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CPC
G01R31/2889

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2889Interfaces

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Lead guides having a recessed face
- Patent number 12,181,516
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Chi-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with rigid frame and flexible tip portion
- Patent number 12,169,210
- Issue date Dec 17, 2024
- Keysight Technologies, Inc.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe card assembly
- Patent number 12,158,482
- Issue date Dec 3, 2024
- Mediatek Inc.
- Tung-Hsien Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Massively independent testers system
- Patent number 12,153,085
- Issue date Nov 26, 2024
- Hsu Kai Yang
- G01 - MEASURING TESTING
Information Patent Grant
In-situ testing system for semiconductor device in aerospace irradi...
- Patent number 12,146,908
- Issue date Nov 19, 2024
- Nanjing University
- Feng Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing system and time certification method
- Patent number 12,135,350
- Issue date Nov 5, 2024
- CHROMA ATE INC.
- Tzu-Ching Yang
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 12,117,484
- Issue date Oct 15, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip and chip test system
- Patent number 12,092,685
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Workpiece positioning mechanism and workpiece inspection apparatus
- Patent number 12,078,673
- Issue date Sep 3, 2024
- TAKAOKA TOKO CO., LTD.
- Taichi Aranami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Provisioning a reference voltage based on an evaluation of a pseudo...
- Patent number 12,066,959
- Issue date Aug 20, 2024
- Intel Corporation
- Vijayalakshmi Ramachandran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Degradation monitor for bond wire to bond pad interfaces
- Patent number 12,061,228
- Issue date Aug 13, 2024
- NXP B.V.
- Michiel van Soestbergen
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level device measurement for optical sensors
- Patent number 12,062,585
- Issue date Aug 13, 2024
- Artilux, Inc.
- Chien-Yu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration system
- Patent number 12,044,726
- Issue date Jul 23, 2024
- Xcerra Corporation
- William Reid
- G01 - MEASURING TESTING
Information Patent Grant
Probes for electrical testing in defect detection systems
- Patent number 12,044,727
- Issue date Jul 23, 2024
- Orbotech Ltd.
- Tal Goichman
- G01 - MEASURING TESTING
Information Patent Grant
Electronic instrument and signal analysis method
- Patent number 12,038,474
- Issue date Jul 16, 2024
- Rohde & Schwarz GmbH & Co. KG
- Sebastian Petzsch
- G01 - MEASURING TESTING
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 12,032,002
- Issue date Jul 9, 2024
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a test system
- Patent number 12,025,636
- Issue date Jul 2, 2024
- Teradyne, Inc.
- Timothy D. Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting semiconductor
- Patent number 12,025,652
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Mi-Sol Youn
- G01 - MEASURING TESTING
Information Patent Grant
Heater substrate, probe card substrate, and probe card
- Patent number 12,013,433
- Issue date Jun 18, 2024
- Kyocera Corporation
- Daisuke Jingu
- G01 - MEASURING TESTING
Information Patent Grant
Prober controlling device, prober controlling method, and prober
- Patent number 12,007,413
- Issue date Jun 11, 2024
- Tokyo Seimitsu Co., Ltd.
- Tetsuo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Signal transmission circuit and method, and integrated circuit (IC)
- Patent number 11,994,553
- Issue date May 28, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- You-Hsien Lin
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,994,554
- Issue date May 28, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,940,484
- Issue date Mar 26, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe station capable of maintaining stable and accurate contact to...
- Patent number 11,940,486
- Issue date Mar 26, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai Chao
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,940,487
- Issue date Mar 26, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250004042
- Publication date Jan 2, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER FOR SEMICONDUCTOR-BASED SINGLE PHOTON EMISSION COMPUTED...
- Publication number 20240413186
- Publication date Dec 12, 2024
- Siemens Medical Solutions USA, Inc.
- Patanit Sanpitak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...
- Publication number 20240393389
- Publication date Nov 28, 2024
- Advantest Corporation
- Kosuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS
- Publication number 20240393364
- Publication date Nov 28, 2024
- Smiths Interconnect Americas, Inc.
- Jiachun Zhou
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CAPACITANCE-BASED DETECTION OF PROBE CONTACT
- Publication number 20240385238
- Publication date Nov 21, 2024
- FEI Company
- Shyam Sundar Aswadha Narayanan
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...
- Publication number 20240369622
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- SUNHEE KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF OPTIMIZING CABLING OF AT LEAST ONE DEVICE UNDER TEST AND...
- Publication number 20240353482
- Publication date Oct 24, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Sebastian ENGEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING A CHIP
- Publication number 20240353483
- Publication date Oct 24, 2024
- Lenovo (Singapore) Pte, Ltd.
- Xueyong Yang
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
FORCE/MEASURE CURRENT GAIN TRIMMING
- Publication number 20240337686
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Tanmay Neema
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STATE TRANSITION CONTROL FOR PARAMETRIC MEASUREMENT UNIT
- Publication number 20240319260
- Publication date Sep 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Tanmay Neema
- G01 - MEASURING TESTING
Information Patent Application
MASSIVELY INDEPENDENT TESTERS SYSTEM
- Publication number 20240302429
- Publication date Sep 12, 2024
- Hsu Kai YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP WITH RIGID FRAME AND FLEXIBLE TIP PORTION
- Publication number 20240272199
- Publication date Aug 15, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR IN...
- Publication number 20240272200
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yuan-Li LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS A...
- Publication number 20240241155
- Publication date Jul 18, 2024
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR TESTING ICs
- Publication number 20240230715
- Publication date Jul 11, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO...
- Publication number 20240230754
- Publication date Jul 11, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai CHAO
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT, TESTING SYSTEM, AND OPERATING METHOD THEREOF
- Publication number 20240219458
- Publication date Jul 4, 2024
- VIA Labs, INC.
- Yi-Te Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE RESISTANT CONTACT UNIT HOLDER RECEPTACLE ASSEMBLY AND R...
- Publication number 20240201224
- Publication date Jun 20, 2024
- Semiconductor Components Industries, LLC
- Novellie Pangilinan VICTORIA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-RESET TESTING SYSTEMS AND METHODS
- Publication number 20240201251
- Publication date Jun 20, 2024
- Advantest Corporation
- Camilo Montenegro
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE ELEMENT WITH ELASTIC PROPERTIES PROVIDED WITH INTERNAL EL...
- Publication number 20240183900
- Publication date Jun 6, 2024
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
- Publication number 20240151769
- Publication date May 9, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND METHOD FOR REPAIRING PROBE CARD
- Publication number 20240110974
- Publication date Apr 4, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Yutaka TOMITA
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT CHIP FOR PROBE CARD, PROBE CARD AND PROBE CARD REPAIR METHOD
- Publication number 20240103071
- Publication date Mar 28, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Takashi YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBES FOR ELECTRICAL TESTING IN DEFECT DETECTION SYSTEMS
- Publication number 20240094285
- Publication date Mar 21, 2024
- ORBOTECH LTD.
- Tal GOICHMAN
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Amplitude-modulating probe card and its probe and amplitude-modulat...

Lead guides having a recessed face

Probe tip with rigid frame and flexible tip portion

Apparatus for testing electronic devices

Probe card assembly

Massively independent testers system

In-situ testing system for semiconductor device in aerospace irradi...

Electronic component testing system and time certification method

Test device

Coaxial probe

Chip and chip test system

Workpiece positioning mechanism and workpiece inspection apparatus

Semiconductor package test apparatus and method

Provisioning a reference voltage based on an evaluation of a pseudo...

Degradation monitor for bond wire to bond pad interfaces

Wafer-level device measurement for optical sensors

Calibration system

Probes for electrical testing in defect detection systems

Electronic instrument and signal analysis method

Chevron interconnect for very fine pitch probing

Probe for a test system

Apparatus and method for inspecting semiconductor

Heater substrate, probe card substrate, and probe card

Prober controlling device, prober controlling method, and prober

Signal transmission circuit and method, and integrated circuit (IC)

Test apparatus for semiconductor package

Probe head for reduced-pitch applications

Test apparatus for semiconductor package

Probe station capable of maintaining stable and accurate contact to...

Thermal solution for massively parallel testing

Patents Applicationslast 30 patents

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

ELECTRONICS TESTER

ELECTRICAL CONNECTION APPARATUS

INTERPOSER FOR SEMICONDUCTOR-BASED SINGLE PHOTON EMISSION COMPUTED...

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...

SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS

CAPACITANCE-BASED DETECTION OF PROBE CONTACT

HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...

METHOD OF OPTIMIZING CABLING OF AT LEAST ONE DEVICE UNDER TEST AND...

METHOD AND SYSTEM FOR TESTING A CHIP

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

FORCE/MEASURE CURRENT GAIN TRIMMING

STATE TRANSITION CONTROL FOR PARAMETRIC MEASUREMENT UNIT

MASSIVELY INDEPENDENT TESTERS SYSTEM

PROBE TIP WITH RIGID FRAME AND FLEXIBLE TIP PORTION

PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR IN...

PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS A...

SOCKET DEVICE FOR TESTING ICs

PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO...

INTEGRATED CIRCUIT, TESTING SYSTEM, AND OPERATING METHOD THEREOF

TEMPERATURE RESISTANT CONTACT UNIT HOLDER RECEPTACLE ASSEMBLY AND R...

SELF-RESET TESTING SYSTEMS AND METHODS

INTERFACE ELEMENT WITH ELASTIC PROPERTIES PROVIDED WITH INTERNAL EL...

TEST APPARATUS FOR IMAGE SENSOR PACKAGE

PROBE CARD AND METHOD FOR REPAIRING PROBE CARD

ALIGNMENT CHIP FOR PROBE CARD, PROBE CARD AND PROBE CARD REPAIR METHOD

APPARATUS FOR TESTING ELECTRONIC DEVICES

PROBES FOR ELECTRICAL TESTING IN DEFECT DETECTION SYSTEMS