Specially adapted optical and illumination features

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CPC
G01N21/8806

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8806Specially adapted optical and illumination features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
High intensity illumination systems and methods of use thereof
- Patent number 12,365,284
- Issue date Jul 22, 2025
- CARBON AUTONOMOUS ROBOTIC SYSTEMS INC.
- Alexander Igorevich Sergeev
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Measuring apparatus and method for roughness and/or defect measurem...
- Patent number 12,366,445
- Issue date Jul 22, 2025
- ASML Netherlands B.V.
- Alexander Von Finck
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, image processing method, and storage me...
- Patent number 12,360,053
- Issue date Jul 15, 2025
- Canon Kabushiki Kaisha
- Kimitaka Arai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission apparatus, measurement system, and camera system
- Patent number 12,360,038
- Issue date Jul 15, 2025
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method using the same
- Patent number 12,360,055
- Issue date Jul 15, 2025
- Samsung Display Co., Ltd.
- Sungwoo Jung
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system for measuring edge of circular workpiece
- Patent number 12,352,704
- Issue date Jul 8, 2025
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Shape reconstruction method and image measurement device
- Patent number 12,352,558
- Issue date Jul 8, 2025
- Machine Vision Lighting Inc.
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,345,653
- Issue date Jul 1, 2025
- Shimadzu Corporation
- Hiroshi Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, defect inspection method, and adjustment...
- Patent number 12,345,654
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Subsurface defect detecting device for cylindrical components and m...
- Patent number 12,345,655
- Issue date Jul 1, 2025
- Taiyuan University of Technology
- Yanjie Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Large-particle monitoring with laser power control for defect inspe...
- Patent number 12,345,658
- Issue date Jul 1, 2025
- KLA Corporation
- Anatoly Romanovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and inspection method
- Patent number 12,339,238
- Issue date Jun 24, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Shozo Oshio
- G01 - MEASURING TESTING
Information Patent Grant
Physical body inspection system and display control method
- Patent number 12,335,630
- Issue date Jun 17, 2025
- TOYOTA PRODUCTION ENGINEERING
- Haruki Kabashima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dual lens inspection device
- Patent number 12,332,181
- Issue date Jun 17, 2025
- Sun Yang Optics Development Co., Ltd.
- Sheng Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Dark field illumination based on laser illuminated phosphor
- Patent number 12,332,176
- Issue date Jun 17, 2025
- Camtek Ltd.
- Amnon Menachem
- G01 - MEASURING TESTING
Information Patent Grant
Weld bead inspection apparatus
- Patent number 12,330,242
- Issue date Jun 17, 2025
- WONIK HOLDINGS CO., LTD.
- Myeng Jin Choi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Imaging condition setting system, imaging condition setting method,...
- Patent number 12,335,628
- Issue date Jun 17, 2025
- Omron Corporation
- Yosuke Naruse
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Reflective waveplates for pupil polarization filtering
- Patent number 12,322,620
- Issue date Jun 3, 2025
- KLA Corporation
- Chong Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 12,320,757
- Issue date Jun 3, 2025
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stroboscopic stepped illumination defect detection system
- Patent number 12,313,561
- Issue date May 27, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Xiaosong Hu
- G01 - MEASURING TESTING
Information Patent Grant
Light reflection support and through hole inspection system
- Patent number 12,313,568
- Issue date May 27, 2025
- JOONGWOO M-TECH CO., LTD.
- Sung Soo Park
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus based on vorte...
- Patent number 12,313,563
- Issue date May 27, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Foreign object debris discrimination with modulated laser light
- Patent number 12,313,562
- Issue date May 27, 2025
- RTX Corporation
- Jose-Rodrigo Castillo-Garza
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
- Patent number 12,306,112
- Issue date May 20, 2025
- AXIOMATIQUE TECHNOLOGIES, INC.
- Trevor A. Norman
- G01 - MEASURING TESTING
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Inspection condition presentation apparatus, surface inspection app...
- Patent number 12,306,109
- Issue date May 20, 2025
- Resonac Corporation
- Katsuhisa Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Part control device and method
- Patent number 12,296,520
- Issue date May 13, 2025
- UNIVERSITE DE CHAMBERY-UNIVERSITE SAVOIE MONT BLANC
- Pierre Nagorny
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Windshield with optical windows for seal application
- Patent number 12,296,655
- Issue date May 13, 2025
- Ford Motor Company
- Steven Angus
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Visual inspection systems and methods
- Patent number 12,298,253
- Issue date May 13, 2025
- ESSEX SOLUTIONS USA LLC
- Russell Glenn Post
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING DEFECT IN MOLDED PRODUCT SURFACE
- Publication number 20250237614
- Publication date Jul 24, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Yong Kwi LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for Measuring Microplastics in an Aquatic Environment
- Publication number 20250231115
- Publication date Jul 17, 2025
- Ely Oser
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBSERVING SURFACE
- Publication number 20250231116
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Shin OOWADA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...
- Publication number 20250231119
- Publication date Jul 17, 2025
- NEC Corporation
- Michiaki INOUE
- G01 - MEASURING TESTING
Information Patent Application
VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...
- Publication number 20250231122
- Publication date Jul 17, 2025
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Guangze LI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR WITH OXIDE FREE WAFER BONDED STRUCTURES AND METHODS FO...
- Publication number 20250231114
- Publication date Jul 17, 2025
- KLA Corporation
- Yajun Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
- Publication number 20250224328
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
HIGH INTENSITY ILLUMINATION SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20250214506
- Publication date Jul 3, 2025
- Carbon Autonomous Robotic Systems Inc.
- Alexander Igorevich SERGEEV
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE
- Publication number 20250216343
- Publication date Jul 3, 2025
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHIH-YUAN LIN
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...
- Publication number 20250218812
- Publication date Jul 3, 2025
- SEMES CO., LTD.
- Oh Yeol KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...
- Publication number 20250216255
- Publication date Jul 3, 2025
- NANJING INSTITUTE OF ASTRONOMICAL OPTICS & TECHNOLOGY, CHINESE ACADEMY OF SCI...
- Jinping HE
- G01 - MEASURING TESTING
Information Patent Application
Device And Method For Determining Defects In A Part Or Presence Of...
- Publication number 20250217955
- Publication date Jul 3, 2025
- INSTITUTO TECNOLOGICO DE INFORMATICA
- Javier Pérez Soler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE
- Publication number 20250209607
- Publication date Jun 26, 2025
- Pratt & Whitney Canada Corp.
- Michael Morash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHTING FOR AN OPTICAL MONITORING APPARATUS
- Publication number 20250208055
- Publication date Jun 26, 2025
- BÜHLER UK LTD.
- Brice THURIN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
MANUFACTURING METHOD FOR CONDUCTIVE FILM, MANUFACTURING METHOD FOR...
- Publication number 20250208500
- Publication date Jun 26, 2025
- MITSUBISHI CHEMICAL CORPORATION
- Shunsuke KANAME
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHEET MATERIAL EDGE BURR DETECTION DEVICE
- Publication number 20250198943
- Publication date Jun 19, 2025
- Supersonic Artificial Intelligence Technology Co., Ltd.
- Junfeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Device and Method to Capture High Resolution Images of a Moving Obj...
- Publication number 20250198884
- Publication date Jun 19, 2025
- Derrick Schmenk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD
- Publication number 20250198941
- Publication date Jun 19, 2025
- Samsung Electronics Co., Ltd.
- Min Ho RIM
- G01 - MEASURING TESTING
Information Patent Application
ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...
- Publication number 20250198947
- Publication date Jun 19, 2025
- HEXAGON TECHNOLOGY CENTER GMBH
- Bernd REIMANN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
WOUND CARE IMAGE ANALYSIS USING A SMARTPHONE
- Publication number 20250194928
- Publication date Jun 19, 2025
- Precision Healing LLC
- David B Strasfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE
- Publication number 20250189458
- Publication date Jun 12, 2025
- GUDENG EQUIPMENT CO., LTD.
- Che-Wei Chan
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING
Information Patent Application
IMAGING
- Publication number 20250189457
- Publication date Jun 12, 2025
- Rolls-Royce plc
- Benjamin J MOORE
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
- Publication number 20250180488
- Publication date Jun 5, 2025
- Xerox Corporation
- Jeng PING LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH INTENSITY ILLUMINATION SYSTEM AND METHODS OF USE THEREOF
- Publication number 20250178522
- Publication date Jun 5, 2025
- Carbon Autonomous Robotic Systems Inc.
- Alexander Igorevich SERGEEV
- B60 - VEHICLES IN GENERAL
Information Patent Application
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...
- Publication number 20250172493
- Publication date May 29, 2025
- JEDEX INC.
- Jin Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...
- Publication number 20250164407
- Publication date May 22, 2025
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Shunta HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM
- Publication number 20250167021
- Publication date May 22, 2025
- Axcelis Technologies, Inc.
- Phillip Geissbuhler
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
- Publication number 20250164238
- Publication date May 22, 2025
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Application
POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS
- Publication number 20250164408
- Publication date May 22, 2025
- KLA Corporation
- Florian Melsheimer
- G05 - CONTROLLING REGULATING

Specially adapted optical and illumination features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High intensity illumination systems and methods of use thereof

Measuring apparatus and method for roughness and/or defect measurem...

Image processing apparatus, image processing method, and storage me...

Transmission apparatus, measurement system, and camera system

Inspection system and inspection method using the same

Metrology system for measuring edge of circular workpiece

Shape reconstruction method and image measurement device

Defect inspection apparatus

Defect inspection device, defect inspection method, and adjustment...

Subsurface defect detecting device for cylindrical components and m...

Large-particle monitoring with laser power control for defect inspe...

Inspection device and inspection method

Physical body inspection system and display control method

Dual lens inspection device

Dark field illumination based on laser illuminated phosphor

Weld bead inspection apparatus

Imaging condition setting system, imaging condition setting method,...

Reflective waveplates for pupil polarization filtering

Semiconductor inspection tool system and method for wafer edge insp...

Stroboscopic stepped illumination defect detection system

Light reflection support and through hole inspection system

Dark-field confocal microscopy measurement apparatus based on vorte...

Foreign object debris discrimination with modulated laser light

Methods and apparatus for detecting defects in semiconductor systems

3D image acquisition system for optical inspection and method for o...

Inspection condition presentation apparatus, surface inspection app...

Part control device and method

Windshield with optical windows for seal application

Visual inspection systems and methods

Apparatus and method for inspecting laser defect inside of transpar...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MEASURING DEFECT IN MOLDED PRODUCT SURFACE

System for Measuring Microplastics in an Aquatic Environment

METHOD FOR OBSERVING SURFACE

INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...

VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...

IMAGE SENSOR WITH OXIDE FREE WAFER BONDED STRUCTURES AND METHODS FO...

DEVICE FOR MEASURING SEMICONDUCTORS

HIGH INTENSITY ILLUMINATION SYSTEMS AND METHODS OF USE THEREOF

METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE

SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...

APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...

Device And Method For Determining Defects In A Part Or Presence Of...

METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE

LIGHTING FOR AN OPTICAL MONITORING APPARATUS

MANUFACTURING METHOD FOR CONDUCTIVE FILM, MANUFACTURING METHOD FOR...

SHEET MATERIAL EDGE BURR DETECTION DEVICE

Device and Method to Capture High Resolution Images of a Moving Obj...

DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD

ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...

WOUND CARE IMAGE ANALYSIS USING A SMARTPHONE

OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

IMAGING

HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM

HIGH INTENSITY ILLUMINATION SYSTEM AND METHODS OF USE THEREOF

OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...

POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...

DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM

SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS