Electron or ion microscopes Electron or ion diffraction tubes

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H01J37/26

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/26Electron or ion microscopes Electron or ion diffraction tubes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring correlation between fatigue perform...
- Patent number 12,366,540
- Issue date Jul 22, 2025
- Beijing University of Technology
- Lihua Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automated sample alignment for microscopy
- Patent number 12,362,137
- Issue date Jul 15, 2025
- FEI Company
- John Flanagan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection apparatus and semiconductor inspection met...
- Patent number 12,362,139
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Yujin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple landing energy scanning electron microscopy systems and me...
- Patent number 12,354,833
- Issue date Jul 8, 2025
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor analysis system
- Patent number 12,347,707
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yudai Kubo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Scanning electron microscope
- Patent number 12,347,642
- Issue date Jul 1, 2025
- TASMIT, INC.
- Naoya Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Area selection in charged particle microscope imaging
- Patent number 12,347,083
- Issue date Jul 1, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphene functionalization method, apparatus, and functionalized gr...
- Patent number 12,344,527
- Issue date Jul 1, 2025
- MEDICAL RESEARCH COUNCIL AS PART OF UNITED KINGDOM RESEARCH AND INNOVATION
- Christopher Russo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Device for observing permeation and diffusion path of observation t...
- Patent number 12,315,696
- Issue date May 27, 2025
- National Institute for Materials Science
- Akiko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron beam inspection apparatus, multipole array control m...
- Patent number 12,308,202
- Issue date May 20, 2025
- NuFlare Technology, Inc.
- Yuichi Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting a sample by means of multiple c...
- Patent number 12,306,121
- Issue date May 20, 2025
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting measurement error of SEM equipment and method o...
- Patent number 12,307,651
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 12,300,462
- Issue date May 13, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, method of operating a charged particl...
- Patent number 12,293,895
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Eugen Foca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple particle beam microscope and associated method with an imp...
- Patent number 12,283,457
- Issue date Apr 22, 2025
- Carl Zeiss MultiSEM GmbH
- Nicole Rauwolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,283,458
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Mai Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanofluidic cell and loading platform
- Patent number 12,283,459
- Issue date Apr 22, 2025
- Germán Sciaini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator device and methods of use thereof
- Patent number 12,283,455
- Issue date Apr 22, 2025
- Cornell University
- Duncan Cameron
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern height metrology using an e-beam system
- Patent number 12,278,086
- Issue date Apr 15, 2025
- Imec VZW
- Gian Francesco Lorusso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 12,272,518
- Issue date Apr 8, 2025
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for area-wise inspecting a sample via a multi-beam particle...
- Patent number 12,272,519
- Issue date Apr 8, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle gun and charged particle beam device
- Patent number 12,266,500
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Tomoyo Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopositioning systems and associated methods
- Patent number 12,266,501
- Issue date Apr 1, 2025
- The Texas A&M University System
- ChaBum Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and control method therefor
- Patent number 12,261,013
- Issue date Mar 25, 2025
- Jeol Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiducial guided cross-sectioning and lamella preparation with tomog...
- Patent number 12,255,044
- Issue date Mar 18, 2025
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 12,255,045
- Issue date Mar 18, 2025
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage anti-fretting mechanism for roller bearing lifetime improvement
- Patent number 12,249,481
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Mark Henricus Wilhelmus Van Gerven
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laminate, electron source and electronic device containing laminate...
- Patent number 12,237,141
- Issue date Feb 25, 2025
- National Institute for Materials Science
- Katsumi Nagaoka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE PARTICLE BEAM SYSTEM WITH PROLONGED MAINTENANCE INTERVAL
- Publication number 20250232943
- Publication date Jul 17, 2025
- Carl Zeiss MultiSEM GmbH
- Ticia Buhr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20250232947
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Naoto ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE
- Publication number 20250226173
- Publication date Jul 10, 2025
- DELONG INSTRUMENTS A.S.
- Tomas Bejdak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DEFECT INSPECTION USING VOLTAGE CONTRAST IN A...
- Publication number 20250226174
- Publication date Jul 10, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS
- Publication number 20250226172
- Publication date Jul 10, 2025
- The University of Liverpool
- Nigel BROWNING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRAPHENE LAYER TRANSFER METHOD
- Publication number 20250214331
- Publication date Jul 3, 2025
- UNIVERSITEIT ANTWERPEN
- Adrian Pedrazo Tardajos
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE
- Publication number 20250218721
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MIC...
- Publication number 20250210300
- Publication date Jun 26, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk ZEIDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20250210301
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cooling Apparatus and Cooling Preparation Method
- Publication number 20250207827
- Publication date Jun 26, 2025
- JEOL Ltd.
- Mitsuru Hamochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Volume Transmission Electron Microscopy Grid
- Publication number 20250201509
- Publication date Jun 19, 2025
- Yale University
- Cong Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20250201512
- Publication date Jun 19, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Gas Phase Sample Preparation for Cryo-Electron Microscopy
- Publication number 20250198891
- Publication date Jun 19, 2025
- Wisconsin Alumni Research Foundation
- Joshua COON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENSES, CHARGED PARTICLE MICROSCOPES INCLUDING THE SAME,...
- Publication number 20250191873
- Publication date Jun 12, 2025
- FEI Company
- Radovan Vašina
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION OF AN EXAMINATION SYSTEM
- Publication number 20250183001
- Publication date Jun 5, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS
- Publication number 20250183002
- Publication date Jun 5, 2025
- FEI Company
- Gert-Jan de Vos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRAPHENE SUPPORTED CRYO-ELECTRON MICROSCOPY GRID
- Publication number 20250180574
- Publication date Jun 5, 2025
- The Regents of the University of Michigan
- Uhn-Soo Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEGMENTED ENDPOINTING FOR SAMPLE PREPARATION
- Publication number 20250174428
- Publication date May 29, 2025
- FEI Company
- Tomáš Onderlicka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DISTORTION MEASUREMENT AND PARAMETER SETTING FOR CHARGED...
- Publication number 20250166962
- Publication date May 22, 2025
- Carl Zeiss SMT GMBH
- Dmitry KLOCHKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20250166961
- Publication date May 22, 2025
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...
- Publication number 20250157785
- Publication date May 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Hidenori MACHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20250157783
- Publication date May 15, 2025
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20250157786
- Publication date May 15, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20250155387
- Publication date May 15, 2025
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...
- Publication number 20250157782
- Publication date May 15, 2025
- CARL ZEISS MICROSCOPY GMBH
- Bjoern Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20250140518
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recipe Creating System, Length Measurement System, and Recipe Creat...
- Publication number 20250140516
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Hiromi FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid cells for the study of electrochemical processes using trans...
- Publication number 20250140514
- Publication date May 1, 2025
- The Regents of the University of California
- Haimei Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun and Charged Particle Beam System
- Publication number 20250132118
- Publication date Apr 24, 2025
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS

Electron or ion microscopes Electron or ion diffraction tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring correlation between fatigue perform...

Automated sample alignment for microscopy

Semiconductor inspection apparatus and semiconductor inspection met...

Multiple landing energy scanning electron microscopy systems and me...

Semiconductor analysis system

Scanning electron microscope

Area selection in charged particle microscope imaging

Graphene functionalization method, apparatus, and functionalized gr...

Device for observing permeation and diffusion path of observation t...

Multi-electron beam inspection apparatus, multipole array control m...

Method and apparatus for inspecting a sample by means of multiple c...

Method of detecting measurement error of SEM equipment and method o...

System comprising a multi-beam particle microscope and method for o...

Charged particle beam system, method of operating a charged particl...

Multiple electron beam image acquisition method, multiple electron...

Live-assisted image acquisition method and system with charged part...

Multiple particle beam microscope and associated method with an imp...

Charged particle beam device

Nanofluidic cell and loading platform

Monochromator device and methods of use thereof

Pattern height metrology using an e-beam system

3D metrology from 3D datacube created from stack of registered imag...

Method for area-wise inspecting a sample via a multi-beam particle...

Charged particle gun and charged particle beam device

Nanopositioning systems and associated methods

Charged particle beam system and control method therefor

Fiducial guided cross-sectioning and lamella preparation with tomog...

Transmission charged particle microscope with an electron energy lo...

Stage anti-fretting mechanism for roller bearing lifetime improvement

Laminate, electron source and electronic device containing laminate...

Patents Applicationslast 30 patents

MULTIPLE PARTICLE BEAM SYSTEM WITH PROLONGED MAINTENANCE INTERVAL

Charged Particle Beam System

A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE

SYSTEM AND METHOD FOR DEFECT INSPECTION USING VOLTAGE CONTRAST IN A...

METHOD AND APPARATUS

GRAPHENE LAYER TRANSFER METHOD

SCANNING ELECTRON MICROSCOPE DEVICE

PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MIC...

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

Cooling Apparatus and Cooling Preparation Method

High-Volume Transmission Electron Microscopy Grid

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

Gas Phase Sample Preparation for Cryo-Electron Microscopy

OBJECTIVE LENSES, CHARGED PARTICLE MICROSCOPES INCLUDING THE SAME,...

CALIBRATION OF AN EXAMINATION SYSTEM

SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS

GRAPHENE SUPPORTED CRYO-ELECTRON MICROSCOPY GRID

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

SEGMENTED ENDPOINTING FOR SAMPLE PREPARATION

METHOD FOR DISTORTION MEASUREMENT AND PARAMETER SETTING FOR CHARGED...

MICROSCOPY IMAGING METHOD AND SYSTEM

CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...

APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES

Charged Particle Beam Apparatus

BIFOCAL ELECTRON MICROSCOPE

METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...

MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE

Recipe Creating System, Length Measurement System, and Recipe Creat...

Liquid cells for the study of electrochemical processes using trans...

Charged Particle Gun and Charged Particle Beam System