Dielectric compositions for firing at low temperatures and electronic parts

Information

  • Patent Grant
  • 7091147
  • Patent Number
    7,091,147
  • Date Filed
    Thursday, February 26, 2004
    20 years ago
  • Date Issued
    Tuesday, August 15, 2006
    18 years ago
Abstract
A dielectric composition for firing at a low temperature having a high dielectric constant εr, a high Q value, and a low temperature coefficient τf of the resonance frequency is provided. The dielectric composition includes a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3, (x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.075
Description

This application claims the benefits of Japanese Patent Applications P2003-56718, filed on Mar. 4, 2003, and 2003-420051, filed on Dec. 17, 2003, the entireties of which are incorporated by reference.


BACKGROUND OF THE INVENTION

1. Field of the Invention


The present invention relates to a low temperature-fired porcelain having a high dielectric constant εr and to an electronic part using such porcelain.


2. Related Art Statement


In high frequency circuit radio instruments such as cellular phones, top filters, interstage filters, local filters, etc. are used as high frequency circuit filters, and a laminated type dielectric filter is used as an interstage filter.


In order to produce a dielectric-laminated filter, a plurality of green sheets are produced from a powdery ceramic material to constitute a dielectric, and a given electrode pattern is formed on each of the green sheets by printing with a given conductive paste. A laminate is then obtained by laminating the resulting green sheets, and the laminate is fired so that the conductive paste layers and the green sheets are simultaneously fired to densify the laminate.


At that time, a metallic conductor having a low melting point, such as a silver-based conductor, a copper-based conductor or a nickel-based conductor is generally used for the electrode. The melting points are, for example, 1100° C. or lower. Ag has a melting point of about 950 to 960° C. For this reason, the dielectric needs to be sintered at a firing temperature lower than the melting point of the metal constituting the electrode.


The assignee has disclosed a dielectric composition for firing at a low temperature in Japanese patent publication H5-319922A.


It has recently been demanded to further miniaturize electronic parts and thus to further improve the dielectric constant εr of a dielectric porcelain composition. For example, the lower limit of dimensions of a dielectric laminate filter obtainable is 2.0 mm×1.25 mm when the dielectric composition having a dielectric constant of 80. When a dielectric porcelain composition having a dielectric constant of 110 or higher is used, the lower limits of the dimensions of the filter can be reduced to 1.6 mm×0.8 mm.


An object of the present invention is to provide a dielectric composition for firing at a low temperature having a high dielectric constant εr, a high Q value, and a low temperature coefficient τf of resonance frequency.


SUMMARY OF THE INVENTION

According to a first aspect of the present invention, a dielectric composition for firing at low temperatures is provided, comprising a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3, wherein x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.075<t≦0.185). The dielectric composition also includes a glass component containing at least 0.1 weight percent of B2O3 in an amount of 0.05 to 20 weight parts with respect to 100 weight parts of the main composition.


According to a second aspect of the present invention, a dielectric composition for firing at low temperatures is provided, comprising a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3, wherein x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385 ≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.075<t≦0.185. The dielectric composition also includes B2O3 in an amount of 0.05 to 10 weight parts with respect to 100 weight parts of the main composition.


The main compositions of the dielectric compositions according to the first and second aspects of the present invention are the same.


According to a third aspect of the present invention, a dielectric composition for firing at low temperatures is provided, comprising a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3, wherein x+y+z1+z2+z3+t=1, 0.100≦x≦0.250, 0.600-≦y≦0.750, 0.010≦z1≦0120, 0.000≦z2≦0.120, 0.000≦z3≦0.120, 0.010≦(z1+z2+z3)≦0.120; 0.065≦t≦0.075, and 0.35≦t/(z1+z2+z3+t). The dielectric composition also includes a glass component containing at least 0.1 weight percent of B2O3 in an amount of 0.05 to 20 weight parts with respect to 100 weight parts of the main composition.


According to a fourth aspect of the present invention, a dielectric composition for firing at low temperatures is provided comprising a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3, wherein x+y+z1+z2+z3+t=1, 0.100≦x≦0.250, 0.600≦y≦0.750, 0.010≦z1≦0.20, 0.000≦z2≦0.120, 0.000≦z3≦0.120, 0.010≦(z1+z2+z3)≦0.120, 0.065≦t≦0.075, and 0.35≦t/(z1+z2+z3+t). The dielectric composition also includes B2O3 in an amount of 0.05 to 10 weight parts with respect to 100 weight parts of the main composition.


The main compositions of the dielectric compositions according to the third and fourth aspects of the present invention are the same.


The present invention further provides electronic part each having a dielectric composition for firing at a low temperature according to the first to fourth aspects of the present invention.


The present invention provides a dielectric composition for firing at a low temperature having a high dielectric constant (εr), a high Q value, a low temperature coefficient of resonance frequency, τf, and which can be produced by firing at a low temperature. Typically, the dielectric constant εr can be improved to 110 or more, Q can be improved to 200 or more, and the absolute value of τf can be reduced to 50 or lower.


These and other objects, features and advantages of the invention will be appreciated upon reading the following description of the invention when taken in conjunction with the attached drawings, with the understanding that some modifications, variations and changes of the same could be made by the skilled person in the art.







DETAILED DESCRIPTION OF THE INVENTION

The main compositions of the dielectric compositions according to the first and second aspects of the invention are the same, and will be described as follows.


The value “x” of BaO is in a range of 0.070 to 0.300 in the main composition. The dielectric constant εr can be improved by increasing “x” to 0.070 or higher. From this viewpoint, “x” is 0.070 or higher and is preferably 0. 100 or higher. The “Q” value can be improved and τf can be reduced by lowering “x” to 0.300 or lower. From this viewpoint, “x” is 0.300 or lower, and is preferably 0.250 or lower.


The value “y” of TiO2 is in a range of 0.385 to 0.844 in the main composition. The “Q” value can be improved and τf can be reduced by increasing “y” to 0.385 or higher. From this viewpoint, “y” is 0.385 or higher, and is preferably 0.390 or higher. The dielectric constant εr can be improved by reducing “y” to 0.844 or lower. From this viewpoint, “y” is 0.844 or lower and is preferably 0.800 or lower.


The value “z1” of Nd2O3 is in a range of 0.010 to 0.130. The dielectric constant εr can be improved by adjusting “z1” at a value in a range of 0.010 to 0.130. From this viewpoint, “z1” is preferably 0.030 or higher and is 0.130 or lower.


The value “t” of Bi2O3 is in a range of 0.075 to 0.185 in the main composition. The dielectric constant εr can be improved by increasing “x” to a value exceeding 0.075. From this viewpoint, “t” is preferably 0.0751 or higher and more preferably, 0.076 or higher. Further, the “Q” value can be improved and τf can be reduced by lowering “t” to 0.185 or lower. From this viewpoint, “t” is 0.185 or lower, and is preferably 0.160 or lower.


The value “z2” of La2O3 is 0.120 or lower. The dielectric constant εr can be further improved by adding La2O3. Further, the “Q” value can be improved and τf can be reduced by lowering “z2” to 0.120 or lower. From this viewpoint, “z2” is 0.120 or lower, and is preferably be 0.100 or lower.


The value “z3” of Sm2O3 is 0.120 or lower. The dielectric constant εr and the “Q” value can be improved and τf can be reduced by adding Sm2O3 in an amount of 0.120 or lower. From this viewpoint, “z3” is 0.120 or lower, and is preferably 0.100 or lower.


The main compositions of the dielectric compositions according to third and fourth aspects of the invention are the same, and will be described as follows.


The value “x” of BaO is in a range of 0.100 to 0.250 in the main composition. The dielectric constant εr can be improved by increasing “x” to 0.100 or higher. From this viewpoint, “x” is preferably 0.150 or higher. The “Q” value can be improved and τf can be reduced by lowering “x” to 0.250 or lower. From this viewpoint, “x” is preferably 0.200 or lower.


The value “y” of TiO2 is in a range of 0.600 to 0.750 in the main composition. The “Q” value can be improved and τf can be reduced by increasing “y” to 0.600 or higher. From this viewpoint, “y” is preferably 0.640 or higher. The dielectric constant εr can be improved by reducing “y” to 0.750 or lower. From this viewpoint, “y” is preferably 0.720 or lower.


The value “z1” of Nd2O3 is in a range of 0.010 to 0.120 or lower. The dielectric constant εr can be improved by reducing “z1” to 0.120 or lower. τf can be reduced by increasing “z1” to 0.010 or higher. The value of “z1” is preferably be 0.030 or higher.


The value “z2” of La2O3 is 0.120 or lower. The dielectric constant εr can be further improved by adding La2O3. The “Q” value can be improved and τf can be reduced by reducing “z2” to 0.120 or lower.


The value “z3” of Sm2O3 is 0.120 or lower. The “Q” value and the dielectric constant εr can be improved and τf can be reduced by adding Sm2O3 in an amount of 0.120 or lower.


The value of (z1+z2+z3) is in a range of 0.010 to 0.120, so that the dielectric constant εr can be improved.


The value “t” of Bi2O3 is in a range of 0.065 to 0.075 in the main composition according to the third and fourth aspects of the present invention. It has been found that the dielectric constant εr can be improved only when the value of t/(z1+z2+z3+t) is 0.35 or higher, provided that “t” is 0.075 or lower. It has further been found that the Q value is lowered when “t” is lower than 0.065, provided that the value of t/(z1+z2+z3+t) is 0.35 or higher. It has also been found that the dielectric constant εr is reduced when the value of t/(z1+z2+z3+t) is lower than 0.35, provided that “t” is in a range of 0.065 to 0.075.


In the dielectric compositions according to the first and third aspects of the present invention, a glass component containing 0.1 weight percent or more of B2O3 is mixed with the main composition in an amount of 0.05 to 20 weight parts with respect to 100 weight parts of the main composition. The porcelain can be obtained by sintering at a low temperature by adding 0.1 weight percent or more of B2O3 into the glass component.


The content of the glass component is 0.05 weight parts or higher, so that the dielectric constant εr of the porcelain can be further improved. From this viewpoint, the content of the glass component is made 0.05 weight parts or higher and is preferably 0.10 weight parts or higher. Further, the dielectric constant εr can be improved by reducing the content of the glass component to 20.0 weight parts or lower. From this viewpoint, the content of the glass component is 20.00 weight parts or lower, and is preferably 15.00 weight parts or lower.


The glass component is not particularly limited and is preferably one or more of the following compositions: ZnO—B2O3—SiO2; ZnO—Bi2O3—B2O3—SiO2; B2O3—SiO2; RO—B2O3—SiO2; GeO2—B2O3; GeO2—B2O3—SiO2; GeO2—ZnO—B2O3—SiO2; GeO2—ZnO—B2O3; Li2O—Al2O3—SiO2—B2O3; Li2O—Al2O3—SiO2—ZnO—B2O3; RO—Li2O—Al2O3—SiO2—B2O3; RO—Li2O—Al2O3—SiO2—ZnO—B2O3; Re2O—B2O3—SiO2; Re2O—B2O3—ZnO—SiO2; Re2O—RO—B2O3—SiO2; and Re2O—RO—B2O3—ZnO—SiO2 glass; wherein Re represents an alkali metal and R represents an alkali earth metal.


In a preferred embodiment, the glass component has a ZnO—B2O3—SiO2 composition of k (weight %) ZnO.m(weight %) B2O3. n (weight %) SiO2, wherein 10≦k≦85, 5≦m≦50, 2≦n≦60 and k+m+n=100.


In the above composition, the vitrifaction of the composition can proceed by increasing the content (k) of ZnO to 10 weight percent or higher. From this viewpoint, “k” is 10 weight percent or higher and is preferably 20 weight percent or higher. Further, vitrifaction of the composition can proceed and the optimum firing temperature of the dielectric porcelain composition can be reduced by increasing “k” to 85 weight percent or higher. From this viewpoint, “k” is 85 weight percent or lower, and is preferably 80 weight percent or lower.


The vitrifaction of the composition can proceed and the dielectric constant εr can be improved by increasing the content (m) of B2O3 to 5 weight percent or higher. From this viewpoint, “m” is made 5 weight percent or higher, and is preferably 10 weight percent or higher. Further, Q can be reduced by lowering “m” to 50 weight percent or lower. From this viewpoint, “m” is 50 weight percent or lower, and is preferably 45 weight percent or lower.


A glass having stable properties can be produced by adding SiO2 in a content “n” of 2 weight percent or higher. From this viewpoint, “n” is preferably 5 weight percent or higher. On the other hand, vitrifaction of the composition can proceed and the sintering temperature of the dielectric porcelain composition can be reduced by adding SiO2 in a content “n” of 60 weight percent or lower.


In the dielectric compositions according to the second and fourth aspects of the present invention, B2O3 is added in the main composition in an amount of 0.05 weight parts to 10 weight parts with respect to 100 weight parts of the main composition. The dielectric constant εr and Q value can be improved by adding at least 0.05 weight parts B2O3. From this viewpoint, the content of B2O3 is 0.05 weight parts or higher, and is preferably 0.1 weight parts or higher. Further, the dielectric constant εr and Q value can be improved by adding B2O3 in a content of 10 weight parts or lower, and is preferably 9 weight parts or lower.


In the first to fourth aspects of the present invention, each of the values “x”, “y”, “z1”, “z2”, “z3” and “t” of the metal oxide components is a converted value of a content of each metal contained in the corresponding raw material calculated as a content of the metal oxide. The converted value of the content of each metal in a mixture of the raw materials is dependent on a mixed ratio of the raw materials. According to the present invention, the mixed ratio of the raw materials for metals is weighed using a precision balance to obtain a measured ratio, so that the converted contents are then calculated based on the measured ratio.


The main compositions and glass components of the dielectric porcelain compositions according to the first to fourth aspects of the invention have been described above. Other metal elements may be contained in the compositions.


For example, the dielectric composition may also contain at least one metal selected from the group consisting of Ag, Cu and Ni in a total amount of 5 weight percent or lower. It is thus possible to further reduce τf.


The dielectric composition may contain one or more metal oxide selected from the group consisting of CuO, V2O5 and WO3. In this case, the total content of the metal oxides is preferably 0.0 to 5.0 weight percent.


The dielectric composition may further contain at least one of the oxides of Mg, Al, Si, Ca, Sc, Fe, Co, Ni, Zn, Ga, Se, Sr, Y, Zr, Nb, Mo, Ru, Hf and Mn in a total content of 5 weight percent or lower.


The materials for a metal electrode used in an electronic part according to the invention are not particularly limited. Such materials are preferably silver, copper, nickel, or the alloys of these metals, more preferably, silver or an alloy of silver, and most preferably, silver.


The types of electronic parts targeted by the first to fourth aspects of the present invention are not particularly limited, and include, for example, laminated dielectric filters, multi-layered circuit boards, dielectric antennas, dielectric couplers, dielectric composite modules and bulk type dielectric filters.


The dielectric composition for firing at a low temperature may be sintered at a temperature of 1100° C. or lower, more preferably 1050° C. or lower, and most preferably, 1000° C. or lower.


The porcelains according to the first to fourth aspects of the present invention are preferably produced as follows. The starting materials for the respective metal components are mixed in a given ratio to obtain a mixed powder. The powder is then calcined at 1000 to 1400° C. to obtain a calcined powder, which is then crushed to obtain ceramic powder. Preferably, a green sheet is formed by using the ceramic powder and a glass powder composed of SiO2, B2O3 and ZnO, and the green sheet are fired at 850 to 930° C. As the starting materials for the respective metallic oxide components, an oxide, a nitrate, a carbonate, a sulfate or the like of each of the metals may be used.


EXAMPLES
Experiment 1

(Production of Powder of the Main Composition)


Powdery raw materials of barium carbonate, titanium oxide, neodymium oxide, bismuth oxide, lanthanum oxide and samarium oxide each having a high purity were weighed in given ratios shown in Tables 2, 3 and 4 to obtain a mixed powder. The mixed powder was charged into a polyethylene pot with alumina medium and water was added to wet mix the powder. The thus obtained mixture was drawn from the pot, dried, and charged into an alumina crucible to calcine the mixture at various temperatures of 900 to 1270° C. for 4 hours under air to obtain a calcined body. The calcined body was crushed, charged into a polyethylene pot with zirconia medium and ground until the mean grain diameter was reduced to 0.1 to 2.0 μm measured by laser diffraction scattering method to obtain various kinds of calcined and crushed compositions.


(Production of Glass Powder)


Powdery raw materials of zinc oxide, boron oxide and silicon oxide each having a high purity were weighed according to ratios shown in Table 1 and mixed to obtain mixed powder. The mixed powder was then charged into a polyethylene pot with alumina medium and dry mixed. The thus obtained mixture was melted in a chamotte crucible, and rapidly cooled by immersion into water to proceed the vitrifaction. The thus obtained glass was charged in an alumina pot with alumina medium and then ground until the mean grain diameter was reduced to 4 μm in ethanol to obtain each glass powder shown in Table 1.














TABLE 1







Glass






Composition No.
ZnO
B2O3
SiO2









A1 
0.10
0.45
0.45



A2 
0.20
0.40
0.40



A3 
0.50
0.29
0.21



A4 
0.70
0.15
0.15



A5 
0.80
0.10
0.10



A6 
0.85
0.05
0.10



A7 
0.60
0.05
0.35



A8 
0.40
0.10
0.50



A9 
0.20
0.20
0.60



A10
0.35
0.30
0.35



A11
0.15
0.45
0.40



A12
0.20
0.50
0.30



A13
0.75
0.23
0.02



A14
0.45
0.50
0.05



A15
0.30
0.40
0.30



A16
0.30
0.20
0.50



A17
0.25
0.20
0.55



A18
0.35
0.05
0.60











(Production of Porcelain)


The main composition powder and glass powder described above were formulated as shown in Tables 2 to 4. The formulates were charged in a polyethylene pot with alumina medium and water was added for wet mixing. 1 weight percent of polyvinyl alcohol was added to the mixture as a binder to the mixture with respect to a total weight of the powder of the main component and glass powder. The thus obtained mixture was dried and passed through a sieve having a mesh diameter of 355 μm and granulated. The “Glass Contents” shown in Tables 2, 3 and 4 were the contents of the glass component with respect to 100 weight parts of the main composition.


The thus obtained granulated powder was shaped using a press molding machine at a bearing stress of 1 ton/cm2 to obtain a disk shaped test piece having a diameter φ of 20 mm and a thickness of 15 mm. The thus obtained test piece was sintered for 2 hours at 900° C. in air to produce various samples of the dielectric porcelains. Further, the thus sintered samples were ground to a disk having a diameter φ of 16 mm and a thickness of 8 mm, and the dielectric properties were measured. The dielectric constant (εr) and Q were measured by parallel conductor type dielectric resonator method, and the temperature coefficient (τf) of resonance frequency was measured in a range of −25° C. to 75° C. The measurements were performed at a frequency of 2 to 4 GHz. The results were shown in Tables 2, 3 and 4.




















TABLE 2





Main






Glass






composition

y:
z1:
t:
z2:
z3:
Composition
Content


No.
x: BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of glass
εr
Q (at 3 GHz)
τf


























B1 
0.050
0.797
0.063
0.090
0.000
0.000
A3
2.5 wt %
108
357
36


B2 
0.070
0.800
0.053
0.077
0.000
0.000
A3
2.5 wt %
110
405
28


B3 
0.100
0.752
0.070
0.078
0.000
0.000
A3
2.5 wt %
113
380
30


B4 
0.200
0.660
0.060
0.080
0.000
0.000
A3
2.5 wt %
124
242
37


B5 
0.250
0.620
0.051
0.079
0.000
0.000
A3
2.5 wt %
128
236
39


B6 
0.300
0.600
0.024
0.076
0.000
0.000
A3
2.5 wt %
130
230
41


B7 
0.320
0.584
0.020
0.076
0.000
0.000
A3
2.5 wt %
150
124
256


B8 
0.423
0.380
0.097
0.100
0.000
0.000
A3
2.5 wt %
149
153
67


B9 
0.300
0.385
0.130
0.185
0.000
0.000
A3
2.5 wt %
143
205
48


B10
0.300
0.390
0.130
0.180
0.000
0.000
A3
2.5 wt %
141
209
47


B11
0.146
0.584
0.120
0.150
0.000
0.000
A3
2.5 wt %
135
221
44


B12
0.200
0.600
0.110
0.090
0.000
0.000
A3
2.5 wt %
136
218
46


B13
0.120
0.750
0.050
0.080
0.000
0.000
A3
2.5 wt %
118
310
33


B14
0.071
0.800
0.053
0.076
0.000
0.000
A3
2.5 wt %
111
409
29


B15
0.070
0.844
0.011
0.075
0.000
0.000
A3
2.5 wt %
110
410
28


B16
0.064
0.850
0.010
0.076
0.000
0.000
A3
2.5 wt %
89
430
25



























TABLE 3





Main






Glass






Composition
x:
y:
z1:
t:
z2:
z3:
Composition
Content


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of Glass
εr
Q (at 3 GHz)
τf


























B17
0.194
0.724
0.005
0.077
0.000
0.000
A3
2.5 wt %
113
175
63


B18
0.180
0.700
0.010
0.110
0.000
0.000
A3
2.5 wt %
126
238
39


B19
0141
0.750
0.030
0.079
0.000
0.000
A3
2.5 wt %
120
249
35


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
2.5 wt %
123
245
37


B21
0.170
0.570
0.110
0.150
0.000
0.000
A3
2.5 wt %
132
226
42


B22
0.190
0.600
0.130
0.080
0.000
0.000
A3
2.5 wt %
124
242
37


B23
0.153
0.623
0.140
0.084
0.000
0.000
A3
2.5 wt %
106
262
29


B25
0160
0.695
0.0698
0.0752
0.000
0.000
A3
2.5 wt %
110
300
28


B26
0.160
0.695
0.0695
0.0755
0.000
0.000
A3
2.5 wt %
115
28
30


B27
0.160
0.695
0.069
0.076
0.000
0.000
A3
2.5 wt %
120
260
34


B28
0.180
0.660
0.083
0.077
0.000
0.000
A3
2.5 wt %
122
247
36


B29
0.171
0.640
0.089
0.100
0.000
0.000
A3
2.5 wt %
134
222
43


B30
0.170
0.580
0.090
0.160
0.000
0.000
A3
2.5 wt %
142
208
48


B31
0.165
0.600
0.050
0.185
0.000
0.000
A3
2.5 wt %
143
205
49


B32
0.154
0.580
0.076
0.190
0.000
0.000
A3
2.5 wt %
147
183
58



























TABLE 4





Main






Glass






Composition
x:
y:
z1:
t:
z2:
z3:
Composition
Content


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of Glass
εr
Q (at 3 GHz)
τf







B33
0.150
0.720
0.030
0.090
0.000
0.010
A3
2.5 wt %
129
232
41


B34
0.140
0.690
0.040
0.100
0.020
0.010
A3
2.5 wt %
128
234
42


B35
0.170
0.660
0.020
0.080
0.050
0.020
A3
2.5 wt %
132
225
42


B36
0.160
0.570
0.040
0.080
0.100
0.050
A3
2.5 wt %
132
225
42


B37
0.200
0.490
0.030
0.100
0.120
0.060
A3
2.5 wt %
142
208
47


B38
0.125
0.537
0.052
0.076
0.140
0.070
A3
2.5 wt %
151
126
89


B39
0.120
0.680
0.090
0.100
0.010
0.000
A3
2.5 wt %
118
310
33


B40
0.170
0.590
0.080
0.130
0.010
0.020
A3
2.5 wt %
140
211
48


B41
0.180
0.600
0.050
0.090
0.030
0.050
A3
2.5 wt %
128
245
40


B42
0.090
0.610
0.030
0.100
0.070
0.100
A3
2.5 wt %
118
305
33


B43
0.070
0.550
0.040
0.120
0.100
0.120
A3
2.5 wt %
129
239
40


B44
0.120
0.495
0.096
0.079
0.070
0.140
A3
2.5 wt %
105
290
39









As shown in Table 2, the dielectric constant εr can be improved by increasing the value “x” of BaO to 0.070 or higher. Further, the Q value can be improved and τf can be reduced by lowering “x” to 0.300 or lower.


As shown in Table 2, the Q value can be improved and τf can be reduced by increasing the value “y” of TiO2 to 0.385 or higher. Further the dielectric constant εr can be improved by reducing “y” to 0.844 or lower.


As shown in Table 3, the dielectric constant εr can be improved by increasing the value “z1” of Nd2O3 to 0.010 to 0.130.


As shown in Table 3, the dielectric constant εr can be improved by increasing the value “t” of Bi2O3 to a value exceeding 0.075. Further the Q value can be improved and τf can be reduced by lowering “t” to 0.185 or lower.


As shown in Table 4, the dielectric constant εr can be further improved by adding La2O3. Further, the Q value can be improved and τf can be reduced by reducing “z2” to 0.120 or lower.


As shown in Table 4, the dielectric constant εr and the Q value can be improved and τf can be reduced by adding Sm2O3 in an amount of 0.120 or lower.


Experiment 2

Porcelains were produced according to the same process as Experiment 1 and the properties were measured as in Experiment 1. Compositions A1 to A18 of the glass components are shown in Table 1. The ratios of the metal elements and glass compositions are shown in Tables 5 and 6. The results obtained by using the glass compositions A1 to A14 are shown in Table 5, and the results obtained by using the glass compositions A15 to A18 are shown in Table 6.




















TABLE 5





Main






Glass






Composition
x:
y:
z1:
t:
z2:
z3:
Composition
Content


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of Glass
εr
Q (at 3 GHz)
τf







B4 
0.200
0.660
0.060
0.080
0.000
0.000
A1
2.5 wt %
128
232
40


B12
0.200
0.600
0.110
0.090
0.000
0.000
A2
2.5 wt %
130
230
41


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
2.5 wt %
123
245
37


B28
0.180
0.660
0.085
0.075
0.000
0.000
A4
2.5 wt %
122
245
40


B35
0.170
0.660
0.020
0.080
0.050
0.020
A5
2.5 wt %
125
242
39


B41
0.180
0.600
0.050
0.090
0.030
0.050
A6
2.5 wt %
129
234
40


B4 
0.200
0.660
0.060
0.080
0.000
0.000
A7
2.5 wt %
125
245
38


B12
0.200
0.600
0.110
0.090
0.000
0.000
A8
2.5 wt %
124
243
37


B20
0170
0.684
0.070
0.076
0.000
0.000
A9
2.5 wt %
122
246
37


B28
0.180
0.660
0.085
0.075
0.000
0.000
 A10
2.5 wt %
123
244
37


B35
0.170
0.660
0.020
0.080
0.050
0.020
 A11
2.5 wt %
125
241
38


B41
0.180
0.600
0.050
0.090
0.030
0.050
 A12
2.5 wt %
124
242
37


B4 
0.200
0.660
0.060
0.080
0.000
0.000
 A13
2.5 wt %
124
243
38


B12
0.200
0.600
0.110
0.090
0.000
0.000
 A14
2.5 wt %
126
238
39



























TABLE 6





Main






Glass






Composition
x:
y:
z1:
t:
z2:
z3:
Composition
Content


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of Glass
εr
Q (at 3 GHz)
τf


























B20
0.170
0.684
0.070
0.076
0.000
0.000
 A15
 2.5 wt %
124
242
37


B28
0.180
0.660
0.085
0.075
0.000
0.000
 A16
 2.5 wt %
122
252
36


B35
0.170
0.660
0.020
0.080
0.050
0.020
 A17
 2.5 wt %
121
248
37


B41
0.180
0.600
0.050
0.090
0.030
0.050
 A18
 2.5 wt %
120
250
34


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 0.01 wt %
82
120
59


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 0.05 wt %
115
330
31


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 0.10 wt %
118
295
34


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 1.00 wt %
120
248
35


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 2.50 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 5.00 wt %
123
246
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
10.00 wt %
120
245
36


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
15.00 wt %
115
329
33


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
20.00 wt %
110
290
29


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
25.00 wt %
91
200
31









As can be seen from Tables 5 and 6, the dielectric constant εr and Q values can be improved and τf can be reduced by using the glass compositions according to the present invention.


Experiment 3

Porcelains were produced according to the same process as in Experiment 1 and the properties were measured as in Experiment 1. The glass composition A3 was used and the ratio of the ingredients was changed as shown in Table 6. As can be seen from the results, the dielectric constant εr and Q values can be improved and τf can be reduced by adjusting the glass content to 0.05 to 20.00 weight percent.


Experiment 4

Porcelains were produced according to the same process as in Experiment 1 and the properties were measured as in Experiment 1. The glass composition was changed as shown in Table 7 and the ratio of metal oxides and glass composition were changed as shown in Table 8. As can be seen from the results, the dielectric constant εr and Q values can be improved and τf can be reduced in a range of the present invention.










TABLE 7





Composition No.
Composition system







A19
ZnO—B2O3—SiO2 glass


A20
ZnO—Bi2O3—B2O3—SiO2 glass


A21
B2O3—SiO2 glass


A22
RO—B2O3—SiO2 glass



(R represents an alkali earth metal)


A23
GeO2—B2O3 glass


A24
GeO2—B2O3—SiO2 glass


A25
GeO2—ZnO—B2O3—SiO2 glass


A26
GeO2—ZnO—B2O3 glass


A27
Li2O—Al2O3—SiO3—B2O3 glass


A28
Li2O—Al2O3—SiO3—ZnO—B2O3 glass


A29
RO—Li2O—Al2O3—SiO3—B2O3 glass



(R represents an alkali earth metal)


A30
RO—Li2O—Al2O3—SiO3—ZnO—B2O3 glass



(R represents an alkali earth metal)


A31
Re2O—B2O3—SiO2 glass



(Re represents an alkali metal)


A32
Re2O—B2O3—ZnO—SiO2 glass



(Re represents an alkali metal)


A33
Re2O—RO—B2O3—SiO2 glass



(Re represents an alkali metal:



R represents an alkali earth metal)


A34
Re2O—RO—B2O3—ZnO—SiO2 glass



(Re represents an alkali metal;



R represents an alkali earth metal)



























TABLE 8





Main






Glass






Composition
x:
y:
z1:
t:
z2:
z3:
Composition
Content


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of glass
εr
Q (at 3 GHz)
τf







B20
0.170
0.684
0.070
0.076
0.000
0.000
A19
2.5 wt %
126
239
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A20
2.5 wt %
124
243
36


B20
0.170
0.684
0.070
0.076
0.000
0.000
A21
2.5 wt %
125
242
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A22
2.5 wt %
126
237
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A23
2.5 wt %
126
239
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A24
2.5 wt %
123
248
36


B20
0.170
0.684
0.070
0.076
0.000
0.000
A25
2.5 wt %
125
239
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A26
2.5 wt %
126
243
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A27
2.5 wt %
127
231
40


B20
0.170
0.684
0.070
0.076
0.000
0.000
A28
2.5 wt %
129
230
40


B20
0.170
0.684
0.070
0.076
0.000
0.000
A29
2.5 wt %
128
238
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A30
2.5 wt %
124
241
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A31
2.5 wt %
123
246
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A32
2.5 wt %
125
240
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A33
2.5 wt %
126
239
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A34
2.5 wt %
128
231
40









Experiment 5

Porcelains were produced according to the same process as in Experiment 1 and the properties were measured as in Experiment 1. Bi2O3 was added as the glass component and the content was changed as shown in Table 9. The composition of the metal oxides was also changed as shown in Table 9. As a result, the dielectric constant εr and Q values can be improved and τf can be reduced by adding 0.01 weight percent or more of Bi2O3.




















TABLE 9





Main






Glass






Composition
x:
y:
z1:
t:
z2:
z3:
Composition
Content


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
No.
of glass
εr
Q (at 3 GHz)
τf







B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 0.01 wt %
110
205
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 0.10 wt %
116
212
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 1.00 wt %
120
226
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 2.50 wt %
126
239
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
 5.00 wt %
125
242
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
10.00 wt %
121
238
38









Experiment 6

Porcelains were produced according to the same process as in Experiment 1 and the properties were measured as in Experiment 1. The glass composition A3 was used in a content of 1.5 weight percent. The ratio of metal oxides was changed as shown in Table 10. Silver, copper and nickel was added to the main component as shown in Table 10.






















TABLE 10





Main















Compo-









Content of


sition
x:
y:
z1:
t:
z2:
z3:
Glass
Content
Additional
Additional

Q (at


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
Composition
of glass
Component
Component
εr
3 GHz)
τf







B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ag
0.0 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ag
0.5 wt %
126
230
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ag
2.5 wt %
124
220
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ag
5.0 wt %
120
210
35


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ag
7.5 wt %
109
190
63


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Cu
0.0 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Cu
0.5 wt %
126
230
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Cu
2.5 wt %
125
220
34


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Cu
5.0 wt %
122
205
32


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Cu
7.5 wt %
108
188
62


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ni
0.0 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ni
0.5 wt %
126
235
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ni
2.5 wt %
125
220
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ni
5.0 wt %
122
210
36


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
Ni
7.5 wt %
109
189
63









As a result, the dielectric constant εr and Q value can be improved and τf can be reduced when silver, copper or nickel was added to the main composition.


Experiment 7

Porcelains were produced according to the same process as in Experiment 1 and the properties were measured as Experiment 1. The glass composition A3 was used in a content of 1.5 weight percent. The ratio of metal oxides was changed as shown in Table 10. Copper oxide, vanadium oxide or tungsten oxide was added to the main component as shown in Table 11.






















TABLE 11





Main















Compo-









Content of


nent
x:
y:
z1:
t:
z2:
z3:
Glass
Content
Additional
Additional

Q (at


No.
BaO
TiO2
Nd2O3
Bi2O3
La2O3
Sm2O3
Composition
of glass
Component
Component
εr
3 GHz)
τf







B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
CuO
0.0 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
CuO
0.5 wt %
126
320
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
CuO
2.5 wt %
125
270
38


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
CuO
5.0 wt %
123
230
36


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
CuO
7.5 wt %
107
168
10


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
V2O5
0.0 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
V2O5
0.5 wt %
128
290
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
V2O5
2.5 wt %
126
250
39


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
V2O5
5.0 wt %
124
220
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
V2O5
7.5 wt %
105
143
68


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
WO3
0.0 wt %
123
245
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
WO3
0.5 wt %
130
240
41


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
WO3
2.5 wt %
127
230
40


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
WO3
5.0 wt %
125
210
37


B20
0.170
0.684
0.070
0.076
0.000
0.000
A3
1.5 wt %
WO3
7.5 wt %
107
183
67









As a result, the dielectric constant εr and Q value can be improved and τf can be reduced when copper oxide, vanadium oxide or tungsten oxide was added to the main composition.


Experiment 8

Porcelains were produced according to the same process as in Experiment 1 and the properties were measured as in Experiment 1. The glass composition A3 was used in a content of 2.5 weight percent. The ratio of metal oxides was changed as shown in Tables 12 and 13. The results are shown in Tables 12 and 13.























TABLE 12





Main
















Compo-






z1 +


Glass
Content


τf


sition

x:
y:
z1:
z2:
z3:
Z2 +

t:
Composition
of Glass

Q (at
ppm/


No.

BaO
TiO2
Nd2O3
La2O3
Sm2O3
Z3
a
Bi2O3
No.
(wt, %)
εr
3 GHz)
° C.







C1
Comparative
0.090
0.750
0.088
0.000
0.000
0.088
0.450
0.072
A3
2.5
107
305
23



Example


C2
Example
0.137
0.680
0.110
0.000
0.000
0.110
0.400
0.073
A3
2.5
112
295
34


C3
Example
0.176
0.660
0.090
0.000
0.000
0.090
0.450
0.074
A3
2.5
126
278
38


C4
Example
0.160
0.715
0.050
0.000
0.000
0.050
0.600
0.075
A3
2.5
130
259
41


C5
Example
0.245
0.657
0.030
0.000
0.000
0.030
0.695
0.068
A3
2.5
132
227
49


C6
Example
0.245
0.657
0.030
0.000
0.000
0.030
0.695
0.068
A3
2.5
138
213
54


C7
Comparative
0.260
0.600
0.080
0.000
0.000
0.080
0.427
0.060
A3
2.5
123
190
60



Example


C8
Comparative
0.226
0.580
0.120
0.000
0.000
0.120
0.380
0.074
A3
2.5
122
194
54



Example


C9
Comparative
0.100
0.770
0.065
0.000
0.000
0.065
0.500
0.065
A3
2.5
108
297
27



Example






























TABLE 13





Main









Glass
Content


τf


Composition

x:
y:
z1:
z2:
z3:
z1 + Z2 +

t:
Composition
Of glass

Q (at
ppm/


No.

BaO
TiO2
Nd2O3
La2O3
Sm2O3
Z3
a
Bi2O3
No.
wt. %
εr
3 GHz)
° C.





























C10
Comparative
0.180
0.620
0.130
0.000
0.000
0.130
0.350
0.070
A3
2.5
106
227
44



Example


C11
Comparative
0.225
0.704
0.005
0.000
0.000
0.005
0.930
0.066
A3
2.5
112
224
96



Example


C12
Comparative
0.200
0.720
0.056
0.000
0.000
0.056
0.300
0.024
A3
2.5
106
248
30



Example


C13
Example
0.116
0.730
0.080
0.000
0.000
0.080
0.480
0.074
A3
2.5
112
282
28


C14
Example
0.167
0.666
0.020
0.080
0.000
0.100
0.400
0.067
A3
2.5
117
244
39


C15
Example
0.175
0.650
0.030
0.000
0.070
0.100
0.430
0.075
A3
2.5
127
241
43


C16
Example
0.215
0.630
0.020
0.020
0.050
0.090
0.420
0.065
A3
2.5
122
213
50


C17
Comparative
0.205
0.707
0.000
0.022
0.000
0.022
0.750
0.066
A3
2.5
124
237
72



Example


C18
Comparative
0.185
0.668
0.080
0.015
0.015
0.110
0.250
0.037
A3
2.5
105
240
33



Example









In the composition C1, the value “x” of BaO was low so that the dielectric constant εr was reduced. In compositions C2 to C6, the dielectric constant εr and Q can be improved and the temperature coefficient (τf) of resonance frequency can be maintained at a low value. In composition C7, the value “x” of BaO was large and the value “t” of Bi2O3 was low so that Q can be reduced. In composition C8, the value “y” of TiO2 was low so that Q was lowered. In composition C9, the value “y” of TiO2 was high, so that the dielectric constant εr was reduced. In composition C10, the value of (z1+z2+z3) was high so that the dielectric constant εr was lowered. In composition C11, the value “z1” of Nd2O3 was low so that the temperature coefficient (τf) of resonance frequency was large. In composition C12, a/(z1+z2+z3) was low and the ratio “t” of Bi2O3 was low, so that the dielectric constant εr was reduced. In compositions C13 to C16, the dielectric constant εr and Q can be improved and the temperature coefficient (τf) of resonance frequency can be maintained at a low value. In composition C17, the value “z1” of Nd2O3 was low so that the temperature coefficient (τf) of resonance frequency was large. In composition C18, a/(z1+z2+z3) and the ratio “t” of Bi2O3 were low, so that the dielectric constant εr was lowered.


As described above, the present invention provides a dielectric composition for firing at a low temperature having a high dielectric constant εr, a high Q value and a low temperature coefficient τf of resonance frequency.


The present invention has been explained referring to the preferred embodiments, however, the present invention is not limited to the illustrated embodiments which are given by way of examples only, and may be carried out in various modes without departing from the scope of the invention.

Claims
  • 1. A dielectric composition for firing at low temperatures comprising: a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3 (x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.075<t≦0.185); anda glass component containing 0.1 weight percent or more of B2O3 in an amount of 0.05 to 20 weight parts with respect to 100 weight parts of said main composition.
  • 2. The dielectric composition of claim 1, wherein said glass component is selected from the group consisting of ZnO—B2O3—SiO2, ZnO—Bi2O3—B2O3—SiO2, B2O3—SiO2—, RO—B2O3—SiO2, GeO2—B2O3, GeO2—B2O3—SiO2, GeO2—ZnO—B2O3—SiO2, GeO2—ZnO—B2O3, Li2O—Al2O3—SiO2—B2O3, Li2O—Al2O3—SiO2—ZnO—B2O3, RO—Li2O—Al2O3—SiO2—B2O3, RO—Li2O—Al2O3—SiO2—ZnO—B2O3, Re2O—B2O3—SiO2, Re2O—B2O3—ZnO—SiO2, Re2O—RO—B2O3—SiO2 glass, and Re2O—RO—B2O3—ZnO—SiO2 glass, wherein Re represents an alkali metal and R represents an alkali earth metal.
  • 3. The dielectric composition of claim 2, wherein said glass component comprises a ZnO—B2O3—SiO2 glass component having a composition of k (weight %) ZnO.m(weight %) B2O3.n (weight %) SiO2 (10≦k≦85, 5≦m≦50, 2≦n≦60, and k+m+n=100).
  • 4. The dielectric composition of claim 1, comprising at least one metal element selected from the group consisting of Ag, Cu and Ni in a total amount of 5 weight percent or lower.
  • 5. The dielectric composition of claim 1, comprising at least one metal oxide selected from the group consisting of CuO, V2O5 and WO3.
  • 6. An electronic part comprising said dielectric composition of claim 1.
  • 7. The electronic part of claim 6 being comprising a laminate type dielectric filter.
  • 8. A dielectric composition for firing at low temperatures comprising: a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3 (x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.075<t≦0.185); andB2O3 in an amount of 0.05 to 10 weight parts with respect to 100 weight parts of said main composition.
  • 9. The dielectric composition of claim 8, comprising at least one metal element selected from the group consisting of Ag, Cu and Ni in a total amount of 5 weight percent or lower.
  • 10. The dielectric composition of claim 8, comprising at least one metal oxide selected from the group consisting of CuO, V2O5 and WO3.
  • 11. An electronic part comprising said dielectric composition of claim 8.
  • 12. The electronic part of claim 11 comprising a laminate type dielectric filter.
  • 13. A dielectric composition for firing at low temperatures comprising: a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3 (x+y+z1+z2+z3+t=1, 0.100≦x≦0.250, 0.600≦y≦0.750, 0.010≦z1≦0.120, 0.000≦z2≦0.120, 0.000≦z3≦0.120, 0.010≦(z1+z2+z3)≦0.120, 0.065≦t≦0.075, and 0.35≦t/(z1+z2+z3+t)); anda glass component containing at least 0.1 weight percent of B2O3 in an amount of 0.05 to 20 weight parts with respect to 100 weight parts of said main composition.
  • 14. The dielectric composition of claim 13, wherein said glass component is selected from the group consisting of ZnO—B2O3—SiO2, ZnO—Bi2O3—B2O3—SiO2, B2O3—SiO2, RO—B2O3—SiO2, GeO2—B2O3, GeO2—B2O3—SiO2, GeO2—ZnO—B2O3—SiO2, GeO2—ZnO—B2O3, Li2O—Al2O3—SiO2—B2O3, Li2O—Al2O3—SiO2—ZnO—B2O3, RO—Li2O—Al2O3—SiO2—B2O3, RO—Li2O—Al2O3—SiO2—ZnO—B2O3, Re2O—B2O3—SiO2, Re2O—B2O3—ZnO—SiO2, Re2O—RO—B2O3—SiO2, and Re2O—RO—B2O3—ZnO—SiO2 glass, wherein Re represents an alkali metal and R represents an alkali earth metal.
  • 15. The dielectric composition of claim 14, wherein said glass component comprises a of ZnO—B2O3—SiO2 glass component having a composition of k(weight %) ZnO. m(weight %) B2O3.n(weight %) SiO2, (10≦k≦85, 5≦m≦50, 2≦n≦60, and k+m+n=100).
  • 16. The dielectric composition of claim 13, comprising at least one metal element selected from the group consisting of Ag, Cu and Ni in a total amount of 5 weight percent or lower.
  • 17. The dielectric composition of claim 13, comprising at least one metal oxide selected from the group consisting of CuO, V2O5 and WO3.
  • 18. An electronic part comprising said dielectric composition of claim 13.
  • 19. The electronic part of claim 18 comprising a laminate-type dielectric filter.
  • 20. A dielectric composition for firing at low temperatures comprising: a main composition of x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3 (x+y+z1+z2+z3+t=1, 0.100≦x≦0.250, 0.600≦y≦0.750, 0.010≦z1≦0.120, 0.000≦z2≦0.120, 0.000≦z3≦0.120, 0.010≦(z1+z2+z3)≦0.120, 0.065≦t≦0.075, and 0.35≦t/(z1+z2+z3+t)); andB2O3 in an amount of 0.05 to 10 weight parts with respect to 100 weight parts of said main composition.
  • 21. The dielectric composition of claim 20, comprising at least one metal element selected from the group consisting of Ag, Cu and Ni in a total amount of 5 weight percent or lower.
  • 22. The dielectric composition of claim 20, comprising at least one metal oxide selected from the group consisting of CuO, V2O5 and WO3.
  • 23. An electronic part comprising said dielectric composition of claim 20.
  • 24. The electronic part of claim 23 comprising a laminate type dielectric filter.
  • 25. The dielectric composition of claim 1, wherein said main composition is represented by x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3(x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.0751≦t≦0.185).
  • 26. The dielectric composition of claim 1, wherein said main composition is represented by x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3(x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.0752≦t≦0.185).
  • 27. The dielectric composition of claim 1, wherein said main composition is represented by x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3(x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.076≦t≦0.185).
  • 28. The dielectric composition of claim 8, wherein said main composition is represented by x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3(x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000z2≦0.120, 0.000≦z3≦0.120, and 0.0751≦t≦0.185).
  • 29. The dielectric composition of claim 8, wherein said main composition is represented by x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3(x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.0752≦t≦0.185).
  • 30. The dielectric composition of claim 8, wherein said main composition is represented by x.BaO-y.TiO2-z1.Nd2O3-z2.La2O3-z3.Sm2O3-t.Bi2O3(x+y+z1+z2+z3+t=1, 0.070≦x≦0.300, 0.385≦y≦0.844, 0.010≦z1≦0.130, 0.000≦z2≦0.120, 0.000≦z3≦0.120, and 0.076≦t≦0.185).
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5264403 Abe et al. Nov 1993 A
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5350721 Abe et al. Sep 1994 A
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Number Date Country
05-319922 Dec 1993 JP
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Related Publications (1)
Number Date Country
20040176240 A1 Sep 2004 US