IBM Technical Disclosure Bulletin, vol. 22, No. 7, Dec. '79, pp. 2704-2705, New York, US, L.M. Zobniw--"Orthogonal Shorts Detector." |
IBM Technical Disclosure Bulletin, vol. 26, No. 5, Oct. '83, pp. 2594-2595, New York, US; A. H. Kumar et al--"Liquid Crystal Electrical Continuity Tester". |
Patents Abstracts of Japan, vol. 7, No. 15, pp. 169 (1160), 1983; and JP-A-57 172 260 (Hitachi Densen K.K.) 23-10-1982. |
IBM Technical Disclosure Bulletin, vol. 12, No. 5, Oct. '69, pp. 655-656, New York, US; P. M. Degroat et al--"Finding Shorts in Printed Circuit Boards". |