Specially adapted optical and illumination features

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CPC
G01N21/8806

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8806Specially adapted optical and illumination features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for real-time direct surface fouling and scale...
- Patent number 12,203,842
- Issue date Jan 21, 2025
- Noria Water Technologies, Inc.
- Anditya Rahardianto
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,203,867
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for monitoring the drying/curing process of coatings
- Patent number 12,196,685
- Issue date Jan 14, 2025
- BASF Coatings GmbH
- Harry Libutzki
- G01 - MEASURING TESTING
Information Patent Grant
Vortex dichroism dark-field confocal microscopy measurement apparat...
- Patent number 12,196,686
- Issue date Jan 14, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising at least one THz device and method of operatin...
- Patent number 12,188,859
- Issue date Jan 7, 2025
- HELMUT FISCHER GMBH INSTITUT FÜR ELEKRONIK UND MESSTECHNIK
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 12,188,876
- Issue date Jan 7, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution multispectral multi-field-of-view imaging system fo...
- Patent number 12,174,128
- Issue date Dec 24, 2024
- Onto Innovation Inc.
- John A Tejada
- G01 - MEASURING TESTING
Information Patent Grant
Container visual inspection assembly and method
- Patent number 12,169,177
- Issue date Dec 17, 2024
- Amgen Inc.
- Graham F. Milne
- G01 - MEASURING TESTING
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 12,165,937
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for optical inspection of a substrate using same or differen...
- Patent number 12,163,899
- Issue date Dec 10, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis device
- Patent number 12,163,900
- Issue date Dec 10, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Die inspection method and apparatus
- Patent number 12,152,995
- Issue date Nov 26, 2024
- ONTARIO DIE INTERNATIONAL INC.
- Wesley Elton Scott
- G01 - MEASURING TESTING
Information Patent Grant
Laser based inclusion detection system and methods
- Patent number 12,152,999
- Issue date Nov 26, 2024
- Corning Incorporated
- Souma Chaudhury
- G01 - MEASURING TESTING
Information Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
- Patent number 12,148,143
- Issue date Nov 19, 2024
- NEC Corporation
- Keiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single pass automated vehicle inspection system and method
- Patent number 12,140,501
- Issue date Nov 12, 2024
- UVEYE LTD.
- Ohad Hever
- G01 - MEASURING TESTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating the optical quality of a delineated region of...
- Patent number 12,130,244
- Issue date Oct 29, 2024
- Saint-Gobain Glass France
- Théo Rybarczyk
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Product inspection system and method
- Patent number 12,117,404
- Issue date Oct 15, 2024
- TE CONNECTIVITY SOLUTIONS GmbH
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition method and image acquisition apparatus
- Patent number 12,105,026
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Yasuhiro Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Illuminator for a viewing unit of an optical inspection machine for...
- Patent number 12,099,016
- Issue date Sep 24, 2024
- DOSS VISUAL SOLUTION S.R.L.
- Hemiliano Berselli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tab image acquisition device, system, and method
- Patent number 12,092,583
- Issue date Sep 17, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Yinhang Tu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR PROVIDING NOTIFICATION OF ABNORMAL...
- Publication number 20250027883
- Publication date Jan 23, 2025
- Samsung Electronics Co., Ltd.
- Moonsun KIM
- G08 - SIGNALLING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20250012732
- Publication date Jan 9, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Multiple Pass Optical Measurements Of Semiconductor Structures
- Publication number 20250012734
- Publication date Jan 9, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY SYSTEM UTILIZING ANNULAR OPTICAL CONFIGURATION
- Publication number 20250004263
- Publication date Jan 2, 2025
- MITUTOYO CORPORATION
- Paul Gerard Gladnick
- G02 - OPTICS
Information Patent Application
PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...
- Publication number 20250003887
- Publication date Jan 2, 2025
- BRITESCAN, INC.
- Danica HARBAUGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and optical system for imaging optical defect
- Publication number 20240426761
- Publication date Dec 26, 2024
- John Le
- G01 - MEASURING TESTING
Information Patent Application
RAPID REAL-TIME VISUALIZATION METHOD AND SYSTEM FOR CRACK INITIATIO...
- Publication number 20240426767
- Publication date Dec 26, 2024
- NANJING HYDRAULIC RESEARCH INSTITUTE
- Yu Jia
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20240419144
- Publication date Dec 19, 2024
- LG ENERGY SOLUTION, LTD.
- Min Kyu SIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240410835
- Publication date Dec 12, 2024
- AUROS Technology, Inc.
- Seong Yun CHOI
- G01 - MEASURING TESTING
Information Patent Application
INFRARED DETECTION CAMERA
- Publication number 20240402090
- Publication date Dec 5, 2024
- Laser & Plasma Technologies, LLC
- Mool C. GUPTA
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
PROTECTIVE GLASS CONTAMINATION DETECTION DEVICE AND PROTECTIVE GLAS...
- Publication number 20240402095
- Publication date Dec 5, 2024
- AMADA CO., LTD.
- Tatsuya AMANO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY
- Publication number 20240402083
- Publication date Dec 5, 2024
- Honeywell International Inc.
- Kuna Venkat Satya Rama KISHORE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Inspecting Outer Appearance
- Publication number 20240405301
- Publication date Dec 5, 2024
- LG ENERGY SOLUTION, LTD.
- Geun Tae Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...
- Publication number 20240397185
- Publication date Nov 28, 2024
- ORBOTECH LTD.
- Yigal KATZIR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
SPUTTER MEASUREMENT SYSTEM
- Publication number 20240383077
- Publication date Nov 21, 2024
- Prime Planet Energy & Solutions, Inc.
- Takashi YOSHIDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...
- Publication number 20240385123
- Publication date Nov 21, 2024
- TIAMA
- Olivier COLLE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIFIED COMPONENT HAIRPIN INSPECTION DEVICE
- Publication number 20240385120
- Publication date Nov 21, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20240377335
- Publication date Nov 14, 2024
- NuFlare Technology, Inc.
- Masaya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRONIC DEVICES
- Publication number 20240377338
- Publication date Nov 14, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTICAL INSPECTION TOOL
- Publication number 20240377334
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Mark Anthony Lee
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Automatic Monitoring of Lids of Beverage a...
- Publication number 20240369496
- Publication date Nov 7, 2024
- QUISS QUALITÄTS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR VISION BASED COUNTING
- Publication number 20240369497
- Publication date Nov 7, 2024
- Illinois Tool Works Inc.
- Ben Whittier
- G06 - COMPUTING CALCULATING COUNTING

Specially adapted optical and illumination features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Qualitative or quantitative characterization of a coating surface

Method and apparatus for real-time direct surface fouling and scale...

Dark-field confocal microscopy measurement apparatus and method bas...

Method for inspecting pattern defects

Defect inspection apparatus and defect inspection method

Device and method for monitoring the drying/curing process of coatings

Vortex dichroism dark-field confocal microscopy measurement apparat...

Apparatus comprising at least one THz device and method of operatin...

Optical inspection method, non-transitory storage medium storing op...

Station and method for translationally detecting glaze defects on g...

Device and method for inspecting reflective surfaces

Measurement tool for cable-preparation system

High resolution multispectral multi-field-of-view imaging system fo...

Container visual inspection assembly and method

Optical diagnostics of semiconductor process using hyperspectral im...

System for optical inspection of a substrate using same or differen...

Semiconductor failure analysis device

Die inspection method and apparatus

Laser based inclusion detection system and methods

Product-inspection apparatus, product-inspection method, and non-tr...

Single pass automated vehicle inspection system and method

Angle independent optical surface inspector

Method for evaluating the optical quality of a delineated region of...

Inspection system of semiconductor wafer and method of driving the...

Product inspection system and method

System for detecting surface type of object and artificial neural n...

Vibration measurement device

Image acquisition method and image acquisition apparatus

Illuminator for a viewing unit of an optical inspection machine for...

Tab image acquisition device, system, and method

Patents Applicationslast 30 patents

ELECTRONIC DEVICE AND METHOD FOR PROVIDING NOTIFICATION OF ABNORMAL...

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

SURFACE INSPECTION APPARATUS

Multiple Pass Optical Measurements Of Semiconductor Structures

METROLOGY SYSTEM UTILIZING ANNULAR OPTICAL CONFIGURATION

PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...

Method and optical system for imaging optical defect

RAPID REAL-TIME VISUALIZATION METHOD AND SYSTEM FOR CRACK INITIATIO...

MONITORING SYSTEM AND OPERATING METHOD THEREOF

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

INFRARED DETECTION CAMERA

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

PROTECTIVE GLASS CONTAMINATION DETECTION DEVICE AND PROTECTIVE GLAS...

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

System and Method for Inspecting Outer Appearance

MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

APPARATUS AND METHOD FOR MEASURING WAFERS

SPUTTER MEASUREMENT SYSTEM

OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...

ELECTRIFIED COMPONENT HAIRPIN INSPECTION DEVICE

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD FOR ELECTRONIC DEVICES

AUTOMATED OPTICAL INSPECTION TOOL

Apparatus and Method for Automatic Monitoring of Lids of Beverage a...

SYSTEMS AND METHODS FOR VISION BASED COUNTING