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4615030 | Kumagai | Sep 1986 | |
4835458 | Kim | May 1989 | |
4897817 | Katanosaka | Jan 1990 | |
5060230 | Arimoto et al. | Oct 1991 | |
5132937 | Tuda et al. | Jul 1992 | |
5168468 | Magome et al. | Dec 1992 | |
5185722 | Ota et al. | Feb 1993 | |
5258958 | Iwahashi et al. | Nov 1993 | |
5305261 | Furutani et al. | Apr 1994 |
Entry |
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Clinton Kuo et al., Soft-Defect Detection (SDD) Technique for a High-Reliability CMOS SRAM, IEEE Journal of Solid-state Circuits, vol. 25, No. 1, Feb., 1990. |