Cover for an electron microscope

Information

  • Patent Grant
  • D708245
  • Patent Number
    D708,245
  • Date Filed
    Thursday, May 30, 2013
    11 years ago
  • Date Issued
    Tuesday, July 1, 2014
    9 years ago
Abstract
Description


FIG. 1 is a front, top and right side perspective view of a cover for an electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a left side elevational view thereof;



FIG. 5 is a right side elevational view thereof;



FIG. 6 is a top plan view thereof;



FIG. 7 is a bottom plan view thereof;



FIG. 8 is a perspective view thereof shown in an opened position; and,



FIG. 9 is a perspective view thereof shown in another opened position.


Claims
  • We claim the ornamental design for a cover for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2012-029393 Nov 2012 JP national
US Referenced Citations (34)
Number Name Date Kind
D112253 Hayes Nov 1938 S
3297284 Pellerin Jan 1967 A
D220455 Mason Apr 1971 S
D223669 Nishino May 1972 S
3814356 Coleman et al. Jun 1974 A
3835320 Helwig Sep 1974 A
D264752 Leotta Jun 1982 S
4523094 Rossow Jun 1985 A
4669790 Briggs Jun 1987 A
D303267 Takahashi et al. Sep 1989 S
D332616 Hashimoto et al. Jan 1993 S
5350921 Aoyama et al. Sep 1994 A
5577817 Reynolds Nov 1996 A
D381031 Miyata et al. Jul 1997 S
5864138 Miyata et al. Jan 1999 A
6084239 Miyata et al. Jul 2000 A
D571385 Onuma et al. Jun 2008 S
D599688 Ito Sep 2009 S
D608810 Stoiakine Jan 2010 S
D623211 Oonuma et al. Sep 2010 S
D625749 Oonuma et al. Oct 2010 S
D626579 Oonuma et al. Nov 2010 S
D632323 Oonuma et al. Feb 2011 S
D633537 Oonuma et al. Mar 2011 S
D633538 Oonuma et al. Mar 2011 S
D635167 Oonuma et al. Mar 2011 S
D635168 Oonuma et al. Mar 2011 S
D636005 Oonuma et al. Apr 2011 S
D638046 Noda et al. May 2011 S
D644258 Noda et al. Aug 2011 S
D684609 Seo et al. Jun 2013 S
D687475 Oonuma et al. Aug 2013 S
20030227236 Brooks Dec 2003 A1
20080150404 Ono Jun 2008 A1
Foreign Referenced Citations (2)
Number Date Country
D 1295901 Mar 2007 JP
D 1321994 Feb 2008 JP
Non-Patent Literature Citations (3)
Entry
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
Jeol News, Introduction of New Products, High Throughput Electron Microscope, Jem-2800, Jul. 2011, vol. 46, No. 1, in English.
Imaging & Microscopy, Imaging-GIT.com, Fei Ultra-High Resolution Titan, Issue 1, Nov. 1, 2007, in English.