1. Field of the Invention
The present invention relates to the field of silica crucibles and more particularly to a silica crucible having a doped layer formed in the wall.
2. Background of the Invention
The Czochralski (CZ) process is well-known in the art for production of ingots of single crystalline silicon, from which silicon wafers are made for use in the semiconductor industry.
In the CZ process, metallic silicon is charged in a silica glass crucible housed within a susceptor. The charge is then heated by a heater surrounding the susceptor to melt the charged silicon. A single silicon crystal is pulled from the silicon melt at or near the melting temperature of silicon.
In addition to the CZ process, fused silica crucibles are used to melt metallic silicon, which is then poured—from a nozzle formed into the crucible—into a mold to create a polycrystalline silicon ingot, which is used to make solar cells. As with the CZ crucible, a heater surrounds a susceptor, which holds the crucible.
When fused glass crucibles are so used, metallic silicon in the crucible melts—at least in part—as a result of radiant heat transmitted by the heater through the susceptor and crucible. The radiant heat melts the silicon in the crucible, which has a melting point of about 1410 degrees C., but not the crucible. Once the silicon in the crucible is melted, however, the inner surface of the crucible beneath the surface of the molten silicon is heated to the same temperature as the molten silicon by thermal conduction. This is hot enough to deform the crucible wall, which is pressed by the weight of the melt into the susceptor.
The melt line is the intersection of the surface of the molten silicon and the crucible wall. Because the wall above the melt line is not pressed into the susceptor by the weight of the melt, i.e., it is standing free, it may deform. It is difficult to control the heat to melt the silicon, and keep it molten, while preventing the wall above the melt line from sagging, buckling or otherwise deforming. Maintaining precise control over the heat slows down the CZ process and thus throughput of silicon ingots.
It is known in the art to form a fused crucible with doped silica in the outer layer. The element used to dope the silica is one that promotes crystallization, such as aluminum, when the crucible is heated. Crystallized silica is much stronger than fused glass and will not deform as a result of heat in furnaces of the type used in the CZ and similar processes.
One such known approach dopes the outer layer of a crucible with aluminum in the range of 50-120 ppm. Relatively early in the course of a long CZ process, the outer wall crystallizes as a result of the aluminum doping. The crystallized portion is more rigid than the remainder of the crucible and therefore supports the upper wall above the melt line.
This prior art approach produces at least two kinds of problems, depending on the level of doping. First, the doping level must be high enough to create a rigid outer wall that supports the upper wall above the melt line. If the doping level is too low, the wall is subject to deformation in a manner similar to an undoped crucible. But when the doping level is high enough to support the upper wall, that portion of the wall beneath the melt line is subject to very high heat during the CZ process. This forms a very thick crystalline layer below the melt line. As a result of the prolonged heat and thick crystalline layer, the wall beneath the melt line may crack.
Indicated generally at 10 in
System 10 includes a bulk grain hopper 20 and a doped grain hopper 22. The flow of grain from each hopper is controlled by regulating valves 24, 26, respectively. A feed tube 28 introduces flow of silica grain into mold 12 from either one of or both of the hoppers depending upon how valves 24, 26 are set. Feed tube 28 is vertically movable into and out of mold 12. This facilitates selectively depositing grain on upright surface 16 and on generally horizontal surface 14, as well be further explained. A spatula 30 is also vertically movable and in addition is horizontally movable to shape grain in mold 12 as it rotates.
Consideration will now be given to how system 12 is used to make a crucible. First, hopper 20 is loaded with bulk silica grain 32. And hopper 22 is loaded with aluminum-doped silica grain 34. Silica grain 34 may be doped with aluminum in the range of about 85-500 ppm.
Next, mold 12 is rotated at a rate of about 100 rpm, feed tube 28 is positioned as shown in
After collar 36 is laid down as described above, valve 26 is closed, and valve 24 as opened, as shown in
With reference to
It can be seen that an upper portion of crucible 50 has been cut off to produce a flat upper rim 52. This provides a crucible of a predetermined height and also provides a flat upper rim. As can be seen, in
Turning now to
Crucible 54 is supported in a susceptor 60 that is inside a furnace (not shown). The susceptor is surrounded by a heater 62. Crucible 54 has been charged with metallic silicon that has melted, which is now referred to as the melt 64, in response to heat produced by heater 62 inside the furnace. A single silicon seed crystal 61 is held by a holder 63, which slowly draws seed crystal 61 from the molten silicon in accordance with the CZ process. A crystalline ingot 65 forms, also in accordance with the CZ process, on the lower end of seed crystal 61. Melt line 66 is defined about the perimeter of crucible 54. The melt line progressively lowers as ingot 65 forms and is pulled from melt 64.
The melt 64 is at a temperature of about 1400 degrees C. As a result, the surface of crucible 54 beneath the melt line is also at that temperature. Even though the heat from the melt makes the crucible below melt line 66 very soft, the weight of the melt presses the crucible into susceptor 60 thus preventing any deformation of crucible 54 below melt line 66. As the metallic silicon melts, the heat begins to crystallize crucible 54 in collar 56 as a result of the aluminum doped silicon within the collar. The portion of the crucible that is crystallized is hardened. This creates a relatively rigid crystalline ring or collar around the crucible, which stabilizes the portion of the crucible wall that is not crystallized. In other words, the rigid collar prevents the softer uncrystallized wall above the melt line from collapsing or otherwise deforming even as melt line 66 lowers to the bottom of the crucible.
Finally, crucible 50 is shown in use in
As with the crucible of
It should be appreciated that the aluminum-doped collars, like collars 36, 58, can be formed so that the lower portion thereof is substantially at or slightly above the melt line when the crucibles are used. Or they may be slightly below the melt line—at least at the beginning of the CZ process. A good position for the lower end of the collar is less than about 5% of the crucible height below the melt line.
The following examples demonstrate the advantages of the invention.
A crucible like crucible 50 was formed that has a height of 400 mm, 270 mm inner diameter, and 10 mm wall thickness. In this example the crucible was doped with 100 ppm aluminum to form a collar, like collar 36 that extends 150 mm down from rim 52. The collar is 1.4 mm thick and defines an outermost and uppermost surface of the crucible as shown in the drawing. A charge of 120 kg metallic silicon was charged and kept in the crucible for 120 hours without problems.
A crucible like crucible 50 was formed that has a height of 400 mm, 270 mm inner diameter, and 10 mm wall thickness. In Example B the crucible was doped with 500 ppm aluminum to form a collar, like collar 36 that extends 50 mm down from rim 52. The collar is 1.6 mm thick and defines an outermost and uppermost surface of the crucible as shown in the drawing. A charge of 120 kg metallic silicon was charged and kept in the crucible for 120 hours without problems.
A crucible like crucible 50 was formed that has a height of 400 mm, 270 mm inner diameter, and 10 mm wall thickness. In this example the crucible was doped with 100 ppm aluminum to form a collar, like collar 36 that extends 310 mm down from rim 52, which is substantially all of the generally upright outer wall of the crucible. The collar defines an outermost and uppermost surface of the crucible as shown in the drawing. A charge of 120 kg metallic silicon was charged and in the crucible. In this example, the melt overlaps substantially with the collar. Put differently, the melt line was substantially above the lower edge of the collar. After 50 hours of holding the melt, the crucible showed cracking between the substantially upright wall portion and the substantially horizontal bottom portion. This cracking results from the melt being in close proximity to the doped, and therefore crystallized, collar.
Although the examples each use aluminum as a dopant, it should be appreciated that the invention could be implemented with any dopant that promotes crystallization, e.g., Barium.
As can be seen, when the doped portion and the melt do not overlap, or overlap only slightly, the problems associated with the prior art fully doped outer crucible wall can be avoided. In addition, when the process use is known, i.e., how much silicon will be charged in the crucible and how quickly the melt will be drawn down, a crucible can be designed in which there is overlap between the collar and the melt, but only for a few hours, not enough to damage the crucible, during the early stages of the process. As a result, the problems associated with the prior art can be avoided even where there is overlap of the melt and the doped collar in the early stages of the process.
While the invention has been disclosed in its preferred form, the specific embodiments thereof as disclosed and illustrated herein are not to be considered in a limiting sense. Indeed, it should be readily apparent to those skilled in the art in view of the present description that the invention can be modified in numerous ways. The inventor regards the subject matter of the invention to include all combinations and subcombinations of the various elements, features, functions and/or properties disclosed herein.
This application is a Divisional of U.S. patent application Ser. No. 11/612,327, filed on Dec. 18, 2006, now U.S. Pat. No. 7,716,948, the contents of which are hereby incorporated herein by reference for all purposes.
Number | Name | Date | Kind |
---|---|---|---|
5306388 | Nakajima et al. | Apr 1994 | A |
5807416 | Kemmochi et al. | Sep 1998 | A |
5877027 | Kemmochi et al. | Mar 1999 | A |
5968259 | Kemmochi et al. | Oct 1999 | A |
5976247 | Hansen et al. | Nov 1999 | A |
5980629 | Hansen et al. | Nov 1999 | A |
6510707 | Kemmochi et al. | Jan 2003 | B2 |
6641663 | Kemmochi et al. | Nov 2003 | B2 |
7383696 | Kemmochi et al. | Jun 2008 | B2 |
7427327 | Kemmochi et al. | Sep 2008 | B2 |
7556764 | Kemmochi et al. | Jul 2009 | B2 |
20030012898 | Kemmochi et al. | Jan 2003 | A1 |
20030106491 | Kemmochi et al. | Jun 2003 | A1 |
20040040497 | Kemmochi et al. | Mar 2004 | A1 |
20040072007 | Kemmochi et al. | Apr 2004 | A1 |
20050120945 | Hansen | Jun 2005 | A1 |
20060144327 | Ohama et al. | Jul 2006 | A1 |
20070051297 | Kemmochi et al. | Mar 2007 | A1 |
20080141929 | Kemmochi et al. | Jun 2008 | A1 |
Number | Date | Country |
---|---|---|
2000-247778 | Sep 2000 | JP |
WO 2006019913 | Feb 2006 | WO |
Number | Date | Country | |
---|---|---|---|
20100186662 A1 | Jul 2010 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 11612327 | Dec 2006 | US |
Child | 12752998 | US |