Disk drive calibrating touchdown sensor

Abstract

A disk drive is disclosed comprising a head actuated over a disk, the head comprising a touchdown sensor. A bias signal is applied at a first bias value to the touchdown sensor and a corresponding first resistance of the touchdown sensor is measured. The bias signal is applied at a second bias value to the touchdown sensor and a corresponding second resistance of the touchdown sensor is measured. A reference resistance of the touchdown sensor is estimated based on the first and second bias values and the first and second resistances. An operating bias value is generated for the bias signal based on a predetermined operating temperature of the touchdown sensor, the reference resistance, and a thermal coefficient of resistance (TCR) of the touchdown sensor, wherein the TCR specifies a change in temperature of the touchdown sensor relative to a change in the resistance of the touchdown sensor.

Description

BACKGROUND

Disk drives comprise a disk and a head connected to a distal end of an actuator arm which is rotated about a pivot by a voice coil motor (VCM) to position the head radially over the disk. The disk typically comprises a number of concentric data tracks each partitioned into a number of data sectors. Access operations are performed by seeking the head to a target data track, and performing a write/read operation on the data sectors within the data track. The disk typically comprises embedded servo sectors having position information recorded therein, such as coarse position information (e.g., a track address) and fine position information (e.g., servo bursts). A servo controller processes the servo sectors to position the head over the target data track.

Each data sector is typically assigned a physical block address (PBA) which is accessed indirectly through a logical block address (LBA) to facilitate mapping out defective data sectors. A PBA associated with defective data sectors may simply remain unmapped if found during manufacturing, or if a data sector becomes defective while in-the-field (grown defect), the LBA may be remapped to the PBA of a spare data sector (and the data relocated to the spare data sector). The process of initially mapping the LBAs to PBAs and mapping out defective PBAs is referred to as “formatting” the disk. The head may be fabricated with a suitable touchdown sensor, such as a suitable magnetoresistive sensor, which may be used to detect defects on the disk, such as thermal asperities.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A shows a disk drive according to an embodiment comprising a head actuated over a disk.

FIG. 1B shows an embodiment wherein the head comprises a touchdown sensor comprising a resistance.

FIG. 1C is a flow diagram according to an embodiment of the present invention wherein a first and second resistance estimate of the touchdown sensor are measured corresponding to first and second bias values, and then a reference resistance is estimated for the touchdown sensor for use in generating an operating bias value for the touchdown sensor.

FIG. 2A is a graph illustrating a quadratic relationship between a voltage across the touchdown sensor and a current flowing through the touchdown sensor for use in estimating the reference resistance of the touchdown sensor according to an embodiment.

FIG. 2B is a graph illustrating a linear relationship between a resistance of touchdown sensor and a power applied to the touchdown sensor for use in estimating the reference resistance of the touchdown sensor according to an embodiment.

FIG. 3 is a flow diagram according to an embodiment for computing the reference resistance based on the linear relationship between the resistance of touchdown sensor and the power applied to the touchdown sensor.

FIG. 4 is a graph illustrating an iterative technique for estimating the resistance of the touchdown sensor according to an embodiment.

DETAILED DESCRIPTION

FIG. 1A shows a disk drive according to an embodiment comprising a head 2 actuated over a disk 4, the head comprising a touchdown sensor 6 (FIG. 1B) comprising a resistance. The disk drive further comprises control circuitry 8 operable to execute the flow diagram of FIG. 1C, wherein a bias signal 10 is applied at a first bias value to the touchdown sensor and a corresponding first resistance of the touchdown sensor is measured (block 11). The bias signal 10 is applied at a second bias value to the touchdown sensor and a corresponding second resistance of the touchdown sensor is measured (block 12). A reference resistance of the touchdown sensor is estimated based on the first and second bias values and the first and second resistances (block 14), and an operating bias value is generated for the bias signal (block 15) based on a predetermined operating temperature of the touchdown sensor, the reference resistance, and a thermal coefficient of resistance (TCR) of the touchdown sensor, wherein the TCR specifies a change in temperature of the touchdown sensor relative to a change in the resistance of the touchdown sensor.

In the embodiment of FIG. 1A, the disk 4 comprises embedded servo sectors 16₀-16_N that define a plurality of servo tracks 18. The control circuitry 8 processes a read signal 20 emanating from the head 2 to demodulate the servo sectors 16₀-16_N and generate a position error signal (PES) representing an error between the actual position of the head and a target position relative to a target track. The control circuitry 8 filters the PES using a suitable compensation filter to generate a control signal 22 applied to a voice coil motor (VCM) 24 which rotates an actuator arm 26 about a pivot in order to actuate the head 2 radially over the disk in a direction that reduces the PES. The servo sectors 16₀-16_N may comprise any suitable position information, such as a track address for coarse positioning and servo bursts for fine positioning. The servo bursts may comprise any suitable pattern, such as the amplitude-based servo pattern, or a suitable phase-based servo pattern.

In the embodiment of FIG. 1B, the head 2 comprises a suitable read element 28 and a write element 30. The head 2 may also comprise a suitable fly height actuator, such as a suitable heater that controls the fly height of the head 2 over the disk 4 through thermal expansion. In one embodiment, a fly height control signal is applied to the fly height actuator to maintain a target fly height of the head 2 while scanning for defects on the disk using the touchdown sensor 6. Any suitable defects may be detected, such as asperities or recesses on the disk, wherein in one embodiment the defect causes a corresponding thermal response of the touchdown sensor 6.

In one embodiment, the bias signal 10 is applied to the touchdown sensor 6 in order to achieve a desired sensitivity during the defect scan operation. Any suitable touchdown sensor 6 may be employed in the embodiments of the present invention, such as a magnetoresistive sensor that exhibits a change in resistance relative to temperature. Since a defect on the disk 4 induces a temperature change in the touchdown sensor 6, in one embodiment the resulting change in resistance can be transduced into a defect detection signal, such as by measuring a change in current flowing through the touchdown sensor 6 while applying a constant voltage across the touchdown sensor 6.

In one embodiment, the touchdown sensor 6 is fabricated with a thermoresistive material having a thermal coefficient of resistance (TCR) that specifies the change in temperature relative to a change in the resistance of the material. In one embodiment the bias signal 10 applied to the touchdown sensor 6 will raise the temperature of the thermoresistive material (with a corresponding change in resistance); however, the degree to which the temperature of the touchdown sensor 6 rises depends on its geometry which varies due to tolerances in the fabrication process. For a particular setting of the bias signal 10, a larger (or thicker) touchdown sensor 6 may exhibit a lower temperature response (and corresponding resistance response) as compared to a smaller (or thinner) touchdown sensor 6. In one embodiment, in order to achieve a consistent performance for the defect scan operation (accurately detect true defects and minimizes false detections) across a family of disk drives, an operating value for the bias signal 10 is calibrated so as to achieve a target operating temperature for each touchdown sensor 6, thereby compensating for the differences in behavior. That is, with each touchdown sensor 6 biased to achieve a target operating temperature (and corresponding bias resistance), the response to the defects on the disk can be relatively consistent across the disk drives.

In one embodiment, a relationship between the voltage applied to the touchdown sensor and the current flowing through the touchdown sensor may be represented by a quadratic equation as shown in FIG. 2A:v=TCR·i²v+i·Rref  Eq. 1where v represents the voltage across the touchdown sensor, i represents the current flowing through the touchdown sensor, TCR is the thermal coefficient of resistance of the touchdown sensor, and Rref represents the reference resistance of the touchdown sensor. Dividing both sides of the above Eq. 1 by the current i provides the following linear relationship:

$\begin{array}{cc}\frac{v}{i}=\mathrm{TCR}·\mathrm{iv}+\mathrm{Rref}& \mathrm{Eq}.2\end{array}$ From the above Eq. 2, in one embodiment the resistance of the touchdown sensor is a linear function of the power applied to the touchdown sensor as shown in FIG. 2B, where TCR represents the slope of the line, and the reference resistance Rref is the resistance of the touchdown sensor when the bias signal (e.g., current or voltage) applied to the touchdown sensor is zero.

In one embodiment, the bias signal applied to the touchdown sensor comprises the voltage v applied across the touchdown sensor, and an operating voltage Vop is calibrated that will achieve a target operating temperature for the touchdown sensor based on the following equation:Rhot=Rref·(1+(Top−Tref)·TCR)  Eq. 3where Top represents the target operating temperature of the touchdown sensor, Tref represents a reference temperature, and Rhot represents the corresponding operating resistance of the touchdown sensor. After determining Rhot from the above Eq. 3, the corresponding operating voltage can be determined based on the above Eq. 2 according to:

$\begin{array}{cc}\mathrm{Vop}=\sqrt{\frac{\left(\mathrm{Rhot}-\mathrm{Rref}\right)·\mathrm{Rhot}}{\mathrm{TCR}}}& \mathrm{Eq}.4\end{array}$ In one embodiment, accurately estimating the operating voltage Vop for the touchdown sensor that will result in the target operating temperature (which corresponds to Rhot) depends on accurately estimating reference resistance Rref used in both Eq. 3 and Eq. 4.

In one embodiment, the reference resistance Rref is estimated based on a measured resistance of the touchdown sensor for at least two bias values of a bias signal applied to the touchdown sensor. For example, in one embodiment first and second bias voltages are applied to the touchdown sensor and the corresponding first and second resistances of the touchdown sensor are measured (e.g., by measuring the current flowing through the touchdown sensor). The reference resistance Rref of the touchdown sensor is then estimated based on the first and second voltages and the first and second resistances. For example, in one embodiment the two voltage:resistance points are fitted to a curve represented by a function (e.g., the quadratic function of FIG. 2A or the linear function of FIG. 2B), and then the reference resistance Rref computed based on the curve fitted function.

In one embodiment, the reference resistance Rref corresponds to the resistance of the touchdown sensor when the bias signal (e.g., voltage) applied to the touchdown sensor is substantially zero. Accordingly, in one embodiment the reference resistance Rref is estimated by curve fitting the voltage:resistance points shown in FIG. 2B to generate the corresponding linear function, and then estimating the reference resistance Rref based on this linear function at zero voltage. In another embodiment, the reference resistance Rref is estimated by curve fitting the voltage:resistance points shown in FIG. 2A to generate the corresponding quadratic function, and then estimating the reference resistance Rref based on the derivative of this quadratic function at zero voltage.

In the example embodiments shown in FIGS. 2A and 2B, the quadratic and linear functions are estimated based on two voltage:resistance points; however, any suitable number of voltage:resistance points may be measured before estimating the function used to estimate the reference resistance Rref. The accuracy of the estimated reference resistance Rref can improve if more voltage:resistance points are measured; however, measuring more voltage:resistance points can increase the calibration time.

In one embodiment, the reference resistance Rref is updated iteratively until it converges. Also in this embodiment the reference resistance Rref is initially estimated by applying a low bias signal to the touchdown sensor (e.g., a low voltage) when measuring the initial voltage:resistance points which helps ensure the touchdown sensor is not damaged due to being over stressed. Once the initial reference resistance Rref is estimated based on the low bias signal, in one embodiment Rref is used to estimate the operating resistance Rhot based on the above Eq. 3, which in turn is used to determine the corresponding operating voltage Vop based on the above Eq. 4. The operating voltage Vop is then applied to the touchdown sensor and the corresponding current measured in order to generate another voltage:resistance point that can be used to update the function for estimating the reference resistance Rref. This process is then iterated until a suitable criteria is met, such as the change in the reference resistance Rref falling below a threshold.

An embodiment that updates the reference resistance Rref iteratively is shown in the flow diagram of FIG. 3. A reference temperature Tref is measured for the touchdown sensor that corresponds to a zero bias voltage applied to the touchdown sensor (block 32). A first bias voltage is applied to the touchdown sensor and a corresponding resistance measured (block 34), and a second bias voltage is applied to the touchdown sensor and a corresponding resistance is measured (block 36). These blocks may then be repeated to generate any suitable number of voltage:resistance points. The voltage:resistance points are then curve fitted to a linear function (block 38) as illustrated in FIG. 2B. If the slope of the linear function is less than a threshold (block 40), it is assumed that the estimated linear function is inaccurate due to an insufficient number of voltage:resistance points. Therefore another bias voltage is applied to the touchdown sensor and a corresponding resistance is measured (block 42). The voltage:resistance points are again curve fitted to the linear function (block 44) and the flow diagram repeats from block 40 until the slope of the linear function exceeds the threshold. In another embodiment, the voltage:resistance points may be measured until the difference between the slope of the estimated linear function and the TCR falls below a threshold (since the ideal slope represents the TCR). The reference resistance Rref is then estimated by setting the voltage bias to zero in the estimated linear function (see Eq. 2).

After estimating an initial reference resistance Rref based on the estimated linear function, the operating resistance Rhot of the touchdown sensor is computed using the above-described Eq. 3 (block 46). The corresponding operating voltage Vop is then computed using the above-described Eq. 4 (block 48). The computed operating voltage Vop is applied to the touchdown sensor and the resistance measured in order to generate another voltage:resistance point (block 50). The new voltage:resistance point is then used to update the estimate of the linear function (by again curve fitting) which in turn is used to update the estimate of the reference resistance Rref (block 52). If the delta in the reference resistance Rref is less than a threshold (block 54), it means the reference resistance Rref and the operating voltage Vop have converged to acceptable values so that the final operating voltage Vop will result in the desired operating temperature of the touchdown sensor while performing the defect scan of the disk (block 56). If the delta in the reference resistance Rref is greater than the threshold (block 54), the flow diagram of FIG. 3 is repeated from block 46 until the reference resistance Rref converges.

FIG. 4 illustrates the iterative operation of the flow diagram of FIG. 3, wherein first and second voltage:resistance points 58A and 58B are used to generate the initial estimate of the linear relationship 60 used to estimate an initial reference resistance Rref′. As more voltage:resistance points 62 are generated based on the iterative procedure described above with reference to FIG. 3, the estimate of the linear function eventually converges to linear relationship 64 which is used to generate the final estimate for the reference resistance Rref.

The reference temperature Tref may be measured at block 32 of FIG. 3 using any suitable technique. In one embodiment, a dynamic fly height actuator is not used to control the fly height of the head, or the dynamic fly height actuator does not affect the temperature of the touchdown sensor 6. In this embodiment, the reference temperature Tref may be measured using any suitable temperature sensor capable of measuring the ambient temperature of the disk drive. In another embodiment, the disk drive comprises a suitable fly height actuator (e.g., a heater) for controlling the fly height of the head to a target fly height based on a calibrated power applied to the dynamic fly height actuator (e.g., based on a touchdown calibration procedure). The dynamic fly height actuator may heat the touchdown sensor, and therefore in one embodiment the reference temperature Tref may be determined based on a known relationship between the power applied to the dynamic fly height actuator and the resulting heating effect of the touchdown sensor. For example, a nominal relationship between the power applied to the fly height actuator and the heating of the touchdown sensor may be determined for a family of disk drives during a design stage of the disk drives. This nominal relationship may then be used in each individual disk drive to estimate the reference temperature Tref of the touchdown sensor based on the operating power applied to the dynamic fly height actuator that achieves the target fly height during the defect scan.

Any suitable control circuitry may be employed to implement the flow diagrams in the above embodiments, such as any suitable integrated circuit or circuits. For example, the control circuitry may be implemented within a read channel integrated circuit, or in a component separate from the read channel, such as a disk controller, or certain operations described above may be performed by a read channel and others by a disk controller. In one embodiment, the read channel and disk controller are implemented as separate integrated circuits, and in an alternative embodiment they are fabricated into a single integrated circuit or system on a chip (SOC). In addition, the control circuitry may include a suitable preamp circuit implemented as a separate integrated circuit, integrated into the read channel or disk controller circuit, or integrated into a SOC.

In one embodiment, the control circuitry comprises a microprocessor executing instructions, the instructions being operable to cause the microprocessor to perform the flow diagrams described herein. The instructions may be stored in any computer-readable medium. In one embodiment, they may be stored on a non-volatile semiconductor memory external to the microprocessor, or integrated with the microprocessor in a SOC. In another embodiment, the instructions are stored on the disk and read into a volatile semiconductor memory when the disk drive is powered on. In yet another embodiment, the control circuitry comprises suitable logic circuitry, such as state machine circuitry.

The various features and processes described above may be used independently of one another, or may be combined in various ways. All possible combinations and subcombinations are intended to fall within the scope of this disclosure. In addition, certain method, event or process blocks may be omitted in some implementations. The methods and processes described herein are also not limited to any particular sequence, and the blocks or states relating thereto can be performed in other sequences that are appropriate. For example, described tasks or events may be performed in an order other than that specifically disclosed, or multiple may be combined in a single block or state. The example tasks or events may be performed in serial, in parallel, or in some other manner. Tasks or events may be added to or removed from the disclosed example embodiments. The example systems and components described herein may be configured differently than described. For example, elements may be added to, removed from, or rearranged compared to the disclosed example embodiments.

While certain example embodiments have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope of the inventions disclosed herein. Thus, nothing in the foregoing description is intended to imply that any particular feature, characteristic, step, module, or block is necessary or indispensable. Indeed, the novel methods and systems described herein may be embodied in a variety of other forms; furthermore, various omissions, substitutions and changes in the form of the methods and systems described herein may be made without departing from the spirit of the inventions disclosed herein.

Claims

1. A disk drive comprising: a disk;a head actuated over the disk, the head comprising a touchdown sensor comprising a resistance; andcontrol circuitry operable to: apply a bias signal at a first bias value to the touchdown sensor and measure a corresponding first resistance of the touchdown sensor;apply the bias signal at a second bias value to the touchdown sensor and measure a corresponding second resistance of the touchdown sensor;estimate a reference resistance of the touchdown sensor based on the first and second bias values and the first and second resistances; andgenerate an operating bias value for the bias signal based on a predetermined operating temperature of the touchdown sensor, the reference resistance, and a thermal coefficient of resistance (TCR) of the touchdown sensor, wherein the TCR specifies a change in temperature of the touchdown sensor relative to a change in the resistance of the touchdown sensor,wherein the bias signal comprises a voltage and the control circuitry is operable to generate the operating bias value for the bias signal according to:

2. The disk drive as recited in claim 1, wherein the reference resistance corresponds to a resistance of the touchdown sensor when the bias signal is substantially zero.

3. The disk drive as recited in claim 1, wherein the control circuitry is further operable to curve fit the first and second resistances in order to estimate the reference resistance.

4. The disk drive as recited in claim 3, wherein the control circuitry is further operable to: measure the first resistance based on a first voltage across the touchdown sensor and a first current flowing through the touchdown sensor;measure the second resistance based on a second voltage across the touchdown sensor and a second current flowing through the touchdown sensor; andcurve fit a relationship between the first and second voltages versus the first and second currents in order to estimate the reference resistance.

5. The disk drive as recited in claim 4, wherein: the relationship comprises a quadratic function; andthe control circuitry is operable to estimate the reference resistance based on a derivative of the quadratic function when the voltage across the touchdown sensor is substantially zero.

6. The disk drive as recited in claim 3, wherein the control circuitry is further operable to curve fit the first and second resistances to a line having a slope representing the TCR.

7. The disk drive as recited in claim 6, wherein the control circuitry is further operable to: measure a power applied to the touchdown sensor; andcurve fit the first and second resistances to the line representing a linear relationship between the first and second resistances and the corresponding power.

8. The disk drive as recited in claim 6, wherein when the slope is less than a threshold the control circuitry is further operable to: apply the bias signal at a third bias value to the touchdown sensor and measure a corresponding third resistance of the touchdown sensor; andupdate the reference resistance of the touchdown sensor based on the first, second, and third bias values and the first, second, and third resistances.

9. The disk drive as recited in claim 8, wherein the control circuitry is further operable to curve fit the first, second, and third resistances in order to estimate the reference resistance.

10. The disk drive as recited in claim 1, wherein the control circuitry is further operable to: apply the bias signal at the operating bias value to the touchdown sensor and measure a corresponding third resistance of the touchdown sensor;update the reference resistance of the touchdown sensor based on the first, second, and operating bias values and the first, second, and third resistances; andupdate the operating bias value for the bias signal based on the updated reference resistance.

11. The disk drive as recited in claim 10, wherein the control circuitry is further operable to curve fit the first, second, and third resistances in order to update the reference resistance.

12. A method of operating a disk drive comprising a head actuated over a disk, the head comprising a touchdown sensor comprising a resistance, the method comprising: applying a bias signal at a first bias value to the touchdown sensor and measure a corresponding first resistance of the touchdown sensor;applying the bias signal at a second bias value to the touchdown sensor and measure a corresponding second resistance of the touchdown sensor;estimating a reference resistance of the touchdown sensor based on the first and second bias values and the first and second resistances; andgenerating an operating bias value for the bias signal based on a predetermined operating temperature of the touchdown sensor, the reference resistance, and a thermal coefficient of resistance (TCR) of the touchdown sensor, wherein the TCR specifies a change in temperature of the touchdown sensor relative to a change in the resistance of the touchdown sensor,wherein the bias signal comprises a voltage and the operating bias value for the bias signal is generated according to:

13. The method as recited in claim 12, wherein the reference resistance corresponds to a resistance of the touchdown sensor when the bias signal is substantially zero.

14. The method as recited in claim 12, further comprising curve fitting the first and second resistances in order to estimate the reference resistance.

15. The method as recited in claim 14, further comprising: measuring the first resistance based on a first voltage across the touchdown sensor and a first current flowing through the touchdown sensor;measuring the second resistance based on a second voltage across the touchdown sensor and a second current flowing through the touchdown sensor; andcurve fitting a relationship between the first and second voltages versus the first and second currents in order to estimate the reference resistance.

16. The method as recited in claim 15, wherein: the relationship comprises a quadratic function; andthe method further comprises estimating the reference resistance based on a derivative of the quadratic function when the voltage across the touchdown sensor is substantially zero.

17. The method as recited in claim 14, further comprising curve fitting the first and second resistances to a line having a slope representing the TCR.

18. The method as recited in claim 17, further comprising: measuring a power applied to the touchdown sensor; andcurve fitting the first and second resistances to the line representing a linear relationship between the first and second resistances and the corresponding power.

19. The method as recited in claim 17, wherein when the slope is less than a threshold the method further comprises: applying the bias signal at a third bias value to the touchdown sensor and measure a corresponding third resistance of the touchdown sensor; andupdating the reference resistance of the touchdown sensor based on the first, second, and third bias values and the first, second, and third resistances.

20. The method as recited in claim 19, further comprising curve fitting the first, second, and third resistances in order to estimate the reference resistance.

21. The method as recited in claim 12, further comprising: applying the bias signal at the operating bias value to the touchdown sensor and measure a corresponding third resistance of the touchdown sensor;updating the reference resistance of the touchdown sensor based on the first, second, and operating bias values and the first, second, and third resistances; andupdating the operating bias value for the bias signal based on the updated reference resistance.

22. The method as recited in claim 21, further comprising curve fitting the first, second, and third resistances in order to update the reference resistance.

23. A disk drive comprising: a disk;a head actuated over the disk, the head comprising a touchdown sensor comprising a resistance; andcontrol circuitry operable to: apply a bias signal at a first bias value to the touchdown sensor and measure a corresponding first resistance of the touchdown sensor;apply the bias signal at a second bias value to the touchdown sensor and measure a corresponding second resistance of the touchdown sensor;estimate a reference resistance of the touchdown sensor based on the first and second bias values and the first and second resistances;generate an operating bias value for the bias signal based on a predetermined operating temperature of the touchdown sensor, the reference resistance, and a thermal coefficient of resistance (TCR) of the touchdown sensor, wherein the TCR specifies a change in temperature of the touchdown sensor relative to a change in the resistance of the touchdown sensor;apply the bias signal at the operating bias value to the touchdown sensor and measure a corresponding third resistance of the touchdown sensor;update the reference resistance of the touchdown sensor based on the first, second, and operating bias values and the first, second, and third resistances; andupdate the operating bias value for the bias signal based on the updated reference resistance.