| Number | Name | Date | Kind |
|---|---|---|---|
| 5357628 | Yuen | Oct 1994 | |
| 5530804 | Edgington et al. | Jun 1996 | |
| 5539901 | Ramirez | Jul 1996 | |
| 5570375 | Tsai et al. | Oct 1996 | |
| 5586270 | Roiter et al. | Dec 1996 | |
| 5590354 | Klapproth et al. | Dec 1996 | |
| 5596584 | Warren | Jan 1997 | |
| 5621886 | Alpert et al. | Apr 1997 | |
| 5649142 | Lavelle et al. | Jul 1997 | |
| 5737516 | Circello et al. | Apr 1998 | |
| 5838897 | Bluhm et al. | Nov 1998 | |
| 5964893 | Circello et al. | Oct 1999 | |
| 6026501 | Hohl et al. | Feb 2000 | |
| 6035422 | Hohl et al. | Mar 2000 |
| Entry |
|---|
| Floyd et al., “Real Time on Board Testing”, VLSI Test Symposium, IEEE, pp. 140-145, 1995.* |
| XuBang et al., “Design and Implementation of A JTAG Boundary Scan Interface Controller”, Asian Test Symposium, IEEE, pp. 215-218, 1993.* |
| Winters, “Using IEEE 1149.1 For Incircuit Emulation”, WSCON, Idea/Microelectronics, IEEE, pp. 525-528, 1994. |