Specially adapted optical and illumination features

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CPC
G01N21/8806

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8806Specially adapted optical and illumination features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Cylindrical shell detection method and cylindrical shell detection...
- Patent number 12,265,037
- Issue date Apr 1, 2025
- Advanced ACEBIOTEK CO., LTD.
- Jyh-Chern Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and inspection device for optically inspecting a surface
- Patent number 12,259,232
- Issue date Mar 25, 2025
- ISRA VISION GMBH
- Stefan Leute
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, injection molding system, and inspection method
- Patent number 12,259,335
- Issue date Mar 25, 2025
- Sumitomo Heavy Industries, Ltd.
- Itta Nozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of evaluating semiconductor wafer
- Patent number 12,247,927
- Issue date Mar 11, 2025
- Sumco Corporation
- Motoi Kurokami
- G01 - MEASURING TESTING
Information Patent Grant
High intensity illumination systems and methods of use thereof
- Patent number 12,240,372
- Issue date Mar 4, 2025
- CARBON AUTONOMOUS ROBOTIC SYSTEMS INC.
- Alexander Igorevich Sergeev
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for detecting a defect on a semi-reflective film...
- Patent number 12,241,844
- Issue date Mar 4, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system utilizing annular optical configuration
- Patent number 12,242,047
- Issue date Mar 4, 2025
- Mitutoyo Corporation
- Paul Gerard Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection system using 3D measuring machine
- Patent number 12,235,222
- Issue date Feb 25, 2025
- Young Han Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Optical sorter
- Patent number 12,222,295
- Issue date Feb 11, 2025
- Satake Corporation
- Tomoyuki Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting cans
- Patent number 12,216,062
- Issue date Feb 4, 2025
- Krones AG
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopic measurement apparatus and method ba...
- Patent number 12,216,264
- Issue date Feb 4, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for optically inspecting containers
- Patent number 12,209,969
- Issue date Jan 28, 2025
- Krones AG
- Anton Niedermeier
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,209,971
- Issue date Jan 28, 2025
- VIENEX CORPORATION
- Osamu Iwasaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and device for optically inspecting containers
- Patent number 12,209,970
- Issue date Jan 28, 2025
- Krones AG
- Anton Niedermeier
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for real-time direct surface fouling and scale...
- Patent number 12,203,842
- Issue date Jan 21, 2025
- Noria Water Technologies, Inc.
- Anditya Rahardianto
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,203,867
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for monitoring the drying/curing process of coatings
- Patent number 12,196,685
- Issue date Jan 14, 2025
- BASF Coatings GmbH
- Harry Libutzki
- G01 - MEASURING TESTING
Information Patent Grant
Vortex dichroism dark-field confocal microscopy measurement apparat...
- Patent number 12,196,686
- Issue date Jan 14, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising at least one THz device and method of operatin...
- Patent number 12,188,859
- Issue date Jan 7, 2025
- HELMUT FISCHER GMBH INSTITUT FÜR ELEKRONIK UND MESSTECHNIK
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 12,188,876
- Issue date Jan 7, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution multispectral multi-field-of-view imaging system fo...
- Patent number 12,174,128
- Issue date Dec 24, 2024
- Onto Innovation Inc.
- John A Tejada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SENSING SYSTEM AND OPTICAL SENSING METHOD
- Publication number 20250116608
- Publication date Apr 10, 2025
- PIXART IMAGING Inc.
- Guo-Zhen Wang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM FOR OBJECTS
- Publication number 20250116610
- Publication date Apr 10, 2025
- ANTARES VISION S.P.A.
- Gianmarco MANIACI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION METHOD FOR METAL MATERIAL, SURFACE INSPECTION AP...
- Publication number 20250116609
- Publication date Apr 10, 2025
- JFE STEEL CORPORATION
- Yuya NIIZUMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION OF PULP BOTTLES
- Publication number 20250102432
- Publication date Mar 27, 2025
- KRONES AG
- Rainer KWIRANDT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
FIBER OPTIC PROFILER FOR EARLY DAMAGE WARNING
- Publication number 20250102444
- Publication date Mar 27, 2025
- Honeywell International Inc.
- Chen FENG
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102445
- Publication date Mar 27, 2025
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFEC...
- Publication number 20250093274
- Publication date Mar 20, 2025
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING PATTERN DEFECTS
- Publication number 20250093278
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ju-Ying CHEN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE
- Publication number 20250093279
- Publication date Mar 20, 2025
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
Illumination Apparatus for Illuminating a Microfluidic Device, Anal...
- Publication number 20250091045
- Publication date Mar 20, 2025
- ROBERT BOSCH GmbH
- Reinhold Fiess
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MULTI-CAMERA SYNCHRONIZATION FOR INSPECTION SYSTEMS
- Publication number 20250093275
- Publication date Mar 20, 2025
- VIRTEK VISION INTERNATIONAL INC.
- Ahmed Elhossini
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...
- Publication number 20250093280
- Publication date Mar 20, 2025
- UnitX, Inc.
- Tommy Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION SYSTEM AND DETECTION METHOD FOR ELECTRONIC DEVICE
- Publication number 20250097563
- Publication date Mar 20, 2025
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20250085231
- Publication date Mar 13, 2025
- SAMSUNG DISPLAY CO., LTD.
- Youngil JUNG
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250076204
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Min Hwan SEO
- G01 - MEASURING TESTING
Information Patent Application
HOLE INSPECTION LENS UNIT
- Publication number 20250076206
- Publication date Mar 6, 2025
- AISIN CORPORATION
- Syotaro NAGATA
- G01 - MEASURING TESTING
Information Patent Application
Testing Apparatus and Testing Method
- Publication number 20250076215
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Hiroyuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION
- Publication number 20250076212
- Publication date Mar 6, 2025
- Applied Materials, Inc.
- Venkatakaushik VOLETI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250076209
- Publication date Mar 6, 2025
- Mitsubishi Heavy Industries, Ltd.
- Yuki YANO
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL ANGULAR METROLOGY
- Publication number 20250076208
- Publication date Mar 6, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250076205
- Publication date Mar 6, 2025
- Canon Kabushiki Kaisha
- Takayuki Jinno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...
- Publication number 20250067680
- Publication date Feb 27, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Dong Hoon SONG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...
- Publication number 20250067660
- Publication date Feb 27, 2025
- COGNEX CORPORATION
- Ben R. Carey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
BEAM SPLITTER USING MULTI-REFRACTIVE INDEX LAYER AND DEFECTIVE ELEM...
- Publication number 20250060607
- Publication date Feb 20, 2025
- Korea Institute of Machinery and Materials
- Mi Kyung LIM
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING SYSTEM OF IMAGE SENSORS AND ELECTROMAGNETIC RADIATION E...
- Publication number 20250058897
- Publication date Feb 20, 2025
- QUANDUM AEROSPACE S.L.
- RAFAEL RODRIGUEZ ROSAS
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
Optical Inspection System for Detecting Surface Profile Defects in...
- Publication number 20250060319
- Publication date Feb 20, 2025
- 3M Innovative Properties Company
- Steven P. Floeder
- G01 - MEASURING TESTING
Information Patent Application
DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER
- Publication number 20250052666
- Publication date Feb 13, 2025
- KLA Corporation
- Chao Chang
- G01 - MEASURING TESTING

Specially adapted optical and illumination features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cylindrical shell detection method and cylindrical shell detection...

Method and inspection device for optically inspecting a surface

Inspection apparatus, injection molding system, and inspection method

Method of evaluating semiconductor wafer

High intensity illumination systems and methods of use thereof

Method and system for detecting a defect on a semi-reflective film...

Metrology system utilizing annular optical configuration

Wafer metrology technologies

Defect inspection system using 3D measuring machine

Optical inspection device and inspecting method using the same

Optical sorter

Inspection system for quality analysis of a product to be inspected

Apparatus and method for inspecting cans

Dark-field confocal microscopic measurement apparatus and method ba...

Method and device for optically inspecting containers

Foreign substance/defect inspection device, image generation device...

Method and device for optically inspecting containers

Qualitative or quantitative characterization of a coating surface

Method and apparatus for real-time direct surface fouling and scale...

Dark-field confocal microscopy measurement apparatus and method bas...

Method for inspecting pattern defects

Defect inspection apparatus and defect inspection method

Device and method for monitoring the drying/curing process of coatings

Vortex dichroism dark-field confocal microscopy measurement apparat...

Apparatus comprising at least one THz device and method of operatin...

Optical inspection method, non-transitory storage medium storing op...

Station and method for translationally detecting glaze defects on g...

Device and method for inspecting reflective surfaces

Measurement tool for cable-preparation system

High resolution multispectral multi-field-of-view imaging system fo...

Patents Applicationslast 30 patents

OPTICAL SENSING SYSTEM AND OPTICAL SENSING METHOD

INSPECTION SYSTEM FOR OBJECTS

SURFACE INSPECTION METHOD FOR METAL MATERIAL, SURFACE INSPECTION AP...

OPTICAL INSPECTION OF PULP BOTTLES

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

FIBER OPTIC PROFILER FOR EARLY DAMAGE WARNING

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFEC...

METHOD FOR INSPECTING PATTERN DEFECTS

SEMICONDUCTOR FAILURE ANALYSIS DEVICE

Illumination Apparatus for Illuminating a Microfluidic Device, Anal...

MULTI-CAMERA SYNCHRONIZATION FOR INSPECTION SYSTEMS

MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...

DETECTION SYSTEM AND DETECTION METHOD FOR ELECTRONIC DEVICE

DEFECT INSPECTION APPARATUS

IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME

HOLE INSPECTION LENS UNIT

Testing Apparatus and Testing Method

MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION

TOPOGRAPHICAL INSPECTION

INSPECTION DEVICE AND INSPECTION METHOD

SPECTRAL ANGULAR METROLOGY

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...

SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

BEAM SPLITTER USING MULTI-REFRACTIVE INDEX LAYER AND DEFECTIVE ELEM...

POSITIONING SYSTEM OF IMAGE SENSORS AND ELECTROMAGNETIC RADIATION E...

Optical Inspection System for Detecting Surface Profile Defects in...

DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER