Claims
- 1. An electronic telecommunication module comprising:circuit components interconnected in an electronic circuit for use in telecommunications by conductors on said module; said components and said conductors interconnecting said components having signal insertion points and monitoring points for testing and analyzing; and means for interfacing said circuit with a testing and diagnosing system, said means for interfacing including: a plurality of actuation probes driven by control signals provided by said testing and diagnosing system, for the automatic and programmed insertion of test signals into predetermined insertion points; a plurality of monitoring probes to collect signals present in the module from the monitoring points and transfer such signals to the testing and diagnosing system; shielded micro-coaxial cables connected on one side to said actuation and monitoring probes and on another side to connectors provided on the module, for signal transfer between the connectors and the probes; and conditioning means associated with the connectors and the cables for providing the control signals to the actuation probes, to allow signal insertion into modules based on different technologies by using the same type of control signal provided by the testing and diagnosing system and to provide a galvanic isolation between the testing and diagnosing system and the modules.
- 2. The electronic telecommunication module defined in claim 1 wherein said actuation probes comprise probes for connecting pre-determined points of the module to a pre-determined voltage level to simulate in these points a possible fault condition, and probes for injecting an adjustable current, simulating an interference, into these points, and said monitoring probes are arranged to collect responses from monitoring points connected with the insertion points and to transfer these responses to the testing and diagnosing system.
- 3. The electronic telecommunication module defined in claim 1 wherein said probes are made as miniaturized components.
- 4. The electronic telecommunication module defined in claim 1 wherein the insertion and/or monitoring points comprise pins of the components mounted on the module and said probes are permanently fixed to these points.
- 5. The electronic telecommunication module defined in claim 4 wherein the insertion points are placed in correspondence with a component in which the fault is to be simulated or a noise is to be injected.
- 6. The electronic telecommunication module defined in claim 1 wherein the insertion and/or monitoring points comprise pads for contact with the probes for performing functional tests on the module.
- 7. The electronic telecommunication module defined in claim 6 wherein the insertion points are intermediate points of a connection between a first component in which the fault is to be simulated or a noise is to be inserted and a second component which receives signals coming from the first component.
- 8. The electronic telecommunication module defined in claim 6 wherein the probes have conductors for connection with the respective insertion or monitoring point, an end of each of said conductors of the respective probe being anchored in a metal supports inserted into the respective pad.
- 9. The electronic telecommunication module defined in claim 1 wherein the insertion and/or monitoring points comprise metallized through holes pierced along said conductors.
- 10. The electronic telecommunication module defined in claim 1 wherein said conditioning means comprise an opto-isolator including a phototransistor and means for amplifying and inverting the signal emitted by the phototransistor of the opto-isolator.
Priority Claims (1)
Number |
Date |
Country |
Kind |
TO96A0256 |
Apr 1996 |
IT |
|
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a national stage of PCT/EP97/01632 filed Apr. 1, 1997 and based in turn on Italian national application TO 96 A 000256 filed Apr. 2, 1996 under the International Convention.
PCT Information
Filing Document |
Filing Date |
Country |
Kind |
102e Date |
371c Date |
PCT/EP97/01632 |
|
WO |
00 |
8/5/1998 |
8/5/1998 |
Publishing Document |
Publishing Date |
Country |
Kind |
WO97/37234 |
10/9/1997 |
WO |
A |
US Referenced Citations (5)
Number |
Name |
Date |
Kind |
4498196 |
Holoyda et al. |
Feb 1985 |
|
4646299 |
Schinabeck et al. |
Feb 1987 |
|
4731879 |
Sepp et al. |
Mar 1988 |
|
4810956 |
Hvezda et al. |
Mar 1989 |
|
5252914 |
Bobbit et al. |
Oct 1993 |
|
Foreign Referenced Citations (1)
Number |
Date |
Country |
33 22 914 |
Feb 1984 |
DE |
Non-Patent Literature Citations (1)
Entry |
International Test Conferrence 1988 Proceedings, Washington, Sep. 1988, pp. 13-22, Sheng-Jen Tsai et al: “GaAs Driver and Sensor for a High Speed Test System”. |