Number | Name | Date | Kind |
---|---|---|---|
5609489 | Bickford et al. | Mar 1997 | |
6062870 | Hopfer, III et al. | May 2000 | |
6183266 | Turner | Feb 2001 | |
6210173 | Matsunaga | Apr 2001 |
Entry |
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Burn-In & Test Socket Workshop Proceedings; Feb. 27-29, 2000, Hilton Mesa Pavilion Hotel, Mesa, Arizona; Sponsored By The IEEE Computer Society, Test Technology Technical Council; 11 Pages. |