BRIEF DESCRIPTION OF DRAWINGS
FIG. 1 is a sectional view of a test head in an electronic device testing apparatus according to an embodiment of the present invention.
FIG. 2 is an enlarged view of a region surrounded by a two-dot chain line in FIG. 1.
FIG. 3 is a side view of a performance board in the same embodiment.
FIG. 4 is a disassembled perspective view of an interface member in the same embodiment.
FIG. 5 is a plan view of the interface member in the same embodiment.
FIG. 6 is a perspective view of a connector housing in the same embodiment.
FIG. 7 is a sectional view of the connector housing in the same embodiment.
FIG. 8 is a perspective view of a connector housing in the related art.
FIG. 9 is a sectional view of the connector housing in the related art.