Number | Name | Date | Kind |
---|---|---|---|
3219927 | Topp, Jr. et al. | Nov 1965 | |
3581074 | Waltz | May 1971 | |
3621387 | Smith et al. | Nov 1971 | |
3651315 | Collins | Mar 1972 | |
3673397 | Schaefer | Jun 1972 | |
3812426 | Illian | May 1974 |
Entry |
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Williams, Michael "Enhancing Testability of Large Scale Integrated Circuits . . . " Report No. SU-SFL-70-065, Stanford Elect. Labs. Sept. 1970. |
Krosner S. P. et al. "Logic Card Tester" IBM Technical Disclosure Bulletin, vol. 14, No. 4, Sept. 1971, pp. 1242-1243. |
Millham, E. H. et al. "Logical Assembly Testing System" IBM Technical Disclosure Bulletin vol. 14 No. 11 Apr. 1972 pp. 3446-3449. |