1. Field of the Invention
The present disclosure relates to a method for estimating a defocus amount occurring when an imaging apparatus captures an image.
2. Description of the Related Art
In recent years, a pathological diagnosis support system referred to as a virtual slide system has attracted attention in the medical field. In the virtual slide system, a virtual slide (i.e., a digital imaging apparatus) captures an image of a specimen to be observed, so that a digital image is acquired. The system is thus capable of providing a new method of diagnosis, such as remote diagnosis and automatic diagnosis, which has not been able to realize by using a conventional microscope. Further, a high-resolution image of an entire observation area of the specimen (e.g., a stained body tissue) is required in performing pathological diagnosis. It is thus necessary for the virtual slide to acquire a high-quality image with a broad field of view.
In a general pathologic diagnosis, a prepared slide in which the specimen is covered and fixed by a transparent member (i.e., a cover glass) is used. However, there is unpredictable waviness in the specimen and the cover glass, so that defocusing occurs differently for each prepared slide, or depending on the imaging position even in the same prepared slide. Further, defocusing occurs due to a temperature change or a mechanical error. Accordingly, it becomes necessary to estimate the defocus amount at each imaging position and correct defocusing in the entire observation area to acquire a high-resolution image with abroad field of view for performing pathological diagnosis.
U.S. Patent Application Publication No. 2002/0021434 and U.S. Patent Application Publication No. 2005/0112475 discuss, as a method for estimating the defocus amount in a semiconductor exposure apparatus, a method using image intensity distribution of a mask having an asymmetrical diffraction grating. More specifically, U.S. Patent Application Publication No. 2002/0021434 discusses a method using a test mask having an asymmetrical diffraction grating pattern. Since the image of the asymmetrical diffraction grating pattern horizontally shifts in proportion to the defocus amount, the defocus amount is quantified by measuring the shift amount. Further, U.S. Patent Application Publication No. 2005/0112475 discusses a method of, by disposing the asymmetrical diffraction grating on a mask substrate used for manufacturing, calculating the defocus amount from a relation between the position of a projected image and the position of a wafer.
However, since U.S. Patent Application Publication No. 2002/0021434 discusses the method of estimating the defocus amount using a test mask different from the mask used for manufacturing, it becomes necessary to separately perform exposure for the focus estimation and exposure for manufacturing. In other words, the test specimen and the prepared slide are separately imaged even when the method discussed in U.S. Patent Application Publication No. 2002/0021434 is applied to the virtual slide. Thus, the defocus amount caused by the waviness in the specimen and the cover glass cannot be estimated. Further, the asymmetrical diffraction grating discussed in U.S. Patent Application Publication No. 2005/0112475 is arranged at a position on the mask substrate different from a device pattern to be exposed. Thus, the defocus amount in the device pattern surface cannot be estimated with the unpredictable waviness taken into account. Therefore, in the virtual slide, it is difficult to estimate the defocus amount with consideration of the waviness within the observation area of the prepared slide, even when using the methods discussed in U.S. Patent Application Publication No. 2002/0021434 or 2005/0112475.
An embodiment of the present invention is directed to an imaging apparatus that estimates a defocus amount caused by waviness of a specimen to acquire an image of the specimen.
According to an aspect of the present invention, a defocus amount estimation method for an imaging apparatus that captures, using an image sensor, an image of a specimen formed by an imaging optical system includes a captured image evaluation step of fixing the specimen using a transparent member including a mark that applies at least one of a phase variation and an amplitude change to transmitted light, to acquire a captured image containing an image of the specimen and an image of the mark, and an estimation step of estimating a defocus amount based on the captured image.
Further features and aspects of the present invention will become apparent from the following description of exemplary embodiments with reference to the attached drawings.
Various exemplary embodiments, features, and aspects of the invention will be described below with reference to the drawings.
A conveyance unit 201 in the control unit 200 moves the prepared slide 103 onto a stage 102 of the imaging unit 100 according to an instruction from a controller 202. An illumination system 101 illuminates the prepared slide 103 mounted on the stage 102, and the image of the prepared slide 103 is enlarged and formed on an image sensor 105 via an imaging optical system 104. The image sensor 105 then converts the enlarged image of the prepared slide 103 into an electrical signal, and transmits, to the information processing unit 400, the electrical signal as image data. An image processing unit 402 converts, into a digital signal (i.e., a luminance signal), the image data transmitted from the image sensor 105, and performs image processing such as noise reduction and compression. A calculation unit (i.e., a computer) 401 stores the processed digital signal, and performs calculation with respect to the stored captured image. The calculation unit 401 thus estimates the defocus amount and performs image recovery (which will be described in detail below).
According to the present exemplary embodiment, the above-described mark A and mark B are alternately arranged in the +x direction at 3 μm intervals on the cover glass. However, relative positions of the mark A group and the mark B group, and the distribution of the respective marks are not limited thereto. For example, mark A and mark B may be respectively arranged at 6 μm intervals in the y direction and 3 μm intervals in the x direction to constitute the mark A group and the mark B group, and the mark A group and the mark B group may be arranged at 3 μm intervals in the +y direction. Further, according to the present exemplary embodiment, mark A and mark B are each arranged at intervals. However, it is not limited thereto. Furthermore, according to the present exemplary embodiment, mark A and mark B are square-shaped, each of which is 1 μm on a side. However, shapes of the marks are not limited thereto, and may be circular or rectangular marks. Moreover, according to the present exemplary embodiment, mark A applies, to the transmitted light, the phase variation of −π/4 radian, and mark B applies, to the transmitted light, the amplitude change by 70%. However, the values are not limited thereto, and the phase variation may be π/2 radian and the amplitude change may be 50%.
A description about a simulation of the image, which is an image of the prepared slide captured by the imaging unit, will be described below. The prepared slide is prepared by using the cover glass according to the present exemplary embodiment. In the simulation, the intensity transmittance distribution of the specimen is as illustrated in
The method for calculating an evaluation amount for estimating the image plane defocus amount from the image acquired by the imaging unit (i.e., an evaluation amount calculation process) will be described below with reference to the flowchart illustrated in
In step S701 (i.e., a division process), the calculation unit divides the image so that a divided area includes at least one of mark A and mark B, to extract the respective image change of mark A and mark B. According to the present exemplary embodiment, the marks are arranged at regular intervals on the cover glass as described above. It is thus desirable to equally divide the image as indicated by broken lines illustrated in
In step S702 (i.e. a first averaging process), the calculation unit calculates an average value of the image within the area in which the image of the mark appears (i.e., within thin solid lines illustrated in
However, if there is a distribution in the transmittance of the specimen within each divided area, the value obtained in step S704 becomes different for each divided area. To solve such a problem, in step S705 (i.e., a third averaging process), the calculation unit averages the value obtained in step S704 among the same mark group (i.e., each of mark group A and mark group B). As a result, the calculation unit calculates the value in which the effect of the transmittance distribution of the specimen in each divided area has been reduced. The value obtained as above with respect to the mark A group is thus set as an evaluation amount 1, and the value obtained with respect to the mark B group is set as an evaluation amount 2. In step S706, the calculation unit stores each evaluation value.
According to the present exemplary embodiment, by performing the above-described evaluation amount calculation process, the evaluation values can be calculated from the captured image of the prepared slide including the cover glass and the specimen. According to the present exemplary embodiment, the evaluation value calculation process has been described, assuming the case where the evaluation value is calculated with respect to the captured image of the prepared slide. However, the evaluation amount calculation process may be applied to the image acquired by imaging only the cover glass (i.e., the reference image) without previously placing the specimen. In other words, only the cover glass is previously imaged before preparing the prepared slide, and the evaluation amount calculation process is then performed on the acquired reference image. The evaluation value thereof can thus be stored in the calculation unit (the process will be described in detail below).
In
As described above, according to the present exemplary embodiment, the cover glass including the specific marks is employed, so that the image plane defocus amount caused by the specimen to be observed or the cover glass can be estimated. In such a case, as illustrated in
The evaluation amount 1 and the evaluation amount 2 are used to estimate the image plane defocus amount from the captured image of the prepared slide. The image among the plurality of reference images (i.e., the through-focus images of the cover glass) previously stored in the calculation unit, which corresponds to the estimated image plane defocus amount, is then read. The captured image of the prepared slide is thus divided by the read reference image of the cover glass.
The method for estimating the defocus amount according to the first exemplary embodiment will be described below with reference to the flowchart illustrated in
In step S1201, the imaging unit images the cover glass according to the present exemplary embodiment with respect to a plurality of defocus amounts, and the calculation unit stores the acquired plurality of reference images (i.e., through-focus images). According to the present exemplary embodiment, the defocus amount is changed when performing imaging by vertically-driving the image sensor in the optical axis direction of the imaging optical system. However, the defocus amount may also be changed by driving the stage on which the prepared slide is mounted.
In step S1202, the calculation unit calculates the evaluation amount 1 and the evaluation amount 2 with respect to each of the plurality of reference images acquired in step S1201, according to the evaluation amount calculation process illustrated in
In step S1203, the specimen to be observed is fixed by the cover glass which has been imaged in the reference image evaluation step (S1201). The calculation unit then obtains and stores the captured image of the prepared slide that has been prepared. In step S1204, the calculation unit calculates the evaluation amount 1 and the evaluation amount 2 from the captured image of the prepared slide obtained in step S1203, according to the evaluation amount calculation process illustrated in
In step S1205 (i.e., an estimation step), the calculation unit compares each evaluation amount acquired in the captured image evaluation step (step S1204) with the reference data stored in the reference image evaluation step (S1202). The calculation unit then estimates the image plane defocus amount. For example, it is assumed that the values of the evaluation amount 1 and the evaluation amount 2 are respectively obtained as 1.13 and 0.858 from the acquired captured image of the prepared slide. If the values are compared with the reference data previously stored in the calculation unit, it can be estimated from the evaluation amount 2 that the image plane defocus amount is proximately ±3 mm. Further, since the evaluation amount 1 is a positive value, it can be estimated that the image plane defocus amount is +3 mm. The estimation method performed in the estimation step (S1205) is not limited to the above-described method. For example, if it is estimated from the evaluation amount 1 that the image plane defocus amount is 1 mm or 3 mm, it may be estimated from the evaluation amount 2 that 3 mm among the two estimation values is more appropriate. Further, other values obtained by calculating the evaluation amount 1 and the evaluation amount 2 may be used as the evaluation amount.
After estimating the image plane defocus amount, in step S1206 (i.e., an image recovery step), the calculation unit performs image recovery. More specifically, the calculation unit reads, among the plurality of reference images of the cover glass acquired in the reference image evaluation step (S1201), the image corresponding to the image plane defocus amount estimated in the estimation step (S1205). The calculation unit then divides the captured image of the prepared slide by the read reference image. As a result, the effect of the cover glass can be removed from the captured image, so that the captured image acquired for estimating the image plane defocus amount can be used in performing pathological diagnosis.
As described above, by performing the image plane defocus amount estimation method according to the present exemplary embodiment, the image plane defocus amount in the imaging position of the prepared slide can be estimated. Further, the image of the prepared slide in which the effect of the cover glass has been removed can be acquired. Furthermore, by performing the image plane defocus amount estimation method at each imaging position of the specimen, the image defocus amount distribution in the entire observation area of the specimen can be acquired.
The image plane defocus amount estimation method according to a second exemplary embodiment of the present invention will be described below.
According to the first exemplary embodiment, the image plane defocus amount is estimated by performing comparison with the reference data acquired by previously imaging the cover glass. However, it is not necessary to acquire the reference data only for determining whether the defocusing direction is in the positive direction or the negative direction. In other words, the defocusing direction can be determined based on whether the images of mark A in the captured image of the prepared slide appear light or dark. For example, if the images of mark A appear bright (i.e., appear white) as compared to the surroundings, it can be determined that the defocusing direction is in the positive direction.
Further, according to the first exemplary embodiment, the cover glass applies, to the transmitted light, the negative phase variation and the amplitude change. However, the image plane defocus amount can be estimated using the cover glass which applies only the phase variation. In such a case, the cover glass only needs to include mark A and does not need to include the filter (i.e., mark B) to be arranged for applying the amplitude change, so that manufacturing becomes easy. However, if such a cover glass is used, only the evaluation amount 1 is obtained, and the range in which the image plane defocus amount can be estimated becomes limited. For example, according to the simulation result of the present exemplary embodiment, if the image plane defocus amount is within the range between −2 mm and 2 mm, the image plane defocus amount can be estimated only using the evaluation amount 1. Further, normalization may be performed by a value calculated as follows, to express the amounts in a unit referred to as a Rayleigh unit which does not depend on the imaging optical system. wavelength×the square of magnification/the square of numerical aperture/2
As a result, estimation can be performed in the range between −2.24 and 2.24. In the case where the cover glass which only applies the phase variation is used, the effect of the cover glass can also be removed by dividing the captured image of the prepared slide by the previously stored reference image of the cover glass.
On the other hand, the image plane defocus amount can be estimated using the cover glass which only applies the amplitude change. In such a case, the cover glass only needs to include mark B and does not need to include the recess (i.e., mark A) for applying the phase variation, so that manufacturing becomes easy. However, if such a cover glass is used, the value that can be estimated is only the absolute value of the image plane defocus amount.
Furthermore, a mark which applies a positive phase variation may be arranged on the cover glass in addition to the mark that applies the negative phase variation and the amplitude change to the transmitted light. If the mark which applies the positive phase variation is arranged on the cover glass as mark C, the image of the mark C in the through-focus image of the cover glass indicates a light-dark change according to the defocusing direction. Since the light-dark change of the image of the mark C is opposite to the light-dark change of the image of mark A, one of the marks always appears white regardless of the defocusing direction. In other words, if mark C is added, it becomes easy to visibly distinguish the change in the through-focus image. This can prevent the image of the mark A from being mistakenly recognized as the image of mark B that applies the amplitude change when estimating the image plane defocus amount.
Moreover, an evaluation amount 3 can be newly acquired by obtaining the difference between the evaluation amount 1 obtained from mark A and the evaluation amount 1 obtained from mark C. For example,
According to the above-described exemplary embodiment, the image recovery process for removing the effect of the cover glass is performed by division using the previously-acquired reference image of the cover glass. However, the method for calculating the image is not limited thereto. For example, the effect of the cover glass can be removed by subtracting the previously-acquired reference image of the cover glass from the captured image of the prepared slide.
While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
This application claims the benefit of Japanese Patent Application No. 2012-130104 filed Jun. 7, 2012, which is hereby incorporated by reference herein in its entirety.
Number | Date | Country | Kind |
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2012-130104 | Jun 2012 | JP | national |