This application claims benefit of priority to Japanese Patent Application No. 2019-202352, filed Nov. 7, 2019, the entire content of which is incorporated herein by reference.
The present disclosure relates to a common mode choke coil.
A common mode choke coil is known as one type of circuit noise filter. For example, International Publication No. 2015/029976 discloses a common mode choke coil that includes a body composed of an insulator, a plurality of coil conductors that are provided in the body and each consist of a spiral-shaped coil portion and an extension portion that is connected to the coil portion and extends in a straight line, a plurality of outer electrodes that are provided on a surface of the body, and a plurality of outer pads that connect the extension portions and the outer electrodes to each other. In each coil conductor, the angle formed between the coil portion and the extension portion at the contact point where the coil portion and the extension portion are connected to each other is set to be an obtuse angle.
In the common mode choke coil disclosed in International Publication No. 2015/029976, the angle formed between the coil portion and the extension portion in each coil conductor at the contact point where the coil portion and the extension portion are connected to each other is set to be an obtuse angle in order suppress degradation of inductance caused by some magnetic flux generated by the coil conductors being canceled out. However, the two coils in this common mode choke coil have significantly different path lengths from each other, and therefore there is a risk of the inductances of the two coils being greatly shifted from each other. Therefore, when such a common mode choke coil is incorporated into a circuit, among the lines corresponding to the individual coils, the signal-waveform sharpness of one line may be weakened as a result of the characteristic impedance between that signal line and ground (GND) being greatly shifted. In other words, the noise suppression function provided by the common mode choke coil may be reduced.
Accordingly, the present disclosure provides a common mode choke coil that has an excellent noise suppression function.
A preferred embodiment of the present disclosure provides a common mode choke coil that includes an element body formed by stacking a plurality of insulating layers in a height direction; a first coil and a second coil that are built into the element body; a first outer electrode that is provided on a surface of the element body and is electrically connected to one end of the first coil; a second outer electrode that is provided on a surface of the element body at a position that faces the first outer electrode in a width direction that is perpendicular to the height direction and that is electrically connected to another end of the first coil; a third outer electrode that is provided on a surface of the element body and is electrically connected to one end of the second coil; and a fourth outer electrode that is provided on a surface of the element body at a position that faces the third outer electrode in the width direction and that is electrically connected to another end of the second coil. When L1 is an inductance of the first coil and L2 is an inductance of the second coil, 100×|L1−L2|/((L1+L2)/2)≤5 at 1 GHz.
According to the preferred embodiment of the present disclosure, a common mode choke coil having an excellent noise suppression function can be provided.
Other features, elements, characteristics and advantages of the present disclosure will become more apparent from the following detailed description of preferred embodiments of the present disclosure with reference to the attached drawings.
Hereafter, a common mode choke coil of an embodiment of the present disclosure will be described. Note that the present disclosure is not limited to the following configurations and may be modified as appropriate within a range that does not depart from the gist of the present disclosure. Furthermore, combinations of a plurality of the preferred configurations described below are also included in the scope of the present disclosure.
Common Mode Choke Coil
In this specification, a length direction, a width direction, and a height direction of the common mode choke coil are the directions respectively defined by arrows L, W, and T, as indicated in
As illustrated in
The element body 10 is, for example, substantially shaped like a rectangular parallelepiped having six surfaces as illustrated in
Corner portions and edge portions of the element body 10 are preferably rounded. “Corner portions” of the element body 10 are parts where three surfaces of the element body 10 intersect. “Edge portions” of the element body 10 are parts where two surfaces of the element body 10 intersect.
As described later, the element body 10 is formed by stacking a plurality of insulating layers in the height direction T.
The insulating layers constituting the element body 10 are preferably composed of a glass ceramic material. Thus, the radio-frequency characteristics of the common mode choke coil 1 are improved.
The glass ceramic material preferably includes a glass material containing at least K, B, and Si.
The glass material preferably contains K at 0.5 to 5 wt % expressed in terms of K2O, B at 10 to 25 wt % expressed in terms of B2O3, Si at 70 to 85 wt % expressed in terms of SiO2, and Al at 0 to 5 wt % expressed in terms of Al2O3.
The glass-ceramic material preferably contains SiO2 (quartz) and Al2O3 (alumina) as fillers in addition to the glass material described above. In this case, the glass ceramic material preferably contains the glass material at 60 to 66 wt %, SiO2 at 34 to 37 wt % as a filler, and Al2O3 at 0.5 to 4 wt % as a filler. The radio-frequency characteristics of the common mode choke coil 1 are improved as a result of the glass ceramic material including SiO2 as a filler. Furthermore, the mechanical strength of the element body 10 is improved as a result of the glass ceramic material including Al2O3 as a filler.
The first outer electrode 21 is provided on the surface of the element body 10, more specifically, the first outer electrode 21 extends along part of each of the first side surface 10c, the first main surface 10e, and the second main surface 10f.
The second outer electrode 22 is provided on the surface of the element body 10, more specifically, the second outer electrode 22 extends along part of each of the second side surface 10d, the first main surface 10e, and the second main surface 10f. In addition, the second outer electrode 22 is provided at a position facing the first outer electrode 21 in the width direction W.
The third outer electrode 23 is provided on the surface of the element body 10, more specifically, the third outer electrode 23 extends along part of each of the first side surface 10c, the first main surface 10e, and the second main surface 10f at a position spaced apart from the first outer electrode 21.
The fourth outer electrode 24 is provided on the surface of the element body 10, more specifically, the fourth outer electrode 24 extends along part of each of the second side surface 10d, the first main surface 10e, and the second main surface 10f at a position spaced apart from the second outer electrode 22. In addition, the fourth outer electrode 24 is provided at a position facing the third outer electrode 23 in the width direction W.
The first outer electrode 21, the second outer electrode 22, the third outer electrode 23, and the fourth outer electrode 24 may each have a single-layer structure or a multilayer structure.
In the case where the first outer electrode 21, the second outer electrode 22, the third outer electrode 23, and the fourth outer electrode 24 each have a single-layer structure, for example, Ag, Au, Cu, Pd, Ni, and Al or an alloy of any of these metals may be used as the material forming the outer electrodes.
In the case where the first outer electrode 21, the second outer electrode 22, the third outer electrode 23, and the fourth outer electrode 24 each have a multilayer structure, each outer electrode may for example include a base electrode layer containing Ag, a Ni plating film, and a Sn plating film stacked in this order from the surface of the element body 10.
As illustrated in
The insulating layer 11a, the insulating layer 11b, the insulating layer 11c, the insulating layer 11d, and the insulating layer 11e are preferably formed of the same material.
In the element body 10, at least one insulating layer having no conductor portions such as coil conductors, extension electrodes, and via conductors may be stacked on at least either of the side of the insulating layer 11a near the second main surface 10f and the side of the insulating layer 11e near the first main surface 10e. For example, in the element body 10, an insulating layer 11f may be stacked on the side of the insulating layer 11e near the first main surface 10e, as illustrated in
A first coil 31 and a second coil 32 are built into the element body 10.
The first coil 31 is formed by stacking a plurality of coil conductors, including a first coil conductor and a second coil conductor, together with insulating layers in the height direction T and electrically connecting the coil conductors to each other. In addition, the second coil 32 is formed by stacking a plurality of coil conductors, including a third coil conductor and a fourth coil conductor, together with insulating layers in the height direction T and electrically connecting the coil conductors to each other. This is described in more detail below.
A second coil conductor 42 is provided on a main surface of the insulating layer 11a. The second coil conductor 42 includes a second line portion 52 and a second land portion 62. One end of the second line portion 52 is connected to a second extension electrode 72 that extends from the second outer electrode 22. The other end of the second line portion 52 is connected to the second land portion 62.
A fourth coil conductor 44 is provided on a main surface of the insulating layer 11b. The fourth coil conductor 44 includes a fourth line portion 54 and a fourth land portion 64. One end of the fourth line portion 54 is connected to a fourth extension electrode 74 that extends from the fourth outer electrode 24. The other end of the fourth line portion 54 is connected to the fourth land portion 64.
A land portion 65a is provided on the main surface of the insulating layer 11b at a position that is spaced apart from the fourth land portion 64. In addition, a via conductor 81a that penetrates through the insulating layer 11b in the height direction T is provided at a position that overlaps the land portion 65a.
A land portion 65b is provided on a main surface of the insulating layer 11c. In addition, a via conductor 81b that penetrates through the insulating layer 11c in the height direction T is provided at a position that overlaps the land portion 65b.
A land portion 65c is provided on the main surface of the insulating layer 11c at a position that is spaced apart from the land portion 65b. In addition, a via conductor 81c that penetrates through the insulating layer 11c in the height direction T is provided at a position that overlaps the land portion 65c.
A first coil conductor 41 is provided on a main surface of the insulating layer 11d. The first coil conductor 41 includes a first line portion 51 and a first land portion 61. One end of the first line portion 51 is connected to a first extension electrode 71 that extends from the first outer electrode 21. The other end of the first line portion 51 is connected to the first land portion 61.
A via conductor 81e that penetrates through the insulating layer 11d in the height direction T is provided at a position that overlaps the first land portion 61.
A land portion 65d is provided on the main surface of the insulating layer 11d at a position that is spaced apart from the first land portion 61. In addition, a via conductor 81d that penetrates through the insulating layer 11d in the height direction T is provided at a position that overlaps the land portion 65d.
A third coil conductor 43 is provided on a main surface of the insulating layer 11e. The third coil conductor 43 includes a third line portion 53 and a third land portion 63. One end of the third line portion 53 is connected to a third extension electrode 73 that extends from the third outer electrode 23. The other end of the third line portion 53 is connected to the third land portion 63.
A via conductor 81f that penetrates through the insulating layer 11e in the height direction T is provided at a position that overlaps the third land portion 63.
As described above, when the insulating layer 11a, the insulating layer 11b, the insulating layer 11c, the insulating layer 11d, and the insulating layer 11e having the conductor portions such as the coil conductors, extension electrodes, and the via conductors are sequentially stacked in the height direction T, the first land portion 61 of the first coil conductor 41 is electrically connected to the second land portion 62 of the second coil conductor 42 by the via conductor 81e, the land portion 65b, the via conductor 81b, the land portion 65a, and the via conductor 81a in this order, as illustrated in
As illustrated in
As illustrated in
The coil axes of the first coil 31 and the second coil 32 extend in the height direction T through the centers of the cross-sectional shape of the coils in a sectional view in the height direction T.
In a sectional view in the height direction T, the first coil 31 and the second coil 32 may have outer shapes consisting of substantially straight line portions and curved line portions as illustrated in
In a sectional view in the height direction T, the first land portion 61, the second land portion 62, the third land portion 63, the fourth land portion 64, the land portion 65a, the land portion 65b, the land portion 65c, and the land portion 65d may have substantially circular shapes as illustrated in
For example, Ag, Au, Cu, Pd, Ni, Al, or an alloy of any of these metals may be used as the material forming the first line portion 51, the second line portion 52, the third line portion 53, the fourth line portion 54, the first land portion 61, the second land portion 62, the third land portion 63, the fourth land portion 64, the land portion 65a, the land portion 65b, the land portion 65c, the land portion 65d, the first extension electrode 71, the second extension electrode 72, the third extension electrode 73, the fourth extension electrode 74, the via conductor 81a, the via conductor 81b, the via conductor 81c, the via conductor 81d, the via conductor 81e, and the via conductor 81f.
In the common mode choke coil 1, when L1 is the inductance of the first coil 31 and L2 is the inductance of the second coil 32, 100×|L1−L2|/((L1+L2)/2)≤5 at 1 GHz. “100×|L1−L2|/((L1+L2)/2)” expresses the degree of deviation between the inductance of the first coil 31 and the inductance of the second coil 32. The common mode choke coil 1 having an excellent noise suppression function particularly in a radio-frequency band can be realized by setting the degree of deviation between the inductances to be less than or equal to 5%.
In the common mode choke coil 1, at 1 GHz, it is preferable that 100×|L1−L2|/((L1+L2)/2)≤4 and it is particularly preferable that 100×|L1−L2|/((L1+L2)/2)=0, i.e., L1=L2.
In the common mode choke coil 1, at 100 MHz, it is preferable that 100×|L1−L2|/((L1+L2)/2)≤3, it is more preferable that 100×|L1−L2|/((L1+L2)/2)≤1, and it is particularly preferable that 100×|L1−L2|/((L1+L2)/2)=0, i.e., L1=L2.
L1 and L2 may lie in a range from 1 nH to 10 nH. The effect of the deviation between the inductance of the first coil 31 and the inductance of the second coil 32 on the noise suppression function tends to be more pronounced when the inductances of the first coil 31 and the second coil 32 are small. In contrast, the noise suppression function of the common mode choke coil 1 is excellent even when the inductances of the first coil 31 and the second coil 32 are small.
The inductances of the first coil 31 and the second coil 32 are measured in the following way.
First, as illustrated in
Next, as illustrated in
For example, the network analyzer “E5071C” manufactured by Keysight Technologies is used as the network analyzer.
In the common mode choke coil 1, it is preferable that 100×(R1−R2)/R1≤3 when R1≥R2 and that 100×(R2−R1)/R2≤3 when R2≥R1, where R1 is the path length of the first coil 31 and R2 is the path length of the second coil 32. “100×(R1−R2)/R1” and “100×(R2−R1)/R2” express the degree of deviation between the path length of the first coil 31 and the path length of the second coil 32. The degree of deviation between the inductance of the first coil 31 and the inductance of the second coil 32 becomes sufficiently small and as a result the noise suppression function of the common mode choke coil 1 is markedly improved by making the degree of path length deviation less than or equal to 3%.
The path length of the first coil 31 means the total length of the wiring line connected between the first extension electrode 71 and the second extension electrode 72, more specifically, the length of the line passing through the first line portion 51, the first land portion 61, the via conductor 81e, the land portion 65b, the via conductor 81b, the land portion 65a, the via conductor 81a, the second land portion 62, and the second line portion 52. The path length of the second coil 32 means the total length of the wiring line connected between the third extension electrode 73 and the fourth extension electrode 74, more specifically, the length of the line passing through the third line portion 53, the third land portion 63, the via conductor 81f, the land portion 65d, the via conductor 81d, the land portion 65c, the via conductor 81c, the fourth land portion 64, and the fourth line portion 54.
The path length of the first coil 31 and the path length of the second coil 32 are determined in the following manner. First, the common mode choke coil 1 (element body 10) is ground down so as to expose an LW cross section that is parallel to the length direction L and the width direction W. Then, the length of the line passing through the center of the width of each line portion and each land portion is measured for each LW section, as illustrated in
In the common mode choke coil 1, it is desirable to reduce the difference between the path length of the first coil 31 and the path length of the second coil 32, as described above, from the viewpoint of reducing the deviation between the inductance of the first coil 31 and the inductance of the second coil 32. A specific example of a method for reducing the difference between the path length of the first coil 31 and the path length of the second coil 32 will be described below.
First, description will be given of a common mode choke coil of the related art, which will be compared with the present disclosure.
In contrast to the common mode choke coil of the related art illustrated in
In the example common mode choke coil of the embodiment of the present disclosure illustrated in
More specifically, in the example common mode choke coil of the embodiment of the present disclosure illustrated in
In contrast, in the common mode choke coil of the related art illustrated in
As illustrated in
The path adjusting portions are provided in the first coil 31 in the example common mode choke coil of the embodiment of the present disclosure illustrated in
A method of reducing the difference between the path length of the first coil 31 and the path length of the second coil 32 by providing path adjusting portions has been described, but the following method may also be used.
In this other example of the common mode choke coil of the embodiment of the present disclosure illustrated in
The coil diameters (outer diameters) of the first coil 31 and the second coil 32 mean the diameters of area equivalent circles of the cross-sectional shapes (outer shapes) of the coils in a sectional view in the height direction T.
The number of turns of the first coil 31 and the number of turns of the second coil 32 may be less than or equal to five turns. The effect of the deviation between the inductance of the first coil 31 and the inductance of the second coil 32 on the noise suppression function tends to be more pronounced when the number of turns of the first coil 31 and the second coil 32 is small. In contrast, the common mode choke coil 1 has an excellent noise suppression function even when the number of turns of the first coil 31 and the second coil 32 is small Note that the number of turns of the first coil 31 and the number of turns of the second coil 32 may be greater than or equal to five turns.
It is preferable that the width of the first line portion 51, the width of the second line portion 52, the width of the third line portion 53, and the width of the fourth line portion 54 in a sectional view in the height direction T be identical from the viewpoint of reducing the deviation between the inductance of the first coil 31 and the inductance of the second coil 32.
In the common mode choke coil 1, at 1 GHz, it is preferable that 100×|Z1−Z2|/((Z1+Z2)/2)≤5, it is more preferable that 100×|Z1−Z2|/((Z1+Z2)/2)≤4, and it is particularly preferable that 100×|Z1−Z2|/((Z1+Z2)/2)=0, i.e., Z1=Z2, where Z1 is the impedance of the first coil 31 and Z2 is the impedance of the second coil 32. “100×|Z1−Z2|/((Z1+Z2)/2)” expresses the degree of deviation between the impedance of the first coil 31 and the impedance of the second coil 32. By reducing this impedance deviation to be less than or equal to 5%, the noise suppression function of the common mode choke coil 1 becomes especially excellent, particularly in a radio-frequency band.
In the common mode choke coil 1, at 100 MHz, it is preferable that 100×|Z1−Z2|/((Z1+Z2)/2)≤3, it is more preferable that 100×|Z1−Z2|/((Z1+Z2)/2)≤1, and it is particularly preferable that 100×|Z1−Z2|/((Z1+Z2)/2)=0, i.e., Z1=Z2.
The impedances of the first coil 31 and the second coil 32 are measured in the same manner as in the inductance measurement method described with reference to
Method of Manufacturing Common Mode Choke Coil
Next, an example of a method of manufacturing the common mode choke coil of the embodiment of the present disclosure will be described.
Preparation of Glass Ceramic Material
K2O, B2O3, SiO2, Al2O3, and so forth are mixed in a prescribed ratio. The resulting mixture is then melted by being subjected to firing. The resulting melted mixture is then quenched to produce a glass material. Next, a glass ceramic material is prepared by adding SiO2 (quartz), Al2O3 (alumina), and so forth to the glass material as fillers.
Preparation of Glass Ceramic Sheets
A ceramic slurry is prepared by adding an organic binder such as polyvinyl butyral resin, an organic solvent such as ethanol or toluene, a plasticizer, and so forth to the glass ceramic material and mixing the materials. The ceramic slurry is then molded into a substantially sheet-like shape using a doctor blade method or the like and then punched to form prescribed shapes, thereby forming glass ceramic sheets.
Formation of Conductor Patterns
Coil-conductor conductor patterns corresponding to the coil conductors illustrated in
Manufacture of Multilayer Block
The glass ceramic sheets on and in which conductor patterns have been formed are stacked in the order illustrated in
Manufacture of Element Body
Individual chips are manufactured by cutting the multilayer block into pieces of a prescribed size by using a dicer or the like. After that, the individual chips are fired, whereby the glass ceramic sheets become the insulating layers and the coil-conductor conductor patterns, the extension-electrode conductor patterns, and the via-conductor conductor patterns become the coil conductors, the extension electrodes, and the via conductors. As a result, the element body having the first coil and the second coil built thereinto as illustrated in
The corner portions and edge portions of the element body may be rounded by performing barrel polishing, for example.
Formation of Outer Electrodes
A conductive paste containing Ag and glass frit is applied to at least four locations on both side surfaces of the element body where the extension electrodes are exposed. Then, base electrode layers are formed by baking the thus-formed films. Next, a Ni plating film and a Sn plating film are sequentially formed on each base electrode layer by performing electrolytic plating. As a result, the first outer electrode, the second outer electrode, the third outer electrode, and the fourth outer electrode are formed as illustrated in
The common mode choke coil of the embodiment of the present disclosure as exemplified in
Hereafter, an example that discloses the common mode choke coil of the embodiment of the present disclosure in a more specific manner is described. The present disclosure is not limited to just the following example.
A common mode choke coil of example 1 was manufactured using the following method.
Preparation of Glass Ceramic Material
K2O, B2O3, SiO2, and Al2O3 were weighed in a prescribed ratio and mixed inside a platinum crucible. Then, the resulting mixture was melted by firing the mixture at a temperature in the range from 1500° C. to 1600° C. After that, the resulting melted mixture was quenched to produce a glass material.
Next, glass powder was prepared by pulverizing the glass material so that the average particle diameter D50 was in a range from 1 μm to 3 μm. In addition, quartz powder and alumina powder with an average particle diameter D50 in a range from 0.5 μm to 2.0 μm were prepared as fillers. Here, the average particle diameter D50 is a particle diameter corresponding to a volume basis cumulative percentage of 50%. A glass ceramic material was then prepared by adding the quartz powder and the alumina powder to the glass powder as fillers.
Preparation of Glass Ceramic Sheets
A ceramic slurry was prepared by adding an organic binder such as polyvinyl butyral resin, an organic solvent such as ethanol or toluene, a plasticizer, and a PSZ medium to a ball mill together with the glass ceramic material and mixing the materials. Then, the ceramic slurry was molded into a substantially sheet-like shape with a thickness in a range from 20 μm to 30 μm using a doctor blade method or the like and then punched to form substantially rectangular shapes, thereby forming glass ceramic sheets.
Formation of Conductor Patterns
Coil-conductor conductor patterns corresponding to the coil conductors illustrated in
Manufacture of Multilayer Block
The glass ceramic sheets on and in which conductor patterns had been formed were stacked in the order illustrated in
Manufacture of Element Body
The multilayer block was cut into pieces of a prescribed size using a dicer or the like, thereby manufacturing individual chips. After that, the individual chips were fired at 880° C. for 1.5 hours, whereby the glass ceramic sheets became the insulating layers and the coil-conductor conductor patterns, the extension-electrode conductor patterns, and the via-conductor conductor patterns became the coil conductors, the extension electrodes, and the via conductors. As a result, the element body having the first coil and the second coil built thereinto as illustrated in
Next, the corner portions and edge portions of the element body were rounded by placing the element body in a rotary barrel machine along with a medium and performing barrel polishing.
Formation of Outer Electrodes
A conductive paste containing Ag and glass frit was applied to at least four locations on both side surfaces of the element body where the extension electrodes were exposed. Then, base electrode layers were formed by baking the resulting films at 810° C. for 1 minute. The thickness of the base electrode layers was 5 μm. Next, a Ni plating film and a Sn plating film were sequentially formed on each base electrode layer by performing electrolytic plating. The thickness of each Ni plating film and Sn plating film was 3 μm. As a result, the first outer electrode, the second outer electrode, the third outer electrode, and the fourth outer electrode were formed as illustrated in
The common mode choke coil of example 1 was manufactured as described above. The size of the common mode choke coil of example 1 was 0.6 mm in the length direction, 0.5 mm in the width direction, and 0.3 mm in the height direction.
A common mode choke coil of comparative example 1 was manufactured in the same manner as the common mode choke coil of example 1 except that the element body in which the first coil and the second coil were built in as illustrated in
Evaluation
Evaluation of the common mode choke coils of example 1 and comparative example 1 was performed as described below.
Inductance
The inductances of the first coils and the second coils of the common mode choke coils were measured using the above-described method and the frequency characteristics were evaluated.
Next, when L1 and L2 represent the measured values of the inductances of the first coil and the second coil and the degree of deviation between these inductances was evaluated by calculating 100×|L1−L2|/((L1+L2)/2). This evaluation was carried under conditions of frequencies of 1 GHz and 100 MHz. The obtained results are illustrated in Table 1.
Impedance
The impedances of the first coils and the second coils of the common mode choke coils were measured using the above-described method and the frequency characteristics were evaluated.
Next, Z1 and Z2 represent the measured values of the impedances of the first coil and the second coil and the degree of deviation between these impedances was evaluated by calculating 100×|Z1−Z2|/((Z1+Z2)/2). This evaluation was carried under conditions of frequencies of 1 GHz and 100 MHz. The obtained results are illustrated in Table 1.
As illustrated in Table 1, the degree of deviation between the inductance of the first coil and the inductance of the second coil was smaller in the common-mode choke coil of example 1 than in the common-mode choke coil of comparative example 1. In addition, as illustrated in
As illustrated in Table 1, the degree of deviation between the impedance of the first coil and the impedance of the second coil was smaller in the common-mode choke coil of example 1 than in the common-mode choke coil of comparative example 1. In addition, as illustrated in
Path Length
The path lengths of the first and second coils of the common mode choke coils were measured using the method described above and the respective measured values were represented by R1 and R2. The degree of deviation between these path lengths was evaluated by calculating 100×(R1−R2)/R1 when R1≥R2 and 100×(R2−R1)/R2 when R2≥R1. As a result, the degree of deviation between the path length of the first coil and the path length of the second coil was 2.1% in the common mode choke coil of example 1 and 6.4% in the common mode choke coil of comparative example 1.
From the above evaluation results, it was found that the common mode choke coil of example 1 had a superior noise suppression function than the common mode choke coil of comparative example 1.
While preferred embodiments of the disclosure have been described above, it is to be understood that variations and modifications will be apparent to those skilled in the art without departing from the scope and spirit of the disclosure. The scope of the disclosure, therefore, is to be determined solely by the following claims.
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An Office Action mailed by the Korean Intellectual Property Office dated Oct. 9, 2021, which corresponds to Korean Patent Application No. 10-2020-0146103 and is related to U.S. Appl. No. 17/084,321 with English language translation. |
Number | Date | Country | |
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20210142938 A1 | May 2021 | US |