1. Field of the Invention
The present invention relates generally to x-ray tubes and cold electron number amplifiers.
2. Related Art
Many devices require generation of electrons. For example an x-ray tube can include a cathode attached to one end of an evacuated tube and an anode attached at an opposing end. The cathode can include an electron emitter, such as a filament. The filament can be heated, such as by a laser or an alternating current flowing through the filament. Due to the heat of the filament (1500-2000° C. for example) and a very large voltage differential between the filament and the anode (10 kV-100 kV for example) electrons can leave the filament and accelerate towards the anode. The anode can include a material that will emit x-rays in response to impinging electrons. Other examples of devices that require generation of electrons are cathode-ray tubes, electron microscopes, gas electron tubes or gas discharge tubes, and travelling wave tubes.
Electrons in the above devices can be generated by electron emitters, such as a filament. Due to the high required electron emitter temperature for the desired rate of electron emission, the electron emitter can fail at an undesirably low life. For example, in x-ray tubes, filament failure can be one of the most common failures and limiting factors in extending x-ray tube life. It would be desirable to be able to operate electron emitters at a lower temperature than is presently used while maintaining the same electron generation rate.
It has been recognized that it would be advantageous to be able to operate electron emitters at a lower temperature than is presently used while maintaining the same electron generation rate. The present invention is directed to a cold electron number amplifier that satisfies the need for producing the same rate of electrons while allowing the electron emitter to operate at a lower temperature.
The apparatus comprises an evacuated enclosure, a first electron emitter attached to the evacuated enclosure and configured to emit electrons within the evacuated enclosure, and an electrically conductive second electron emitter, also attached to the evacuated enclosure. The electrically conductive second electron emitter is configured to have a voltage greater than a voltage of the first electron emitter and is positioned to receive impinging electrons from the first electron emitter. Electrons from the first electron emitter impart energy to electrons in the second electron emitter and cause the second electron emitter to emit more electrons.
Due to additional electrons produced by the second electron emitter, the same rate of total electrons may be produced with less electrons produced by the first electron emitter. Due to lower required electron generation rate of the first electron emitter, it can be operated at a lower temperature, which can result in longer first electron emitter life.
Reference will now be made to the exemplary embodiments illustrated in the drawings, and specific language will be used herein to describe the same. It will nevertheless be understood that no limitation of the scope of the invention is thereby intended. Alterations and further modifications of the inventive features illustrated herein, and additional applications of the principles of the inventions as illustrated herein, which would occur to one skilled in the relevant art and having possession of this disclosure, are to be considered within the scope of the invention.
As illustrated in
The second electron emitter 13 is configured to have a voltage V2 greater than a voltage V1 of the first electron emitter 12 (V2>V1). In the various embodiments described herein, a voltage differential between the first electron emitter 12 and the second electron emitter 13 can be sufficiently high so that electrons in the second electron emitter 13 will have enough energy to exit the second electron emitter 13. For example, the voltage V2 of the second electron emitter 13 can be greater than a voltage V1 of the first electron emitter by more than a work function of the second electron emitter 13.
The second electron emitter 13 is positioned to receive impinging electrons 14 from the first electron emitter 12. Electrons 14 from the first electron emitter 12 impart energy to electrons in the second electron emitter 13 and cause the second electron emitter 13 to emit more electrons 15. A larger voltage differential (V2-V1) between the first electron emitter 12 and the second electron emitter 13, can result in an increased rate of electron generation at the second electron emitter. Such large voltage differential (V2-V1) can be in one embodiment, 10 times the work function of the second electron emitter 13, in another embodiment 100 times the work function of the second electron emitter 13, and in another embodiment 1000 times the work function of the second electron emitter 13.
Due to additional electrons produced by the second electron emitter, the same rate of total electrons may be produced with less electrons produced by the first electron emitter. Due to lower required electron generation rate of the first electron emitter, it can be operated at a lower temperature, which can result in longer first electron emitter life.
In the various embodiments described herein, many more electrons 15 can be emitted from the second electron emitter 13 than are emitted from the first electron emitter 12. In one embodiment, at least ten times more electrons 15 are emitted from the second electron emitter 13 than are emitted from the first electron emitter 12. In another embodiment, at least 50 times more electrons 15 are emitted from the second electron emitter 13 than are emitted from the first electron emitter 12. In another embodiment, at least 500 times more electrons 15 are emitted from the second electron emitter 13 than are emitted from the first electron emitter 12.
The above described cold electron number amplifier 10 can be used in many devices that require generation of electrons, such as x-ray tubes, cathode-ray tubes. electron microscopes, gas electron tubes or gas discharge tubes, and travelling wave tubes. Such devices can be operated at very large voltage differentials. For example, a voltage differential between the first electron emitter 12 and the electrode 23 can be at least 9 kilovolts. A configuration that may be used in such devices is shown in
Also shown in
Also shown in
As shown in
In one embodiment of the present invention, the second electron emitter 13b can be disposed between the first electron emitter 12 and the electrode 23 and the second electron emitter 12 can have a hole 21 allowing electrons from the second electron emitter 13b to be propelled therethrough towards the electrode 23. In another embodiment of the present invention, the first electron emitter 12 can be disposed between the second electron emitter 13a and the electrode 23. As shown in
For example, the cold electron number amplifier 30 of
Voltages V2a-b attached to the second electron emitters 13a-b can be the same (V2a=V2b) or different from (V2a≠V2b) each other. Whether the two voltages V2a and V2b are the same or different is dependent upon the desired electric field produced between the first electron emitter 12 and the second electron emitters 13a-b and the difficulty of providing an extra voltage.
Shown in
Voltage(s) V2a-b of the second electron emitter(s) 13a-b can be greater than a voltage V1 of the first electron emitter 13a. A voltage V3 of the anode 43 can be greater than a voltage V2a-b of the second electron emitter(s) 13a-b. A voltage differential between the first electron emitter 12 and the anode 43 can be at least 9 kilovolts (V3-V1>9 kV). A voltage differential between the first electron emitter 12 and the second electron emitter(s) 13a-b can be greater than a work function of the second electron emitter(s) 13a-b. For example, a voltage of the first electron emitter 12 can be less than about −20 kilovolts (kV), a voltage of the anode can be about 0 volts, and voltage(s) of the second electron emitter(s) can be between about −20 kV and 0 volts.
Impinging electrons 14 from the first electron emitter 12 on the second electron emitter(s) 13a-b impart energy to electrons in the second electron emitter(s) 13a-b, thus causing additional electrons 15 to be emitted from the second electron emitter(s) 13a-b. Electrons 15 from the second electron emitter(s) 13a-b can accelerate towards and impinge upon the anode 43. Electrons 15 impinging upon the anode 43 can cause the anode to emit x-rays 41.
A method of producing x-rays 41 in an x-ray tube 40 can include:
In one embodiment, shown in
As shown in
The second electron emitter 13 can be electrically conductive and can be is metallic, such as tungsten for example.
For the various embodiments described herein, the second electron emitter 13 can be manufactured by machining. The second electron emitter 13 can be attached to the evacuated enclosure 11 by an adhesive or by welding.
It is to be understood that the above-referenced arrangements are only illustrative of the application for the principles of the present invention. Numerous modifications and alternative arrangements can be devised without departing from the spirit and scope of the present invention. While the present invention has been shown in the drawings and fully described above with particularity and detail in connection with what is presently deemed to be the most practical and preferred embodiment(s) of the invention, it will be apparent to those of ordinary skill in the art that numerous modifications can be made without departing from the principles and concepts of the invention as set forth herein.
Priority is claimed to U.S. Provisional Patent Application Ser. No. 61/443,822, filed Feb. 17, 2011; which is hereby incorporated herein by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
1276706 | Aydelotte | Aug 1918 | A |
1881448 | Forde et al. | Oct 1932 | A |
1946288 | Kearsley | Feb 1934 | A |
2291948 | Cassen | Aug 1942 | A |
2316214 | Atlee et al. | Apr 1943 | A |
2329318 | Atlee et al. | Sep 1943 | A |
2340363 | Atlee et al. | Feb 1944 | A |
2502070 | Atlee et al. | Mar 1950 | A |
2663812 | Jamison et al. | Mar 1950 | A |
2683223 | Hosemann | Jul 1954 | A |
2952790 | Steen | Sep 1960 | A |
3356559 | Juras | Dec 1967 | A |
3358368 | Kuhnl | Dec 1967 | A |
3397337 | Denholm | Aug 1968 | A |
3434062 | Cox | Mar 1969 | A |
3665236 | Gaines et al. | May 1972 | A |
3679927 | Kirkendall | Jul 1972 | A |
3691417 | Gralenski | Sep 1972 | A |
3741797 | Chavasse, Jr. et al. | Jun 1973 | A |
3751701 | Gralenski et al. | Aug 1973 | A |
3801847 | Dietz | Apr 1974 | A |
3828190 | Dahlin et al. | Aug 1974 | A |
3851266 | Conway | Nov 1974 | A |
3872287 | Koeman | Mar 1975 | A |
3882339 | Rate et al. | May 1975 | A |
3894219 | Weigel | Jul 1975 | A |
3962583 | Holland et al. | Jun 1976 | A |
3970884 | Golden | Jul 1976 | A |
4007375 | Albert | Feb 1977 | A |
4075526 | Grubis | Feb 1978 | A |
4160311 | Ronde et al. | Jul 1979 | A |
4163900 | Warren et al. | Aug 1979 | A |
4178509 | More et al. | Dec 1979 | A |
4184097 | Auge | Jan 1980 | A |
4250127 | Warren et al. | Feb 1981 | A |
4293373 | Greenwood | Oct 1981 | A |
4368538 | McCorkle | Jan 1983 | A |
4393127 | Greschner et al. | Jul 1983 | A |
4400822 | Kuhnke et al. | Aug 1983 | A |
4421986 | Friauf et al. | Dec 1983 | A |
4443293 | Mallon et al. | Apr 1984 | A |
4463338 | Utner et al. | Jul 1984 | A |
4521902 | Peugeot | Jun 1985 | A |
4532150 | Endo et al. | Jul 1985 | A |
4573186 | Reinhold | Feb 1986 | A |
4576679 | White | Mar 1986 | A |
4584056 | Perret et al. | Apr 1986 | A |
4591756 | Avnery | May 1986 | A |
4608326 | Neukermans et al. | Aug 1986 | A |
4645977 | Kurokawa et al. | Feb 1987 | A |
4675525 | Amingual et al. | Jun 1987 | A |
4679219 | Ozaki | Jul 1987 | A |
4688241 | Peugeot | Aug 1987 | A |
4696994 | Nakajima et al. | Sep 1987 | A |
4705540 | Hayes | Nov 1987 | A |
4734924 | Yahata et al. | Mar 1988 | A |
4761804 | Yahata | Aug 1988 | A |
4777642 | Ono | Oct 1988 | A |
4797907 | Anderton | Jan 1989 | A |
4818806 | Kunimune et al. | Apr 1989 | A |
4819260 | Haberrecker | Apr 1989 | A |
4862490 | Karnezos et al. | Aug 1989 | A |
4870671 | Hershyn | Sep 1989 | A |
4876330 | Higashi et al. | Oct 1989 | A |
4878866 | Mori et al. | Nov 1989 | A |
4885055 | Woodbury et al. | Dec 1989 | A |
4891831 | Tanaka et al. | Jan 1990 | A |
4933557 | Perkins et al. | Jun 1990 | A |
4939763 | Pinneo et al. | Jul 1990 | A |
4957773 | Spencer et al. | Sep 1990 | A |
4960486 | Perkins et al. | Oct 1990 | A |
4969173 | Valkonet | Nov 1990 | A |
4979198 | Malcolm et al. | Dec 1990 | A |
4979199 | Cueman et al. | Dec 1990 | A |
4995069 | Tanaka | Feb 1991 | A |
5010562 | Hernandez et al. | Apr 1991 | A |
5063324 | Grunwald | Nov 1991 | A |
5066300 | Isaacson et al. | Nov 1991 | A |
5077771 | Skillicorn et al. | Dec 1991 | A |
5077777 | Daly | Dec 1991 | A |
5090046 | Friel | Feb 1992 | A |
5105456 | Rand et al. | Apr 1992 | A |
5117829 | Miller et al. | Jun 1992 | A |
5153900 | Nomikos et al. | Oct 1992 | A |
5161179 | Suzuki et al. | Nov 1992 | A |
5173612 | Imai et al. | Dec 1992 | A |
5178140 | Ibrahim | Jan 1993 | A |
5187737 | Watanabe | Feb 1993 | A |
5196283 | Ikeda et al. | Mar 1993 | A |
5200984 | Laeuffer | Apr 1993 | A |
5217817 | Verspui et al. | Jun 1993 | A |
5226067 | Allred et al. | Jul 1993 | A |
RE34421 | Parker et al. | Oct 1993 | E |
5258091 | Imai et al. | Nov 1993 | A |
5267294 | Kuroda et al. | Nov 1993 | A |
5302523 | Coffee et al. | Apr 1994 | A |
5343112 | Wegmann et al. | Aug 1994 | A |
5347571 | Furbee et al. | Sep 1994 | A |
5391958 | Kelly | Feb 1995 | A |
5400385 | Blake et al. | Mar 1995 | A |
5422926 | Smith et al. | Jun 1995 | A |
5428658 | Oettinger et al. | Jun 1995 | A |
5432003 | Plano et al. | Jul 1995 | A |
5469429 | Yamazaki et al. | Nov 1995 | A |
5469490 | Golden et al. | Nov 1995 | A |
5478266 | Kelly | Dec 1995 | A |
5521851 | Wei et al. | May 1996 | A |
5524133 | Neale et al. | Jun 1996 | A |
5532003 | Wong et al. | Jul 1996 | A |
RE35383 | Miller et al. | Nov 1996 | E |
5571616 | Phillips et al. | Nov 1996 | A |
5578360 | Viitanen | Nov 1996 | A |
5592042 | Takuchi et al. | Jan 1997 | A |
5602507 | Suzuki | Feb 1997 | A |
5607723 | Plano et al. | Mar 1997 | A |
5621780 | Smith et al. | Apr 1997 | A |
5627871 | Wang | May 1997 | A |
5631943 | Miles | May 1997 | A |
5673044 | Pellon | Sep 1997 | A |
5680433 | Jensen | Oct 1997 | A |
5682412 | Skillicorn et al. | Oct 1997 | A |
5696808 | Lenz | Dec 1997 | A |
5706354 | Stroehlein | Jan 1998 | A |
5729583 | Tang et al. | Mar 1998 | A |
5774522 | Warburton | Jun 1998 | A |
5812632 | Schardt et al. | Sep 1998 | A |
5835561 | Moorman et al. | Nov 1998 | A |
5870051 | Warburton et al. | Feb 1999 | A |
5898754 | Gorzen | Apr 1999 | A |
5907595 | Sommerer | May 1999 | A |
5978446 | Resnick | Nov 1999 | A |
6002202 | Meyer et al. | Dec 1999 | A |
6005918 | Harris et al. | Dec 1999 | A |
6044130 | Inazura et al. | Mar 2000 | A |
6062931 | Chung et al. | May 2000 | A |
6063629 | Knoblauch | May 2000 | A |
6069278 | Chuang | May 2000 | A |
6073484 | Miller et al. | Jun 2000 | A |
6075839 | Treseder | Jun 2000 | A |
6097790 | Hasegawa et al. | Aug 2000 | A |
6129901 | Moskovits et al. | Oct 2000 | A |
6133401 | Jensen | Oct 2000 | A |
6134300 | Trebes et al. | Oct 2000 | A |
6184333 | Gray | Feb 2001 | B1 |
6205200 | Boyer et al. | Mar 2001 | B1 |
6277318 | Bower et al. | Aug 2001 | B1 |
6282263 | Arndt et al. | Aug 2001 | B1 |
6288209 | Jensen | Sep 2001 | B1 |
6307008 | Lee et al. | Oct 2001 | B1 |
6320019 | Lee et al. | Nov 2001 | B1 |
6351520 | Inazaru | Feb 2002 | B1 |
6385294 | Suzuki et al. | May 2002 | B2 |
6388359 | Duelli et al. | May 2002 | B1 |
6438207 | Chidester et al. | Aug 2002 | B1 |
6477235 | Chornenky et al. | Nov 2002 | B2 |
6487272 | Kutsuzawa | Nov 2002 | B1 |
6487273 | Takenaka et al. | Nov 2002 | B1 |
6494618 | Moulton | Dec 2002 | B1 |
6546077 | Chornenky et al. | Apr 2003 | B2 |
6567500 | Rother | May 2003 | B2 |
6645757 | Okandan et al. | Nov 2003 | B1 |
6646366 | Hell et al. | Nov 2003 | B2 |
6658085 | Sklebitz | Dec 2003 | B2 |
6661876 | Turner et al. | Dec 2003 | B2 |
6740874 | Doring | May 2004 | B2 |
6778633 | Loxley et al. | Aug 2004 | B1 |
6799075 | Chornenky et al. | Sep 2004 | B1 |
6803570 | Bryson, III et al. | Oct 2004 | B1 |
6803571 | Mankos et al. | Oct 2004 | B1 |
6816573 | Hirano et al. | Nov 2004 | B2 |
6819741 | Chidester | Nov 2004 | B2 |
6838297 | Iwasaki et al. | Jan 2005 | B2 |
6852365 | Smart et al. | Feb 2005 | B2 |
6866801 | Mau et al. | Mar 2005 | B1 |
6876724 | Zhou et al. | Apr 2005 | B2 |
6900580 | Dai et al. | May 2005 | B2 |
6956706 | Brandon | Oct 2005 | B2 |
6962782 | Livache et al. | Nov 2005 | B1 |
6976953 | Pelc | Dec 2005 | B1 |
6987835 | Lovoi | Jan 2006 | B2 |
7035379 | Turner et al. | Apr 2006 | B2 |
7046767 | Okada et al. | May 2006 | B2 |
7049735 | Ohkubo et al. | May 2006 | B2 |
7050539 | Loef et al. | May 2006 | B2 |
7075699 | Oldham et al. | Jul 2006 | B2 |
7085354 | Kanagami | Aug 2006 | B2 |
7108841 | Smalley et al. | Sep 2006 | B2 |
7110498 | Yamada | Sep 2006 | B2 |
7130380 | Lovoi et al. | Oct 2006 | B2 |
7130381 | Lovoi et al. | Oct 2006 | B2 |
7189430 | Ajayan et al. | Mar 2007 | B2 |
7203283 | Puusaari | Apr 2007 | B1 |
7206381 | Shimono et al. | Apr 2007 | B2 |
7215741 | Ukita | May 2007 | B2 |
7224769 | Turner | May 2007 | B2 |
7233071 | Furukawa et al. | Jun 2007 | B2 |
7233647 | Turner et al. | Jun 2007 | B2 |
7286642 | Ishikawa et al. | Oct 2007 | B2 |
7305066 | Ukita | Dec 2007 | B2 |
7317784 | Durst et al. | Jan 2008 | B2 |
7358593 | Smith et al. | Apr 2008 | B2 |
7382862 | Bard et al. | Jun 2008 | B2 |
7399794 | Harmon et al. | Jul 2008 | B2 |
7410601 | Sato et al. | Aug 2008 | B2 |
7428298 | Bard et al. | Sep 2008 | B2 |
7448801 | Oettinger et al. | Nov 2008 | B2 |
7448802 | Oettinger et al. | Nov 2008 | B2 |
7486774 | Cain | Feb 2009 | B2 |
7526068 | Dinsmore | Apr 2009 | B2 |
7529345 | Bard et al. | May 2009 | B2 |
7618906 | Meilahti | Nov 2009 | B2 |
7634052 | Grodzins et al. | Dec 2009 | B2 |
7649980 | Aoki et al. | Jan 2010 | B2 |
7650050 | Haffner et al. | Jan 2010 | B2 |
7657002 | Burke et al. | Feb 2010 | B2 |
7675444 | Smith et al. | Mar 2010 | B1 |
7680652 | Giesbrecht et al. | Mar 2010 | B2 |
7693265 | Hauttmann et al. | Apr 2010 | B2 |
7709820 | Decker et al. | May 2010 | B2 |
7737424 | Xu et al. | Jun 2010 | B2 |
7756251 | Davis et al. | Jul 2010 | B2 |
7915800 | Kim et al. | Mar 2011 | B2 |
20020075999 | Rother | Jun 2002 | A1 |
20020094064 | Zhou et al. | Jul 2002 | A1 |
20030096104 | Tobita et al. | May 2003 | A1 |
20030152700 | Asmussen et al. | Aug 2003 | A1 |
20030165418 | Ajayan et al. | Sep 2003 | A1 |
20040076260 | Charles Jr et al. | Apr 2004 | A1 |
20050018817 | Oettinger et al. | Jan 2005 | A1 |
20050141669 | Shimono et al. | Jun 2005 | A1 |
20050207537 | Ukita | Sep 2005 | A1 |
20060073682 | Furukawa et al. | Apr 2006 | A1 |
20060098778 | Oettinger et al. | May 2006 | A1 |
20060210020 | Takahashi et al. | Sep 2006 | A1 |
20060233307 | Dinsmore | Oct 2006 | A1 |
20060269048 | Cain | Nov 2006 | A1 |
20060280289 | Hanington et al. | Dec 2006 | A1 |
20070025516 | Bard et al. | Feb 2007 | A1 |
20070087436 | Miyawaki et al. | Apr 2007 | A1 |
20070111617 | Meilahti | May 2007 | A1 |
20070133921 | Haffner et al. | Jun 2007 | A1 |
20070142781 | Sayre | Jun 2007 | A1 |
20070165780 | Durst et al. | Jul 2007 | A1 |
20070176319 | Thostenson et al. | Aug 2007 | A1 |
20070183576 | Burke et al. | Aug 2007 | A1 |
20070217574 | Beyerlein | Sep 2007 | A1 |
20080199399 | Chen et al. | Aug 2008 | A1 |
20080296479 | Anderson et al. | Dec 2008 | A1 |
20080296518 | Xu et al. | Dec 2008 | A1 |
20080317982 | Hecht et al. | Dec 2008 | A1 |
20090085426 | Davis et al. | Apr 2009 | A1 |
20090086923 | Davis et al. | Apr 2009 | A1 |
20090213914 | Dong et al. | Aug 2009 | A1 |
20090243028 | Dong et al. | Oct 2009 | A1 |
20100096595 | Prud'Homme et al. | Apr 2010 | A1 |
20100098216 | Dobson | Apr 2010 | A1 |
20100126660 | O'Hara | May 2010 | A1 |
20100140497 | Damiano, Jr. et al. | Jun 2010 | A1 |
20100239828 | Cornaby et al. | Sep 2010 | A1 |
20100243895 | Xu et al. | Sep 2010 | A1 |
20100248343 | Aten et al. | Sep 2010 | A1 |
20100285271 | Davis et al. | Nov 2010 | A1 |
20100323419 | Aten et al. | Dec 2010 | A1 |
20110017921 | Jiang et al. | Jan 2011 | A1 |
Number | Date | Country |
---|---|---|
1030936 | May 1958 | DE |
4430623 | Mar 1996 | DE |
19818057 | Nov 1999 | DE |
0297808 | Jan 1989 | EP |
0330456 | Aug 1989 | EP |
0400655 | May 1990 | EP |
0676772 | Mar 1995 | EP |
1252290 | Nov 1971 | GB |
57 082954 | Aug 1982 | JP |
3170673 | Jul 1991 | JP |
4171700 | Jun 1992 | JP |
05066300 | Mar 1993 | JP |
5066300 | Mar 1993 | JP |
5135722 | Jun 1993 | JP |
06119893 | Jul 1994 | JP |
6289145 | Oct 1994 | JP |
6343478 | Dec 1994 | JP |
8315783 | Nov 1996 | JP |
08315783 | Nov 1996 | JP |
2003007237 | Jan 2003 | JP |
2003088383 | Mar 2003 | JP |
2003510236 | Mar 2003 | JP |
2003211396 | Jul 2003 | JP |
2006297549 | Nov 2006 | JP |
1020050107094 | Nov 2005 | KR |
WO 9965821 | Dec 1999 | WO |
WO 0009443 | Feb 2000 | WO |
WO 0017102 | Mar 2000 | WO |
WO 03076951 | Sep 2003 | WO |
WO2008052002 | May 2008 | WO |
WO 2008052002 | May 2008 | WO |
WO 2009009610 | Jan 2009 | WO |
WO 2009045915 | Apr 2009 | WO |
WO 2009085351 | Jul 2009 | WO |
WO 2010107600 | Sep 2010 | WO |
Entry |
---|
Chakrapani et al.; Capillarity-Driven Assembly of Two-Dimensional Cellular Carbon Nanotube Foams; PNAS; Mar. 23, 2004; pp. 4009-4012; vol. 101; No. 12. |
Chen, Xiaohua et al., “Carbon-nanotube metal-matrix composites prepared by electroless plating,” Composites Science and Technology, 2000, pp. 301-306, vol. 60. |
Coleman, et al.; “Mechanical Reinforcement of Polymers Using Carbon Nanotubes”; Adv. Mater. 2006, 18, 689-706. |
Coleman, et al.; “Small but strong: A review of the mechanical properties of carbon nanotube-polymer composites”; Carbon 44 (2006) 1624-1652. |
Flahaut, E. et al, “Carbon Nanotube-metal-oxide nanocomposites; microstructure, electrical conductivity and mechanical properties,” Acta mater., 2000, pp. 3803-3812.Vo. 48. |
Gevin et al., “IDeF-X V1.0: performances of a new CMOS multi channel analogue readout ASIC for Cd(Zn)Te detectors”, IDDD, Oct. 2005, 433-437, vol. 1. |
Grybos et al., “Measurements of matching and high count rate performance of mulitchannel ASIC for digital x-ray imaging systems”, IEEE, Aug. 2007, 1207-1215, vol. 54, Issue 4. |
Grybos et al., “Pole-Zero cancellation circuit with pulse pile-up tracking system for low noise charge-sensitive amplifiers”, Feb. 2008, 583-590, vol. 55, Issue 1. |
http://www.orau.org/ptp/collectio/xraytubescollidge/MachlettCW250T.htm, 1999, 2 pages. |
Hu, et al.; “Carbon Nanotube Thin Films: Fabrication, Properties, and Applications”; 2010 American Chemical Society Jul. 22, 2010. |
Hutchison, “Vertically aligned carbon nanotubes as a framework for microfabrication of high aspect ration mems,” 2008, pp. 1-50. |
Jiang, Linquin et al., “Carbon nanotubes-metal nitride composites; a new class of nanocomposites with enhanced electrical properties,” J. Mater. Chem., 2005, pp. 260-266, vol. 15. |
Li, Jun et al., “Bottom-up approach for carbon nanotube interconnects,” Applied Physics Letters, Apr. 14, 2003, pp. 2491-2493, vol. 82 No. 15. |
Ma. R.Z., et al., “Processing and properties of carbon nanotubes-nano-SIC ceramic”, Journal of Materials Science 1998, pp. 5243-5246, vol. 33. |
Micro X-ray Tube Operation Manual, X-ray and Specialty Instruments Inc., 1996, 5 pages. |
Moore, A. W., S. L. Strong, and G. L. Doll, “Properties and characterization of codeposited boron nitride and carbon materials,” J. Appl. Phys. 65, 5109 (1989). |
Najafi, et al.; “Radiation resistant polymer-carbon nanotube nanocomposite thin films”; Department of Materials Science and Engineering . . . Nov. 21, 2004. |
Nakajima et al; Trial Use of Carbon-Fiber-Reinforced Plastic as a Non-Bragg Window Material of X-Ray Transmission; Rev. Sci. Instrum.; Jul. 1989; pp. 2432-2435; vol. 60, No. 7. |
Nakamura, K., “Preparation and properties of amorphous boron nitride films by molecular flow chemical vapor deposition,” J. Electrochem. Soc. 132, 1757 (1985). |
Panayiotatos, et al., “Mechanical performance and growth characteristics of boron nitride films with respect to their optical, compositional properties and density,” Surface and Coatings Technology, 151-152 (2002) 155-159. |
Peigney, et al., “Carbon nanotubes in novel ceramic matrix nanocomposites,” Ceramics International, 2000, pp. 677-683, vol. 26. |
Perkins, F. K., R. A. Rosenberg, and L. Sunwoo, “Synchrotronradiation deposition of boron and boron carbide films from boranes and carboranes: decaborane,” J. Appl. Phys. 69,4103 (1991). |
Rankov et al., “A novel correlated double sampling poly-Si circuit for readout systems in large area x-ray sensors”, IEEE, May 2005, 728-731, vol. 1. |
Roca i Cabarrocas, P., S. Kumar, and B. Drevillon, “In situ study of the thermal decomposition of B.sub.2 H.sub.6 by combining spectroscopic ellipsometry and Kelvin probe measurements,” J. Appl. Phys. 66, 3286 (1989). |
Satishkumar B.C., et al. “Synthesis of metal oxide nanorods using carbon nanotubes as templates,” Journal of Materials Chemistry, 2000, pp. 2115-2119, vol. 10. |
Scholze et al., “Detection efficiency of energy-dispersive detectors with low-energy windows” X-Ray Spectrometry, X-Ray Spectrom, 2005: 34: 473-476. |
Sheather, “The support of thin windows for x-ray proportional counters,” Journal Phys,E., Apr. 1973, pp. 319-322, vol. 6, No. 4. |
Shirai, K., S.-I. Gonda, and S. Gonda, “Characterization of hydrogenated amorphous boron films prepared by electron cyclotron resonance plasma chemical vapor deposition method,” J. Appl. Phys. 67, 6286 (1990). |
Tamura, et al “Developmenmt of ASICs for CdTe Pixel and Line Sensors”, IEEE Transactions on Nuclear Science, vol. 52, No, 5, Oct. 2005. |
Tien-Hui Lin et al., “An investigation on the films used as the windows of ultra-soft X-ray counters.” Acta Physica Sinica, vol. 27, No. 3, pp. 276-283, May 1978, abstract only. |
U.S. Appl. No. 12/640,154, filed Dec. 17, 2009, Krzysztof Kozaczek. |
U.S. Appl. No. 12/726,120, filed Mar. 17, 2010, Michael Lines. |
U.S. Appl. No. 12/783,707, filed May 20, 2010, Steven D. Liddiard. |
U.S. Appl. No. 12/899,750, filed Oct. 7, 2010, Steven Liddiard. |
U.S. Appl. No. 13/018,667, filed Feb. 1, 2011, Robert C. Davis. |
U.S. Appl. No. 13/018,667, filed Feb. 1, 2011, Lei Pei. |
U.S. Appl. No. 13/307,579, filed Nov. 30, 2011, Dongbing Wang. |
Vajtai et al.; Building Carbon Nanotubes and Their Smart Architectures; Smart Mater. Struct.; 2002; vol. 11; pp. 691-698. |
Vandenbulcke, L. G., “Theoretical and experimental studies on the chemical vapor deposition of boron carbide,” Indust. Eng. Chem. Prod. Res. Dev. 24, 568 (1985). |
Viitanen Veli-Pekka et al., Comparison of Ultrathin X-Ray Window Designs, presented at the Soft X-rays in the 21st Century Conference held in Provo, Utah Feb. 10-13, 1993, pp. 182-190. |
Wagner et al, “Effects of Scatter in Dual-Energy Imaging: An Alternative Analysis”; IEEE; Sep. 1989, vol. 8. No. 3. |
Wang, et al.; “Highly oriented carbon nanotube papers made of aligned carbon nanotubes”; Tsinghua-Foxconn Nanotechnology Research Center and Department of Physics; Published Jan. 31, 2008. |
Winter, J., H. G. Esser, and H. Reimer, “Diborane-free boronization,” Fusion Technol. 20, 225 (1991). |
Wu, et al.; “Mechanical properties and thermo-gravimetric analysis of PBO thin films”; Advanced Materials Laboratory, Institute of Electro-Optical Engineering; Apr. 30, 2006. |
www.moxtek,com, Moxtek, Sealed Proportional Counter X-Ray Windows, Oct. 2007, 3 pages. |
www.moxtek.com, Moxtek, AP3 Windows, Ultra-thin Polymer X-Ray Windows, Sep. 2006, 2 pages. |
www.moxtek.com, Moxtek, DuraBeryllium X-Ray Windows, May 2007, 2 pages. |
www.moxtek.com, Moxtek, ProLine Series 10 Windows, Ultra-thin Polymer X-Ray Windows, Sep. 2006, 2 pages. |
Xie, et al.; “Dispersion and alignment of carbon nanotubes in polymer matrix: A review”; Center for Advanced Materials Technology; Apr. 20, 2005. |
Yan, Xing-Bin, et al., Fabrications of Three-Dimensional ZnO-Carbon Nanotube (CNT) Hybrids Using Self-Assembled CNT Micropatterns as Framework, 2007. pp. 17254-17259, vol. III. |
Zhang, et al.; “Superaligned Carbon Nanotube Grid for High Resolution Transmission Electron Microscopy of Nanomaterials”; 2008 American Chemical Society. |
U.S. Appl. No. 12/890,325, filed Sep. 24, 2010, Dongbing Wang; office action dated Sep. 7, 2012. |
PCT Application No. PCT/US2011/044168; filed Mar. 28, 2012; Kang Hyun II; report mailed Mar. 28, 2012. |
U.S. Appl. No. 12/899,750, filed Oct. 7, 2010, Steven Liddiard; notice of allowance dated Jun. 4, 2013. |
U.S. Appl. No. 12/890,325, filed Sep. 24, 2010, Dongbing Wang; notice of allowance dated Jul. 16, 2013. |
Number | Date | Country | |
---|---|---|---|
61443822 | Feb 2011 | US |