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Specially adapted optical and illumination features
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G01N21/8806
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
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G01N21/8806
Specially adapted optical and illumination features
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Patents Grants
last 30 patents
Information
Patent Grant
High intensity illumination systems and methods of use thereof
Patent number
12,365,284
Issue date
Jul 22, 2025
CARBON AUTONOMOUS ROBOTIC SYSTEMS INC.
Alexander Igorevich Sergeev
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Measuring apparatus and method for roughness and/or defect measurem...
Patent number
12,366,445
Issue date
Jul 22, 2025
ASML Netherlands B.V.
Alexander Von Finck
G01 - MEASURING TESTING
Information
Patent Grant
Image processing apparatus, image processing method, and storage me...
Patent number
12,360,053
Issue date
Jul 15, 2025
Canon Kabushiki Kaisha
Kimitaka Arai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Transmission apparatus, measurement system, and camera system
Patent number
12,360,038
Issue date
Jul 15, 2025
Canon Kabushiki Kaisha
Takeaki Itsuji
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and inspection method using the same
Patent number
12,360,055
Issue date
Jul 15, 2025
Samsung Display Co., Ltd.
Sungwoo Jung
G01 - MEASURING TESTING
Information
Patent Grant
Metrology system for measuring edge of circular workpiece
Patent number
12,352,704
Issue date
Jul 8, 2025
Mitutoyo Corporation
Christopher Richard Hamner
G01 - MEASURING TESTING
Information
Patent Grant
Shape reconstruction method and image measurement device
Patent number
12,352,558
Issue date
Jul 8, 2025
Machine Vision Lighting Inc.
Shigeki Masumura
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus
Patent number
12,345,653
Issue date
Jul 1, 2025
Shimadzu Corporation
Hiroshi Horikawa
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device, defect inspection method, and adjustment...
Patent number
12,345,654
Issue date
Jul 1, 2025
HITACHI HIGH-TECH CORPORATION
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Grant
Subsurface defect detecting device for cylindrical components and m...
Patent number
12,345,655
Issue date
Jul 1, 2025
Taiyuan University of Technology
Yanjie Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Large-particle monitoring with laser power control for defect inspe...
Patent number
12,345,658
Issue date
Jul 1, 2025
KLA Corporation
Anatoly Romanovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection device and inspection method
Patent number
12,339,238
Issue date
Jun 24, 2025
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Shozo Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Physical body inspection system and display control method
Patent number
12,335,630
Issue date
Jun 17, 2025
TOYOTA PRODUCTION ENGINEERING
Haruki Kabashima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Dual lens inspection device
Patent number
12,332,181
Issue date
Jun 17, 2025
Sun Yang Optics Development Co., Ltd.
Sheng Che Wu
G01 - MEASURING TESTING
Information
Patent Grant
Dark field illumination based on laser illuminated phosphor
Patent number
12,332,176
Issue date
Jun 17, 2025
Camtek Ltd.
Amnon Menachem
G01 - MEASURING TESTING
Information
Patent Grant
Weld bead inspection apparatus
Patent number
12,330,242
Issue date
Jun 17, 2025
WONIK HOLDINGS CO., LTD.
Myeng Jin Choi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Imaging condition setting system, imaging condition setting method,...
Patent number
12,335,628
Issue date
Jun 17, 2025
Omron Corporation
Yosuke Naruse
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Reflective waveplates for pupil polarization filtering
Patent number
12,322,620
Issue date
Jun 3, 2025
KLA Corporation
Chong Shen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
Patent number
12,320,757
Issue date
Jun 3, 2025
Camtek Ltd.
Carmel Yehuda Drillman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stroboscopic stepped illumination defect detection system
Patent number
12,313,561
Issue date
May 27, 2025
Casi Vision Technology (Beijing) Co., Ltd.
Xiaosong Hu
G01 - MEASURING TESTING
Information
Patent Grant
Light reflection support and through hole inspection system
Patent number
12,313,568
Issue date
May 27, 2025
JOONGWOO M-TECH CO., LTD.
Sung Soo Park
G01 - MEASURING TESTING
Information
Patent Grant
Dark-field confocal microscopy measurement apparatus based on vorte...
Patent number
12,313,563
Issue date
May 27, 2025
Harbin Institute of Technology
Jian Liu
G01 - MEASURING TESTING
Information
Patent Grant
Foreign object debris discrimination with modulated laser light
Patent number
12,313,562
Issue date
May 27, 2025
RTX Corporation
Jose-Rodrigo Castillo-Garza
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
Patent number
12,306,112
Issue date
May 20, 2025
AXIOMATIQUE TECHNOLOGIES, INC.
Trevor A. Norman
G01 - MEASURING TESTING
Information
Patent Grant
3D image acquisition system for optical inspection and method for o...
Patent number
12,306,110
Issue date
May 20, 2025
Scuola universitaria professionale della Svizzera italiana (SUPSI)
Daniele Guido Allegri
G01 - MEASURING TESTING
Information
Patent Grant
Inspection condition presentation apparatus, surface inspection app...
Patent number
12,306,109
Issue date
May 20, 2025
Resonac Corporation
Katsuhisa Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Part control device and method
Patent number
12,296,520
Issue date
May 13, 2025
UNIVERSITE DE CHAMBERY-UNIVERSITE SAVOIE MONT BLANC
Pierre Nagorny
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Windshield with optical windows for seal application
Patent number
12,296,655
Issue date
May 13, 2025
Ford Motor Company
Steven Angus
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Visual inspection systems and methods
Patent number
12,298,253
Issue date
May 13, 2025
ESSEX SOLUTIONS USA LLC
Russell Glenn Post
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
Patent number
12,292,387
Issue date
May 6, 2025
Corning Incorporated
Chong Pyung An
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING DEFECT IN MOLDED PRODUCT SURFACE
Publication number
20250237614
Publication date
Jul 24, 2025
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Yong Kwi LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System for Measuring Microplastics in an Aquatic Environment
Publication number
20250231115
Publication date
Jul 17, 2025
Ely Oser
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OBSERVING SURFACE
Publication number
20250231116
Publication date
Jul 17, 2025
TOKYO ELECTRON LIMITED
Shin OOWADA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...
Publication number
20250231119
Publication date
Jul 17, 2025
NEC Corporation
Michiaki INOUE
G01 - MEASURING TESTING
Information
Patent Application
VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...
Publication number
20250231122
Publication date
Jul 17, 2025
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Guangze LI
G01 - MEASURING TESTING
Information
Patent Application
IMAGE SENSOR WITH OXIDE FREE WAFER BONDED STRUCTURES AND METHODS FO...
Publication number
20250231114
Publication date
Jul 17, 2025
KLA Corporation
Yajun Wei
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
Publication number
20250224328
Publication date
Jul 10, 2025
Samsung Electronics Co., Ltd.
Sangwoo BAE
G01 - MEASURING TESTING
Information
Patent Application
HIGH INTENSITY ILLUMINATION SYSTEMS AND METHODS OF USE THEREOF
Publication number
20250214506
Publication date
Jul 3, 2025
Carbon Autonomous Robotic Systems Inc.
Alexander Igorevich SERGEEV
B60 - VEHICLES IN GENERAL
Information
Patent Application
METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE
Publication number
20250216343
Publication date
Jul 3, 2025
CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
CHIH-YUAN LIN
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...
Publication number
20250218812
Publication date
Jul 3, 2025
SEMES CO., LTD.
Oh Yeol KWON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...
Publication number
20250216255
Publication date
Jul 3, 2025
NANJING INSTITUTE OF ASTRONOMICAL OPTICS & TECHNOLOGY, CHINESE ACADEMY OF SCI...
Jinping HE
G01 - MEASURING TESTING
Information
Patent Application
Device And Method For Determining Defects In A Part Or Presence Of...
Publication number
20250217955
Publication date
Jul 3, 2025
INSTITUTO TECNOLOGICO DE INFORMATICA
Javier Pérez Soler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE
Publication number
20250209607
Publication date
Jun 26, 2025
Pratt & Whitney Canada Corp.
Michael Morash
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHTING FOR AN OPTICAL MONITORING APPARATUS
Publication number
20250208055
Publication date
Jun 26, 2025
BÜHLER UK LTD.
Brice THURIN
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
MANUFACTURING METHOD FOR CONDUCTIVE FILM, MANUFACTURING METHOD FOR...
Publication number
20250208500
Publication date
Jun 26, 2025
MITSUBISHI CHEMICAL CORPORATION
Shunsuke KANAME
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SHEET MATERIAL EDGE BURR DETECTION DEVICE
Publication number
20250198943
Publication date
Jun 19, 2025
Supersonic Artificial Intelligence Technology Co., Ltd.
Junfeng ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Device and Method to Capture High Resolution Images of a Moving Obj...
Publication number
20250198884
Publication date
Jun 19, 2025
Derrick Schmenk
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD
Publication number
20250198941
Publication date
Jun 19, 2025
Samsung Electronics Co., Ltd.
Min Ho RIM
G01 - MEASURING TESTING
Information
Patent Application
ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...
Publication number
20250198947
Publication date
Jun 19, 2025
HEXAGON TECHNOLOGY CENTER GMBH
Bernd REIMANN
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
WOUND CARE IMAGE ANALYSIS USING A SMARTPHONE
Publication number
20250194928
Publication date
Jun 19, 2025
Precision Healing LLC
David B Strasfeld
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE
Publication number
20250189458
Publication date
Jun 12, 2025
GUDENG EQUIPMENT CO., LTD.
Che-Wei Chan
G01 - MEASURING TESTING
Information
Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
Publication number
20250189460
Publication date
Jun 12, 2025
INGENTEC CORPORATION
Chia-Liang LIN
G01 - MEASURING TESTING
Information
Patent Application
IMAGING
Publication number
20250189457
Publication date
Jun 12, 2025
Rolls-Royce plc
Benjamin J MOORE
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
Publication number
20250180488
Publication date
Jun 5, 2025
Xerox Corporation
Jeng PING LU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH INTENSITY ILLUMINATION SYSTEM AND METHODS OF USE THEREOF
Publication number
20250178522
Publication date
Jun 5, 2025
Carbon Autonomous Robotic Systems Inc.
Alexander Igorevich SERGEEV
B60 - VEHICLES IN GENERAL
Information
Patent Application
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...
Publication number
20250172493
Publication date
May 29, 2025
JEDEX INC.
Jin Ho KIM
G01 - MEASURING TESTING
Information
Patent Application
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...
Publication number
20250164407
Publication date
May 22, 2025
NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
Shunta HARADA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM
Publication number
20250167021
Publication date
May 22, 2025
Axcelis Technologies, Inc.
Phillip Geissbuhler
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
Publication number
20250164238
Publication date
May 22, 2025
Applied Materials, Inc.
Eric Chin Hong Ng
G01 - MEASURING TESTING
Information
Patent Application
POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS
Publication number
20250164408
Publication date
May 22, 2025
KLA Corporation
Florian Melsheimer
G05 - CONTROLLING REGULATING