1. Field of the Invention
The present invention relates to a polishing pad and a method for making the same. More particularly, the present invention relates to a complex polishing pad and a method for making the same.
2. Description of the Related Art
A common polishing is using a chemical mechanical polishing (CMP) process to polish a rough surface, in which a slurry containing polishing particles is uniformly distributed on the surface of a polishing pad. Meanwhile, after a polishing workpiece is rest on the polishing pad, a repeated and regulate rubbing and polishing action is performed. The polishing workpiece is an object, such as semiconductor, storage medium buffer layer, integrated circuit, LCD flat panel glass, optical glass, and photoelectric panel.
In the conventional single-layer independent foaming polishing layer, the distribution and size of the foaming pores generated during the process are unlikely to be made uniform due to the slurry concentration and the molding temperature, resulting in the instability of the quality of the conventional polishing layer. In another conventional polishing layer formed by an independent non-foaming resin, the polishing surface has no fine pores, such that the slurry cannot be maintained between the polishing layer and the polishing article, thereby alleviating the polishing efficacy.
Another conventional complex polishing pad is formed by the following steps: directly coating a polymer elastomer on a buffer layer; obtaining a polymer elastomer film by solidifying and slicing; and then adhering the polymer elastomer film to another buffer layer with a double-sided tape. However, the polymer elastomer film obtained through slicing may be uneven due to differences in the equipment and the cotton content.
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Accordingly, the conventional complex polishing pad has a surface of poor flatness, and thus the polishing effect is poor. Furthermore, in the conventional technique, the polymer elastomer film and the buffer layer are adhered with a double-sided tape, and the polymer elastomer film and the buffer layer both have an uneven surface, so the combination between the polymer elastomer film and the buffer layer is weak.
Consequently, there is an existing need for providing a complex polishing pad and method for making the same to solve the above-mentioned problems.
An objective of the present invention is to provide a complex polishing pad. The complex polishing pad comprises a buffer layer and a polishing layer. The buffer layer is of a continuous-porous material, and has a flattened surface. The polishing layer is of a continuous-porous material, disposed on the flattened surface, so as to form a complex polishing pad, in which the polishing layer is used to polish a polishing workpiece.
Another objective of the present invention is to provide a method for making a complex polishing pad. The making method comprises: (a) providing a buffer layer, in which the buffer layer is of a continuous-porous material and has a surface; (b) flattening the surface of the buffer layer to form a flattened surface; and (c) disposing a polishing layer on the flattened surface, so as to form a complex polishing pad, in which the polishing layer is of a continuous-porous material and is used to polish a polishing workpiece.
A buffer layer with an extremely flat surface can be generated according to the making method of the present invention, such that the polishing layer disposed on the flattened surface also has an extremely flat surface. Therefore, during the polishing process of the complex polishing pad of the present invention, a uniform force is applied to the surface of a polishing workpiece, such that the polishing workpiece after being polished has a flatter surface, and the polishing workpiece may not be scratched or damaged. Thus, the complex polishing pad of the present invention has a preferred polishing effect. Additionally, the complex polishing pad has a better flatness, and thus the buffer layer and the polishing layer have a stronger combination.
The present invention provides a complex polishing pad, which is used in a chemical mechanical polishing (CMP) process for polishing or planarizing a polishing workpiece. The polishing workpiece comprises, but not limited to, objects such as semiconductor, storage medium buffer layer, integrated circuit, LCD flat panel glass, optical glass, and photoelectric panel.
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In the embodiment, the flatness of the flattened surface 142 is calculated by means of standard deviation, and the calculation equation is as follows:
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Similarly, after the solidifying step, the method of the invention preferably further comprises a step of grinding and leveling the polishing layer 25, so as to enhance the flatness of the polishing layer 25, and increase the uniformity of the thickness of the complex polishing pad 2. Additionally, after the step of polishing, the method of the invention preferably further comprises a step of forming a plurality of grooves in the polishing layer 25. According to different applications, the grooves can be of geometric configurations of square, triangle, or rectangle.
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The polishing layer 15 is disposed on the flattened surface 142, so as to form the complex polishing pad 1. In the embodiment, the polishing layer 15 is a continuous-porous polymer elastic sheet, used for polishing a polishing workpiece, and has a plurality of polishing particles (not shown) uniformly distributed in the polishing layer 15.
The present invention will be described in detail in the following embodiments. However, the present invention is not limited to the disclosure of the following embodiments.
First, a non-woven fabric is immersed in a continuous porous foaming PU polymer solution; after solidifying, the non-woven fabric containing PU polymer solution is sliced to have a thickness of about 1.1 mm; and after surface grinding, trimming, and smoothing, a buffer layer having a flattened surface is formed.
Additionally, an OPP film having a thickness of 0.03 mm is used as a carrier, and a polymer elastomer having a thickness of 1.0-1.1 mm is coated on the surface of the carrier. Next, the polymer elastomer is solidified by 25% of dimethylformamide (DMF). The solidified polymer elastomerhas a thickness of about 0.65 mm. Afterward, the polymer elastomer is water-washed at 75° C.-80° C., and a baking step is then performed at 130° C., such that the baked polymer elastomer has a thickness of about 0.55 mm.
Next, the baked polymer elastomer is separated from the carrier, so as to form a polishing layer. Then, the polishing layer is disposed on the flattened surface of the buffer layer. Finally, the surface of the polishing layer is grinded, such that the overall thickness is about 1.55 mm, and thereby the complex polishing pad of the present invention is performed.
First, a non-woven fabric is immersed in a continuous porous foaming PU polymer solution; after solidifying, the non-woven fabric containing PU polymer solution is sliced to have a thickness of about 1.1 mm; and after surface polishing, trimming, and smoothing, a buffer layer having a flattened surface is formed.
Additionally, a polymer elastomer having a thickness of 1.0-1.1 mm is coated on the flattened surface of the buffer layer, wherein the buffer layer is used as a carrier. Next, the polymer elastomer is solidified by 25% of DMF. The solidified polymer elastomer has a thickness of about 0.65 mm. Afterward, the polymer elastomer is water-washed at 75° C.-80° C., and a baking step is then performed at 130° C., such that the baked polymer elastomer has a thickness of about 0.55 mm.
Next, the baked polymer elastomer is grinded to have an overall thickness of about 1.55 mm, and thereby the complex polishing pad of the present invention is performed.
According to the making method of the present invention, a buffer layer having an extremely flat surface can be made, and thus the polishing layer 15 disposed on the buffer layer 14 also has an extremely flat surface. Therefore, during the polishing of the complex polishing pad 1 of the present invention, a uniform force is applied to the surface of a polishing workpiece, such that the polishing workpiece after being polished may have a flat surface, and may not be scratched or damaged. Thus, the complex polishing pad 1 of the present invention has a preferred polishing effect. In addition, the complex polishing pad 1 has a better flatness, and thus the buffer layer 14 and the polishing layer 15 have a stronger combination.
While the embodiments of the present invention have been illustrated and described, various modifications and improvements can be made by those skilled in the art. The embodiments of the present invention are therefore described in an illustrative but not restrictive sense. It is intended that the present invention may not be limited to the particular forms as illustrated, and that all modifications that maintain the spirit and scope of the present invention are within the scope as defined in the appended claims.