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G01R31/2889

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2889Interfaces

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for probing device-under-test
- Patent number 12,345,760
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method for repairing probe card
- Patent number 12,339,314
- Issue date Jun 24, 2025
- Japan Electronic Materials Corporation
- Yutaka Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,332,278
- Issue date Jun 17, 2025
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Interface board for testing image sensor, test system having the sa...
- Patent number 12,328,424
- Issue date Jun 10, 2025
- Samsung Electronics Co., Ltd.
- Shinki Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Space transformers configured to be utilized in a probe system, pro...
- Patent number 12,306,243
- Issue date May 20, 2025
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, inspection component, and inspection device
- Patent number 12,298,342
- Issue date May 13, 2025
- Kioxia Corporation
- Kohei Ide
- G01 - MEASURING TESTING
Information Patent Grant
Wedge amplitude-modulation probe card and a main body thereof
- Patent number 12,292,456
- Issue date May 6, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao Yu
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 12,282,062
- Issue date Apr 22, 2025
- AEHR Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 12,253,560
- Issue date Mar 18, 2025
- AEHR Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 12,244,083
- Issue date Mar 4, 2025
- Kabushiki Kaisha Nihon Micronics
- Shou Harako
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronics tester
- Patent number 12,228,609
- Issue date Feb 18, 2025
- AEHR Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Probe station capable of maintaining stable and accurate contact to...
- Patent number 12,228,608
- Issue date Feb 18, 2025
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai Chao
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Lead guides having a recessed face
- Patent number 12,181,516
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Chi-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with rigid frame and flexible tip portion
- Patent number 12,169,210
- Issue date Dec 17, 2024
- Keysight Technologies, Inc.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe card assembly
- Patent number 12,158,482
- Issue date Dec 3, 2024
- Mediatek Inc.
- Tung-Hsien Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Massively independent testers system
- Patent number 12,153,085
- Issue date Nov 26, 2024
- Hsu Kai Yang
- G01 - MEASURING TESTING
Information Patent Grant
In-situ testing system for semiconductor device in aerospace irradi...
- Patent number 12,146,908
- Issue date Nov 19, 2024
- Nanjing University
- Feng Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing system and time certification method
- Patent number 12,135,350
- Issue date Nov 5, 2024
- CHROMA ATE INC.
- Tzu-Ching Yang
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 12,117,484
- Issue date Oct 15, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip and chip test system
- Patent number 12,092,685
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Workpiece positioning mechanism and workpiece inspection apparatus
- Patent number 12,078,673
- Issue date Sep 3, 2024
- TAKAOKA TOKO CO., LTD.
- Taichi Aranami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Provisioning a reference voltage based on an evaluation of a pseudo...
- Patent number 12,066,959
- Issue date Aug 20, 2024
- Intel Corporation
- Vijayalakshmi Ramachandran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Degradation monitor for bond wire to bond pad interfaces
- Patent number 12,061,228
- Issue date Aug 13, 2024
- NXP B.V.
- Michiel van Soestbergen
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level device measurement for optical sensors
- Patent number 12,062,585
- Issue date Aug 13, 2024
- Artilux, Inc.
- Chien-Yu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration system
- Patent number 12,044,726
- Issue date Jul 23, 2024
- Xcerra Corporation
- William Reid
- G01 - MEASURING TESTING
Information Patent Grant
Probes for electrical testing in defect detection systems
- Patent number 12,044,727
- Issue date Jul 23, 2024
- Orbotech Ltd.
- Tal Goichman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST INSTRUMENT AND TEST LEAD EXTENSION FOR ONE HANDED TESTING OF A...
- Publication number 20250208167
- Publication date Jun 26, 2025
- John Riccitelli
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250208202
- Publication date Jun 26, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
BREAKOUT CONNECTOR PLATFORM FOR INTERPOSER MODULES THAT IMPLEMENT D...
- Publication number 20250180639
- Publication date Jun 5, 2025
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Andrew M. Kraemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER ACCEPTANCE TEST TOOL AND TEST METHOD USING THEREOF
- Publication number 20250155491
- Publication date May 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jin YAO
- G01 - MEASURING TESTING
Information Patent Application
IC TESTING APPARATUS WITH ELASTIC CONDUCTIVE PILLARS AND ITS MANUFA...
- Publication number 20250147099
- Publication date May 8, 2025
- He Chou Technology INC.
- WEI-BEEN YU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250138086
- Publication date May 1, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING INTEGRATED CIRCUITS
- Publication number 20250130256
- Publication date Apr 24, 2025
- MEDIATEK INC.
- Jing-Hui Zhuang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING IMAGING ELEMENT
- Publication number 20250130277
- Publication date Apr 24, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- SHINICHI MACHIDA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20250123325
- Publication date Apr 17, 2025
- KEN HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TESTER
- Publication number 20250102568
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ting-Yu CHIU
- G01 - MEASURING TESTING
Information Patent Application
LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...
- Publication number 20250085309
- Publication date Mar 13, 2025
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS
- Publication number 20250085335
- Publication date Mar 13, 2025
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS OF OPERATING PROBE SYSTEMS
- Publication number 20250067799
- Publication date Feb 27, 2025
- FormFactor, Inc.
- Jörg Hertwig
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, METHOD AND SYSTEM FOR IN-FIELD LANE TESTING AND REPAIR WITH...
- Publication number 20250052809
- Publication date Feb 13, 2025
- Intel Corporation
- Fei Su
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST CARRIER, SEMICONDUCTOR TEST APPARATUS INCLUDING...
- Publication number 20250044351
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Heejin Baek
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250044348
- Publication date Feb 6, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250004042
- Publication date Jan 2, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER FOR SEMICONDUCTOR-BASED SINGLE PHOTON EMISSION COMPUTED...
- Publication number 20240413186
- Publication date Dec 12, 2024
- Siemens Medical Solutions USA, Inc.
- Patanit Sanpitak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...
- Publication number 20240393389
- Publication date Nov 28, 2024
- Advantest Corporation
- Kosuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS
- Publication number 20240393364
- Publication date Nov 28, 2024
- Smiths Interconnect Americas, Inc.
- Jiachun Zhou
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CAPACITANCE-BASED DETECTION OF PROBE CONTACT
- Publication number 20240385238
- Publication date Nov 21, 2024
- FEI Company
- Shyam Sundar Aswadha Narayanan
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...
- Publication number 20240369622
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- SUNHEE KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF OPTIMIZING CABLING OF AT LEAST ONE DEVICE UNDER TEST AND...
- Publication number 20240353482
- Publication date Oct 24, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Sebastian ENGEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING A CHIP
- Publication number 20240353483
- Publication date Oct 24, 2024
- Lenovo (Singapore) Pte, Ltd.
- Xueyong Yang
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
FORCE/MEASURE CURRENT GAIN TRIMMING
- Publication number 20240337686
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Tanmay Neema
- H03 - BASIC ELECTRONIC CIRCUITRY

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for probing device-under-test

Probe card and method for repairing probe card

Probe card

Interface board for testing image sensor, test system having the sa...

Space transformers configured to be utilized in a probe system, pro...

Semiconductor device, inspection component, and inspection device

Wedge amplitude-modulation probe card and a main body thereof

Electronics tester

Electronics tester

Electrical connecting apparatus

Electronics tester

Probe station capable of maintaining stable and accurate contact to...

Amplitude-modulating probe card and its probe and amplitude-modulat...

Lead guides having a recessed face

Probe tip with rigid frame and flexible tip portion

Apparatus for testing electronic devices

Probe card assembly

Massively independent testers system

In-situ testing system for semiconductor device in aerospace irradi...

Electronic component testing system and time certification method

Test device

Coaxial probe

Chip and chip test system

Workpiece positioning mechanism and workpiece inspection apparatus

Semiconductor package test apparatus and method

Provisioning a reference voltage based on an evaluation of a pseudo...

Degradation monitor for bond wire to bond pad interfaces

Wafer-level device measurement for optical sensors

Calibration system

Probes for electrical testing in defect detection systems

Patents Applicationslast 30 patents

TEST INSTRUMENT AND TEST LEAD EXTENSION FOR ONE HANDED TESTING OF A...

ELECTRONICS TESTER

BREAKOUT CONNECTOR PLATFORM FOR INTERPOSER MODULES THAT IMPLEMENT D...

WAFER ACCEPTANCE TEST TOOL AND TEST METHOD USING THEREOF

IC TESTING APPARATUS WITH ELASTIC CONDUCTIVE PILLARS AND ITS MANUFA...

ELECTRONICS TESTER

APPARATUS FOR TESTING INTEGRATED CIRCUITS

INSPECTION METHOD AND METHOD OF MANUFACTURING IMAGING ELEMENT

ELECTRICAL CONNECTING APPARATUS

SEMICONDUCTOR DEVICE TESTER

LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...

TESTING APPARATUS

PROBE SYSTEMS AND METHODS OF OPERATING PROBE SYSTEMS

DEVICE, METHOD AND SYSTEM FOR IN-FIELD LANE TESTING AND REPAIR WITH...

SEMICONDUCTOR TEST CARRIER, SEMICONDUCTOR TEST APPARATUS INCLUDING...

ELECTRONICS TESTER

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

ELECTRONICS TESTER

ELECTRICAL CONNECTION APPARATUS

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

INTERPOSER FOR SEMICONDUCTOR-BASED SINGLE PHOTON EMISSION COMPUTED...

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...

SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS

CAPACITANCE-BASED DETECTION OF PROBE CONTACT

HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...

METHOD OF OPTIMIZING CABLING OF AT LEAST ONE DEVICE UNDER TEST AND...

METHOD AND SYSTEM FOR TESTING A CHIP

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

FORCE/MEASURE CURRENT GAIN TRIMMING