Bare printed circuit boards

Industry

CPC
G01R31/2805

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2805Bare printed circuit boards

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting and adjusting poor back drills in printed circ...
- Patent number 12,135,347
- Issue date Nov 5, 2024
- R&D Circuits
- Michael Caprio
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test system for memory card
- Patent number 12,038,470
- Issue date Jul 16, 2024
- Huawei Technologies Co., Ltd.
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection test for unpopulated printed circuit boards
- Patent number 11,940,481
- Issue date Mar 26, 2024
- Dyconex AG
- Daniel Luchsinger
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus, analysis method, and computer-readable medium
- Patent number 11,635,458
- Issue date Apr 25, 2023
- Fuji Electric Co., Ltd.
- Norihiro Komiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for depositing conductive and nonconductive material to f...
- Patent number 11,596,071
- Issue date Feb 28, 2023
- BotFactory Inc.
- Michael Knox
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing method
- Patent number 11,454,663
- Issue date Sep 27, 2022
- Realtek Semiconductor Corp.
- Chia-Min Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for faster testing of manufactured PCB, apparatus, system, a...
- Patent number 11,215,659
- Issue date Jan 4, 2022
- HONGFUJIN PRECISION ELECTRONICS (TIANJIN) CO., LTD.
- Meng-Chu Chang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting wiring short in substrate
- Patent number 11,143,711
- Issue date Oct 12, 2021
- SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Tai Jin Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe and apparatus for testing printed circuit board
- Patent number 10,718,807
- Issue date Jul 21, 2020
- BOE Technology Group Co., Ltd.
- Kai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Printed wiring board, crack prediction device, and crack prediction...
- Patent number 10,605,851
- Issue date Mar 31, 2020
- Fujitsu Limited
- Shigeo Iriguchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated high frequency test station
- Patent number 10,481,194
- Issue date Nov 19, 2019
- COMMSCOPE CONNECTIVITY UK LIMITED
- Ian Robert George
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board test coupon for electrical testing during the...
- Patent number 10,334,720
- Issue date Jun 25, 2019
- Greater Asia Pacific Limited
- Robert Neves
- G01 - MEASURING TESTING
Information Patent Grant
Conductivity inspection method of printed circuit board and manufac...
- Patent number 10,264,684
- Issue date Apr 16, 2019
- Nitto Denko Corporation
- Terukazu Ihara
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 10,228,411
- Issue date Mar 12, 2019
- Nidec-Read Corporation
- Jun Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Printed board with wiring pattern for detecting deterioration, and...
- Patent number 10,184,975
- Issue date Jan 22, 2019
- FANUC CORPORATION
- Yuichi Okouchi
- G01 - MEASURING TESTING
Information Patent Grant
Board inspection apparatus system and board inspection method
- Patent number 10,041,991
- Issue date Aug 7, 2018
- Koh Young Technology Inc.
- Seung-Jun Lee
- G05 - CONTROLLING REGULATING
Information Patent Grant
Flexible circuit board inspecting apparatus
- Patent number 9,910,084
- Issue date Mar 6, 2018
- Nidec-Read Corporation
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Flexible circuit board and cutting device
- Patent number 9,903,906
- Issue date Feb 27, 2018
- BOE Technology Group Co., Ltd.
- Guowen Yang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
High bandwidth signal probe tip
- Patent number 9,880,198
- Issue date Jan 30, 2018
- Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- Eric R. Ao
- G01 - MEASURING TESTING
Information Patent Grant
Printed wiring board, crack prediction device, and crack prediction...
- Patent number 9,709,619
- Issue date Jul 18, 2017
- Fujitsu Limited
- Shigeo Iriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and test apparatus including the same
- Patent number 9,612,274
- Issue date Apr 4, 2017
- Samsung Electronics Co., Ltd.
- Jun-Hee Lee
- G01 - MEASURING TESTING
Information Patent Grant
Insulation inspection method and insulation inspection apparatus
- Patent number 9,606,162
- Issue date Mar 28, 2017
- Nidec-Read Corporation
- Munehiro Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Insulation inspection apparatus and insulation inspection method
- Patent number 9,606,166
- Issue date Mar 28, 2017
- Nidec-Read Corporation
- Jun Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,535,108
- Issue date Jan 3, 2017
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method for inspecting a wiring...
- Patent number 9,476,934
- Issue date Oct 25, 2016
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Electric circuit evaluation method and electric circuit
- Patent number 9,470,735
- Issue date Oct 18, 2016
- Rohm Co., Ltd.
- Noriaki Hiraga
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer readable media for detecting electri...
- Patent number 9,442,151
- Issue date Sep 13, 2016
- SanDisk Technologies LLC
- Shai Tubul
- G01 - MEASURING TESTING
Information Patent Grant
Electric circuit evaluation method
- Patent number 9,400,300
- Issue date Jul 26, 2016
- Rohm Co., Ltd.
- Noriaki Hiraga
- G01 - MEASURING TESTING
Information Patent Grant
Testing circuit and printed circuit board using same
- Patent number 9,322,873
- Issue date Apr 26, 2016
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Li-Sheng Shu
- G01 - MEASURING TESTING
Information Patent Grant
Using time-domain reflectometry to identify manufacturing informati...
- Patent number 9,310,417
- Issue date Apr 12, 2016
- Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- Jordan HP Chin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD OF BARE CIRCUIT BOARD
- Publication number 20240310428
- Publication date Sep 19, 2024
- Unimicron Technology Corp.
- Chun-Hsien CHIEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AND ADJUSTING POOR BACK DRILLS IN PRINTED CIRC...
- Publication number 20230026067
- Publication date Jan 26, 2023
- R&D Circuits
- Michael Caprio
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HOT E-TEST FOR UNPOPULATED PRINTED CIRCUIT BOARDS
- Publication number 20220283218
- Publication date Sep 8, 2022
- DYCONEX AG
- Daniel Luchsinger
- G01 - MEASURING TESTING
Information Patent Application
Test System for Memory Card
- Publication number 20220074986
- Publication date Mar 10, 2022
- Huawei Technologies Co., Ltd
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FASTER TESTING OF MANUFACTURED PCB, APPARATUS, SYSTEM, A...
- Publication number 20210190853
- Publication date Jun 24, 2021
- HONGFUJIN PRECISION ELECTRONICS(TIANJIN)CO.,LTD.
- MENG-CHU CHANG
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND TESTING MACHINE HAVING THE SAME
- Publication number 20200379011
- Publication date Dec 3, 2020
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YANG-GANG LIU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING WIRING SHORT IN SUBSTRATE
- Publication number 20200225272
- Publication date Jul 16, 2020
- Samsung Electro-Mechanics Co., Ltd.
- Tai Jin Kim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DEPOSITING CONDUCTIVE AND NONCONDUCTIVE MATERIAL TO F...
- Publication number 20200163220
- Publication date May 21, 2020
- BOTFACTORY INC.
- Michael Knox
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONDUCTIVE SHEET, ELECTRICAL INSPECTION HEAD, ELECTRICA...
- Publication number 20180113152
- Publication date Apr 26, 2018
- Yamaha Fine Technologies Co.,Ltd.
- Katsunori SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
PRINTED WIRING BOARD, CRACK PREDICTION DEVICE, AND CRACK PREDICTION...
- Publication number 20170285096
- Publication date Oct 5, 2017
- Fujitsu Limited
- Shigeo IRIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR INSPECTING A WIRING...
- Publication number 20140375351
- Publication date Dec 25, 2014
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CIRCUIT EVALUATION METHOD
- Publication number 20140368212
- Publication date Dec 18, 2014
- Noriaki HIRAGA
- G01 - MEASURING TESTING
Information Patent Application
Electric Circuit Evaluation Method and Electric Circuit
- Publication number 20140368213
- Publication date Dec 18, 2014
- Noriaki HIRAGA
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20140298898
- Publication date Oct 9, 2014
- Wistron Corporation
- Jun-Min YANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD AND TEST APPARATUS INCLUDING THE SAME
- Publication number 20140239992
- Publication date Aug 28, 2014
- Samsung Electronics Co., Ltd.
- Jun-Hee LEE
- G01 - MEASURING TESTING
Information Patent Application
HIGH BANDWIDTH SIGNAL PROBE TIP
- Publication number 20140225637
- Publication date Aug 14, 2014
- International Business Machines Corporation
- Eric R. Ao
- G01 - MEASURING TESTING
Information Patent Application
WIRING FAULT DETECTION METHOD, WIRING FAULT DETECTION APPARATUS, AN...
- Publication number 20140159759
- Publication date Jun 12, 2014
- Sharp Kabushiki Kaisha
- Yuji Karita
- G01 - MEASURING TESTING
Information Patent Application
BOARD INSPECTION APPARATUS SYSTEM AND BOARD INSPECTION METHOD
- Publication number 20140125375
- Publication date May 8, 2014
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- G01 - MEASURING TESTING
Information Patent Application
PRINTED WIRING BOARD, CRACK PREDICTION DEVICE, AND CRACK PREDICTION...
- Publication number 20140077834
- Publication date Mar 20, 2014
- Shigeo IRIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING CIRCUIT AND PRINTED CIRCUIT BOARD USING SAME
- Publication number 20130328588
- Publication date Dec 12, 2013
- HON HAI PRECISION INDUSTRY CO., LTD.
- LI-SHENG SHU
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE FOR TESTING PLATES FOR ELECTRONIC CIRCUITS AND RELAT...
- Publication number 20130093441
- Publication date Apr 18, 2013
- Applied Materials Italia S.R.L.
- Diego Tonini
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR GLASS SUBSTRATE
- Publication number 20130049785
- Publication date Feb 28, 2013
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Wen-da Cheng
- G02 - OPTICS
Information Patent Application
ELECTRONIC DEVICE AND METHOD OF AUTOMATICALLY TESTING TRANSMISSION...
- Publication number 20120221989
- Publication date Aug 30, 2012
- HON HAI Precision Industry CO., LTD.
- HSIEN-CHUAN LIANG
- G01 - MEASURING TESTING
Information Patent Application
Printed Circuit Board Registration Testing
- Publication number 20120212252
- Publication date Aug 23, 2012
- Scott H. Aronson
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER WIRING BOARD AND METHOD FOR EVALUATING MULTILAYER WIRING...
- Publication number 20120032700
- Publication date Feb 9, 2012
- Fujitsu Limited
- Mitsuhiko SUGANE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING CONDUCTIVE PATTERN ON SUBSTRATE
- Publication number 20120025839
- Publication date Feb 2, 2012
- Industrial Technology Research Institute
- Yong-Tong ZOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE TESTING OF CIRCUIT BOARDS
- Publication number 20110273203
- Publication date Nov 10, 2011
- DTG International GMBH
- Victor Romanov
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE TEST APPARATUS
- Publication number 20110260734
- Publication date Oct 27, 2011
- AFA Micro Co.
- Shyh-Shyan Liao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TERMINAL DISCRIMINATING APPARATUS AND TERMINAL DISCRIMINATING METHO...
- Publication number 20110234254
- Publication date Sep 29, 2011
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Seung Jei YANG
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR IMPULSE VOLTAGE TESTING OF ELECTRICAL HIGH-VOL...
- Publication number 20110133754
- Publication date Jun 9, 2011
- ABB TECHNOLOGY AG
- Peter Werle
- G01 - MEASURING TESTING

Bare printed circuit boards

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detecting and adjusting poor back drills in printed circ...

Test system for memory card

Electrical connection test for unpopulated printed circuit boards

Analyzing apparatus, analysis method, and computer-readable medium

Apparatus for depositing conductive and nonconductive material to f...

Signal processing method

Method for faster testing of manufactured PCB, apparatus, system, a...

Apparatus and method for detecting wiring short in substrate

Test probe and apparatus for testing printed circuit board

Printed wiring board, crack prediction device, and crack prediction...

Automated high frequency test station

Printed circuit board test coupon for electrical testing during the...

Conductivity inspection method of printed circuit board and manufac...

Testing apparatus

Printed board with wiring pattern for detecting deterioration, and...

Board inspection apparatus system and board inspection method

Flexible circuit board inspecting apparatus

Flexible circuit board and cutting device

High bandwidth signal probe tip

Printed wiring board, crack prediction device, and crack prediction...

Probe card and test apparatus including the same

Insulation inspection method and insulation inspection apparatus

Insulation inspection apparatus and insulation inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method for inspecting a wiring...

Electric circuit evaluation method and electric circuit

Methods, systems, and computer readable media for detecting electri...

Electric circuit evaluation method

Testing circuit and printed circuit board using same

Using time-domain reflectometry to identify manufacturing informati...

Patents Applicationslast 30 patents

INSPECTION SYSTEM AND INSPECTION METHOD OF BARE CIRCUIT BOARD

METHOD FOR DETECTING AND ADJUSTING POOR BACK DRILLS IN PRINTED CIRC...

HOT E-TEST FOR UNPOPULATED PRINTED CIRCUIT BOARDS

Test System for Memory Card

METHOD FOR FASTER TESTING OF MANUFACTURED PCB, APPARATUS, SYSTEM, A...

TEST FIXTURE AND TESTING MACHINE HAVING THE SAME

APPARATUS AND METHOD FOR DETECTING WIRING SHORT IN SUBSTRATE

APPARATUS FOR DEPOSITING CONDUCTIVE AND NONCONDUCTIVE MATERIAL TO F...

ANISOTROPIC CONDUCTIVE SHEET, ELECTRICAL INSPECTION HEAD, ELECTRICA...

PRINTED WIRING BOARD, CRACK PREDICTION DEVICE, AND CRACK PREDICTION...

INSPECTION APPARATUS AND INSPECTION METHOD FOR INSPECTING A WIRING...

ELECTRIC CIRCUIT EVALUATION METHOD

Electric Circuit Evaluation Method and Electric Circuit

TESTING APPARATUS AND TESTING METHOD

PROBE CARD AND TEST APPARATUS INCLUDING THE SAME

HIGH BANDWIDTH SIGNAL PROBE TIP

WIRING FAULT DETECTION METHOD, WIRING FAULT DETECTION APPARATUS, AN...

BOARD INSPECTION APPARATUS SYSTEM AND BOARD INSPECTION METHOD

PRINTED WIRING BOARD, CRACK PREDICTION DEVICE, AND CRACK PREDICTION...

TESTING CIRCUIT AND PRINTED CIRCUIT BOARD USING SAME

TESTING DEVICE FOR TESTING PLATES FOR ELECTRONIC CIRCUITS AND RELAT...

INSPECTION DEVICE FOR GLASS SUBSTRATE

ELECTRONIC DEVICE AND METHOD OF AUTOMATICALLY TESTING TRANSMISSION...

Printed Circuit Board Registration Testing

MULTILAYER WIRING BOARD AND METHOD FOR EVALUATING MULTILAYER WIRING...

APPARATUS FOR MEASURING CONDUCTIVE PATTERN ON SUBSTRATE

METHOD FOR THE TESTING OF CIRCUIT BOARDS

INTEGRATED CIRCUIT DEVICE TEST APPARATUS

TERMINAL DISCRIMINATING APPARATUS AND TERMINAL DISCRIMINATING METHO...

TEST ARRANGEMENT FOR IMPULSE VOLTAGE TESTING OF ELECTRICAL HIGH-VOL...