arranged on a flexible frame or film

Industry

CPC
G01R1/0735

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/0735arranged on a flexible frame or film

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vertical probe pin and a probe card having same
- Patent number 12,169,211
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Seok Ho Son
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam probes with decoupled structural and current carrying be...
- Patent number 12,146,898
- Issue date Nov 19, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Proximity detection for assessing sensing probe attachment state
- Patent number 12,135,337
- Issue date Nov 5, 2024
- The General Hospital Corporation
- Maria A. Franceschini
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 12,105,119
- Issue date Oct 1, 2024
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with extension springs, methods for making, an...
- Patent number 12,078,657
- Issue date Sep 3, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 12,032,002
- Issue date Jul 9, 2024
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for electronic devices and corresponding probe card
- Patent number 12,032,003
- Issue date Jul 9, 2024
- Technoprobe, S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 12,000,867
- Issue date Jun 4, 2024
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 11,959,941
- Issue date Apr 16, 2024
- Industrial Technology Research Institute
- Min-Chieh Chou
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and transmission structure
- Patent number 11,933,817
- Issue date Mar 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with flat extension springs, methods for makin...
- Patent number 11,906,549
- Issue date Feb 20, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam probe arrays and methods for making such arrays inclu...
- Patent number 11,821,918
- Issue date Nov 21, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for electrically contacting components in a semic...
- Patent number 11,796,567
- Issue date Oct 24, 2023
- Osram Opto Semiconductors GmbH
- Michael Bergler
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head
- Patent number 11,774,468
- Issue date Oct 3, 2023
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer probes having longitudinal axes and preferential probe...
- Patent number 11,768,227
- Issue date Sep 26, 2023
- Microfabrica Inc.
- Ming Ting Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Short interconnect assembly with strip elastomer
- Patent number 11,674,977
- Issue date Jun 13, 2023
- JF Microtechnology Sdn. Bhd.
- Wei Kuong Foong
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Micro-coaxial wire interconnect architecture
- Patent number 11,656,247
- Issue date May 23, 2023
- Intel Corporation
- Ronald Michael Kirby
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and die set having horizontally fine adjustable die and...
- Patent number 11,619,656
- Issue date Apr 4, 2023
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and probe module thereof
- Patent number 11,585,832
- Issue date Feb 21, 2023
- MPI CORPORATION
- Chung-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Compliant organic substrate assembly for rigid probes
- Patent number 11,561,243
- Issue date Jan 24, 2023
- International Business Machines Corporation
- David Audette
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-beam test probe
- Patent number 11,543,454
- Issue date Jan 3, 2023
- Intel Corporation
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Contact element system with at least two contact elements having di...
- Patent number 11,519,937
- Issue date Dec 6, 2022
- Feinmetall GmbH
- Gunther Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING...
- Publication number 20240361355
- Publication date Oct 31, 2024
- MPI Corporation
- YU-SHAN HU
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having an Adjustable Angle
- Publication number 20240288473
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
Compliant Probes with Enhanced Pointing Stability and Including At...
- Publication number 20240103038
- Publication date Mar 28, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Application
Compliant Probes Including Dual Independently Operable Probe Contac...
- Publication number 20240094250
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam Probes with Decoupled Structural and Current Carrying Be...
- Publication number 20240094259
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METH...
- Publication number 20240085493
- Publication date Mar 14, 2024
- INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG
- Xian Huang
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20240027495
- Publication date Jan 25, 2024
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027522
- Publication date Jan 25, 2024
- Advantest Corporation
- Takayuki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...
- Publication number 20240019463
- Publication date Jan 18, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...
- Publication number 20240012028
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...
- Publication number 20240012027
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE MEMBRANE ADAPTED TO CARRY HIGH-FREQUENCY (RF) POWER SIGNAL...
- Publication number 20230408548
- Publication date Dec 21, 2023
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20230314476
- Publication date Oct 5, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE PIN AND PROBE CARD HAVING SAME
- Publication number 20230258691
- Publication date Aug 17, 2023
- TSE CO., LTD.
- Seok Ho SON
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME
- Publication number 20230221351
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- BYUNGWOOK CHOI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20230204628
- Publication date Jun 29, 2023
- Industrial Technology Research Institute
- Min-Chieh Chou
- G01 - MEASURING TESTING
Information Patent Application
PROBE TESTING DEVICE HAVING ELASTIC STRUCTURE
- Publication number 20230194570
- Publication date Jun 22, 2023
- STAR TECHNOLOGIES (WUHAN) CO., LTD.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACHIEVING THE MEASURING SLIP OF MEMBRANE PROBES
- Publication number 20230168280
- Publication date Jun 1, 2023
- Maxone Semiconductor Co., Ltd
- Liangyu ZHAO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TRANSMISSION STRUCTURE
- Publication number 20230033013
- Publication date Feb 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD
- Publication number 20230007997
- Publication date Jan 12, 2023
- MPI Corporation
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
JIG
- Publication number 20220413014
- Publication date Dec 29, 2022
- Yokowo Co., Ltd.
- Daisuke HOSOKAWA
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
- Publication number 20220397587
- Publication date Dec 15, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SHORT INTERCONNECT ASSEMBLY WITH STRIP ELASTOMER
- Publication number 20220390488
- Publication date Dec 8, 2022
- JF Microtechnology Sdn. Bhd.
- Wei Kuong FOONG
- G01 - MEASURING TESTING
Information Patent Application
Probe Head Including a Guide Plate with Angled Holes to Determine P...
- Publication number 20220236304
- Publication date Jul 28, 2022
- Sterling Tadashi Collins
- G01 - MEASURING TESTING

arranged on a flexible frame or film

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vertical probe pin and a probe card having same

Multi-beam probes with decoupled structural and current carrying be...

Testing apparatus

Proximity detection for assessing sensing probe attachment state

Electrical contactor and electrical connecting apparatus

Cantilever probe card device and elastic probe thereof

Compliant pin probes with extension springs, methods for making, an...

Chevron interconnect for very fine pitch probing

Probe head for electronic devices and corresponding probe card

Electrical connecting device

Probe head for a testing apparatus of electronic devices with enhan...

Probe card

Probe head for reduced-pitch applications

Probe card device and transmission structure

Testing head having improved frequency properties

Compliant pin probes with flat extension springs, methods for makin...

Buckling beam probe arrays and methods for making such arrays inclu...

Testing head having improved frequency properties

Method and device for electrically contacting components in a semic...

Vertical probe head

Multi-layer probes having longitudinal axes and preferential probe...

Short interconnect assembly with strip elastomer

Testing head having improved frequency properties

Micro-coaxial wire interconnect architecture

Probe head and die set having horizontally fine adjustable die and...

Probe card and probe module thereof

Compliant organic substrate assembly for rigid probes

Double-beam test probe

Contact element system with at least two contact elements having di...

Contact probe and relative probe head of an apparatus for testing e...

Patents Applicationslast 30 patents

MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING...

Electrical Testing Device with Probe Having an Adjustable Angle

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

Compliant Probes with Enhanced Pointing Stability and Including At...

Compliant Probes Including Dual Independently Operable Probe Contac...

Multi-Beam Probes with Decoupled Structural and Current Carrying Be...

FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METH...

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...

LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...

PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...

FLEXIBLE MEMBRANE ADAPTED TO CARRY HIGH-FREQUENCY (RF) POWER SIGNAL...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

VERTICAL PROBE PIN AND PROBE CARD HAVING SAME

PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME

PROBE CARD

PROBE TESTING DEVICE HAVING ELASTIC STRUCTURE

METHOD FOR ACHIEVING THE MEASURING SLIP OF MEMBRANE PROBES

PROBE CARD DEVICE AND TRANSMISSION STRUCTURE

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

VERTICAL PROBE HEAD

JIG

ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE

SHORT INTERCONNECT ASSEMBLY WITH STRIP ELASTOMER

Probe Head Including a Guide Plate with Angled Holes to Determine P...