Cover for an electron microscope

Information

  • Patent Grant
  • D708245
  • Patent Number
    D708,245
  • Date Filed
    Thursday, May 30, 2013
    11 years ago
  • Date Issued
    Tuesday, July 1, 2014
    10 years ago
Abstract
Description


FIG. 1 is a front, top and right side perspective view of a cover for an electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a left side elevational view thereof;



FIG. 5 is a right side elevational view thereof;



FIG. 6 is a top plan view thereof;



FIG. 7 is a bottom plan view thereof;



FIG. 8 is a perspective view thereof shown in an opened position; and,



FIG. 9 is a perspective view thereof shown in another opened position.


Claims
  • We claim the ornamental design for a cover for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2012-029393 Nov 2012 JP national
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Entry
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
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