(a) Field of the Invention
The present invention relates to a polycrystalline silicon formation apparatus, and more particularly to a polycrystalline silicon formation apparatus capable of reducing or eliminating defects and impurities.
(b) Description of the Related Art
Solar cell is a kind of semiconductor, and is also known as solar chip, and silicon is a material generally used for manufacturing solar cells, whose power generation principle is to convert solar energy into electric energy. Solar PV cells are made of various different materials including monocrystalline silicon, polycrystalline (or multicrystalline) silicon, amorphous silicon and other non-silicon materials, wherein monocrystalline silicon and polycrystalline silicon are commonly used, and the monocrystalline silicon is composed of atoms arranged according to a specific rule, and each crystal grain in the region of the polycrystalline silicon has its own arrangement, and the structure of a grain boundary between crystal grains is relatively incomplete and accumulated with impurities easily, and thus resulting in a higher detective rate, and affecting the efficiency of converting solar energy into electric energy by the solar cell. The monocrystalline silicon solar cell provides higher conversion efficiency, but it incurs higher manufacturing costs. Although products available in the market at an early stage are still based on the monocrystalline silicon, polycrystalline silicon tends to take over the position of monocrystalline silicon in recent years, since the monocrystalline silicon has a higher cost, and the development of polycrystalline silicon advances to improve the conversion efficiency of polycrystalline silicon and lower the cost of polycrystalline silicon.
With reference to
Each crystal grain of the polycrystalline silicon is isolated by a “grain boundary”, and most grain boundaries of the polycrystalline silicon formed by the aforementioned conventional method are electro-active grain boundaries, and excited electron holes passing through a region of the electro-active grain boundary are captured and cannot be transferred through an electrode or used, and the region of the electro-active grain boundary becomes invalid. If the excited electron holes pass through a region of an electrically inactive grain boundary, the electron holes will not be recombined. Thus, it is very important to control the electro-passive grain boundary or reduce the electro-active grain boundary in the polycrystalline silicon manufacturing technology. The twin boundary is an electrically inactive grain boundary. The more the twin boundaries, the better the quality of the polycrystalline silicon.
Therefore, it is a primary objective of the present invention to overcome the aforementioned shortcoming and deficiency of the prior art by providing a polycrystalline silicon formation apparatus capable of reducing or eliminating defects and impurities.
To achieve the foregoing objective, the present invention provides a polycrystalline silicon formation apparatus, and the invention applies a quick cooling method at the bottom of a crucible to control the growth of polycrystalline silicon grains, such that the crystal grains form a twin boundary to reduce electrically active grain boundaries, and the twin boundary is a structure having atoms arranged symmetrically at both ends of the grain boundary, and the crystal grain is solidified in unidirection and grown upward to form a complete polycrystalline silicon, such that reduce defects or impurities in the polycrystalline silicon.
The technical characteristics of the present invention will become apparent with the detailed description of the preferred embodiments and the illustration of the related drawings as follows.
The present invention discloses a crystalline silicon formation apparatus, wherein a quick cooling method is applied to the bottom of a crucible (such as a position near to the center of the bottom of the crucible) to control the growth orientation of polycrystalline silicon, such as the orientation {112} or {110}, and a crystal grain 21 forms a twin boundary 24 as shown in
In
The quick cooling device 35 can be made of a heat dissipating material, and the heat dissipating material includes a contact portion 351 and a heat dissipating portion 352 extended from the contact portion 351, and the contact portion 351 is in contact with the external crucible 33, and the heat dissipating portion 352 has a larger heat dissipation area, and the quick cooling device 35 can be integrally formed with the external crucible 33, and the quick cooling device 35 is extended downwardly from the external crucible 33, and the quick cooling device 35 can be made of graphite.
The whole crystalline silicon formation apparatus is operated under the effect of the quick cooling device 35, so that crystal grains 21 having high percentage of twin boundary are formed at the bottom of the crucible 31, and the quick cooling device 35 keeps the bottom of the liquid material contained in the crucible 31 with a heat flux approximately equal to 50˜60 W or a temperature gradient approximately equal to 5150˜5250 k/m, such that the crystal grains 21 are formed in a specific growth orientation such as the grain orientation {112} or {110}, and the crystal grains 21 with more twin boundaries are formed. Of course, the formation apparatus can further comprise a cooling module 37 as shown in
The formation apparatus further comprises a temperature preserving device 36 (made of carbon fiber, aluminum oxide or zirconium oxide) as shown in
Since the present invention forms a crystal grain with a high percentage of twin boundaries at the bottom of the crucible, therefore defects and impurities will not form in the polycrystalline silicon easily. With the large crystal grain, each crystal grain is solidified in a unidirection and grown upward to form a complete polycrystalline silicon having the advantages of less crystal grains and less grain boundaries in cross-sectional area, so that a recombination effect of silicon wafers caused by dangling bonds derived from the grain boundary can be reduced or eliminated. Particularly, the conversion efficiency of silicon wafer will be enhanced after the grain boundaries (which are impurities inside wafer) are reduced.
The conventional crystalline silicon formation method and the crystalline silicon method of the present invention are compared as shown in
In
In
In summation of the description above, the present invention provides a feasible crystalline silicon formation method and its formation apparatus and complies with the patent application requirements, and thus the invention is duly filed for patent application.
While the invention has been described by device of specific embodiments, numerous modifications and variations could be made thereto by those generally skilled in the art without departing from the scope and spirit of the invention set forth in the claims.
Number | Name | Date | Kind |
---|---|---|---|
20020139296 | Ohnishi et al. | Oct 2002 | A1 |
20040261691 | Doguchi | Dec 2004 | A1 |
20080174822 | Kaimi et al. | Jul 2008 | A1 |
20090000536 | Fujiwara et al. | Jan 2009 | A1 |
20120282133 | Liu et al. | Nov 2012 | A1 |
Number | Date | Country | |
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20110142730 A1 | Jun 2011 | US |