Defect inspection apparatus and defect inspection method

Abstract

Light sources emit irradiation lights respectively, so that edge parts of mutual irradiation areas (inspection areas) are superposed one another. The imaging apparatus receives regular reflection lights and generates two images corresponding to each of the light sources. A main control part combines two images and determines presence/absence of a defect. By irradiating an inspected surface A with the irradiation lights from mutually different directions, a position of an area showing the defect in each image is slightly deviated. Therefore, even if a dimension of an area showing the defect is small in each image, by superposing two images one another, the dimension of the area showing a defect part becomes large in the image after composition. Thus, an accuracy of defect detection on the edge part of the inspection area can be improved.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a view showing a basic structure of a defect inspection apparatus of a first embodiment;

FIG. 2 shows a view further explaining an arrangement of light sources 1A and 1B of FIG. 1 in detail;

FIG. 3 shows a view further explaining in detail a structure of a main control part 3 of FIG. 1;

FIG. 4 shows a flowchart showing a flow of an inspection processing executed by the main control part 3 of FIG. 2;

FIG. 5 shows a first view explaining an advantage of the defect inspection apparatus of the embodiment 1;

FIG. 6 shows a second view explaining the advantage of the defect inspection apparatus of the embodiment 1;

FIG. 7 shows a view explaining an inspection area by the defect inspection apparatus of the embodiment 1;

FIG. 8 shows a view explaining a result of inspecting the inspection area shown in FIG. 7 by the defect inspection apparatus of the embodiment 1;

FIG. 9 shows a flowchart showing the flow of inspection processing in the defect inspection apparatus of an embodiment 2;

FIG. 10 shows a schematic view showing a structure of a conventional defect inspection apparatus;

FIG. 11 shows a view schematically showing an inspection of irregularity defects by a main control part 113 of FIG. 10;

FIG. 12 shows a view explaining a problem generated in the inspection by the defect inspection apparatus 110 of FIG. 10, when an inspected surface is a curved surface;

FIG. 13 shows a view explaining a method of securing a wide inspection area when the inspected surface is the curved surface;

FIG. 14 shows a view explaining the problem of an inspection method disclosed in Japanese Patent Application Laid Open No. 11-23243;

FIG. 15 shows a view explaining a defect detection on an edge part of an inspection area; and

FIG. 16 shows a view explaining light received by an imaging apparatus when the inspected surface of a work is a flat surface.

Claims

1. A defect inspection apparatus that irradiates light to an inspection object having a surface with gloss and inspects whether a defect is present or not on the surface of the inspection object based on reflection of the irradiated light, the apparatus comprising: an imaging apparatus that receives regular reflection of first irradiation light on the surface of the inspection object and images the surface of the inspection object to generate a first inspection image, and receives regular reflection of second irradiation light on the surface of the inspection object and images the surface of the inspection object to generate a second inspection image;a first light source that emits the first irradiation light, so that the regular reflection on the surface of the inspection object is received by the imaging apparatus; anda second light source that emits the second irradiation light at an angle different from that of the first irradiation light, so that the regular reflection on the surface of the inspection object is received by the imaging apparatus,wherein the first and second light sources emit the first and second irradiation lights, respectively, so that a first regular reflection area and a second regular reflection area are superposed one another, the first regular reflection area being a range on the surface of the inspection object where the imaging apparatus can receive regular reflection of the first irradiation light, and the second regular reflection area being a range on the surface of the inspection object where the imaging apparatus can receive regular reflection of the second irradiation light, andthe defect inspection apparatus further comprises:a main control part that acquires the first and second inspection images from the imaging apparatus, superposes the first and second inspection images one another, and determines whether a defect is present or not on the surface of the inspection object, the defect appearing as either convex or concave with respect to a periphery thereof.

2. The defect inspection apparatus according to claim 1, wherein the first and second light sources emit the first and second irradiation lights from a predetermined area toward the surface of the inspection object, with a certain degree of incident angle, andthe imaging apparatus receives the regular reflection on the surface of the inspection object, in an opening area having a predetermined size.

3. The defect inspection apparatus according to claim 1, wherein the main control part applies a binarization processing to each of the first and second inspection images, prior to superposing the first and second inspection images one another.

4. The defect inspection apparatus according to claim 3, wherein the main control part applies a labeling processing to a plurality of pixels included in a composite image produced by superposing the first and second inspection images one another, and when an area formed by a pixel with the same label out of the plurality of pixels in the composite image is greater than a predetermined value, it is determined that the defect is present in the area.

5. The defect inspection apparatus according to claim 1, wherein the first and second irradiation lights are lights having mutually different characteristics,the main control part turns on the first and second light sources simultaneously, andthe imaging apparatus separates regular reflection of the light that has been received in accordance with a difference of the characteristics, and generates the first and second inspection images respectively corresponding to the first and second irradiation lights.

6. The defect inspection apparatus according to claim 5, wherein the characteristic is a peak wavelength.

7. The defect inspection apparatus according to claim 1, wherein the main control part turns on the first and second light sources sequentially.

8. A defect inspection method for irradiating light to an inspection object having a surface with gloss and inspecting whether a defect is present or not on the surface of the inspection object by receiving reflection of the irradiated light with an imaging apparatus, the method comprising the steps of: emitting first irradiation light with a first light source so that regular reflection of the first irradiation light on the surface of the inspection object is received by the imaging apparatus, and emitting second irradiation light at an angle different from that of the first irradiation light with a second light source so that regular reflection of the second irradiation light on the surface of the inspection object is received by the imaging apparatus,wherein in the step of emitting irradiation lights, the first and second irradiation lights are emitted, so that a first regular reflection area and a second regular reflection area are superposed one another, the first regular reflection area being a range on the surface of the inspection object where the imaging apparatus can receive regular reflection of the first irradiation light on the surface of the inspection object, and a second regular reflection area being a range on the surface of the inspection object where the imaging apparatus can receive regular reflection of the second irradiation light on the surface of the inspection object, andthe defect inspection method further comprises the steps of:receiving the regular reflection of the first irradiation light on the surface of the inspection object and imaging the surface of the inspection object to generate a first inspection image; and receiving the regular reflection of the second irradiation light on the surface of the inspection object and imaging the surface of the inspection object to generate the second inspection image; andsuperposing the first and second inspection images one another and determining whether a defect is present or not on the surface of the inspection object, the defect appearing as either convex or concave with respect to a periphery thereof.

9. The defect inspection method according to claim 8, wherein the first and second light sources emit the first and second irradiation lights from a predetermined area toward the surface of the inspection object, with a certain degree of incident angle, andthe imaging apparatus receives the regular reflection on the surface of the inspection object, in an opening area having a predetermined size.

10. The defect inspection method according to claim 8, further comprising the step of applying a binarizing processing to each of the first and second inspection images prior to the step of determining the presence/absence of the defect.

11. The defect inspection method according to claim 10, wherein in the step of determining the presence/absence of the defect, a labeling processing is applied to a plurality of pixels included in a composite image produced by superposing the first and second inspection images one another, and when an area formed by a pixel added with the same label out of the plurality of pixels in the composite image is greater than a predetermined value, it is determined that the defect is present in the area.

12. The defect inspection method according to claim 8, wherein the first and second irradiation lights are lights having mutually different characteristics,in the step of emitting irradiation lights, the first and second light sources are turned on simultaneously, andin the step of generating the inspection images, regular reflection of the lights that has been received by the imaging apparatus is separated in accordance with a difference of the characteristics, and the first and second inspection images respectively corresponding to each of the first and second irradiation lights are generated.

13. The defect inspection method according to claim 12, wherein the characteristic is a peak wavelength.

14. The defect inspection method according to claim 8, wherein in the step of emitting the irradiation lights, the first and second light sources are turned on sequentially.