Claims
- 1. A method of manufacturing a magnetic stamper/imprinter for use in patterning of magnetic recording media by means of a contact printing process, comprising sequential steps of:(a) providing a stamper/imprinter comprising a body of a magnetic material having an imprinting surface including a topographical pattern formed therein corresponding to a pattern to be formed in the surface of a magnetic or magneto-optical (MO) recording medium by said contact printing process and comprising a patterned plurality of spaced-apart recesses with a plurality of non-recessed areas therebetween, wherein said imprinting surface includes a plurality of defects comprising surface blemishes and stains, magnetic particles, and non-magnetic particles; (b) initially removing said surface blemishes, stains, and magnetic particles; and (c) then removing or rendering said non-magnetic particles benign to said contact printing process.
- 2. The method as in claim 1, wherein:step (a) comprises providing a stamper/imprinter having an imprinting surface including a topographical pattern corresponding to a servo pattern to be formed in said surface of said magnetic or MO recording medium.
- 3. The method as in claim 2, wherein:step (a) comprises providing a stamper/imprinter including a topographical pattern corresponding to a plurality of servo sector patterns to be formed in said surface of said magnetic or MO recording medium, each of said servo sectors of said topographical pattern comprised of a plurality of non-critical feature locations in the form of recesses having widths in the range from about 50 to about 500 nm and depths in the range from about 100 to about 500 nm and a plurality of critical feature locations in the form of non-recessed areas having widths in the range from about 50 to about 500 nm.
- 4. The method as in claim 3, wherein:step (a) comprises providing a stamper/imprinter wherein said non-magnetic and said magnetic particles each have a maximum lateral dimension ranging from submicron-sizes up to about 1 μm.
- 5. The method as in claim 3, wherein:step (b) comprises removing said surface blemishes, stains, and magnetic particles from said non-critical and critical feature locations of said imprinting surface.
- 6. The method as in claim 5, wherein:step (b) includes a preliminary step of determining the presence and location of said stains, blemishes, and magnetic particles on said imprinting surface.
- 7. The method as in claim 6, wherein:step (b) comprises performing said preliminary step of determining the presence and location of said stains, blemishes, and magnetic particles on said imprinting surface by means of an optical scanning technique.
- 8. The method as in claim 5, wherein:step (b) comprises performing at least one treatment of said imprinting surface for removing said surface blemishes, stains, and magnetic particles from said non-critical and critical feature locations of said imprinting surface.
- 9. The method as in claim 8, wherein:step (b) comprises performing at least one fluid treatment of said imprinting surface.
- 10. The method as in claim 3, wherein:step (c) comprises removing said non-magnetic particles from said critical feature locations of said imprinting surface.
- 11. The method as in claim 10, wherein:step (c) comprises performing tape buffing/burnishing of said critical feature locations.
- 12. The method as in claim 10, wherein:step (c) comprises re-locating said non-magnetic particles from said critical feature locations to said non-critical feature locations.
- 13. The method as in claim 10, wherein:step (c) comprises micro-scale removal of said non-magnetic particles from said critical feature locations.
- 14. The method as in claim 13, wherein:step (c) comprises utilizing the tip of an Atomic Force Microscope (AFM) for removing said non-magnetic particles from said critical feature locations.
- 15. The method as in claim 14, wherein:step (c) comprises electrostatically attracting said non-magnetic particles to said tip of said AFM.
- 16. The method as in claim 14, wherein:step (c) comprises utilizing said AFM tip for re-locating said non-magnetic particles from said critical feature locations to said non-critical feature locations.
- 17. The method as in claim 13, wherein:step (c) includes a preliminary step of determining the locations of said non-magnetic particles at said critical feature locations prior to removal therefrom.
- 18. The method as in claim 17, wherein:step (c) includes a preliminary step of determining the locations of said non-magnetic particles at said critical feature locations by means of an optical scanning technique.
- 19. A magnetic stamper/imprinter manufactured according to the process of claim 3.
- 20. A magnetic stamper/imprinter manufactured according to the process of claim 1.
CROSS-REFERENCE TO PROVISIONAL APPLICATION
This application claims priority from U.S. provisional patent application Serial No. 60/392,900 filed Jun. 28, 2002, the entire disclosure of which is incorporated herein by reference.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
6668894 |
Jang et al. |
Dec 2003 |
B2 |
Provisional Applications (1)
|
Number |
Date |
Country |
|
60/392900 |
Jun 2002 |
US |