1. Field of the Invention
The present invention relates generally to equipment used in semiconductor processing. More particularly, the present invention relates to efficiently reducing the occurrence of force discontinuity of a planar motor during coil switching.
2. Description of the Related Art
Planar motors often include more than one coil. During the course of operating a planar motor, coil switching may occur in which the planar motor switches from using one coil to using another coil. During coil switching, force discontinuities generally occur. Such force discontinuities may adversely affect the operation of a planar motor and, when the planar motor is used to drive a stage, the accuracy with which the stage may scan. When the accuracy with which a stage may scan is adversely affected, the quality of a semiconductor formed using the stage may be compromised.
According to one aspect of the present invention, a method for operating a planar motor that includes a magnet array having a first magnet unit, e.g., quadrant, with an associated range and a coil array including at least a first coil and a second coil includes providing electrical current to the first coil when the first coil is within the range, and determining when the first magnet unit is in proximity to a switching location. When it is determined that the first magnet unit is in proximity to the switching location, the electrical current provided to the first coil is reduced. After reducing the electrical current provided to the first coil, it is determined whether the first magnet unit has reached the switching location. The method also includes switching to providing the electrical current to a second coil when it is determined that the first magnet unit has reached the switching location, wherein switching to providing the electrical current to the second coil includes ceasing providing the electrical current to the first coil.
In accordance with another aspect of the present invention, an apparatus includes a stage, a motor to move the stage, an amplifier, and a controller. The motor has at least a first coil and a second coil, and the amplifier is configured to selectively provide electrical current to either the first coil or the second coil. The controller is configured to control force generated by the motor. When moving the stage, the controller controls the motor force by using the amplifier to provide electrical current to the first coil, smoothly reducing a force generated by the first coil before the stage moves to a predetermined switching location so that the coil is generating substantially no force when the stage is at the switching location, switching the amplifier so that the amplifier provides electrical current to the second coil, and smoothly increasing a force generated by the second coil after the stage moves past the predetermined switching location. Smoothly reducing the force generated by the first coil force, switching the amplifier output when the current is substantially zero, and smoothly increasing the force generated by the second coil reduces discontinuities in the force generated by the motor when moving the stage.
The invention will be readily understood by the following detailed description in conjunction with the accompanying drawings, in which:
Example embodiments of the present invention are discussed below with reference to the various figures. However, those skilled in the art will readily appreciate that the detailed description given herein with respect to these figures is for explanatory purposes, as the invention extends beyond these embodiments.
In order for a stage to be driven by a moving magnet planar motor with a substantially minimal number of amplifiers, the amplifiers may connect to different coils based on a position of the stage such that coil switching may be implemented. As will be appreciated by those skilled in the art, the magnet arrays of a planar motor may have a relatively noticeable edge effect, e.g., magnetic flux leakage of outside magnet arrays, which may cause force discontinuity during coil switching.
Within an overall stage apparatus, the problem of force discontinuity which occurs in a planar motor during coil switching is solved by utilizing two types of switching, e.g., unit-by-unit switching and coil-by-coil switching, depending on whether multi-phase, e.g., three-phase, amplifiers or single-phase amplifiers are used. That is, the type of switching used may depend on whether the amplifiers used substantially require balanced phase currents, where the sum of u, v, and w phase currents is substantially zero, or whether single-phase amplifiers which allow independent phase current control where u, v, and w phase currents may be independently controlled are used. Unit-by-unit switching generally involves switching units that each include multiple coils, while coil-by-coil switching generally involves switching coils individually. In one embodiment, unit-by-unit switching may be used with balanced three-phase amplifiers while coil-by-coil switching may be used with either independent three-phase amplifiers or single-phase amplifiers. When compared with unit-by-unit switching, coil-by-coil switching generally leads to better efficiency with fewer amplifier channels and less generated heat.
By utilizing a smooth scaling factor for coil current commands, a motor force discontinuity caused by coil switching may be substantially removed. That is, the application of a smooth coil current command scaling factor may allow for a substantially smooth transition between coils used to generate motor force. The same formulation may generally be applied to both X and Y directions which are parallel or perpendicular to a motor force direction. Utilizing a relatively simple and substantially deterministic formulation for coil switching may improve motor efficiency, utilize fewer amplifiers, and generate less heat.
A smooth transition between coils, or a smooth coil switch, is generally a switch from one coil to another coil while substantially maintaining continuity of both a function that specifies coil currents and the derivative of that function such that stage vibrations during the coil switch may be significantly reduced. During a smooth coil switch, the electrical switching event from one coil to another coil occurs when a current command is substantially zero. In other words, a coil switch is generally a switch from one coil to another coil which is made when a current command to both of the coils is substantially zero, and the current command is adjusted according to a continuous and differentiable function before and after the switch.
In one embodiment, a motor or actuator includes more than two coils such that when a stage is moving, the relative position of the coils and at least one associated motor magnet array is such that some coils are temporarily not used, e.g., temporarily not connected to amplifiers, while other coils may be switching their amplifier connections and still other coils may generate a relatively steady force. A controller may determine current commands of amplifiers which are connected to the coils switching their amplifier connections and to the coils generating force. Amplifier current commands for coils may be manipulated or controlled to generate a relatively smooth force, or a force without significant disturbances, during switching.
Generally, a motor force command may be transformed to amplifier current commands through a motor commutation formula. In one embodiment, a motor commutation formula may include a set of sinusoidal functions of relative positions between a magnet array and coils, as for example with magnitude being proportional to a motor force command.
A single XZ or YZ coil under a magnet array, as for example a magnet array as shown in
For a coil unit to generate substantially constant X and Z forces, or substantially constant Y and Z forces, three-phase coil current commutation formulas may be applied to the appropriate current commands of the associated three-phase coils within the coil unit. It should be appreciated that any suitable three-phase commutation formula may be applied to current commands. A first suitable three-phase commutation formula for XZ coils is as follows:
A second suitable three-phase commutation formula for YZ coils is as follows:
The type of coil switching algorithm which is used with respect to motion of a magnet quadrant is dependent, at least in part, upon an amplifier configuration. By way of example, for three-phase amplifiers which utilize balanced currents, i.e., the sum of u, v, and w currents is substantially zero, a unit-by-unit coil switching algorithm may be applied. In alternate embodiments, a coil-by-coil switching algorithm may lead to better motor efficiency and generate less heat when the amplifiers are configured to have independent phase current control, i.e., when each of the u, v, and w currents may be independently controlled.
A sensor arrangement 234 includes any number of sensors or sensing devices, and may be configured to identify a location of a particular magnet quadrant of magnet array 200 with respect to particular coil units in coil array 250. In other words, sensor arrangement 234 may provide information relating to the positioning of magnet array 200 relative to coil array 250. Information from sensor arrangement 234 may be provided to a controller 240, which uses the information to control an amplifier arrangement 236 and a current supply 238 as appropriate. Controller 240 controls amplifier arrangement 246 and current supply 238 as needed to energize coils in coil array 250 efficiently.
Controller 240 includes unit-by-unit switch module 242 and coil-by-coil switch module 244. Modules 242, 244 may generally include hardware and/or software logic, e.g., software logic arranged to be executed by a processor (not shown) associated with controller 240. In general, module 242, 244 are each configured to apply a smooth scaling factor for coil current commands.
Unit-by-unit switch module 242 is configured to identify which coil units of coil array 250 are to be turned on or turned off, and to cause appropriate coil units to be turned on or turned off. Unit-by-unit switch module 242 is also generally arranged to cause amplifier arrangement 236 to smoothly reduce a force generated by a coil unit (not shown) of coil array 250 that is to be turned off, and to cause individual amplifiers (not shown) in amplifier arrangement 236 to switch from providing current from current supply 238 to one coil unit to providing current from current supply 238 to another coil unit. When switching to providing current from current supply 238 to another coil unit (not shown), unit-by-unit switch module 242 may control amplifiers 236 such that amplifiers 236 may smoothly increase the force generated by that coil unit. Smoothly increasing force and smoothly decreasing force may generally involve smoothly increasing current and smoothly decreasing current, respectively.
Coil-by-coil switch module 244 is configured to identify which individual coils of coil array 250 are to be turned on or turned off, and to cause appropriate individual coils to be turned on or turned off. Coil-by-coil switch module 244 is also generally arranged to cause amplifier arrangement 236 to smoothly reduce a force generated by a coil that is to be turned off, and to cause amplifiers (not shown) in amplifier arrangement 236 to switch from providing current from current supply 238 to one coil to providing current from current supply 238 to another coil. When switching to providing current from current supply 238 to another coil (not shown), coil-by-coil switch module 244 may control amplifiers 236 such that amplifiers 236 may smoothly increase the force generated by that coil.
With reference to
As the edge of the YZ magnet quadrant 304 approaches at least one new YZ coil unit and effectively leaves one or more YZ coil units, a switching event may happen as shown in
According to another embodiment of the present invention, when a magnet quadrant moves in a force direction, substantially energizing approaching coil units before switching off the coil units that the magnet quadrant effectively moves away from may lead to a relatively smoother force transition during a coil switching operation, but may utilize extra amplifiers. In such an embodiment, the commutated current amplitude may be increased gradually, e.g., smoothly, in a coil unit that a magnet quadrant is moving towards until the coil unit produces substantially nominal force, after which the commutated current amplitude may be reduced gradually, e.g., smoothly, in coil unit(s) that the magnet quadrant is moving away from.
At a time t2, as shown in
At a time t3, as shown in
When a unit-by-unit switching event occurs with movement in a cross direction, e.g., an X direction for a YZ coil unit, end turns or turnaround portions of a coil may not produce as much useful force in an intended direction. End turns of a coil, as will be understood by those skilled in the art, are effectively the ends of the coils. As a result of end turns of a coil not producing as much useful force in an intended direction, a coil may be relatively freely switched off and on when substantially only the end turn portions of the coil are effectively covered by a magnet quadrant.
As YZ magnet quadrant 404 translates along X axis 458a, and covers end turns of YZ coil units 456e, 456f at a time t2, YZ coil units 456e, 456f are energized, as shown in
To facilitate a relatively smoother force transition during a coil switch or coil switching event, extra coils may be turned on or energized during a coil switch in a cross direction.
As YZ magnet quadrant 484 translates relative to an X axis 488a, YZ magnet quadrant 484 covers end turns of YZ coil units 486g, 486h at a time t2, YZ coil units 486g, 486h are energized, as shown in
In lieu of a unit-by-unit coil switch, a coil-by-coil switch may be implemented. That is, rather than energizing all coils in a coil unit during a switch, single coils of a coil unit may instead be energized during a switch. Single coils may also be turned off during a switch.
At a time t1, as shown in
Coil-by-coil switching may also occur when a magnet quadrant moves in a cross direction.
At a time t1, as shown in
At a time t2, as shown in
The number of amplifiers, e.g., the number of three-phase amplifiers, used to substantially control coils may effectively be minimized by using the same amplifiers to substantially control different coils. That is, an amplifier that causes current to be provided to a first coil may be used to provide current to a second coil once it is no longer necessary to provide current to the first coil. In one embodiment, approximately eighteen three-phase amplifiers may be used to provide current to an overall coil array which is used with two YZ magnet quadrants and two XZ magnet quadrants, with nine three-phase amplifiers used to provide current to the YZ coil and nine three-phase amplifiers used to provide current to the XZ coils. It should be appreciated that more than eighteen or fewer than eighteen three-phase amplifiers may be used to provide current to an overall coil array. By way of example, for an embodiment in which single-phase amplifiers are used to provide current to a coil array used with a magnet array that includes two YZ magnet quadrants and two XZ magnet quadrants of the type shown above in
With reference to
In the described embodiment, nine three phase-amplifiers are used to provide current to coil array 650 for YZ coils 618, and nine three-phase amplifiers are used to provide current to coil array 650 for XZ coils 622. It should be appreciated, however, that more than nine three-phase amplifiers or fewer than nine three-phase amplifiers may be used to provide current for YZ coils 618 and more than nine three-phase amplifiers or fewer than nine three-phase amplifiers may be used to provide current for XZ coils 622.
The nine amplifiers used to provide current to YZ coils 618 such that YZ coils 618 may be energized are identified in
At a time t2, as shown in
It should be appreciated that, in one embodiment, prior to one phase of an amplifier switching from providing current to one coil, e.g., YZ coil 618f, to providing current to another coil, e.g., YZ coil 618k, the amplifier may smoothly reduce the output current of that phase to substantially zero, e.g., until YZ coil 618f is effectively turned off. YZ coil 618f may be substantially turned off, and the associated amplifier may switch to providing current to coil 618k, when a pre-determined switching location is reached by YZ magnet quadrants 604a, 604b.
At a time t3, as shown in
YZ magnet quadrants 604a, 604b continue to move relative to Y axis 688b, and at a time t4, are positioned as shown in
In the described embodiment, nine three phase-amplifiers are used to provide current to coil array 650′ for YZ coils 618′, and nine three-phase amplifiers are used to provide current to coil array 650′ for XZ coils 622′. It should be appreciated, however, that more than nine three-phase amplifiers or fewer than nine three-phase amplifiers may be used to provide current for YZ coils 618′ and more than nine three-phase amplifiers or fewer than nine three-phase amplifiers may be used to provide current for XZ coils 622′.
The nine amplifiers used to provide current to YZ coils 618′ such that YZ coils 618′ may be energized are identified in
At a time t2, as shown in
In the described embodiment, nine amplifiers may be used to provide current to YZ coils 618″ such that YZ coils 618″ may be energized. The amplifiers are identified in
At a time t2, as shown in
As discussed above, coil-by-coil switching may occur for two YZ magnet quadrants of a planar motor. It should be appreciated that a total number of energized coils associated with YZ magnet quadrants may remain substantially the same. For example, approximately twenty seven coils of coil array 650 as discussed with respect to
In one embodiment, substantially every coil associated with a planar motor may connect to an amplifier in cases of both unit-by-unit and coil-by-coil switching.
A coil current command scaling factor may be used to smooth out a motor force during coil switching. In general, a coil current command scaling factor may vary based on a distance of a coil, i.e., a coil that is subject to the coil current command, from a magnet quadrant with respect to an X axis and/or a Y axis.
In a motor force direction, to accommodate an edge effect of magnet quadrant 804, a coil current may gradually be turned down or reduced when a particular coil is positioned substantially further out of the range of magnet quadrant 804. Centerlines of coil positions 862a, 862a′ are located at a distance “a” from a centerline of magnet quadrant 804, centerlines of coil positions 862b, 862b′ are located at a distance “b” from the centerline of magnet quadrant 804, and centerlines of coil positions 862c, 862c′ are located at a distance “c” from the centerline of magnet quadrant 804. As shown in a plot 915 of
Coil current is gradually reduced until a distance between a coil and magnet quadrant 804 reaches distance “b.” That is, coils (not shown) in coil positions 862b, 862b′ will have no coil current provided. In one embodiment, a difference between “a” and “b” may be approximately half of a coil width. In another embodiment, a difference between “a” and “b” may be a few millimeters or less.
In a motor force direction, to accommodate an edge effect of a corresponding magnet array, a coil current may gradually be turned down in coils (not shown) when the coils are between coil positions 862a, 862a′ and coil positions 862b, 862b′, respectively, when the coils have moved substantially out from under magnet quadrant 804. Coil positions 862b, 862b′ are shown as being approximately a coil-width away from magnet quadrant 804. In one embodiment, once coils (not shown) have moved into coil positions 862b, 862b′, the coil current is substantially zero, as indicated in plot 915 of
With reference to
Referring next to
As a stage that is coupled to a moving magnet planar motor generally moves in both an X direction and a Y direction, or along an X-axis and a Y-axis, an overall coil current command scaling factor for smooth switching may be the product of scaling factors in both a motor force direction and a cross direction, as follows:
k
c
=k
c,p
·k
c,n
kc is an overall coil current command scaling factor, while kc,p is a coil current command scaling factor in a motor force direction and kc,n is a coil current command scaling factor in a cross direction. As shown in plot 915 of
While an overall coil current command scaling factor for smooth switching may be a product of scaling factors in both a motor force direction and a cross direction, it should be appreciated that an overall coil current command scaling factor is not limited to being a product of scaling factors in both a motor force direction and a cross direction. By way of example, an overall coil current command scaling factor may be a function of the scaling factors in a motor force direction and a cross direction in which one of the scaling factors is weighted more than the other.
A current command for a specific coil may depend, at least in part, on the phase of a coil and its associated scaling factor. For example, a current command for a u-phase coil j may be as follows:
l
u,j
=l
u
·k
c,j
=l
u
·k
c,p,j
·k
c,n,j
where t is a nominal commutated current command, as mentioned above, and kc,j is its overall scaling factor that depends on the relative position of the coil and the associated magnet array.
Referring next to
A determination is made in step 959 as to whether the magnet quadrant is in proximity to a switching location. A switching location may be a location which, when reached by the magnet quadrant, effectively triggers or otherwise causes the amplifier to switch from providing electrical current to the first coil to providing electrical current to a second coil. In one embodiment, such a determination may involve determining when the stage has moved past a switching location.
If it is determined in step 959 that the magnet quadrant is not in proximity to the switching location, process flow returns to step 955 in which the amplifier continues to provide electrical current to the first coil. Alternatively, if it is determined in step 959 that the magnet quadrant is in proximity to the switching location, then the control software commands the amplifier to begin to smoothly reduce the electrical current provided to the first coil in step 963. If the current reduction is applied in a location where the coil does not contribute a large force to driving the stage, the effect on the overall stage control will be sufficiently small. Smoothly reducing the electrical current in the coil generally causes the force generated using the coil to be smoothly reduced. Smoothly reducing the electrical current provided to the coil generally includes the application of a coil current command scaling factor, as discussed above with respect to
After the amplifier smoothly reduces the electrical current provided to the first coil, it is determined in step 967 whether the magnet quadrant has reached the switching location. If the determination is that the magnet quadrant has not reached the switching location, the electrical current provided to the first coil continues to be smoothly reduced in step 963 or maintained at a substantially zero value.
Alternatively, if the determination in step 967 is that the magnet quadrant has reached the switching location, the amplifier stops providing electrical current to the first coil in step 971, and the first coil is effectively de-energized or turned off. Then, in step 975, the amplifier switches to the second coil and begins providing electrical current to the second coil. In one embodiment, providing electrical current to the second coil includes beginning with a substantially zero electrical current and then smoothly increasing the electrical current to the second coil such that a force generated by the second coil smoothly increases after the magnet quadrant moves past the switching location. Once the amplifier begins providing electrical current to the second coil, the method of controlling an amplifier is completed.
With reference to
A wafer 64 is held in place on a wafer holder or chuck 74 which is coupled to wafer table 51. Wafer positioning stage 52 is arranged to move in multiple degrees of freedom, e.g., in up to six degrees of freedom, under the control of a control unit 60 and a system controller 62. In one embodiment, wafer positioning stage 52 may include a plurality of actuators and have a configuration as described above. The movement of wafer positioning stage 52 allows wafer 64 to be positioned at a desired position and orientation relative to a projection optical system 46.
Wafer table 51 may be levitated in a z-direction 10b by any number of voice coil motors (not shown), e.g., three voice coil motors. In one described embodiment, at least three magnetic bearings (not shown) couple and move wafer table 51 along a y-axis 10a. The motor array of wafer positioning stage 52 is typically supported by a base 70. Base 70 is supported to a ground via isolators 54. Reaction forces generated by motion of wafer stage 52 may be mechanically released to a ground surface through a frame 66. One suitable frame 66 is described in JP Hei 8-166475 and U.S. Pat. No. 5,528,118, which are each herein incorporated by reference in their entireties. In alternate embodiments, the wafer positioning stage 52 may be driven in 3 or 6 degrees of freedom by a planar motor including the features described above.
An illumination system 42 is supported by a frame 72. Frame 72 is supported to the ground via isolators 54. Illumination system 42 includes an illumination source, which may provide a beam of light that may be reflected off of a reticle. In one embodiment, illumination system 42 may be arranged to project a radiant energy, e.g., light, through a mask pattern on a reticle 68 that is supported by and scanned using a reticle stage 44 which may include a coarse stage and a fine stage, or which may be a single, monolithic stage. The radiant energy is focused through projection optical system 46, which is supported on a projection optics frame 50 and may be supported the ground through isolators 54. Suitable isolators 54 include those described in JP Hei 8-330224 and U.S. Pat. No. 5,874,820, which are each incorporated herein by reference in their entireties.
A first interferometer 56 is supported on projection optics frame 50, and functions to detect the position of wafer table 51. Interferometer 56 outputs information on the position of wafer table 51 to system controller 62. In one embodiment, wafer table 51 has a force damper which reduces vibrations associated with wafer table 51 such that interferometer 56 may accurately detect the position of wafer table 51. A second interferometer 58 is supported on projection optical system 46, and detects the position of reticle stage 44 which supports a reticle 68. Interferometer 58 also outputs position information to system controller 62. In other embodiments, precision encoders may be used to detect the position of wafer table 51 and reticle stage 44 in place of interferometer 58.
It should be appreciated that there are a number of different types of photolithographic apparatuses or devices. For example, photolithography apparatus 40, or an exposure apparatus, may be used as a scanning type photolithography system which exposes the pattern from reticle 68 onto wafer 64 with reticle 68 and wafer 64 moving substantially synchronously. In a scanning type lithographic device, reticle 68 is moved perpendicularly with respect to an optical axis of a lens assembly (projection optical system 46) or illumination system 42 by reticle stage 44. Wafer 64 is moved perpendicularly to the optical axis of projection optical system 46 by a wafer stage 52. Scanning of reticle 68 and wafer 64 generally occurs while reticle 68 and wafer 64 are moving substantially synchronously.
Alternatively, photolithography apparatus or exposure apparatus 40 may be a step-and-repeat type photolithography system that exposes reticle 68 while reticle 68 and wafer 64 are stationary, i.e., at a substantially constant velocity of approximately zero meters per second. In one step and repeat process, wafer 64 is in a substantially constant position relative to reticle 68 and projection optical system 46 during the exposure of an individual field. Subsequently, between consecutive exposure steps, wafer 64 is consecutively moved by wafer positioning stage 52 perpendicularly to the optical axis of projection optical system 46 and reticle 68 for exposure. Following this process, the images on reticle 68 may be sequentially exposed onto the fields of wafer 64 so that the next field of semiconductor wafer 64 is brought into position relative to illumination system 42, reticle 68, and projection optical system 46.
It should be understood that the use of photolithography apparatus or exposure apparatus 40, as described above, is not limited to being used in a photolithography system for semiconductor manufacturing. For example, photolithography apparatus 40 may be used as a part of a liquid crystal display (LCD) photolithography system that exposes an LCD device pattern onto a rectangular glass plate or a photolithography system for manufacturing a thin film magnetic head.
The illumination source of illumination system 42 may be g-line (436 nanometers (nm)), i-line (365 nm), a KrF excimer laser (248 nm), an ArF excimer laser (193 nm), and an F2-type laser (157 nm). Alternatively, illumination system 42 may also use charged particle beams such as x-ray and electron beams. For instance, in the case where an electron beam is used, thermionic emission type lanthanum hexaboride (LaB6) or tantalum (Ta) may be used as an electron gun. Furthermore, in the case where an electron beam is used, the structure may be such that either a mask is used or a pattern may be directly formed on a substrate without the use of a mask.
With respect to projection optical system 46, when far ultra-violet rays such as an excimer laser are used, glass materials such as quartz and fluorite that transmit far ultra-violet rays is preferably used. When either an F2-type laser or an x-ray is used, projection optical system 46 may be either catadioptric or refractive (a reticle may be of a corresponding reflective type), and when an electron beam is used, electron optics may comprise electron lenses and deflectors. As will be appreciated by those skilled in the art, the optical path for the electron beams is generally in a vacuum.
In addition, with an exposure device that employs vacuum ultra-violet (VUV) radiation of a wavelength that is approximately 200 nm or lower, use of a catadioptric type optical system may be considered. Examples of a catadioptric type of optical system include, but are not limited to, those described in Japan Patent Application Disclosure No. 8-171054 published in the Official gazette for Laid-Open Patent Applications and its counterpart U.S. Pat. No. 5,668,672, as well as in Japan Patent Application Disclosure No. 10-20195 and its counterpart U.S. Pat. No. 5,835,275, which are all incorporated herein by reference in their entireties. In these examples, the reflecting optical device may be a catadioptric optical system incorporating a beam splitter and a concave mirror. Japan Patent Application Disclosure (Hei) No. 8-334695 published in the Official gazette for Laid-Open Patent Applications and its counterpart U.S. Pat. No. 5,689,377, as well as Japan Patent Application Disclosure No. 10-3039 and its counterpart U.S. Pat. No. 5,892,117, which are all incorporated herein by reference in their entireties. These examples describe a reflecting-refracting type of optical system that incorporates a concave mirror, but without a beam splitter, and may also be suitable for use with the present invention.
The present invention may be utilized, in one embodiment, in an immersion type exposure apparatus if suitable measures are taken to accommodate a fluid. For example, PCT patent application WO 99/49504, which is incorporated herein by reference in its entirety, describes an exposure apparatus in which a liquid is supplied to a space between a substrate (wafer) and a projection lens system during an exposure process. Aspects of PCT patent application WO 99/49504 may be used to accommodate fluid relative to the present invention.
Further, semiconductor devices may be fabricated using systems described above, as will be discussed with reference to
At each stage of wafer processing, when preprocessing steps have been completed, post-processing steps may be implemented. During post-processing, initially, in step 1217, photoresist is applied to a wafer. Then, in step 1221, an exposure device may be used to transfer the circuit pattern of a reticle to a wafer. Transferring the circuit pattern of the reticle of the wafer generally includes scanning a reticle scanning stage which may, in one embodiment, include a force damper to dampen vibrations.
After the circuit pattern on a reticle is transferred to a wafer, the exposed wafer is developed in step 1225. Once the exposed wafer is developed, parts other than residual photoresist, e.g., the exposed material surface, may be removed by etching in step 1229. Finally, in step 1233, any unnecessary photoresist that remains after etching may be removed. As will be appreciated by those skilled in the art, multiple circuit patterns may be formed through the repetition of the preprocessing and post-processing steps.
Although only a few embodiments of the present invention have been described, it should be understood that the present invention may be embodied in many other specific forms without departing from the spirit or the scope of the present invention. By way of example, a magnet arrangement may include any number of magnets, the number of coils in a coil array may vary widely, and the number of coils in a coil unit may vary widely. In addition, the sizes of magnets and coils may also vary.
Without smooth switching, a Z force or force generated in a Z direction by a YZ magnet quadrant may have a force discontinuity along an X direction substantially at every coil pitch. A smooth switching algorithm or scheme, as discussed above, may effectively remove such force discontinuities. A longer smoothing range may generally result in a smoother force.
Magnet quadrants of a magnet array have generally been described as having associated regions or ranges such that when the regions or ranges overlay a coil, the coil may be energized. It should be appreciated that the size of such regions or ranges may generally vary widely. By way of example, a region associated with a magnet quadrant may extend past the edges of the magnet quadrant such that a coil which is not directly under the magnet quadrant is still within the region associated with the magnet quadrant.
The many features of the embodiments of the present invention are apparent from the written description. Further, since numerous modifications and changes will readily occur to those skilled in the art, the present invention should not be limited to the exact construction and operation as illustrated and described. Hence, all suitable modifications and equivalents may be resorted to as falling within the spirit or the scope of the present invention.
The present application claims benefit under 35 U.S.C. §119(e) of U.S. Provisional Patent Application No. 61/897,925, entitled “Smooth Coil Switching Method for Moving Magnet Planar Motor,” filed Oct. 31, 2013, which is incorporated herein by reference in its entirety for all purposes.
Number | Date | Country | |
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61897925 | Oct 2013 | US |