Number | Name | Date | Kind |
---|---|---|---|
3696319 | Olsson | Oct 1972 | |
3702439 | McGahey et al. | Nov 1972 | |
3803709 | Beltz et al. | Apr 1974 | |
3810016 | Chayka et al. | May 1974 | |
4340860 | Teeple, Jr. | Jul 1982 |
Entry |
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IBM Technical Disclosure Bulletin, Jeenicke, E. et al., "Microcircuitry Test Probe", vol. 12, No. 9, Feb. 1970, pp. 1435,1436. |
Schelhorn, R. L.; "Test Fixture for Testing Chip Carrier Devices Assembled in Larger Ckts."; RCA Tech. Notes; Oct. 12, 1982. |