Electron or ion microscopes Electron or ion diffraction tubes

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H01J37/26

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/26Electron or ion microscopes Electron or ion diffraction tubes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 12,272,518
- Issue date Apr 8, 2025
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for area-wise inspecting a sample via a multi-beam particle...
- Patent number 12,272,519
- Issue date Apr 8, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle gun and charged particle beam device
- Patent number 12,266,500
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Tomoyo Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopositioning systems and associated methods
- Patent number 12,266,501
- Issue date Apr 1, 2025
- The Texas A&M University System
- ChaBum Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and control method therefor
- Patent number 12,261,013
- Issue date Mar 25, 2025
- Jeol Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiducial guided cross-sectioning and lamella preparation with tomog...
- Patent number 12,255,044
- Issue date Mar 18, 2025
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 12,255,045
- Issue date Mar 18, 2025
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage anti-fretting mechanism for roller bearing lifetime improvement
- Patent number 12,249,481
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Mark Henricus Wilhelmus Van Gerven
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laminate, electron source and electronic device containing laminate...
- Patent number 12,237,141
- Issue date Feb 25, 2025
- National Institute for Materials Science
- Katsumi Nagaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus using multiple beams of charged particles
- Patent number 12,237,144
- Issue date Feb 25, 2025
- ASML Netherlands B.V.
- Xuerang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electron microscope
- Patent number 12,224,153
- Issue date Feb 11, 2025
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive fixation for electron microscopy
- Patent number 12,224,154
- Issue date Feb 11, 2025
- University of Kansas
- Eduardo Rosa-Molinar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graphene based substrates for imaging
- Patent number 12,217,931
- Issue date Feb 4, 2025
- University of Kansas
- Eduardo Rosa-Molinar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and cell evaluation method
- Patent number 12,215,308
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Akira Ikeuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High framerate and high dynamic range electron microscopy
- Patent number 12,211,667
- Issue date Jan 28, 2025
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,205,790
- Issue date Jan 21, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method of setting parameter of charged parti...
- Patent number 12,198,894
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for defect inspection using voltage contrast in a...
- Patent number 12,191,112
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric coated plasmonic photoemitter
- Patent number 12,183,535
- Issue date Dec 31, 2024
- Board of Trustees of Michigan State University
- Peng Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and overlay misalignment measurement m...
- Patent number 12,183,541
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated operational control of micro-tooling devices
- Patent number 12,176,182
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Ramani Pichumani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing lamella, analysis system and method for analyz...
- Patent number 12,176,180
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Atsushi Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning a sample using multi-beam inspection...
- Patent number 12,165,837
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Martinus Gerardus Maria Johannes Maassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stroboscopic illumination synchronized electron detection and imaging
- Patent number 12,165,835
- Issue date Dec 10, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of profiling charged-particle beams
- Patent number 12,165,836
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20250118528
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TER...
- Publication number 20250112021
- Publication date Apr 3, 2025
- Beijing Youzhuju Network Technology Co., Ltd.
- Jing YUAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CANTILEVER-BASED OPTO-ELECTROMECHANICAL SYSTEMS AND FABRICATION MET...
- Publication number 20250109013
- Publication date Apr 3, 2025
- City University of Hong Kong
- Lixin Dong
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM WITH IMPROVED IMAGING OF...
- Publication number 20250104966
- Publication date Mar 27, 2025
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE, COMPUTER PRO...
- Publication number 20250104961
- Publication date Mar 27, 2025
- Carl Zeiss MultiSEM GmbH
- Michael Behnke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED REGION SELECTION FOR AUTO SWEEP
- Publication number 20250095159
- Publication date Mar 20, 2025
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOSCALE FAILURE ANALYSIS METHOD
- Publication number 20250087453
- Publication date Mar 13, 2025
- Shanghai Huali Microeloctronics Corporation
- Yunong Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION
- Publication number 20250076038
- Publication date Mar 6, 2025
- FEI Company
- Stefano Vespucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM INSPECTION AND REPAIR WITH INCREASED SECONDARY ELECTRON YIELD
- Publication number 20250069956
- Publication date Feb 27, 2025
- Carl Zeiss SMT GMBH
- Brett Lewis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM SYSTEMS AND METHODS FOR DECOUPLING THE WORKING DISTANCE O...
- Publication number 20250069958
- Publication date Feb 27, 2025
- Carl Zeiss SMT GMBH
- Alex Buxbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTRO...
- Publication number 20250069847
- Publication date Feb 27, 2025
- FEI Company
- Stefano Vespucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT
- Publication number 20250069849
- Publication date Feb 27, 2025
- Technische Universitat Berlin
- Tolga WAGNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...
- Publication number 20250069845
- Publication date Feb 27, 2025
- FEI Company
- Neel Leslie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20250069848
- Publication date Feb 27, 2025
- KIOXIA Corporation
- Kazuya HATANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Calibration Method
- Publication number 20250061606
- Publication date Feb 20, 2025
- JEOL Ltd.
- Yuji Konyuba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER-BASED CONTRAST CONTROL IN TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20250062099
- Publication date Feb 20, 2025
- Yeda Research and Development Co. Ltd.
- Osip SCHWARTZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT
- Publication number 20250054723
- Publication date Feb 13, 2025
- FEI Company
- Rens van Alebeek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSECOND MELTING AND REVITRIFICATION OF CRYO SAMPLES WITH A CORR...
- Publication number 20250052992
- Publication date Feb 13, 2025
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Gabriele BONGIOVANNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20250046565
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Tomonori NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20250037966
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE
- Publication number 20250022678
- Publication date Jan 16, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS
- Publication number 20250022681
- Publication date Jan 16, 2025
- INFINEON TECHNOLOGIES AG
- Maximilian Alexander MOSER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Correction Method and Correction Device
- Publication number 20250014858
- Publication date Jan 9, 2025
- Hitachi High-Tech Corporation
- Tomoaki YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250006454
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE ABERRATION CORRECTION
- Publication number 20250006457
- Publication date Jan 2, 2025
- FEI Company
- Maurits Diephuis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIBRATION-FREE CRYOGENIC COOLING
- Publication number 20250003845
- Publication date Jan 2, 2025
- FEI Company
- Ronald Lamers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC VECTOR POTENTIAL-BASED LENS
- Publication number 20240429016
- Publication date Dec 26, 2024
- OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Makoto Tokoro SCHREIBER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20240429018
- Publication date Dec 26, 2024
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING IMMUNE COMPLEXES FOR EPITOPE MAPPING
- Publication number 20240428879
- Publication date Dec 26, 2024
- The Scripps Research Institute
- Lars Hangartner
- H01 - BASIC ELECTRIC ELEMENTS

Electron or ion microscopes Electron or ion diffraction tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

3D metrology from 3D datacube created from stack of registered imag...

Method for area-wise inspecting a sample via a multi-beam particle...

Charged particle gun and charged particle beam device

Nanopositioning systems and associated methods

Charged particle beam system and control method therefor

Fiducial guided cross-sectioning and lamella preparation with tomog...

Transmission charged particle microscope with an electron energy lo...

Stage anti-fretting mechanism for roller bearing lifetime improvement

Laminate, electron source and electronic device containing laminate...

Apparatus using multiple beams of charged particles

Ultra-precision timing clock method

Electron microscope

Conductive fixation for electron microscopy

Bifocal electron microscope

Graphene based substrates for imaging

Charged particle beam apparatus and cell evaluation method

High framerate and high dynamic range electron microscopy

Charged particle beam device

Measurement system and method of setting parameter of charged parti...

System and method for defect inspection using voltage contrast in a...

Dielectric coated plasmonic photoemitter

Charged particle beam system and overlay misalignment measurement m...

Automated operational control of micro-tooling devices

Method for producing lamella, analysis system and method for analyz...

Transmission electron microscope and inspection method using transm...

System and method for scanning a sample using multi-beam inspection...

Stroboscopic illumination synchronized electron detection and imaging

Method and apparatus for Schottky TFE inspection

Systems and methods of profiling charged-particle beams

Electron gun and electron beam application apparatus

Patents Applicationslast 30 patents

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TER...

CANTILEVER-BASED OPTO-ELECTROMECHANICAL SYSTEMS AND FABRICATION MET...

MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM WITH IMPROVED IMAGING OF...

METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE, COMPUTER PRO...

AUTOMATED REGION SELECTION FOR AUTO SWEEP

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

NANOSCALE FAILURE ANALYSIS METHOD

FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION

ION BEAM INSPECTION AND REPAIR WITH INCREASED SECONDARY ELECTRON YIELD

DUAL BEAM SYSTEMS AND METHODS FOR DECOUPLING THE WORKING DISTANCE O...

DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTRO...

DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT

TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

Electron Microscope and Calibration Method

LASER-BASED CONTRAST CONTROL IN TRANSMISSION ELECTRON MICROSCOPY

THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT

MICROSECOND MELTING AND REVITRIFICATION OF CRYO SAMPLES WITH A CORR...

Charged Particle Beam Device

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS

Correction Method and Correction Device

CHARGED PARTICLE BEAM DEVICE

MICROSCOPE ABERRATION CORRECTION

VIBRATION-FREE CRYOGENIC COOLING

MAGNETIC VECTOR POTENTIAL-BASED LENS

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

METHODS OF FORMING IMMUNE COMPLEXES FOR EPITOPE MAPPING