Number | Date | Country | Kind |
---|---|---|---|
62-80548 | Mar 1987 | JPX |
Filing Document | Filing Date | Country | Kind | 102e Date | 371c Date |
---|---|---|---|---|---|
PCT/JP88/00321 | 3/30/1988 | 1/27/1989 | 1/27/1989 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO88/07769 | 10/6/1988 |
Number | Name | Date | Kind |
---|---|---|---|
4011016 | Layne et al. | Mar 1977 | |
4309604 | Yoshikawa et al. | Jan 1982 | |
4698658 | Sannomiya et al. | Oct 1987 | |
4714950 | Kawajiri et al. | Dec 1987 | |
4820915 | Hamakawa et al. | Apr 1989 |
Number | Date | Country |
---|---|---|
3533146 | Mar 1987 | DEX |
58-116781 | Oct 1983 | JPX |
59-27581 | May 1984 | JPX |
Entry |
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"An Amorphous SiC/Si Two-Color Detector", IEEE Electron Device Letters, vol. EDL 8, No. 8, New York, N.Y., Aug. 1987. |
"The Amorphous SiC/Si Two and Three-Color Detector with High Rejection Ration", Technical Digest, International Electron Devices Meeting, Washington, D.C., Dec. 6-9, 1987. |