal (e.g., CLKA 212 or CLKB 214) has a high clock level. When CLKA 212 has a high clock level, the pass gate 218A allows current to flow from the constant current source 216 through the charging circuit. During the time that CLKA 212 has a high clock level, the capacitor 220A will accumulate charge and develop a voltage differential according to the relationship







V
=


I
+
t

C


,





where l is the constant current provided by the constant current source 216, t is the time period during which CLKA 212 has a high clock level, and C is the capacitance of the capacitor 220A. As one skilled in the art will appreciate, the output signal SensA 224 will have a voltage proportional to the voltage across the capacitor 220A, which is proportional to the time period, t, during which CLKA 212 has a high clock level. Accordingly, the voltage of the output signal SensA 224 is also proportional to the time period during which CLKA 212 has a high dock level. The second charging circuit, which includes the constant current source 216, the pass gate 218B, and the capacitors 220B and 222B, operates in an analogous manner to the first charging circuit. Accordingly, the output signal SensB 226 is proportional to the time period during which the input clock signal CLKB 214 has a high clock level. As noted above, CLKA 212 and CLKB 214 may be active for different lengths of time if the frequency of XCLK 208 changes between or during the sample times over which CLKA 212 and CLKB 214 were generated by the frequency divider 244. Therefore, a change in the clock frequency of XCLK 208 between or during the sample times of CLKA 212 and CLKB 214 is proportionally reflected as a voltage difference between SensA 224 and SensB 226.


The comparison circuit 206 is an electronic circuit that amplifies and compares the differences between SensA 224 and SensB 226 with a threshold value. The comparison circuit 206 generally includes a sense amplifier 228, comparators 234A and 234B, NOR gate 238 and inverter 240. In various embodiments, comparison circuit 206 may be substantially the same as comparison circuit 106, as described above with respect to FIG. 1. The sense amplifier 228 receives SensA 224 and SensB 226 as input signals, proportionally amplifies the voltages of the received signals, and outputs signals VAH 230 and VBH 232. An example sense amplifier circuit is discussed below with respect to FIG. 7.


The comparators 234A and 234B may compare the differences between VAH 230 and VBH 232 with a threshold value and outputs a respective signal indicative of whether the difference exceeds the threshold value. For example, one of the comparators (e.g., comparator 234A) compares the voltage difference of VAH 230 subtracted from VBH 232 with a threshold value. If the comparator 234A determines that the difference between VBH 232 and VAH 230 is greater than the threshold value, then comparator 234A may output a signal indicating that DLL tracking should be enabled. The second comparator (e.g., comparator 234B) compares the voltage difference of VBH 232 subtracted from VAH 230 with the threshold value. Similarly, if the comparator 234B determines that the difference between VAH 230 and VBH 232 is greater than the threshold value, then the comparator 234B outputs a signal indicating that DLL tracking should be enabled. By comparing the differences between VAH 230 and VBH 232 with two parallel comparators as described above, the comparison circuit 206 ensures that DLL tracking is enabled in the event of an increased or decreased clock frequency variation exceeding the threshold value.


The comparators 234A and 234B may include static or adaptive hysteresis which may encourage or discourage the enablement of DLL tracking depending on past states of the comparator. In various embodiments in which comparators 234A and 234B have adaptive hysteresis, a hysteresis control signal 236 may be used to control the hysteresis, as will be appreciated by one skilled in the art. An example comparator circuit implementing static hysteresis is discussed in more detail below with respect to FIG. 8.


The NOR gate 238 and the inverter 240 are used to provide tracking enable signal 242 that may be used to enable tracking in response to receiving a signal from one of the comparators (234A or 234B) indicating that the one of the differences between signals VAH 230 or VBH 232 exceeds the threshold value. Accordingly, DLL tracking is enabled when the comparison circuit 106 determines that the clock frequency of XCLK 208 has drifted a sufficient (greater than the threshold value) amount over a certain time period, as determined by CLKA 212 and CLKB 214, and the tracking enable signal 242 is active.


The embodiment of FIG. 2 may be modified in order to monitor both voltage variations (as described with respect to the embodiment of FIG. 1) and clock frequency variations. In order to monitor both voltage variations and clock frequency variations, the constant current source 216 may be replaced with the supply voltage of the memory, such as supply voltage 116 in FIG. 1. In such embodiments, the current of the supply voltage depends upon the variable voltage of the supply. In this embodiment, it is possible for a change in supply voltage and a change in clock frequency to offset each other, in which case DLL tracking would not be enabled.



FIG. 3 is a functional block diagram of a DCC tracking enablement circuit according to an embodiment of the invention, generally designated 300. The DCC tracking enablement circuit 300 generally includes a clock generation circuit 302, a charge pump 304, and a comparison circuit 306.


The clock generation circuit 302 includes a frequency divider 344, an AND gate 338, and an AND gate 340. The clock generation circuit 302 receives a clock signal XCLK 308 and a clock signal XCLKF 310. In various embodiments, XCLK 308 may be the system clock and XCLKF 310 may be the same as XCLK 308, but with a phase delay relative to XCLK 308. In certain embodiments, XCLK 308 and XCLKF 310 may be complimentary signals. However, as will be appreciated by one skilled in the art, overlap may exist as a result of duty cycle variation in the input clock signals XCLK 308 and XCLKF 310. XCLK 308 and XCLKF 310 are provided to the frequency divider 344. The frequency divider 344 may be any frequency divider or counter circuit capable of receiving a periodic signal as an input and outputting a periodic signal having a reduced frequency. In various embodiments, the frequency divider 344 may be implemented in a similar manner to frequency divider 244 as discussed above with respect to FIG. 2. The output of the frequency divider 344 defines the time period over which duty cycle variation is being sampled. The AND gate 338 receives as inputs XCLK 308 and the output of the frequency divider 344. The AND gate 338 generates an output signal CLKH 314 which has a high clock level when, during the sample period defined by the output of the frequency divider 344, XCLK 308 has a high clock level. Accordingly, the time during which CLKH has a high clock level is proportional to the duty cycle of XCLK 308 during the sample period. The AND gate 340 receives as inputs XCLKF 310 and the output of the frequency divider 344. The AND gate 340 outputs a signal CLKL 316 that has a high clock level when, during the sample period defined by the output of the frequency divider 344, CLKF has a high clock level. When XCLK 308 and XCLKF 310 are complimentary signals, CLKL 316 is proportional to the time during the sample period that XCLK 308 has a low clock level (i.e. the compliment of the duty cycle of XCLK 308). In other words, either CLKH or CLKL will be active during the sample period, but CLKH and CLKL are not active at the same time.


The charge pump 304 includes a current source 316, pass gates 318A and 318B, and capacitors 320A, 320B, 322A and 3228. In various embodiments, the charge pump 304 may be implemented in a similar manner as charge pumps 104 and 204 as described above with respect to FIGS. 1 and 2. However, because CLKH and CLKL are proportional to the duty cycle of XCLK 308, the time during which the two charging circuits of the charge pump 304 are active is also proportional to the duty cycle of XCLK 308. The charge pump 304 outputs two signals, SensH 324 and SensL 326, which have voltages that are proportional to the high clock level portion and the low clock level portion of XCLK 308 during the sample time, respectively.


The comparison circuit 306 receives as inputs SensH 324 and SensL 326 and generally includes a sense amplifier 328 and a comparator 334. The comparison circuit 306 may be implemented in a similar manner as comparison circuits 106 and 206 as described above with respect to FIGS. 1 and 2. Sense amplifier 328 may proportionally amplify SensH 324 and SensL 326 to generate VAH 330 and VBH 332. Comparator 334 may compare a difference between VAH 330 and VBH 332 with a threshold value and output an active or inactive tracking enable signal 342 having a logic level indicative of whether the difference between VAH 330 and VBH 332 exceeds a threshold value. The comparator 334 may include static or adaptive hysteresis, which may be controlled by hysteresis control signal 336. As will be appreciated by those skilled in the art, a determination by the comparator 334 that the difference between VAH 330 and VBH 332 exceeds a threshold value indicates that the duty cycle of XCLK 308 has departed from the ideal 50% by more than a threshold value, and therefore a DCC correction circuit should be enabled to correct for the duty cycle variation. The tracking enable signal 342 may be provided, for example, to a DCC control circuit capable of managing a duty cycle correction applied to an input clock signal.



FIG. 4 is a functional block diagram of a combination DLL and DCC tracking enablement circuit according to an embodiment of the invention, generally designated 400. The DLL and DCC tracking enablement circuit 400 includes clock generation circuits 402 and 414, charge pumps 404 and 416, and comparison circuits 406 and 418. The DLL and DCC tracking enablement circuit 400 receives a dock signal, XCLK 408, and a clock signal, XCLKF 412 as inputs. The DLL and DCC tracking enablement circuit 400 outputs a DLL tracking enable signal 410 and a DCC tracking enable signal 420. The clock generation circuit 402 may be implemented in the same manner as clock generation circuit 102 or 202 as described above with respect to FIGS. 1 and 2, respectively. Clock generation circuit 414 may be implemented in the same manner as clock generation circuit 302 as described above with respect to FIG. 3. Charge pumps 404 and 416 may be implemented in the same manner as charge pumps 104, 204, and 304 as described above with respect to FIGS. 1-3. Comparison circuits 406 and 418 may be implemented in the same manner as comparison circuits 106, 206, and 306 as described above with respect to FIGS. 1-3. The DLL and DCC tracking enablement circuit 400 provides a customizable composite circuit for determining whether to enable DLL and/or DCC tracking. The embodiment of FIG. 4 recognizes that it may be desirable to have different voltage comparison threshold values or different frequency dividers between the DLL tracking enablement circuit and the DCC tracking enablement circuit. Accordingly, the embodiment of FIG. 4 provides a parallel configuration which allows for customized circuit components between the DLL tracking enablement circuit and the DCC tracking enablement circuit.



FIG. 5 is a schematic diagram of an example 2N frequency divider circuit according to an embodiment of the invention, generally designated 500. The frequency divider circuit 500 may be used in a DLL and/or DCC tracking enablement circuit. Frequency divider circuit 500 generally includes a number, N, of D flip-flops 504 which are linked together in serial such that the inverted output of one D flip-flop 504 provides the clock signal of the following D flip-flop 504. The output of each D flip-flop 504 has a frequency equal to the frequency of the input dock divided by a power of two. In certain embodiments, the frequency divider 500 has a division period of less than 256 cycles (i.e., a 28 division). In various embodiments, frequency divider 500 may be implemented as frequency divider 244 or 344 as described above with respect to FIGS. 2 and 3. Other frequency divider circuits are possible without departing from the scope of the present disclosure.



FIG. 6 is a schematic diagram of a non-overlapping clock generation circuit according to an embodiment of the invention, generally designated 600. The non-overlapping clock generation circuit may be used in a DLL and/or DCC tracking enablement circuit. As will be appreciated by one skilled in the art, the clock generation circuit 600 generally receives a periodic clock signal XCLK 602 and generates two non-overlapping clock signals CLKA 604 and CLKB 606 using NAND gates and inverters with feedback. In various embodiments, clock generator 600 may be implemented as non-overlapping clock generators 110 and 210 as discussed above. Clock generator 600 represents an example clock generator. Those skilled in the art will recognize that other possible non-overlapping clock generation circuits may be used without departing from the scope of this disclosure.



FIG. 7 is a schematic diagram of a sense amplifier according to an embodiment of the invention, generally designated 700. The sense amplifier 700 may be used in a DLL and/or DCC tracking enablement circuit. In various embodiments, sense amplifier 700 may be implemented as sense amplifier 128, 228, and/or 328, as described above with respect to FIGS. 1-3. As will be appreciated by one skilled in the art, sense amplifier 700 receives two input signals SensA 702 and SensB 704, proportionally amplifies each input signal through two identical amplifier circuits, and outputs two output signals VAH 706 and VBH 708. SensA 702 may be implemented as SensA 124, 224, and/or SensH 324, as discussed above with respect to FIGS. 1-3. Similarly, SensB 704 may be implemented as SensB 126, 226, and/or SensL 326, as discussed above with respect to FIGS. 1-3. VAH 706 may be implemented as VAH 130, 230, and/or 330, as discussed above with respect to FIGS. 1-3. Similarly, VBH 708 may be implemented as VAH 132, 232, and/or 332, as discussed above with respect to FIGS. 1-3. The sense amplifier 700 represents an example sense amplifier. Those skilled in the art will recognize that other possible sense amplifiers may be used without departing from the scope of this disclosure.



FIG. 8 is a schematic diagram of a comparator circuit according to an embodiment of the invention, generally designated 800. The comparator circuit 800 may be used in a DLL and/or DCC tracking enablement circuit. In various embodiments, comparator 800 may be implemented as one or more of comparators 134A, 134B, 234A, 234B, or 334. As shown in FIG. 8, comparator 800 may be a differential comparator having two pairs of transistors 808 and 810. As will be appreciated by one skilled in the art, by varying the relative strengths of transistor pairs 808 and 810, a static hysteresis may be applied to the comparator 800. The comparator compares the difference between the input signals VAH 802 and VBH 804 to a predetermined threshold value and outputs a tracking enable signal 806 if the comparator 800 determines that the difference between VAH 802 and VBH 804 exceeds the threshold value. In other embodiments, the comparator 800 may include a feedback loop and/or a hysteresis control signal which allow for adaptive hysteresis capabilities. By using adaptive hysteresis, the comparator 800 may reduce the frequency with which tracking is enabled and therefore reduce the power consumed by a DLL, a DCC correction circuit, or both. The comparator 800 represents an example comparator. Those skilled in the art will recognize that other possible comparators may be used without departing from the scope of this disclosure.



FIG. 9 is a block diagram of a memory, according to an embodiment of the invention. The memory 900 may include an array 902 of memory cells, which may be, for example, volatile memory cells (e.g., dynamic random-access memory (DRAM) memory cells, static random-access memory (SRAM) memory cells), non-volatile memory cells (e.g., flash memory cells), or some other types of memory cells. The memory 900 includes a command decoder 906 that may receive memory commands through a command bus 908 and provide (e.g., generate) corresponding control signals within the memory 900 to carry out various memory operations. For example, the command decoder 906 may respond to memory commands provided to the command bus 908 to perform various operations on the memory array 902. In particular, the command decoder 906 may be used to provide internal control signals to read data from and write data to the memory array 902. Row and column address signals may be provided (e.g., applied) to an address latch 910 in the memory 900 through an address bus 920. The address latch 910 may then provide (e.g., output) a separate column address and a separate row address.


The address latch 910 may provide row and column addresses to a row address decoder 922 and a column address decoder 928, respectively. The column address decoder 928 may select bit lines extending through the array 902 corresponding to respective column addresses. The row address decoder 922 may be connected to a word line driver 924 that activates respective rows of memory cells in the array 902 corresponding to received row addresses. The selected data line (e.g., a bit line or bit lines) corresponding to a received column address may be coupled to a read/write circuitry 930 to provide read data to an output data buffer 934 via an input-output data path 940. Write data may be provided to the memory array 902 through an input data buffer 944 and the memory array read/write circuitry 930.


The memory 900 may include a clock generator 916 that includes a delay circuit 914. The delay circuit 914 provides an output clock signal OUT 912 signal that may be used for clocking circuitry of the memory 900. The delay circuit 914 may include one or more tracking enablement circuits 917, which can be activated by a tracking enable signal 918, according to embodiments of the invention. For example, the delay circuit 914 may include a tracking enablement circuit 917 in accordance with any of the previously described embodiments with reference to FIGS. 1-4.


Those of ordinary skill would further appreciate that the various illustrative logical blocks, configurations, modules, circuits, and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software executed by a processor, or combinations of both. Various illustrative components, blocks, configurations, modules, circuits, and steps have been described above generally in terms of their functionality. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present disclosure.


In the embodiment of FIGS. 1-4, the variation of frequency and/or the duty cycle of the input clock signal 108, 208, 308, 310, 408 or 412 are translated into the variation of signal voltage level of the output signals SENSA, SENSB, SENSH or SENSL. The signal voltage level is stored in the capacitors 122A, 122B, 222A, 222B, 322A, 322B as signal information based on a corresponding time period of the input clock signal 108, 208, 308, 310, 408 or 412. The signal information stored in the capacitors may also include the variation of supply voltage level of the power supply voltage source VPERI 116, 216 or 316. The comparison circuit 106, 206, 306, 406, 418 in FIGS. 1-4 is coupled to the capacitors as storage elements and configured to provide a control signal. The control signal may include a tracking enable signal 142, 242, 342, 410, and/or 420. Those skilled in the art will appreciate that the comparison circuit 106, 206, 306, 406, 418 may be constructed of a logic circuit though the comparison circuit in FIG. 7 or FIG. 8 is constructed by an analogue circuit.


The embodiment may include steps of monitoring a signal information, such as a variation of supply voltage of the power source, a variation of a frequency and/or a duty cycle of input dock signal, detecting whether the signal information exceeds a predetermined value, and providing a tracking enable signal enabling a tracking enablement circuit, such as a DLL tracking circuit and a duty cycle tracking circuit, if the signal information exceeds the predetermined value.


The comparison circuit may be called a control circuit which can provide a control signal based on two signal information. The control signal can include an active tracking enablement signal enabling an active tracking circuit such as a DLL tracking circuit and a duty cycle tracking circuit. One of the two signal information may be information obtained by monitoring a status such as the voltage source, the frequency or the duty cycle of the input clock signal. The other of the two signal information may be reference information such as a predetermined value or an average value obtained during a predetermined period. Moreover, in the embodiment of FIGS. 1 and 2, the comparison circuit 106, 206 includes the two comparators 134A and 134B, 234A and 234B, respectively, however, those skilled in the art will appreciate that the comparison circuit 106, 206 may be constructed of single comparator with hysteresis control, respectively, like the comparison circuit 306 in FIG. 3.


The previous description of the disclosed embodiments is provided to enable a person skilled in the art to make or use the disclosed embodiments. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the principles defined herein may be applied to other embodiments without departing from the scope of the disclosure. Thus, the present disclosure is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope possible consistent with the principles and novel features as previously described.

Claims
  • 1. An apparatus comprising: a first tracking enablement circuit configured to enable a delay-locked loop tracking circuit based on a variation in a voltage output of a voltage source, a variation in a frequency of an input clock signal, or combinations thereof; anda second tracking enablement circuit configured to enable a duty cycle correction circuit based on a variation in a duty cycle of the input clock signal.
  • 2. The apparatus of claim 1, wherein each of the first and second tracking enablement circuits comprises: a clock generation circuit configured to generate a first signal for a first time period and a second signal for a second time period based, at least in part, on the input clock signal;a charge pump circuit coupled to the clock generation circuit and configured to generate a first voltage and a second voltage based, at least in part, on the first signal and the second signal; anda comparison circuit coupled to the charge pump circuit, the comparison circuit configured to compare a difference between the first voltage and the second voltage with a threshold value and generate an active tracking enablement signal in response to determining that the difference between the first and second voltages exceeds the threshold value.
  • 3. The apparatus of claim 1, wherein the first tracking enablement circuit is further configured to disable the delay locked loop tracking circuit; andwherein the second tracking enablement circuit is further configured to disable the duty cycle correction circuit.
  • 4. An apparatus comprising: a first circuit configured, when enabled, to perform a delay locked loop (DLL) operation;a second circuit configured, when enabled, to perform a duty cycle correction (DCC) operation;a first tracking enablement circuit configured to produce a first voltage based on a signal related to the DLL operation, the first tracking enablement circuit being further configured to enable the first circuit when a variation of the first voltage exceeds a first threshold value; anda second tracking enablement circuit configured to produce a second voltage based on a signal related to the DCC operation, the second tracking enablement circuit being further configured to enable the second circuit when a variation of the second voltage exceeds a second threshold value.
  • 5. The apparatus of claim 4, wherein each of the first and second tracking enablement circuits comprises: a clock generation circuit configured to generate a first signal and a second signal responsive to a corresponding one of the signal related to the DLL operation and the signal related to the DCC operation, the first signal and the second signal being non-overlapping, periodic signals;a charge pump circuit coupled to the clock generation circuit and configured to generate a corresponding one of the first voltage and the second voltage responsive, at least in part, to the first signal and the second signal; anda comparison circuit coupled to the charge pump circuit, the comparison circuit configured to compare the corresponding one of the first voltage and the second voltage with a corresponding one of the first and second threshold values.
  • 6. The apparatus of claim 5, wherein each of the first voltage and the second voltage comprises a first sense voltage and a second sense voltage responsive, at least in part; to the first signal and the second signal, respectively; and wherein the comparison circuit is configured to compare a difference between the first sense voltage and the second sense voltage with the corresponding one of the first and second threshold values.
  • 7. The apparatus of claim 6, wherein the charge pump circuit comprises a first charging circuit and a second charging circuit.
  • 8. The apparatus of claim 7, wherein each of the first and second charging circuits comprises: a pass gate configured to be coupled to a power supply voltage and further configured to allow current to flow from the power supply voltage based, at least in part, on a corresponding one of the first signal and the second signal; andone or more capacitors configured to be charged in response to the pass gate allowing current to flow from the power supply voltage.
  • 9. The apparatus of claim 8, wherein the first sense voltage is generated by the first charging circuit and wherein the second sense voltage is generated by the second charging circuit.
  • 10. The apparatus of claim 5, wherein the clock generation circuit comprises a non-overlapping clock generator.
  • 11. The apparatus of claim 10, wherein the clock generation circuit comprises a frequency divider, the frequency divider being coupled to the non-overlapping clock generator.
  • 12. The apparatus of claim 5, wherein the comparison circuit represents at least one of static hysteresis and adaptive hysteresis.
  • 13. A method comprising: enabling, responsive to assertion of a first active signal, a first circuit to allow the first circuit to perform a delay locked loop (DLL) operation;enabling, responsive to assertion of a second active signal, a second circuit to allow the second circuit to perform a duty cycle correction (DCC) operation;producing a first voltage based on a signal related to the DLL operation;producing a second voltage based on a signal related to the DCC operation;asserting the first active signal when a variation of the first voltage exceeds a first threshold value; andasserting the second active signal when a variation of the second voltage exceeds a second threshold value.
  • 14. The method of claim 13, wherein the producing the first voltage comprises: generating a first signal and a second signal responsive to the signal related to the DLL operation, the first signal and the second signal being non-overlapping, periodic signals, andgenerating the first voltage responsive, at least in part, to the first signal and the second signal; andwherein the producing the second voltage comprises: generating a third signal and a fourth signal responsive to the signal related to the DCC operation, the third signal and the fourth signal being non-overlapping, periodic signals, andgenerating the second voltage responsive, at least in part, to the third signal and the fourth signal.
  • 15. The method of claim 14, wherein the generating the first voltage comprises generating a first sense voltage and a second sense voltage responsive, at least in part, to the first signal and the second signal, respectively; andwherein the generating the second voltage comprises generating a third sense voltage and a fourth sense voltage responsive, at least in part, to the third signal and the fourth signal, respectively.
  • 16. The method of claim 15, wherein the asserting the first active signal comprises comparing a difference between the first sense voltage and the second sense voltage with the first threshold value; andwherein the asserting the second active signal comprises comparing a difference between the third sense voltage and the fourth sense voltage with the second threshold value.
CROSS-REFERENCE TO RELATED APPLICATION

This application is a divisional of U.S. patent application Ser. No. 14/736,005, filed Jun. 10, 2015, and issued as U.S. Pat. No. 9,813,067 on Nov. 7, 2017. The aforementioned application and patent are incorporated by reference herein, in their entirety, and for all purposes.

US Referenced Citations (238)
Number Name Date Kind
4644248 Brennen et al. Feb 1987 A
5004933 Widener Apr 1991 A
5610558 Mittel et al. Mar 1997 A
5935253 Conary et al. Aug 1999 A
6111810 Fujita Aug 2000 A
6219384 Kliza et al. Apr 2001 B1
6260128 Ohshima et al. Jul 2001 B1
6275077 Tobin et al. Aug 2001 B1
6292040 Iwamoto et al. Sep 2001 B1
6327318 Bhullar et al. Dec 2001 B1
6424592 Maruyama Jul 2002 B1
6438055 Taguchi et al. Aug 2002 B1
6459313 Godbee et al. Oct 2002 B1
6489823 Iwamoto Dec 2002 B2
6510095 Matsuzaki et al. Jan 2003 B1
6636110 Ooishi et al. Oct 2003 B1
6687185 Keeth et al. Feb 2004 B1
6710726 Kim et al. Mar 2004 B2
6744285 Mangum et al. Jun 2004 B2
6759881 Kizer et al. Jul 2004 B2
6781861 Gomm et al. Aug 2004 B2
6839288 Kim et al. Jan 2005 B1
6861901 Prexl et al. Mar 2005 B2
6868504 Lin Mar 2005 B1
6885252 Hsu Apr 2005 B2
6914798 Kwon et al. Jul 2005 B2
6930955 Johnson et al. Aug 2005 B2
6973008 Krause Dec 2005 B2
6980479 Park Dec 2005 B2
6988218 Drexler Jan 2006 B2
7042799 Cho May 2006 B2
7046060 Minzoni et al. May 2006 B1
7058799 Johnson Jun 2006 B2
7061941 Zheng Jun 2006 B1
7065001 Johnson et al. Jun 2006 B2
7111185 Gomm et al. Sep 2006 B2
7119591 Lin Oct 2006 B1
7158443 Lin Jan 2007 B2
7170819 Szczypinski Jan 2007 B2
7187599 Schnell et al. Mar 2007 B2
7209396 Schnell Apr 2007 B2
7248512 Shin Jul 2007 B2
7268605 Fang et al. Sep 2007 B2
7269754 Ramaswamy et al. Sep 2007 B2
7280430 Lee Oct 2007 B2
7319728 Bell et al. Jan 2008 B2
7336752 Vlasenko et al. Feb 2008 B2
7340632 Park Mar 2008 B2
7355464 Lee Apr 2008 B2
7375560 Lee et al. May 2008 B2
7411852 Nishioka et al. Aug 2008 B2
7428284 Lin Sep 2008 B2
7443216 Gomm et al. Oct 2008 B2
7451338 Lemos Nov 2008 B2
7463534 Ku et al. Dec 2008 B2
7489172 Kim Feb 2009 B2
7509517 Matsumoto et al. Mar 2009 B2
7541851 Gomm et al. Jun 2009 B2
7580321 Fujisawa et al. Aug 2009 B2
7590013 Yu et al. Sep 2009 B2
7593273 Chu et al. Sep 2009 B2
7609584 Kim et al. Oct 2009 B2
7616040 Motomura Nov 2009 B2
7631248 Zakharchenko et al. Dec 2009 B2
7643334 Lee et al. Jan 2010 B1
7656745 Kwak Feb 2010 B2
7660187 Johnson et al. Feb 2010 B2
7663946 Kim Feb 2010 B2
7671648 Kwak Mar 2010 B2
7675439 Chang et al. Mar 2010 B2
7675791 Kim Mar 2010 B2
7698589 Huang Apr 2010 B2
7715260 Kuo et al. May 2010 B1
7716510 Kwak May 2010 B2
7751261 Cho Jul 2010 B2
7773435 Cho Aug 2010 B2
7822904 LaBerge Oct 2010 B2
7826305 Fujisawa Nov 2010 B2
7826583 Jeong et al. Nov 2010 B2
7872924 Ma Jan 2011 B2
7876640 Lin Jan 2011 B2
7885365 Hagleitner et al. Feb 2011 B2
7913103 Gold et al. Mar 2011 B2
7928782 Booth et al. Apr 2011 B2
7945800 Gomm et al. May 2011 B2
7948817 Coteus et al. May 2011 B2
7969813 Bringivijayaraghavan et al. Jun 2011 B2
7970090 Tetzlaff Jun 2011 B1
7983094 Roge et al. Jul 2011 B1
8004884 Franceschini et al. Aug 2011 B2
8018791 Kwak Sep 2011 B2
8030981 Kim Oct 2011 B2
8115529 Shibata Feb 2012 B2
8116415 Wada et al. Feb 2012 B2
8144529 Chuang et al. Mar 2012 B2
8321714 Wu et al. Nov 2012 B2
8358546 Kim et al. Jan 2013 B2
8392741 Kim et al. Mar 2013 B2
8441888 Bringivijayaraghavan et al. May 2013 B2
8509011 Bringivijayaraghavan Aug 2013 B2
8536915 Terrovitis Sep 2013 B1
8644096 Bringivijayaraghavan Feb 2014 B2
8717078 Idgunji et al. May 2014 B2
8732509 Kwak May 2014 B2
8788896 Tekumalla Jul 2014 B2
9001955 Lamanna et al. Apr 2015 B2
9053815 Bell Jun 2015 B2
9054675 Mazumder et al. Jun 2015 B2
9166579 Huber et al. Oct 2015 B2
9329623 Vankayala May 2016 B2
9508409 Kwak Nov 2016 B2
9529379 Kwak Dec 2016 B2
9530473 Mazumder Dec 2016 B2
9531363 Miyano Dec 2016 B2
9601170 Mazumder et al. Mar 2017 B1
9813067 Ma et al. Nov 2017 B2
9865317 Ishibashi et al. Jan 2018 B2
20010015924 Arimoto et al. Aug 2001 A1
20020057624 Manning May 2002 A1
20020110035 Li et al. Aug 2002 A1
20020149506 Altrichter et al. Oct 2002 A1
20040041604 Jade et al. Feb 2003 A1
20030117864 Hampel et al. Jun 2003 A1
20030147299 Setogawa Aug 2003 A1
20030161210 Acharya et al. Aug 2003 A1
20040000934 Jeon Jan 2004 A1
20040008064 Kashiwazaki Jan 2004 A1
20050017774 Chow et al. Jan 2005 A1
20050024107 Takai et al. Feb 2005 A1
20050047222 Rentschler Mar 2005 A1
20050052309 Wang Mar 2005 A1
20050132043 Wang et al. Jun 2005 A1
20050184780 Chun Aug 2005 A1
20050270852 Dietrich et al. Dec 2005 A1
20060033542 Lin et al. Feb 2006 A1
20060055441 Mcclannahan et al. Mar 2006 A1
20060062341 Edmondson et al. Mar 2006 A1
20060064620 Kuhn et al. Mar 2006 A1
20060155948 Ruckerbauer Jul 2006 A1
20060182212 Hwang et al. Aug 2006 A1
20060193194 Schnell Aug 2006 A1
20060250861 Park et al. Nov 2006 A1
20060250883 Szczypinski Nov 2006 A1
20070033427 Correale, Jr. et al. Feb 2007 A1
20070046346 Minzoni Mar 2007 A1
20070086267 Kwak Apr 2007 A1
20070088903 Choi Apr 2007 A1
20070192651 Schoch Aug 2007 A1
20070291558 Joo Dec 2007 A1
20080042705 Kim Feb 2008 A1
20080080267 Lee Apr 2008 A1
20080080271 Kim Apr 2008 A1
20080082707 Gupta et al. Apr 2008 A1
20080126822 Kim et al. May 2008 A1
20080137471 Schnell et al. Jun 2008 A1
20080144423 Kwak Jun 2008 A1
20080180144 Mai Jul 2008 A1
20080204071 Lee et al. Aug 2008 A1
20080232179 Kwak Sep 2008 A1
20080232180 Kim et al. Sep 2008 A1
20080253205 Park Oct 2008 A1
20090041104 Bogdan Feb 2009 A1
20090219068 Mizuhashi et al. Sep 2009 A1
20090232250 Yamada et al. Sep 2009 A1
20090290445 Kinoshita et al. Nov 2009 A1
20090315600 Becker et al. Dec 2009 A1
20100001762 Kim Jan 2010 A1
20100052739 Shibata Mar 2010 A1
20100054060 Ku Mar 2010 A1
20100058261 Markov et al. Mar 2010 A1
20100066422 Tsai Mar 2010 A1
20100124090 Arai May 2010 A1
20100124102 Lee et al. May 2010 A1
20100128543 Kwon et al. May 2010 A1
20100142308 Kim Jun 2010 A1
20100165769 Kuroki Jul 2010 A1
20100165780 Bains et al. Jul 2010 A1
20100177589 Kinoshita Jul 2010 A1
20100195429 Sonoda Aug 2010 A1
20100199117 Kwak Aug 2010 A1
20100208534 Fujisawa Aug 2010 A1
20100208535 Fujisawa Aug 2010 A1
20100232213 Hwang et al. Sep 2010 A1
20100254198 Bringivijayaraghavan et al. Oct 2010 A1
20100295584 Sano Nov 2010 A1
20100327926 Takahashi Dec 2010 A1
20110026318 Franceschini et al. Feb 2011 A1
20110047319 Jeon et al. Feb 2011 A1
20110055671 Kim et al. Mar 2011 A1
20110057697 Miyano Mar 2011 A1
20110058437 Miyano Mar 2011 A1
20110102039 Shin May 2011 A1
20110194575 Chen et al. Aug 2011 A1
20110228625 Bringivijayaraghavan Sep 2011 A1
20110238866 Zitlaw Sep 2011 A1
20110238941 Xu et al. Sep 2011 A1
20110298505 Khoury et al. Dec 2011 A1
20110298512 Kwak Dec 2011 A1
20110304365 Bunch Dec 2011 A1
20120084575 Flores et al. Apr 2012 A1
20120124317 Mirichigni et al. May 2012 A1
20120147692 Nakamura et al. Jun 2012 A1
20120212268 Kim Aug 2012 A1
20120254873 Bringivijayaraghavan Oct 2012 A1
20120269015 Bringivijayaraghavan Oct 2012 A1
20120274376 Gomm et al. Nov 2012 A1
20130002318 Lu et al. Jan 2013 A1
20130002320 Lin et al. Jan 2013 A1
20130141994 Ito et al. Jun 2013 A1
20130194013 Kwak Aug 2013 A1
20130250701 Bringivijayaraghavan et al. Sep 2013 A1
20130321052 Huber et al. Dec 2013 A1
20130329503 Bringivijayaraghavan Dec 2013 A1
20130342254 Mazumder et al. Dec 2013 A1
20140010025 Bringivijayaraghavan Jan 2014 A1
20140035640 Kwak et al. Feb 2014 A1
20140055184 Vankayala Feb 2014 A1
20140119141 Tamlyn et al. May 2014 A1
20140176213 Rylov Jun 2014 A1
20140177359 Kumar et al. Jun 2014 A1
20140177361 Kitagawa Jun 2014 A1
20140258764 Kwak Sep 2014 A1
20140293719 Jung Oct 2014 A1
20140340158 Thandri et al. Nov 2014 A1
20150097604 Taniguchi Apr 2015 A1
20150156009 Bogdan Jun 2015 A1
20150170725 Kwak Jun 2015 A1
20150235691 Kwak Aug 2015 A1
20150263739 Jung et al. Sep 2015 A1
20150263740 Jung et al. Sep 2015 A1
20150340072 Mazumder Nov 2015 A1
20160013799 Li et al. Jan 2016 A1
20160056807 Neidengard et al. Feb 2016 A1
20160322964 Miyano Nov 2016 A1
20160365860 Ma et al. Dec 2016 A1
20170309320 Ishibashi et al. Oct 2017 A1
20170309323 Ishibashi et al. Oct 2017 A1
20180053538 Miyano et al. Feb 2018 A1
Foreign Referenced Citations (6)
Number Date Country
1952868 Apr 2007 CN
101752009 Jun 2010 CN
2013-222997 Oct 2013 JP
201303735 Jan 2013 TW
2017189127 Nov 2017 WO
2018038835 Mar 2018 WO
Non-Patent Literature Citations (8)
Entry
U.S. Appl. No. 16/000,149 titled “Apparatuses and Methods for Adjusting Delay of Command Signal Path”, filed Jun. 5, 2018, pp. all.
U.S. Appl. No. 15/139,102, entitled “Methods and Apparatuses Including Command Delay Adjustment Circuit”, filed Apr. 26, 2016.
U.S. Appl. No. 15/243,651, entitled “Apparatuses and Methods for Adjusting Delay of Command Signal Path”, filed Aug. 22, 2016.
“Interfacing DDR SDRAM with Stratix II Devices”, Version 3.2, Altera Corp, Sep. 2008.
U.S. Appl. No. 15/595,056, entitled: “Methods and Apparatuses Including Command Delay Adjustment Circuit”, filed May 15, 2017.
Lee, “How to Implement DDR SGRAM in Graphic System”, Samsung Electric, 4Q1998 (Oct.-Dec. 1998).
U.S. Appl. No. 15/660,405, entitled “Apparatuses and Methods for Indirectly Detecting Phase Variations”, filed Jul. 26, 2017.
U.S. Appl. No. 16/107,909 titled “Methods and Apparatuses Including Command Delay Adjustment Circuit” filed Aug. 21, 2018, pp. all.
Related Publications (1)
Number Date Country
20170288682 A1 Oct 2017 US
Divisions (1)
Number Date Country
Parent 14736005 Jun 2015 US
Child 15628260 US