Specially adapted optical and illumination features

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CPC
G01N21/8806

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8806Specially adapted optical and illumination features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution multispectral multi-field-of-view imaging system fo...
- Patent number 12,174,128
- Issue date Dec 24, 2024
- Onto Innovation Inc.
- John A Tejada
- G01 - MEASURING TESTING
Information Patent Grant
Container visual inspection assembly and method
- Patent number 12,169,177
- Issue date Dec 17, 2024
- Amgen Inc.
- Graham F. Milne
- G01 - MEASURING TESTING
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 12,165,937
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for optical inspection of a substrate using same or differen...
- Patent number 12,163,899
- Issue date Dec 10, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis device
- Patent number 12,163,900
- Issue date Dec 10, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Die inspection method and apparatus
- Patent number 12,152,995
- Issue date Nov 26, 2024
- ONTARIO DIE INTERNATIONAL INC.
- Wesley Elton Scott
- G01 - MEASURING TESTING
Information Patent Grant
Laser based inclusion detection system and methods
- Patent number 12,152,999
- Issue date Nov 26, 2024
- Corning Incorporated
- Souma Chaudhury
- G01 - MEASURING TESTING
Information Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
- Patent number 12,148,143
- Issue date Nov 19, 2024
- NEC Corporation
- Keiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single pass automated vehicle inspection system and method
- Patent number 12,140,501
- Issue date Nov 12, 2024
- UVEYE LTD.
- Ohad Hever
- G01 - MEASURING TESTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating the optical quality of a delineated region of...
- Patent number 12,130,244
- Issue date Oct 29, 2024
- Saint-Gobain Glass France
- Théo Rybarczyk
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Product inspection system and method
- Patent number 12,117,404
- Issue date Oct 15, 2024
- TE CONNECTIVITY SOLUTIONS GmbH
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition method and image acquisition apparatus
- Patent number 12,105,026
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Yasuhiro Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Illuminator for a viewing unit of an optical inspection machine for...
- Patent number 12,099,016
- Issue date Sep 24, 2024
- DOSS VISUAL SOLUTION S.R.L.
- Hemiliano Berselli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tab image acquisition device, system, and method
- Patent number 12,092,583
- Issue date Sep 17, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Yinhang Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical inspection device
- Patent number 12,092,582
- Issue date Sep 17, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Deflectometry devices, systems and methods
- Patent number 12,085,473
- Issue date Sep 10, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Lighting optical system and substrate inspecting device
- Patent number 12,085,517
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihiro Iwamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus comprising a first imager imaging fluorescence...
- Patent number 12,072,289
- Issue date Aug 27, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Micro scale image capture system
- Patent number 12,066,387
- Issue date Aug 20, 2024
- SEDDI, INC.
- Carlos Aliaga
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for cleaning an inspection system
- Patent number 12,055,478
- Issue date Aug 6, 2024
- ASML Netherlands B.V.
- Andrey Nikipelov
- G01 - MEASURING TESTING
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for determining properties of a laboratory sample contain...
- Patent number 12,053,782
- Issue date Aug 6, 2024
- Roche Diagnostics Operations, Inc.
- Michael Rein
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for vision based counting
- Patent number 12,038,390
- Issue date Jul 16, 2024
- Illinois Tool Works Inc.
- Ben Whittier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image capturing unit and inspection system
- Patent number 12,038,386
- Issue date Jul 16, 2024
- ROBIT INC.
- Masahiro Arai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20240419144
- Publication date Dec 19, 2024
- LG ENERGY SOLUTION, LTD.
- Min Kyu SIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240410835
- Publication date Dec 12, 2024
- AUROS Technology, Inc.
- Seong Yun CHOI
- G01 - MEASURING TESTING
Information Patent Application
INFRARED DETECTION CAMERA
- Publication number 20240402090
- Publication date Dec 5, 2024
- Laser & Plasma Technologies, LLC
- Mool C. GUPTA
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
PROTECTIVE GLASS CONTAMINATION DETECTION DEVICE AND PROTECTIVE GLAS...
- Publication number 20240402095
- Publication date Dec 5, 2024
- AMADA CO., LTD.
- Tatsuya AMANO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY
- Publication number 20240402083
- Publication date Dec 5, 2024
- Honeywell International Inc.
- Kuna Venkat Satya Rama KISHORE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Inspecting Outer Appearance
- Publication number 20240405301
- Publication date Dec 5, 2024
- LG ENERGY SOLUTION, LTD.
- Geun Tae Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...
- Publication number 20240397185
- Publication date Nov 28, 2024
- ORBOTECH LTD.
- Yigal KATZIR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
SPUTTER MEASUREMENT SYSTEM
- Publication number 20240383077
- Publication date Nov 21, 2024
- Prime Planet Energy & Solutions, Inc.
- Takashi YOSHIDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...
- Publication number 20240385123
- Publication date Nov 21, 2024
- TIAMA
- Olivier COLLE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIFIED COMPONENT HAIRPIN INSPECTION DEVICE
- Publication number 20240385120
- Publication date Nov 21, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20240377335
- Publication date Nov 14, 2024
- NuFlare Technology, Inc.
- Masaya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRONIC DEVICES
- Publication number 20240377338
- Publication date Nov 14, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTICAL INSPECTION TOOL
- Publication number 20240377334
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Mark Anthony Lee
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Automatic Monitoring of Lids of Beverage a...
- Publication number 20240369496
- Publication date Nov 7, 2024
- QUISS QUALITÄTS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR VISION BASED COUNTING
- Publication number 20240369497
- Publication date Nov 7, 2024
- Illinois Tool Works Inc.
- Ben Whittier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRODE SURFACE INSPECTION DEVICE
- Publication number 20240372161
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Hongjae KO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY
- Publication number 20240361252
- Publication date Oct 31, 2024
- LG ENERGY SOLUTION, LTD.
- Tae Young KIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240361244
- Publication date Oct 31, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...
- Publication number 20240354930
- Publication date Oct 24, 2024
- EIGEN INNOVATIONS INC.
- Jacob WILSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...
- Publication number 20240357221
- Publication date Oct 24, 2024
- ORBOTECH LTD.
- Yigal KATZIR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR CLEANING AN INSPECTION SYSTEM
- Publication number 20240353315
- Publication date Oct 24, 2024
- ASML NETHERLANDS B.V.
- Andrey NIKIPELOV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THREE-DIMENSIONAL LASER SCANNING WITH OPTICAL...
- Publication number 20240353346
- Publication date Oct 24, 2024
- PLX, Inc.
- Itai Vishnia
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Nanoscale Imaging Based On Second Harmonic...
- Publication number 20240353352
- Publication date Oct 24, 2024
- KLA Corporation
- Qiang Zhao
- G01 - MEASURING TESTING

Specially adapted optical and illumination features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for inspecting reflective surfaces

Measurement tool for cable-preparation system

High resolution multispectral multi-field-of-view imaging system fo...

Container visual inspection assembly and method

Optical diagnostics of semiconductor process using hyperspectral im...

System for optical inspection of a substrate using same or differen...

Semiconductor failure analysis device

Die inspection method and apparatus

Laser based inclusion detection system and methods

Product-inspection apparatus, product-inspection method, and non-tr...

Single pass automated vehicle inspection system and method

Angle independent optical surface inspector

Method for evaluating the optical quality of a delineated region of...

Inspection system of semiconductor wafer and method of driving the...

Product inspection system and method

System for detecting surface type of object and artificial neural n...

Vibration measurement device

Image acquisition method and image acquisition apparatus

Illuminator for a viewing unit of an optical inspection machine for...

Tab image acquisition device, system, and method

Optical inspection device

Deflectometry devices, systems and methods

Lighting optical system and substrate inspecting device

Inspection apparatus comprising a first imager imaging fluorescence...

Micro scale image capture system

Apparatus and method for cleaning an inspection system

Data processing method and system for detection of deterioration of...

Apparatus for determining properties of a laboratory sample contain...

Systems and methods for vision based counting

Image capturing unit and inspection system

Patents Applicationslast 30 patents

MONITORING SYSTEM AND OPERATING METHOD THEREOF

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

INFRARED DETECTION CAMERA

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

PROTECTIVE GLASS CONTAMINATION DETECTION DEVICE AND PROTECTIVE GLAS...

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

System and Method for Inspecting Outer Appearance

MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

APPARATUS AND METHOD FOR MEASURING WAFERS

SPUTTER MEASUREMENT SYSTEM

OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...

ELECTRIFIED COMPONENT HAIRPIN INSPECTION DEVICE

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD FOR ELECTRONIC DEVICES

AUTOMATED OPTICAL INSPECTION TOOL

Apparatus and Method for Automatic Monitoring of Lids of Beverage a...

SYSTEMS AND METHODS FOR VISION BASED COUNTING

ELECTRODE SURFACE INSPECTION DEVICE

DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...

MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...

APPARATUS AND METHOD FOR CLEANING AN INSPECTION SYSTEM

SYSTEM AND METHOD FOR THREE-DIMENSIONAL LASER SCANNING WITH OPTICAL...

Methods And Systems For Nanoscale Imaging Based On Second Harmonic...