This application claims the priority benefit of Republic of Korea Patent Application No. 10-2021-0119392, filed on Sep. 7, 2021 in the Korean Intellectual Property Office, which is incorporated by reference in its entirety.
The present disclosure relates to electronic devices, and more specifically, to a display device and a method of operating the display device.
In a typical display device, to compensate for degradation of elements included in a subpixel disposed in a display panel, such as, a light emitting element, transistors, and the like, optical compensation has been performed using a camera, or the like during the process of manufacturing the display panel. In such an optical compensation method, luminance from the subpixel can be accurately measure using the camera, and therefore, the level of corresponding degradation at the time of manufacturing the display panel can be accurately determined.
After the display panel is manufactured and the display device is launched, as the display device is used, the elements included in the subpixel age and become less efficient. However, the degradation of the light emitting element, and the like in the subpixel cannot be monitored, and as a result, it has been problematic to compensate for corresponding degradation in accordance with situations where such elements are used.
In the field of current display technology, the monitoring of degradation levels of elements included in a subpixel of a display panel, such as a light emitting element, transistors, and the like, using an optical element or device in a situation where the display panel or a display device including the display panel is used by a user is not available after the display device is manufactured, but is available only during manufacturing of the display device. Therefore, in the field of current display technology, there has been an increasingly need for monitoring, and compensating for, the degradation of such elements using an optical element or device with high accuracy in real time after the display panel is manufactured.
To address these issues, a display device and a method of operating the display device for monitoring the degradation of subpixels in real time using an optical element or device even in a situation where the display device is used by a user after the display device is manufactured, and for compensating for the degradation in real time in accordance with the result of the monitoring is disclosed.
In one embodiment, a display device comprises: a display panel comprising a display area including a plurality of light emitting areas corresponding to a plurality of subpixels, and a non-display area located outside of the display area; one or more optical electronic devices located under, or at a lower portion of, the display panel; and a data driving circuit configured to supply a data voltage corresponding to input image data to the display panel, wherein the display area comprises one or more optical areas that partially overlap the one or more optical electronic devices, and a non-optical area located outside of the one or more optical areas, wherein the one or more optical areas comprises a plurality of first light emitting areas of the plurality of light emitting areas and a plurality of light transmission areas, and the non-optical area comprises a plurality of second light emitting areas of the plurality of light emitting areas, and wherein the one or more optical electronic devices overlaps at least a portion of the plurality of first light emitting areas in the one or more optical areas, and performs an image capturing operation or a sensing operation through the one or more optical areas during one of a first period in which the display device is not used or a second period proceeded by an input related to screen setting.
In one embodiment, a method of operating a display device comprising a display panel comprising a display area comprising a plurality of light emitting areas corresponding to a plurality of subpixels, and a non-display area located outside of the display area, a data driving circuit configured to supply a data voltage corresponding to input image data to the display panel, and one or more optical electronic devices, the method comprising: determining whether the display device operates in a first period in which the display device is not used or a second period proceeded by an input related to screen setting; and executing an image capturing operation or a sensing operation by the one or more optical electronic devices through one or more optical areas during the first period or the second period, wherein the display area comprises one or more optical areas partially overlapping the one or more optical electronic devices, and a non-optical area located outside of the one or more optical areas, wherein the one or more optical areas comprises a plurality of first light emitting areas of the plurality of light emitting areas and a plurality of light transmission areas, and the non-optical area comprises a plurality of second light emitting areas of the plurality of light emitting areas, and wherein the one or more optical electronic devices overlap at least a portion of the plurality of first light emitting areas in the one or more optical areas.
In one embodiment, a display device comprises: a display panel including a first optical area and a non-optical area that are configured to display an image, the first optical area comprising a first plurality of light emitting areas and a first plurality of light transmission areas, and the non-optical area including a second plurality of light emitting areas; and a first electronic device configured to sense light through the first plurality of light transmission areas, the first electronic device under the display panel or located at a lower portion of the display panel and overlapping the first optical area but not the non-optical area.
The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of the disclosure, illustrate embodiments of the disclosure and together with the description serve to explain the principle of the disclosure. In the drawings:
In the following description of examples or embodiments of the present disclosure, reference will be made to the accompanying drawings in which it is shown by way of illustration specific examples or embodiments that can be implemented, and in which the same reference numerals and signs can be used to designate the same or like components even when they are shown in different accompanying drawings from one another. Further, in the following description of examples or embodiments of the present disclosure, detailed descriptions of well-known functions and components incorporated herein will be omitted when it is determined that the description may make the subject matter in some embodiments of the present disclosure rather unclear. The terms such as “including”, “having”, “containing”, “constituting” “make up of”, and “formed of” used herein are generally intended to allow other components to be added unless the terms are used with the term “only”. As used herein, singular forms are intended to include plural forms unless the context clearly indicates otherwise.
Terms, such as “first”, “second”, “A”, “B”, “(A)”, or “(B)” may be used herein to describe elements of the present disclosure. Each of these terms is not used to define essence, order, sequence, or number of elements etc., but is used merely to distinguish the corresponding element from other elements.
When it is mentioned that a first element “is connected or coupled to”, “contacts or overlaps” etc. a second element, it should be interpreted that, not only can the first element “be directly connected or coupled to” or “directly contact or overlap” the second element, but a third element can also be “interposed” between the first and second elements, or the first and second elements can “be connected or coupled to”, “contact or overlap”, etc. each other via a fourth element. Here, the second element may be included in at least one of two or more elements that “are connected or coupled to”, “contact or overlap”, etc. each other.
When time relative terms, such as “after,” “subsequent to,” “next,” “before,” and the like, are used to describe processes or operations of elements or configurations, or flows or steps in operating, processing, manufacturing methods, these terms may be used to describe non-consecutive or non-sequential processes or operations unless the term “directly” or “immediately” is used together.
In addition, when any dimensions, relative sizes etc. are mentioned, it should be considered that numerical values for an elements or features, or corresponding information (e.g., level, range, etc.) include a tolerance or error range that may be caused by various factors (e.g., process factors, internal or external impact, noise, etc.) even when a relevant description is not specified. Further, the term “may” fully encompasses all the meanings of the term “can”.
Hereinafter, various embodiments of the present disclosure will be described in detail with reference to the accompanying drawings.
Referring to
The display panel 110 can include a display area DA in which an image is displayed and a non-display area NDA in which an image is not displayed.
A plurality of subpixels can be arranged in the display area DA, and several types of signal lines for driving the plurality of subpixels can be arranged therein.
The non-display area NDA may refer to an area outside of the display area DA. Several types of signal lines can be arranged in the non-display area NDA, and several types of driving circuits can be connected thereto. At least a portion of the non-display area NDA may be bent to be invisible from the front of the display panel or may be covered by a case (not shown) of the display panel 110 or the display device 100. The non-display area NDA may be also referred to as a bezel or a bezel area.
Referring to
Light can enter the front surface (viewing surface) of the display panel 110, pass through the display panel 110, reach the one or more optical electronic devices (11, 12) located under, or in the lower portion of, the display panel 110 (the opposite side to the viewing surface).
The one or more optical electronic devices (11, 12) can receive or detect light transmitting through the display panel 110 and perform a predefined function based on the received light. For example, the one or more optical electronic devices (11, 12) may include one or more of an image capture device such as a camera (an image sensor), and/or the like, and a sensor such as a proximity sensor, an illuminance sensor, and/or the like.
Referring to
Referring to
According to an example of
According to an example of
According to an example of
Both an image display structure and a light transmission structure are needed to be formed in the one or more optical areas (OA1, OA2). In some embodiments, since the one or more optical areas (OA1, OA2) are one or more portions of the display area DA, subpixels for displaying images are needed to be disposed in the one or more optical areas (OA1, OA2). Further, for enabling light to transmit the one or more optical electronic devices (11, 12), a light transmission structure is needed to be formed in the one or more optical areas (OA1, OA2).
According to the embodiments described above, in spite of a fact that the one or more optical electronic devices (11, 12) are needed to receive or detect light, the one or more optical electronic devices (11, 12) are sometimes located on the back of the display panel 110 (under, or in the lower portion of, the display panel 110, i.e., the opposite side to the viewing surface), and thereby, can receive light that has transmitted the display panel 110.
For example, the one or more optical electronic devices (11, 12) may not be exposed in the front surface (viewing surface) of the display panel 110. Accordingly, when a user looks at the front of the display device 110, the one or more optical electronic devices (11, 12) are invisible to the user.
In one embodiment, the first optical electronic device 11 may be a camera, and the second optical electronic device 12 may be a sensor such as a proximity sensor, an illuminance sensor, and/or the like. For example, the sensor may be an infrared sensor capable of detecting infrared rays.
In another embodiment, the first optical electronic device 11 may be a sensor, and the second optical electronic device 12 may be a camera.
Hereinafter, for convenience of description, discussions will be conducted on the embodiment where the first optical electronic device 11 is a camera, and the second optical electronic device 12 is a sensor such as a proximity sensor, an illuminance sensor, an infrared sensor, and the like. For example, the camera may be a camera lens, an image sensor, or a unit including at least one of the camera lens and the image sensor.
In a case where the first optical electronic device 11 is the camera, this camera may be located on the back of (under, or in the lower portion of) the display panel 110, and be a front camera capable of capturing objects in a front direction of the display panel 110. Accordingly, the user can capture an image through the camera that is not visible on the viewing surface while looking at the viewing surface of the display panel 110.
Although the non-optical area NA and the one or more optical areas (OA1, OA2) included in the display area DA in each of
Accordingly, the one or more optical areas (OA1, OA2) may have a transmittance greater than or equal to a predetermined level, (e.g., a relatively high transmittance), and the non-optical area NA may not have light transmittance or have a transmittance less than the predetermined level (e.g., a relatively low transmittance).
For example, the one or more optical areas (OA1, OA2) may have a resolution, a subpixel arrangement structure, the number of subpixels per unit area, an electrode structure, a line structure, an electrode arrangement structure, a line arrangement structure, or/and the like different from that/those of the non-optical area NA.
In one embodiment, the number of subpixels per unit area in the one or more optical areas (OA1, OA2) may be less than the number of subpixels per unit area in the non-optical area NA. For example, the resolution of the one or more optical areas (OA1, OA2) may be less than that of the non-optical area NA. Here, the number of subpixels per unit area may be a unit for measuring resolution, for example, referred to as pixels per inch (PPI), which represents the number of pixels within 1 inch.
In one embodiment, in each of
In each of
Referring to
Hereinafter, for convenience of description, discussions will be conducted based on an embodiment in which each of the first optical area OA1 and the second optical area OA2 has a circular shape.
Herein, in a case where the display device 100 according to embodiments of the present disclosure has a structure in which the first optical electronic device 11 located to be covered under, or in the lower portion of, the display panel 100 without being exposed to the outside is a camera, the display device 100 may be referred to as a display (or display device) to which under-display camera (UDC) technology is applied.
The display device 100 according to this configuration can have an advantage of preventing the size of the display area DA from being reduced since a notch or a camera hole for exposing a camera need not be formed in the display panel 110.
Since the notch or the camera hole for camera exposure need not be formed in the display panel 110, the display device 100 can have further advantages of reducing the size of the bezel area, and improving the degree of freedom in design as such limitations to the design are removed.
Although the one or more optical electronic devices (11, 12) are covered on the back of (under, or in the lower portion of) the display panel 110 in the display device 100 according to embodiments of the present disclosure, that is, hidden not to be exposed to the outside, the one or more optical electronic devices (11, 12) needed to receive or detect light for normally performing predefined functionality.
Further, in the display device 100 according to embodiments of the present disclosure, although the one or more optical electronic devices (11, 12) are covered on the back of (under, or in the lower portion of) the display panel 110 and located to overlap the display area DA, it is necessary for image display to be normally performed in the one or more optical areas (OA1, OA2) overlapping the one or more optical electronic devices (11, 12) in the area DA.
Referring to
The display driving circuit is a circuit for driving the display panel 110, and can include a data driving circuit 220, a gate driving circuit 230, a display controller 240, and the like.
The display panel 110 can include a display area DA in which an image is displayed and a non-display area NDA in which an image is not displayed. The non-display area NDA may be an area outside of the display area DA, and may also be referred to as an edge area or a bezel area. All or a portion of the non-display area NDA may be an area visible from the front surface of the display device 100, or an area that is bent and invisible from the front surface of the display device 100.
The display panel 110 can include a substrate SUB and a plurality of subpixels SP disposed on the substrate SUB. The display panel 110 can further include various types of signal lines to drive the plurality of subpixels SP.
In some embodiments, the display device 100 herein may be a liquid crystal display device, or the like, or a self-emission display device in which light is emitted from the display panel 110 itself. In some embodiments, when the display device 100 is the self-emission display device, each of the plurality of subpixels SP may include a light emitting element.
In some embodiments, the display device 100 may be an organic light emitting display device in which the light emitting element is implemented using an organic light emitting diode (OLED). In some embodiments, the display device 100 may be an inorganic light emitting display device in which the light emitting element is implemented using an inorganic material-based light emitting diode. In some embodiments, the display device 100 may be a quantum dot display device in which the light emitting element is implemented using quantum dots, which are self-emission semiconductor crystals.
The structure of each of the plurality of subpixels SP may vary according to types of the display devices 100. For example, when the display device 100 is a self-emission display device including self-emission subpixels SP, each subpixel SP may include a self-emission light emitting element, one or more transistors, and one or more capacitors.
The various types of signal lines arranged in the display device 100 may include, for example, a plurality of data lines DL for carrying data signals (also referred to as data voltages or image signals), a plurality of gate lines GL for carrying gate signals (also referred to as scan signals), and the like.
The plurality of data lines DL and the plurality of gate lines GL may intersect each other. Each of the plurality of data lines DL may be disposed to extend in a first direction. Each of the plurality of gate lines GL may be disposed to extend in a second direction.
For example, the first direction may be a column or vertical direction, and the second direction may be a row or horizontal direction. In another example, the first direction may be the row direction, and the second direction may be the column direction.
The data driving circuit 220 is a circuit for driving the plurality of data lines DL, and can supply data signals to the plurality of data lines DL. The gate driving circuit 230 is a circuit for driving the plurality of gate lines GL, and can supply gate signals to the plurality of gate lines GL.
The display controller 240 is a device for controlling the data driving circuit 220 and the gate driving circuit 230, and can control driving timing for the plurality of data lines DL and driving timing for the plurality of gate lines GL.
The display controller 240 can supply a data driving control signal DCS to the data driving circuit 220 to control the data driving circuit 220, and supply a gate driving control signal GCS to the gate driving circuit 230 to control the gate driving circuit 230.
The display controller 240 can receive input image data from a host system 250 and supply image data Data to the data driving circuit 220 based on the input image data.
The data driving circuit 220 can supply data signals to the plurality of data lines DL according to the driving timing control of the display controller 240.
The data driving circuit 220 can receive the digital image data Data from the display controller 240, convert the received image data Data into analog data signals, and supply the resulting analog data signals to the plurality of data lines DL.
The gate driving circuit 230 can supply gate signals to the plurality of gate lines GL according to the timing control of the display controller 240. The gate driving circuit 230 can receive a first gate voltage corresponding to a turn-on level voltage and a second gate voltage corresponding to a turn-off level voltage along with various gate driving control signals GCS, generate gate signals, and supply the generated gate signals to the plurality of gate lines GL.
In some embodiments, the data driving circuit 220 may be connected to the display panel 110 in a tape automated bonding (TAB) type, or connected to a conductive pad such as a bonding pad of the display panel 110 in a chip on glass (COG) type or a chip on panel (COP) type, or connected to the display panel 110 in a chip on film (COF) type.
In some embodiments, the gate driving circuit 230 may be connected to the display panel 110 in the tape automated bonding (TAB) type, or connected to a conductive pad such as a bonding pad of the display panel 110 in the chip on glass (COG) type or the chip on panel (COP) type, or connected to the display panel 110 in the chip on film (COF) type. In another embodiment, the gate driving circuit 230 may be disposed in the non-display area NDA of the display panel 110 in a gate in panel (GIP) type. The gate driving circuit 230 may be disposed on or over the substrate, or connected to the substrate. That is, in the case of the GIP type, the gate driving circuit 230 may be disposed in the non-display area NDA of the substrate. The gate driving circuit 230 may be connected to the substrate in the case of the chip on glass (COG) type, the chip on film (COF) type, or the like.
At least one of the data driving circuit 220 and the gate driving circuit 230 may be disposed in the display area DA of the display panel 110. For example, at least one of the data driving circuit 220 and the gate driving circuit 230 may be disposed not to overlap subpixels SP, or disposed to be overlapped with one or more, or all, of the subpixels SP.
The data driving circuit 220 may also be located on, but not limited to, only one side or portion (e.g., an upper edge or a lower edge) of the display panel 110. In some embodiments, the data driving circuit 220 may be located in, but not limited to, two sides or portions (e.g., an upper edge and a lower edge) of the display panel 110 or at least two of four sides or portions (e.g., the upper edge, the lower edge, a left edge, and a right edge) of the display panel 110 according to driving schemes, panel design schemes, or the like.
The gate driving circuit 230 may be located on, but not limited to, only one side or portion (e.g., a left edge or a right edge) of the display panel 110. In some embodiments, the gate driving circuit 230 may be located on, but not limited to, two sides or portions (e.g., a left edge and a right edge) of the panel 110 or at least two of four sides or portions (e.g., an upper edge, a lower edge, the left edge, and the right edge) of the panel 110 according to driving schemes, panel design schemes, or the like.
The display controller 240 may be implemented in a separate component from the data driving circuit 220, or integrated with the data driving circuit 220 and thus implemented in an integrated circuit.
The display controller 240 may be a timing controller used in the typical display technology or a controller or a control device capable of additionally performing other control functions in addition to the function of the typical timing controller. In some embodiments, the display controller 140 may be a controller or a control device different from the timing controller, or a circuitry or a component included in the controller or the control device. The display controller 240 may be implemented with various circuits or electronic components such as an integrated circuit (IC), a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), a processor, and/or the like.
The display controller 240 may be mounted on a printed circuit board, a flexible printed circuit, and/or the like and be electrically connected to the gate driving circuit 220 and the data driving circuit 230 through the printed circuit board, flexible printed circuit, and/or the like.
The display controller 240 may transmit signals to, and receive signals from, the data driving circuit 220 via one or more predefined interfaces. In some embodiments, such interfaces may include a low voltage differential signaling (LVDS) interface, an EPI interface, a serial peripheral interface (SP), and the like.
In some embodiments, in order to further provide a touch sensing function, as well as an image display function, the display device 100 may include at least one touch sensor, and a touch sensing circuit capable of detecting whether a touch event occurs by a touch object such as a finger, a pen, or the like, or of detecting a corresponding touch position, by sensing the touch sensor.
The touch sensing circuit can include a touch driving circuit 260 capable of generating and providing touch sensing data by driving and sensing the touch sensor, a touch controller 270 capable of detecting the occurrence of a touch event or detecting a touch position using the touch sensing data, and the like.
The touch sensor can include a plurality of touch electrodes. The touch sensor can further include a plurality of touch lines for electrically connecting the plurality of touch electrodes to the touch driving circuit 260.
The touch sensor may be implemented in a touch panel, or in the form of a touch panel, outside of the display panel 110, or be implemented inside of the display panel 110. When the touch sensor is implemented in the touch panel, or in the form of the touch panel, outside of the display panel 110, such a touch sensor is referred to as an add-on type. When the add-on type of touch sensor is disposed, the touch panel and the display panel 110 may be separately manufactured and combined during an assembly process. The add-on type of touch panel may include a touch panel substrate and a plurality of touch electrodes on the touch panel substrate.
When the touch sensor is implemented inside of the display panel 110, the touch sensor may be disposed over the substrate SUB together with signal lines and electrodes related to display driving during the process of manufacturing the display panel 110.
The touch driving circuit 260 can supply a touch driving signal to at least one of the plurality of touch electrodes, and sense at least one of the plurality of touch electrodes to generate touch sensing data.
The touch sensing circuit can perform touch sensing using a self-capacitance sensing method or a mutual-capacitance sensing method.
When the touch sensing circuit performs touch sensing in the self-capacitance sensing method, the touch sensing circuit can perform touch sensing based on capacitance between each touch electrode and a touch object (e.g., a finger, a pen, etc.).
According to the self-capacitance sensing method, each of the plurality of touch electrodes can serve as both a driving touch electrode and a sensing touch electrode. The touch driving circuit 260 can drive all, or one or more, of the plurality of touch electrodes and sense al, or one or more, of the plurality of touch electrodes.
When the touch sensing circuit performs touch sensing in the mutual-capacitance sensing method, the touch sensing circuit can perform touch sensing based on capacitance between touch electrodes.
According to the mutual-capacitance sensing method, the plurality of touch electrodes are divided into driving touch electrodes and sensing touch electrodes. The touch driving circuit 260 can drive the driving touch electrodes and sense the sensing touch electrodes.
The touch driving circuit 260 and the touch controller 270 included in the touch sensing circuit may be implemented in separate devices or in a single device. Further, the touch driving circuit 260 and the data driving circuit 220 may be implemented in separate devices or in a single device.
The display device 100 may further include a power supply circuit for supplying various types of power to the display driving circuit and/or the touch sensing circuit.
In some embodiments, the display device 100 may be a mobile terminal such as a smart phone, a tablet, or the like, or a monitor, a television (TV), or the like. Such devices may be of various types, sizes, and shapes. The display device 100 according to embodiments of the present disclosure are not limited thereto, and includes displays of various types, sizes, and shapes for displaying information or images.
As described above, the display area DA of the display panel 110 may include a non-optical area NA and one or more optical areas (OA1, OA2), for example, as shown in
The non-optical area NA and the one or more optical areas (OA1, OA2) are areas where an image can be displayed. However, the non-optical NA is an area in which a light transmission structure need not be implemented, and the one or more optical areas OA1, OA2 are areas in which the light transmission structure need be implemented.
As discussed above with respect to the examples of
Each of subpixels SP disposed in the non-optical area NA, the first optical area OA1, and the second optical area OA2 included in the display area DA of the display panel 110 may include a light emitting element ED, a driving transistor DRT for driving the light emitting element ED, a scan transistor SCT for transmitting a data voltage VDATA to a first node N1 of the driving transistor DRT, a storage capacitor Cst for maintaining a voltage at an approximate constant level during one frame, and the like.
The driving transistor DRT can include the first node N1 to which a data voltage is applied, a second node N2 electrically connected to the light emitting element ED, and a third node N3 to which a driving voltage ELVDD through a driving voltage line DVL is applied. In the driving transistor DRT, the first node N1 may be a gate node, the second node N2 may be a source node or a drain node, and the third node N3 may be the drain node or the source node.
The light emitting element ED can include an anode electrode AE, an emission layer EL, and a cathode electrode CE. The anode electrode AE may be a pixel electrode disposed in each subpixel SP, and may be electrically connected to the second node N2 of the driving transistor DRT of each subpixel SP. The cathode electrode CE may be a common electrode commonly disposed in the plurality of subpixels SP, and a base voltage ELVSS such as a low-level voltage may be applied to the cathode electrode CE.
For example, the anode electrode AE may be the pixel electrode, and the cathode electrode CE may be the common electrode. In another example, the anode electrode AE may be the common electrode, and the cathode electrode CE may be the pixel electrode. For convenience of description, in the discussion that follows, it is assumed that the anode electrode AE is the pixel electrode, and the cathode electrode CE is the common electrode unless explicitly stated otherwise.
The light emitting element ED may be, for example, an organic light emitting diode (OLED), an inorganic light emitting diode, a quantum dot light emitting element, or the like. In a case where an organic light emitting diode is used as the light emitting element ED, the emission layer EL included in the light emitting element ED may include an organic emission layer including an organic material.
The scan transistor SCT may be turned on and off by a scan signal SCAN that is a gate signal applied through a gate line GL, and be electrically connected between the first node N1 of the driving transistor DRT and a data line DL.
The storage capacitor Cst may be electrically connected between the first node N1 and the second node N2 of the driving transistor DRT.
Each subpixel SP may include two transistors (2T: DRT and SCT) and one capacitor (1C: Cst) (referred to as “2T1C structure”) as shown in
The storage capacitor Cst may be an external capacitor intentionally designed to be located outside of the driving transistor DRT, other than an internal capacitor, such as a parasitic capacitor (e.g., a Cgs, a Cgd), that may be present between the first node N1 and the second node N2 of the driving transistor DRT.
Each of the driving transistor DRT and the scan transistor SCT may be an n-type transistor or a p-type transistor.
Since circuit elements (in particular, a light emitting element ED) in each subpixel SP are vulnerable to external moisture or oxygen, an encapsulation layer ENCAP may be disposed in the display panel 110 in order to prevent the external moisture or oxygen from penetrating into the circuit elements (in particular, the light emitting element ED). The encapsulation layer ENCAP may be disposed to cover the light emitting element ED.
Referring to
The plurality of subpixels SP may include, for example, a red subpixel (Red SP) emitting red light, a green subpixel (Green SP) emitting green light, and a blue subpixel (Blue SP) emitting blue light.
Accordingly, each of the non-optical area NA, the first optical area OA1, and the second optical area OA2 may include one or more light emitting areas EA of one or more red subpixels (Red SP), and one or more light emitting areas EA of one or more green subpixels (Green SP), and one or more light emitting areas EA of one or more blue subpixels (Blue SP).
Referring to
However, the first optical area OA1 and the second optical area OA2 include both the light emitting areas EA and the light transmission structure.
Accordingly, the first optical area OA1 can include light emitting areas EA and first transmission areas TA1 (e.g., light transmission areas), and the second optical area OA2 can include the light emitting areas EA and second transmission area TA2 (e.g., light transmission areas).
The light emitting areas EA and the transmission areas (TA1, TA2) may be distinct according to whether the transmission of light is allowed. That is, the light emitting areas EA may be areas not allowing light to transmit, and the transmission areas TA1, TA2 may be areas allowing light to transmit.
The light emitting areas EA and the transmission areas TA1, TA2 may be also distinct according to whether or not a specific metal layer CE is included. For example, the cathode electrode CE may be disposed in the light emitting areas EA, and the cathode electrode CE may not be disposed in the transmission areas (TA1, TA2). Further, a light shield layer may be disposed in the light emitting areas EA, and the light shield layer may not be disposed in the transmission areas (TA1, TA2).
Since the first optical area OA1 includes the first transmission areas TA1 and the second optical area OA2 includes the second transmission areas TA2, both of the first optical area OA1 and the second optical area OA2 are areas through which light can pass.
In one embodiment, a transmittance (a degree of transmission) of the first optical area OA1 and a transmittance (a degree of transmission) of the second optical area OA2 may be substantially equal.
For example, the first transmission area TA1 of the first optical area OA1 and the second transmission area TA2 of the second optical area OA2 may have a substantially equal shape or size. In another example, even when the first transmission area TA1 of the first optical area OA1 and the second transmission area TA2 of the second optical area OA2 have different shapes or sizes, a ratio of the first transmission area TA1 to the first optical area OA1 and a ratio of the second transmission area TA2 to the second optical area OA2 may be substantially equal.
In another embodiment, a transmittance (a degree of transmission) of the first optical area OA1 and a transmittance (a degree of transmission) of the second optical area OA2 may be different.
For example, the first transmission area TA1 of the first optical area OA1 and the second transmission area TA2 of the second optical area OA2 may have different shapes or sizes. In another example, even when the first transmission area TA1 of the first optical area OA1 and the second transmission area TA2 of the second optical area OA2 have a substantially equal shape or size, a ratio of the first transmission area TA1 to the first optical area OA1 and a ratio of the second transmission area TA2 to the second optical area OA2 may be different from each other.
For example, in a case where the first optical electronic device 11 overlapping the first optical area OA1 is a camera, and the second optical electronic device 12 overlapping the second optical area OA2 is a sensor for detecting images, the camera may need a greater amount of light than the sensor.
Thus, the transmittance (degree of transmission) of the first optical area OA1 may be greater than the transmittance (degree of transmission) of the second optical area OA2.
In this case, the first transmission area TA1 of the first optical area OA1 may have a size greater than the second transmission area TA2 of the second optical area OA2. In another example, even when the first transmission area TA1 of the first optical area OA1 and the second transmission area TA2 of the second optical area OA2 have a substantially equal size, a ratio of the first transmission area TA1 to the first optical area OA1 may be greater than a ratio of the second transmission area TA2 to the second optical area OA2.
For convenience of description, the discussion that follows is performed based on the embodiment in which the transmittance (degree of transmission) of the first optical area OA1 is greater than the transmittance (degree of transmission) of the second optical area OA2.
Further, the transmission areas (TA1, TA2) as shown in
Further, in the discussion that follows, it is assumed that the first optical areas OA1 and the second optical areas OA2 are located in an upper edge of the display area DA of the display panel 110, and are disposed to be horizontally adjacent to each other such as being disposed in a direction in which the upper edge extends, as shown in
Referring to
Referring to
First horizontal display areas HA1 shown in
A first optical area OA1 shown in
Referring to
Various types of horizontal lines HL1, HL2 and various types of vertical lines VLn, VL1, VL2 may be disposed in the display panel 11.
Herein, the term “horizontal” and the term “vertical” are used to refer to two directions intersecting the display panel. However, it should be noted that the horizontal direction and the vertical direction may be changed depending on a viewing direction. The horizontal direction may refer to, for example, a direction in which one gate line GL is disposed to extend and, and the vertical direction may refer to, for example, a direction in which one data line DL is disposed to extend. As such, the term horizontal and the term vertical are used to represent two directions.
Referring to
The horizontal lines disposed in the display panel 110 may be gate lines GL. That is, the first horizontal lines HL1 and the second horizontal lines HL2 may be the gate lines GL. The gate lines GL may include various types of gate lines according to structures of one or more subpixels SP.
Referring to
The vertical lines disposed in the display panel 110 may include data lines DL, driving voltage lines DVL, and the like, and may further include reference voltage lines, initialization voltage lines, and the like. That is, the typical vertical lines VLn, the first vertical lines VL1 and the second vertical lines VL2 may include the data lines DL, the driving voltage lines DVL, and the like, and may further include the reference voltage lines, the initialization voltage lines, and the like.
In some embodiments, it should be noted that the term “horizontal” in the second horizontal line HL2 may mean only that a signal is carried from a left side, to a right side, of the display panel (or from the right side to the left side), and may not mean that the second horizontal line HL2 runs in a straight line only in the direct horizontal direction. For example, in
In some embodiments, it should be noted that the term “vertical” in the typical vertical line VLn may mean only that a signal is carried from an upper portion, to a lower portion, of the display panel (or from the lower portion to the upper portion), and may not mean that the typical vertical line VLn runs in a straight line only in the direct vertical direction. For example, in
Referring to
Referring to
Accordingly, each of the first horizontal lines HL1 running through the first optical area OA1 may include one or more curved or bent portions running around one or more respective outer edges of one or more of the first transmission areas TA1.
Accordingly, the first horizontal lines HL1 disposed in the first horizontal area HA1 and the second horizontal lines HL2 disposed in the second horizontal area HA2 may have different shapes or lengths. For example, the first horizontal lines HL1 running through the first optical area OA1 and the second horizontal lines HL2 not running through the first optical area OA1 may have different shapes or lengths.
Further, in order to improve the transmittance of the first optical area OA1, the first vertical lines VL1 may run through the first optical area OA1 by avoiding the first transmission areas TA1 in the first optical area OA1.
Accordingly, each of the first vertical lines VL1 running through the first optical area OA1 may include one or more curved or bent portions running around one or more respective outer edges of one or more of the first transmission areas TA1.
Thus, the first vertical lines VL1 running through the first optical area OA1 and the typical vertical lines VLn disposed in the non-optical area NA without running through the first optical area OA1 may have different shapes or lengths.
Referring to
Referring to
Referring to
Referring to
In one embodiment, the light emitting areas EA and the second transmission areas TA2 in the second optical area OA2 may have locations and arrangements substantially equal to the light emitting areas EA and the first transmission areas TA1 in the first optical area OA1 of
In another embodiment, as shown in
For example, referring to
When in the first horizontal area HA1, running through the second optical area OA2 and the non-optical area NA adjacent to the second optical area OA2, in one embodiment, the first horizontal lines HL1 may have substantially the same arrangement as the first horizontal lines HL1 of
In another embodiment, as shown in
This is because that the light emitting areas EA and the second transmission areas TA2 in the second optical area OA2 of
Referring to
For example, one first horizontal line HL1 may have one or more curved or bent portions in the first optical area OA1, but may not have a curved or bent portion in the second optical area OA2.
In order to improve the transmittance of the second optical area OA2, the second vertical lines VL2 may run through the second optical area OA2 by avoiding the second transmission areas TA2 in the second optical area OA2.
Accordingly, each of the second vertical lines VL2 running through the second optical area OA2 may include one or more curved or bent portions running around one or more respective outer edges of one or more of the second transmission areas TA2.
Thus, the second vertical lines VL2 running through the second optical area OA2 and the typical vertical lines VLn disposed in the non-optical area NA without running through the second optical area OA2 may have different shapes or lengths.
As shown in
Accordingly, a length of the first horizontal line HL1 running through the first optical area OA1 and the second optical area OA2 may be slightly longer than a length of the second horizontal line HL2 disposed in the non-optical area NA without running through the first optical area OA1 and the second optical area OA2 and.
Accordingly, a resistance of the first horizontal line HL1 running through the first optical area OA1 and the second optical area OA2, which is referred to as a first resistance, may be slightly greater than a resistance of the second horizontal line HL2 disposed in the non-optical area NA without running through the first optical area OA1 and the second optical area OA2 and, which is referred to as a second resistance.
Referring to
Accordingly, the number of subpixels connected to each, or one or more, of the first horizontal lines HL1 running through the first optical area OA1 and the second optical area OA2 may be different from the number of subpixels connected to each, or one or more, of the second horizontal lines HL2 disposed only in the non-optical area NA without running through the first optical area OA1 and the second optical area OA2.
The number of subpixels connected to each, or one or more, of the first horizontal lines HL1 running through the first optical area OA1 and the second optical area OA2, which is referred to as a first number, may be smaller than the number of subpixels connected to each, or one or more, of the second horizontal lines HL2 disposed only in the non-optical area NA without running through the first optical area OA1 and the second optical area OA2, which is referred to as a second number.
A difference between the first number and the second number may vary according to a difference between a resolution of each of the first optical area OA1 and the second optical area OA2 and a resolution of the non-optical area NA. For example, as a difference between a resolution of each of the first optical area OA1 and the second optical area OA2 and a resolution of the non-optical area NA increases, a difference between the first number and the second number may increase.
As described above, since the number (the first number) of subpixels connected to each, or one or more, of the first horizontal lines HL1 running through the first optical area OA1 and the second optical area OA2 is less than the number of subpixels (second number) connected to each, or one or more, of the second horizontal lines HL2 disposed only in the non-optical area NA without running through the first optical area OA1 and the second optical area OA2, an area where the first horizontal line HL1 overlaps one or more other electrodes or lines adjacent to the first horizontal line HL1 may be less than an area where the second horizontal line HL2 overlaps one or more other electrodes or lines adjacent to the second horizontal line HL2.
Accordingly, a parasitic capacitance formed between the first horizontal line HL1 and one or more other electrodes or lines adjacent to the first horizontal line HL1, which is referred to as a first capacitance, may be greatly smaller than a parasitic capacitance formed between the second horizontal line HL2 and one or more other electrodes or lines adjacent to the second horizontal line HL2, which is referred to as a second capacitance.
Considering a relationship in magnitude between the first resistance and the second resistance (the first resistance≥the second resistance) and a relationship in magnitude between the first capacitance and the second capacitance (the first capacitance<<second capacitance), a resistance-capacitance (RC) value of the first horizontal line HL1 running through the first optical area OA1 and the second optical area OA2, which is referred to as a first RC value, may be greatly smaller than an RC value of the second horizontal lines HL2 disposed in the non-optical area NA without running through the first optical area OA1 and the second optical area OA2, which is referred to as a second RC value, that is, resulting in the first RC value<<the second RC value.
Due to such a difference between the first RC value of the first horizontal line HL1 and the second RC value of the second horizontal line HL2, which is referred to as an RC load difference, a signal transmission characteristic through the first horizontal line HL1 may be different from a signal transmission characteristic through the second horizontal line HL2.
Each of
A stack structure of the non-optical area NA will be described with reference to
Referring to
Referring to
Referring to
A first metal layer ML1 and a second metal layer ML2 may be disposed on the first active buffer layer ABUF1. The first metal layer ML1 and the second metal layer ML2 may be, for example, a light shield layer LS for shielding light.
A second active buffer layer ABUF2 may be disposed on the first metal layer ML1 and the second metal layer ML2. An active layer ACT of the driving transistor DRT may be disposed on the second active buffer layer ABUF2.
A gate insulating layer GI may be disposed to cover the active layer ACT.
A gate electrode GATE of the driving transistor DRT may be disposed on the gate insulating layer GI. In this situation, together with the gate electrode GATE of the driving transistor DRT, a gate material layer GM may be disposed on the gate insulating layer GI at a location different from a location where the driving transistor DRT is disposed.
The first interlayer insulating layer ILD1 may be disposed to cover the gate electrode GATE and the gate material layer GM. A metal pattern TM may be disposed on the first interlayer insulating layer ILD1. The metal pattern TM may be located at a location different from a location where the driving transistor DRT is formatted. A second interlayer insulating layer ILD2 may be disposed to cover the metal pattern TM on the first interlayer insulating layer ILD1.
Two first source-drain electrode patterns SD1 may be disposed on the second interlayer insulating layer ILD2. One of the two first source-drain electrode patterns SD1 may be a source node of the driving transistor DRT, and the other may be a drain node of the driving transistor DRT.
The two first source-drain electrode patterns SD1 may be electrically connected to first and second side portions of the active layer ACT, respectively, through contact holes formed in the second interlayer insulating layer ILD2, the first interlayer insulating layer ILD1, and the gate insulating layer GI.
A portion of the active layer ACT overlapping the gate electrode GATE may serve as a channel region. One of the two first source-drain electrode patterns SD1 may be connected to the first side portion of the channel region of the active layer ACT, and the other of the two first source-drain electrode patterns SD1 may be connected to the second side portion of the channel region of the active layer ACT.
A passivation layer PAS0 may be disposed to cover the two first source-drain electrode patterns SD1. A planarization layer PLN may be disposed on the passivation layer PAS0. The planarization layer PLN may include a first planarization layer PLN1 and a second planarization layer PLN2.
The first planarization layer PLN1 may be disposed on the passivation layer PAS0.
A second source-drain electrode pattern SD2 may be disposed on the first planarization layer PLN1. The second source-drain electrode pattern SD2 may be connected to one of the two first source-drain electrode patterns SD1 (corresponding to the second node N2 of the driving transistor DRT in the subpixel SP of
The second planarization layer PLN2 may be disposed to cover the second source-drain electrode pattern SD2. A light emitting element ED may be disposed on the second planarization layer PLN2.
According to an example stack structure of the light emitting element ED, an anode electrode AE may be disposed on the second planarization layer PLN2. The anode electrode AE may be electrically connected to the second source-drain electrode pattern SD2 through a contact hole formed in the second planarization layer PLN2.
A bank BANK may be disposed to cover a portion of the anode electrode AE. A portion of the bank BANK corresponding to a light emitting area EA of the subpixel SP may be opened.
A portion of the anode electrode AE may be exposed through the opening (the opened portion) of the bank BANK. An emission layer EL may be positioned on side surfaces of the bank BANK and in the opening (the opened portion) of the bank BANK. All or at least a portion of the emission layer EL may be located between adjacent banks.
In the opening of the bank BANK, the emission layer EL may contact the anode electrode AE. A cathode electrode CE may be disposed on the emission layer EL.
The light emitting element ED can be formed by including the anode electrode AE, the emission layer EL, and the cathode electrode CE, as described above. The emission layer EL may include an organic layer.
An encapsulation layer ENCAP may be disposed on the stack of the light emitting element ED.
The encapsulation layer ENCAP may have a single-layer structure or a multi-layer structure for example, as shown in
The first encapsulation layer PAS1 and the third encapsulation layer PAS2 may be, for example, an inorganic layer, and the second encapsulation layer PCL may be, for example, an organic layer. Among the first encapsulation layer PAS1, the second encapsulation layer PCL, and the third encapsulation layer PAS2, the second encapsulation layer PCL may be the thickest and serve as a planarization layer.
The first encapsulation layer PAS1 may be disposed on the cathode electrode CE and may be disposed closest to the light emitting element ED. The first encapsulation layer PAS1 may include an inorganic insulating material capable of being deposited using low-temperature deposition. For example, the first encapsulation layer PAS1 may include, but not limited to, silicon nitride (SiNx), silicon oxide (SiOx), silicon oxynitride (SiON), aluminum oxide (Al2O3), or the like. Since the first encapsulation layer PAS1 can be deposited in a low temperature atmosphere, during the deposition process, the first encapsulation layer PAS1 can prevent the emission layer EL including an organic material vulnerable to a high temperature atmosphere from being damaged.
The second encapsulation layer PCL may have a smaller area than the first encapsulation layer PAS1. For example, the second encapsulation layer PCL may be disposed to expose both ends or edges of the first encapsulation layer PAS1. The second encapsulation layer PCL can serve as a buffer for relieving stress between corresponding layers while the display device 100 is curved or bent, and also serve to enhance planarization performance. For example, the second encapsulation layer PCL may include an organic insulating material, such as acrylic resin, epoxy resin, polyimide, polyethylene, silicon oxycarbon (SiOC), or the like. The second encapsulation layer PCL may be disposed, for example, using an inkjet scheme.
The third inorganic encapsulation layer PAS2 may be disposed over the substrate SUB over which the second encapsulation layer PCL is disposed to cover the respective top surfaces and side surfaces of the second encapsulation layer PCL and the first encapsulation layer PAS1. The third encapsulation layer PAS2 can minimize or prevent or at least reduce external moisture or oxygen from penetrating into the first inorganic encapsulation layer PAS1 and the organic encapsulation layer PCL. For example, the third encapsulation layer PAS2 may include an inorganic insulating material, such as silicon nitride (SiNx), silicon oxide (SiOx), silicon oxynitride (SiON), aluminum oxide (Al2O3), or the like.
Referring to
A touch buffer layer T-BUF may be disposed on the encapsulation layer ENCAP.
The touch sensor TS may be disposed on the touch buffer layer T-BUF.
The touch sensor TS may include touch sensor metals TSM and at least one bridge metal BRG, which are located in different layers.
A touch interlayer insulating layer T-ILD may be disposed between the touch sensor metals TSM and the bridge metal BRG.
For example, the touch sensor metals TSM may include a first touch sensor metal TSM, a second touch sensor metal TSM, and a third touch sensor metal TSM, which are disposed adjacent to one another. In an embodiment where the third touch sensor metal TSM is disposed between the first touch sensor metal TSM and the second touch sensor metal TSM, and the first touch sensor metal TSM and the second touch sensor metal TSM need to be electrically connected to each other, the first touch sensor metal TSM and the second touch sensor metal TSM may be electrically connected to each other through the bridge metal BRG located in a different layer. The bridge metal BRG may be electrically insulated from the third touch sensor metal TSM by the touch interlayer insulating layer T-ILD.
While the touch sensor TS is disposed on the display panel 110, a chemical solution (developer or etchant, etc.) used in the corresponding process or moisture from the outside may be generated or introduced. By disposing the touch sensor TS on the touch buffer layer T-BUF, a chemical solution or moisture can be prevented from penetrating into the emission layer EL including an organic material during the manufacturing process of the touch sensor TS. Accordingly, the touch buffer layer T-BUF can prevent or at least reduce damage to the emission layer EL, which is vulnerable to a chemical solution or moisture.
In order to prevent or at least reduce damage to the emission layer EL including an organic material, which is vulnerable to high temperatures, the touch buffer layer T-BUF can be formed at a low temperature less than or equal to a predetermined temperature (e.g., 100 degrees (° C.)) and be formed using an organic insulating material having a low permittivity of 1 to 3. For example, the touch buffer layer T-BUF may include an acrylic-based, epoxy-based, or silicon-based material. As the display device 100 is bent, the encapsulation layer ENCAP may be damaged, and the touch sensor metal located on the touch buffer layer T-BUF may be cracked or broken. Even when the display device 100 is bent, the touch buffer layer T-BUF having the planarization performance as the organic insulating material can prevent the damage of the encapsulation layer ENCAP and/or the cracking or breaking of the metals (TSM, BRG) included in the touch sensor TS.
A protective layer PAC may be disposed to cover the touch sensor TS. The protective layer PAC may be, for example, an organic insulating layer.
Next, a stack structure of the first optical area OA1 will be described with reference to
Referring to
The cathode electrode CE may be disposed in the light emitting areas EA included in the non-optical area NA and the first optical area OA1, but may not be disposed in the first transmission area TA1 in the first optical area OA1. For example, the first transmission area TA1 in the first optical area OA1 may correspond to an opening of the cathode electrode CE.
Further, the light shield layer LS including at least one of the first metal layer ML1 and the second metal layer ML2 may be disposed in the light emitting areas EA included in the non-optical area NA and the first optical area OA1, but may not be disposed in the first transmission area TA1 in the first optical area OA1. For example, the first transmission area TA1 in the first optical area OA1 may correspond to an opening of the light shield layer LS.
The substrate SUB1, SUB2, and the various types of insulating layers (MBUF, ABUF1, ABUF2, GI, ILD1, ILD2, PAS0, PLN (PLN1, PLN2), BANK, ENCAP (PAS1, PCL, PAS2), T-BUF, T-ILD, PAC) disposed in the light emitting areas EA included in the non-optical area NA and the first optical area OA1 may be disposed in the first transmission area TA1 in the first optical area OA1 equally, substantially equally, or similarly.
However, all, or one or more, of one or more material layers having electrical properties (e.g., a metal material layer, a semiconductor layer, etc.), except for the insulating materials or layers, disposed in the light emitting areas EA included in the non-optical area NA and the first optical area OA1 may not be disposed in the first transmission area TA1 in the first optical area OA1.
For example, referring to
Further, referring to
Further, referring to
Accordingly, the light transmittance of the first transmission area TA1 in the first optical area OA1 can be provided or improved because the material layers (e.g., the metal material layer, the semiconductor layer, etc.) having electrical properties are not disposed in the first transmission area TA1 in the first optical area OA1. As a consequence, the first optical electronic device 11 can perform a predefined function (e.g., image sensing) by receiving light transmitting through the first transmission area TA1.
Since all, or one or more, of the first transmission area TA1 in the first optical area OA1 overlap the first optical electronic device 11, for enabling the first optical electronic device 11 to normally operate, it is necessary to further increase a transmittance of the first transmission area TA1 in the first optical area OA1.
To do this, in some embodiments, the first transmission area TA1 formed in the first optical area OA1 of the display panel 110 of the display device 100 may have a transmittance improvement structure TIS.
Referring to
Referring to
Referring to
Referring to
In a case where the first planarization layer PLN1 has the depressed portion that extends downward from the surfaces thereof, the second planarization layer PLN2 can substantially serve to planarize. In one embodiment, the second planarization layer PLN2 may also have a depressed portion that extends downward from the surface thereof. In this case, the second encapsulation layer PCL can substantially serve to planarize.
Referring to
Referring to
Referring to
Referring to
Referring to
Referring to
In order for the first optical area OA1 to have a transmittance higher than the non-optical area NA, an area or size of the touch sensor metal TSM per unit area in the first optical area OA1 may be less than an area or size of the touch sensor metal TSM per unit area in the non-optical area NA.
Referring to
Next, a stack structure of the second optical area OA2 will be described with reference to
Referring to
The cathode electrode CE may be disposed in the light emitting areas EA included in the non-optical area NA and the second optical area OA2, but may not be disposed in the second transmission area TA2 in the second optical area OA2. For example, the second transmission area TA2 in the second optical area OA2 may be corresponded to an opening of the cathode electrode CE.
Further, the light shield layer LS including at least one of the first metal layer ML1 and the second metal layer ML2 may be disposed in the light emitting areas EA included in the non-optical area NA and the second optical area OA2, but may not be disposed in the second transmission area TA2 in the second optical area OA2. For example, the second transmission area TA2 in the second optical area OA2 may be corresponded to an opening of the light shield layer LS.
When the transmittance of the second optical area OA2 and the transmittance of the first optical area OA1 are the same, the stack structure of the second transmission area TA2 in the second optical area OA2 may be the same as the stacked structure of the first transmission area TA1 in the first optical area OA1.
When the transmittance of the second optical area OA2 and the transmittance of the first optical area OA1 are different, the stack structure of the second transmission area TA2 in the second optical area OA2 may be different in at least a portion of the stacked structure of the first transmission area TA1 in the first optical area OA1.
For example, as shown in
The substrate (SUB1, SUB2), and the various types of insulating layers (MBUF, ABUF1, ABUF2, GI, ILD1, ILD2, PAS0, PLN (PLN1, PLN2), BANK, ENCAP (PAS1, PCL, PAS2), T-BUF, T-ILD, PAC) disposed in the light emitting areas EA included in the non-optical area NA and the second optical area OA2 may be disposed in the second transmission area TA2 in the second optical area OA2 equally, substantially equally, or similarly.
However, all, or one or more, of one or more material layers having electrical properties (e.g., a metal material layer, a semiconductor layer, etc.), except for the insulating materials or layers, disposed in the light emitting areas EA included in the non-optical area NA and the second optical area OA2 may not be disposed in the second transmission area TA2 in the second optical area OA2.
For example, referring to
Further, referring to
Further, referring to
Accordingly, the light transmittance of the second transmission area TA2 in the second optical area OA2 can be provided or improved because the material layers (e.g., the metal material layer, the semiconductor layer, etc.) having electrical properties are not disposed in the second transmission area TA2 in the second optical area OA2. As a consequence, the second optical electronic device 12 can perform a predefined function (e.g., approach detection of an object or human body, external illumination detection, etc.) by receiving light transmitting through the second transmission area TA2.
For simplicity of illustration,
Referring to
The third inorganic encapsulation layer PAS2 may be disposed over the substrate SUB over which the second encapsulation layer PCL is disposed such that the third inorganic encapsulation layer PAS2 covers the respective top surfaces and side surfaces of the second encapsulation layer PCL and the first encapsulation layer PAS1.
The third encapsulation layer PAS2 can reduce or prevent external moisture or oxygen from penetrating into the first inorganic encapsulation layer PAS1 and the organic encapsulation layer PCL.
Referring to
The one or more dams (DAM1, DAM2) may include the same material DFP as the bank BANK.
Referring to
For example, the second encapsulation layer PCL may extend only up to all, or at least a portion, of an upper portion of the first dam DAM1. In further another embodiment, the second encapsulation layer PCL may extend past the upper portion of the first dam DAM1 and extend up to all, or at least a portion of, an upper portion of the secondary dam DAM2.
Referring to
A touch line TL can electrically connect, to the touch pad TP, the touch sensor metal TSM or the bridge metal BRG included in, or serving as, a touch electrode disposed in the display area DA.
One end or edge of the touch line TL may be electrically connected to the touch sensor metal TSM or the bridge metal BRG, and the other end or edge of the touch line TL may be electrically connected to the touch pad TP.
The touch line TL may run downward along the inclined surface SLP of the encapsulation layer ENCAP, run along the respective upper portions of the dams DAM1, DAM2, and extend up to the touch pad TP disposed outside of the dams (DAM1, DAM2).
Referring to
Further, herein, although a plurality of subpixels can be disposed in each of the one or more optical areas or the non-optical area of the display area of the display panel, for convenience of description, sometimes, embodiments or examples may be described based on a single subpixel. Thus, it should be noted that although embodiments or examples are described based on a single subpixel, a plurality of subpixels are equally applied to such embodiments or examples.
Circuit elements included in each of the plurality of subpixels SP arranged in the display panel 110 may be subject to degradation such as operating variations over time and usage, this leading the values of unique characteristics of the circuit elements to vary.
For example, each subpixel SP may include a light emitting element ED, and a driving transistor DRT, and the like as such circuit elements. For example, the characteristic values of the circuit elements may include a threshold voltage of the light emitting element ED, a threshold voltage and mobility of the driving transistor DRT, and the like.
In case the characteristic values of the circuit elements vary as the driven time of the circuit elements included in each of the plurality of subpixels SP increases, a luminance value L of each of the plurality of subpixels SP may vary, and thereby, a difference in luminance between the plurality of subpixels the SPs may occur. Such a luminance difference may cause a luminance non-uniformity of the display panel 110, and as a result, deteriorate image quality.
An increase in driven time of circuit elements included in the subpixel SP may mean that the amount of used time of the subpixel SP, (e.g., the usage of the subpixel SP), increases. For example, if the usage of a subpixel SP increases, the luminance value L of the subpixel SP may decrease.
As the usage of the subpixel SP increases, respective degradation levels of circuit elements in the subpixel SP may increase. If the degradation levels of the circuit elements in the subpixel SP increase, the luminance value L of the subpixel SP may decrease.
Referring to
For example, the initial luminance value L0 may be generated before the display device 100 is rolled out and stored in a memory (not shown) of the display device 100.
In another example, when the display device 100 is initially set after the display device 100 is rolled out, the initial luminance value L0 may be generated by the display device 100 and stored in a memory (not shown) of the display device 100. In the initial setting, the display device 100 can measure luminance values of the optical areas (OA1, OA2) using the optical electronic devices (11, 12), generate and store the measured luminance values as the initial luminance values L0 in the memory.
As the usage of the subpixel SP increases, degradation levels of circuit elements in the subpixel SP may increase, and thereby, a luminance value L of the subpixel SP may be less than the initial luminance value L0. Accordingly, a value L/L0 obtained by dividing the luminance value L of the subpixel SP by the initial luminance value L0 of the subpixel SP may be less than 1.
Here, the value L/L0 obtained by dividing the luminance value L of the subpixel SP by the initial luminance value L0 of the subpixel SP may be a luminance index of the subpixel SP. The luminance index L/L0 of the subpixel SP may represent the luminance value L of the subpixel SP with respect to the initial luminance value L0 of the subpixel SP. The luminance index L/L0 of the subpixel SP may be a value (a rational number) of 1 or less.
The luminance index L/L0 of the subpixel SP may descend (decrease) as the driving time for the subpixel SP increases. The luminance index L/L0 of the subpixel SP may descend as the amount of the used time of the subpixel SP increases. The luminance index L/L0 of the subpixel SP may descend as respective degradation of the circuit elements (e.g., the light emitting element ED, the driving transistor DRT, and the like) in the subpixel SP is developed, that is, as respective degradation levels increase.
Hereinafter, for convenience of description, “degradation of circuit elements in the subpixel SP” may be referred to as “degradation of the subpixel SP” or simply as “degradation”.
Embodiments of the present disclosure provide a real-time degradation compensation method and system for performing degradation monitoring in real time using the optical electronic devices (11, 12), optimizing degradation modeling based on the result of the monitoring, and compensating for the degradation in real time using the optimized degradation modeling.
Hereinafter, the real-time degradation compensation method and system according to embodiments of the present disclosure will be described in detail with references to accompanying figures.
Referring to
When it is determined that degradation monitoring is available or needed according to a predefined condition, the real-time degradation compensation system 1000 can control the one or more optical electronic devices (11, 12) to execute an image capturing operation or a sensing operation, and measure luminance of the one or more optical electronic devices (11, 12) based on a result of the execution of the image capturing operation or the sensing operation of the one or more optical electronic devices (11, 12). Herein, the process of measuring the luminance (luminance measuring process) may be referred to as “real-time degradation monitoring”.
The situation in which the degradation monitoring is available or needed may include a situation in which the display device is not used by a user or a situation in which an input related to screen setting from a user is detected.
The real-time degradation compensation system 1000 can predict at least on degradation level of at least one subpixel SP in the one or more optical areas (OA1, OA2) based on measurements of the respective luminance of the one or more optical areas (OA1, OA2). Herein, the process of predicting the degradation level of the subpixel SP (degradation prediction process) may also be referred to as “degradation modeling optimization process”.
The real-time degradation compensation system 1000 can compensate for respective degradation of subpixels included in each of the non-optical area NA and the one or more optical areas (OA1, OA2) based on the predicted at least one degradation level.
Referring to
The degradation monitoring situation determination circuit 1010 can be configured to determine whether degradation monitoring is available or needed.
The display control circuit 1020 can be configured to control so that an image cannot be displayed on the display panel responsive to determining degradation monitoring is available or needed.
The real-time degradation modeling circuit 1030 can be configured to control the one or more optical electronic devices (11, 12) to execute an image capturing operation or a sensing operation responsive to determining that the degradation monitoring is available or needed, and configured to predict degradation levels of subpixels in the one or more optical areas (OA1, OA2) based on the measured luminance of the one or more optical electronic devices (11, 12) through a result of the execution of the image capturing operation or the sensing operation.
The degradation compensator 1040 can be configured to compensate for the degradation of subpixels included in each of the non-optical area NA and the one or more optical areas (OA1, OA2) based on the predicted degradation levels.
Referring to
In another embodiment, at least one of the degradation monitoring situation determination circuit 1010, the display control circuit 1020, the real-time degradation modeling circuit 1030, and the degradation compensator 1040 may be included in, or integrated with, a host system 250 interlinking with the display controller 240.
Referring to
The sub-pixel usage calculator 1110 can be configured to calculate the usage of sub-pixels in one or more optical areas (OA1, OA2).
The luminance measuring device 1120 can be configured to measure respective luminance of the one or more optical areas (OA1, OA2) using a result of the execution of the image capturing operation or the sensing operation of the one or more optical electronic devices (11, 12).
The subpixel degradation predictor 1130 can be configured to predict degradation levels of the sub-pixels in the one or more optical areas (OA1, OA2) based on the calculated usage and the measured luminance.
The degradation modeling lookup table manager 1140 can be configured to manage, or update, a degradation modeling lookup table based on the predicted degradation levels.
In some embodiments, the real-time degradation compensation system 1000 of the display device 100 can perform degradation compensation based on luminance measured through the one or more optical areas (OA1, OA2) that at least partially overlap the one or more optical electronic devices (11, 12) using the one or more optical electronic devices (11, 12) located under, or at a lower portion of, the display panel 110.
More specifically, in some embodiments, the real-time degradation compensation system 1000 of the display device 100 can monitor information on respective degradation of subpixels disposed in the one or more optical areas (OA1, OA2) based on luminance measured through the one or more optical areas (OA1, OA2) using the one or more optical electronic devices (11, 12).
In some embodiments, the real-time degradation compensation system 1000 of the display device 100 can predict information on respective degradation of a plurality of sub-pixels SP disposed on the display panel 110 based on the degradation information obtained by monitoring subpixels disposed in the one or more optical areas (OA1, OA2), generate a real-time degradation modeling lookup table based on this, and perform degradation compensation based on the generated degradation modeling lookup table.
Among typical degradation compensation methods, an optical compensation method using a camera, etc. has been introduced, but such an optical compensation method has been used in the manufacturing process of the display device. In such a typical optical compensation method, since there is no way to apply the optical compensation method after a corresponding display device is manufactured and rolled out, therefore, accurate compensation for degradation developed after the display device has been rolled out cannot be provided.
In comparison with this, the display device 100 according to embodiments of the present disclosure can perform degradation compensation in real time, even in a situation where the display device 100 is used after having been rolled out, by monitoring degradation levels of the sub-pixels SP disposed in the one or more optical areas (OA1, OA2) using the one or more optical electronic devices (11, 12) that at least partially overlap the one or more optical areas (OA1, OA2) in the display area DA.
Referring to
The first optical electronic device 11 may be, for example, a camera for capturing objects or images in a front direction of the display panel 110 through the first optical area OA1.
Referring to
The second optical electronic device 12 may be, for example, a sensor such as a proximity sensor, an illuminance sensor, and/or the like. For example, the luminance sensor may be an illuminance sensor for detecting the brightness of external light transmitting through the second optical area OA2.
Referring to
Hereinafter, the real-time degradation compensation method performed by the real-time degradation compensation system 1000 of the display device 100 as briefly described above will be described in more detail.
The display device 100 according to embodiments of the present disclosure can include a display panel 110 for displaying images, one or more optical electronic devices (11, 12), a data driving circuit 220, and the like.
The display panel 110 can include a display area DA in which an image is displayed and a non-display area NDA located outside the display area DA.
The display area OA may include a plurality of sub-pixels SP and a plurality of light emitting areas EP corresponding to the plurality of sub-pixels SP.
For example, the one or more optical electronic devices (11, 12) may be located under, at a lower portion of, the display panel 110.
The data driving circuit 220 can output data voltages Vdata corresponding to image data Data input from the display controller 240 to a plurality of data lines DL disposed in the display panel 110.
The display area DA may include one or more optical areas (OA1, OA2) at least partially overlapping with the one or more optical electronic devices (11, 12), and a non-optical area NA located outside of the one or more optical areas (OA1, OA2).
The one or more optical areas (OA1, OA2) may include a plurality of first light emitting areas EA of a plurality of light emitting areas EP included in the entire display area DA, and may further include a plurality of transmission areas (TA1, TA2).
The non-optical area NA may include a plurality of second light emitting areas EA of the plurality of light emitting areas EP included in the entire display area DA.
The one or more optical electronic devices (11, 12) may be located under, or at a lower portion of, the display panel 110, and may overlap all, one or more, of the plurality of first light emitting areas EA in the one or more optical areas (OA1, OA2).
In some embodiments, the real-time degradation compensation system 1000 can perform a real-time degradation compensation operation when the display device 100 is not used by a user, or when an input related to screen setting such as image quality setting from a user is detected.
For example, during one of a first period in which the display device is not used by a user and a second period proceeded by an input related to screen setting from the user, the one or more optical electronic devices (11, 12) can be configured to perform an image capturing operation or a sensing operation through the one or more optical areas (OA1, OA2).
The one or more optical electronic devices (11, 12) may include, for example, one or more of an image capture device such as a camera (an image sensor), and/or the like, and a sensor such as a proximity sensor, an illuminance sensor, and/or the like. For example, the one or more optical electronic devices (11, 12) may include one or more of first and second optical electronic devices (11, 12).
In one embodiment, the first optical electronic device 11 may be a camera, and the second optical electronic device 12 may be a sensor such as a proximity sensor, an illuminance sensor, and/or the like. The camera can capture objects or images on the front surface of the first optical area OA1 by performing an image capturing operation using external light transmitting the first optical area OA1. The luminance sensor can perform the sensing operation using external light transmitting the first optical area OA1. For example, the luminance sensor may be an illuminance sensor for detecting the brightness of external light transmitting the second optical area OA2.
For example, the first period of the first period and the second period during which the real-time degradation compensation operation can be performed may be any one of a period in which the power of the display device 100 is turned off, a period in which the display device 100 is turned on, a period in which the display device 100 is in the lock screen state, and a period in which the display device 100 is in the standby mode state.
For example, the second period of the first period and the second period during which the real-time degradation compensation operation can be performed may be a period proceeded by an input related to a screen setting from a user for degradation compensation.
In some embodiments, to compensate for degradation in real time, the real-time degradation compensation system 100 of the display device 100 can store a degradation modeling lookup table LUT including information on an initial luminance value L0 in advance.
In some embodiments, to compensate for degradation in real time, the real-time degradation compensation system 100 of the display device 100 can perform real-time degradation modeling by monitoring (sensing) a degradation level in the current situation (S1410).
In some embodiments, the real-time degradation compensation system 1000 of the display device 100 can measure respective luminance of the one or more optical areas (OA1, OA2) using the one or more optical electronic devices (11, 12), and perform real-time degradation modeling based on the luminance data obtained through the measurement (S1410).
In some embodiments, in order to increase the accuracy of real-time degradation modeling, the real-time degradation compensation system 1000 of the display device 100 can perform the real-time degradation modeling by accumulating the usage of subpixels, and using the accumulated usage of subpixels together with the luminance data obtained through the measurement (S1410).
In some embodiments, the real-time degradation compensation system 1000 of the display device 100 can assess degradation levels (degradation degrees) of subpixels SP disposed in the one or more optical areas (OA1, OA2) by performing the real-time degradation modeling, and update a stored current degradation modeling lookup table that has been updated previously or set initially based on the assessed degradation levels (S1420). The degradation modeling lookup table may include, for example, information on degradation levels of one or more sub-pixels SP.
In some embodiments, the display device 100 may include an updated degradation modeling lookup table LUT changed after the image capturing operation or the sensing operation of the one or more optical electronic devices (11, 12) through the one or more optical areas (OA1, OA2) is performed.
In some embodiments, the real-time degradation compensation system 1000 of the display device 100 can perform degradation compensation using the updated degradation modeling lookup table LUT (S1430).
The degradation compensation can be executed by changing image data Data or data voltages Vdata for image display.
Accordingly, in the display device 100 according to embodiments of the present disclosure, image data Data or data voltages Vdata for image display can be changed after the image capturing operation or the sensing operation of the one or more optical electronic devices (11, 12) through the one or more optical areas (OA1, OA2) is performed.
In some embodiments, using the degradation modeling lookup table updated according to information obtained by monitoring degradation levels (degradation degrees) of subpixels SP disposed in the one or more optical areas (OA1, OA2), the real-time degradation compensation system 1000 of the display device 100 can compensate for respective degradation of the subpixels SP disposed in the one or more optical areas (OA1, OA2), and/or compensate for respective degradation of subpixels disposed in the non-optical area NA. For example, a result of the monitoring of degradation levels (degradation degrees) of subpixels SP disposed in the one or more optical areas (OA1, OA2) may represent degradation levels of subpixels disposed in the non-optical area NA.
In order to execute degradation compensation, the changed image data Data or the changed data voltages Vdata can be supplied to sub-pixels SP disposed in the non-optical area NA.
In another example, in order to execute degradation compensation, the changed image data Data or the changed data voltages Vdata can be supplied to sub-pixels SP disposed in the one or more optical areas (OA1, OA2).
In some embodiments, the real-time degradation compensation system 1000 can perform the degradation monitoring operation (degradation sensing operation) using the one or more optical areas (OA1, OA2) in a situation where a specific image is displayed.
For example, in the real-time degradation compensation system 1000, when the one or more optical electronic devices (11, 12) perform the image capturing operation or the sensing operation through the one or more optical areas (OA1, OA2), a specific image (e.g., a predetermined image) may be displayed in the whole of the display area DA or in the one or more optical areas (OA1, OA2).
The specific image may be an image representing when an initial luminance value L0 is obtained. For example, the specific image may be a monochromatic image of a specific color.
For example, at a first time (a first degradation monitoring time), the specific image displayed in the whole of the display area DA or in the one or more optical areas (OA1, OA2) may have a first luminance. For example, at a second time (a second degradation monitoring time) following the first time (the first degradation monitoring time), the specific image displayed in the whole of the display area DA or in the one or more optical areas (OA1, OA2) may have a second luminance. The second luminance may be lower than the first luminance due to degradation.
In some embodiments, the real-time degradation compensation system 1000 can perform the degradation monitoring operation (degradation sensing operation) using the one or more optical areas (OA1, OA2) in a dark environment.
Accordingly, when the one or more optical electronic devices (11, 12) perform the image capturing operation or the sensing operation through the one or more optical areas (OA1, OA2), a luminance of the environment of the display device 100 may be less than a threshold luminance. Here, the threshold luminance may be a maximum luminance value enabling accurate degradation monitoring (i.e., accurate luminance measurement).
Hereinafter, the real-time degradation compensation method according to embodiments of the present disclosure described above will be described in more detail with reference to
The display device 100 according to embodiments of the present disclosure can include a display panel 110 including a display area DA including a plurality of light emitting areas EP corresponding to a plurality of subpixels SP, and a non-display area NA located outside of the display area DA, one or more optical electronic devices (11, 12), and a data driving circuit configured to supply a data voltage corresponding to input image data to the display panel.
The display area DA may include one or more optical areas (OA1, OA2) at least partially overlapping with the one or more optical electronic devices (11, 12), and a non-optical area NA located outside of the one or more optical areas (OA1, OA2).
The one or more optical areas (OA1, OA2) may include a plurality of first light emitting areas EA of the plurality of light emitting areas EP and a plurality of transmission areas. The non-optical area NA may include a plurality of second light emitting areas EA of the plurality of light emitting areas EP
The one or more optical electronic devices (11, 12) may overlap all, one or more, of the plurality of first light emitting areas EA in the one or more optical areas (OA1, OA2).
Referring to
For example, in step S1510, to determine whether the current situation is a situation in which degradation monitoring is available or needed, the real-time degradation compensation system 1000 can determine whether the display device 100 is in a first period in which the display device 100 is not used by a user or a second period proceeded by an input related to screen setting from the user.
For example, in step S1560, in order for the real-time degradation compensation system 1000 to measure luminance through the one or more optical areas (OA1, OA2) using the one or more optical electronic devices (11, 12), the one or more optical electronic devices (11, 12) can perform the image capturing operation or the sensing operation through the one or more optical areas (OA1, OA2) during the first period or the second period, which is a period in which degradation monitoring is available.
For example, the first period of the first and second periods in which the degradation monitoring is available may be any one of a period in which the power of the display device 100 is turned off, a period in which the display device 100 is turned on, a period in which the display device 100 is in the lock screen state, and a period in which the display device 100 is in the standby mode state. The second period, which is a period in which the degradation monitoring is available, may be a period proceeded by an input from a user related to screen setting for degradation compensation.
Referring to
In step S1560, to measure luminance while the specific image is displayed on the whole of the display area DA or on one or more optical areas (OA1, OA2), the one or more optical electronic devices (11, 12) can perform the image capturing operation or the sensing operation through the one or more optical areas (OA1, OA2).
Referring to
Referring to
Referring to
Referring to
Hereinafter, the real-time degradation monitoring method according to embodiments of the present disclosure, the degradation modeling optimization process using a result of the real-time degradation monitoring, and a degradation compensation performed based on the degradation modeling optimization will be described in more detail with reference to
In some embodiments, the real-time degradation compensation system 1000 can perform real-time degradation monitoring by using usage of one or more subpixels and a measurement result of luminance together.
Referring to
Referring to
Referring to
Referring to
Referring to
The execution of the real-time degradation modeling may mean obtaining information on the predicted degradation levels of the sub-pixels SP of the display panel 110.
Referring to
Referring to
The current degradation graph 900 or the modified degradation graph 1700 may be graphs denoting luminance indexes of one or more sub-pixels SP according to the usage of the one or more sub-pixels. Here, a luminance index of a sub-pixel SP may be a value L/L0 obtained by dividing a measured luminance value L of the subpixel SP by an initial luminance value L0 of the subpixel SP. The luminance index L/L0 of the subpixel SP may be a value (a rational number) of 1 or less.
Referring to
According to this, the step S1660 of updating a current degradation modeling lookup table may proceed after the image capturing operation or the sensing operation of the one or more optical electronic devices (11, 12) through the one or more optical areas (OA1, OA2) is performed in the luminance measurement step S1560 in
Referring to
The display device 100 according to the embodiments described herein can perform the real-time degradation monitoring and degradation compensation by using one or more of the first optical electronic device 11 and the second optical electronic device 12.
The real-time degradation monitoring and degradation compensation method of the display device 100 according to the embodiments described herein can use a plurality of optical electronic devices. Accordingly, the display device 100 can include a plurality of optical areas overlapping the plurality of optical electronic devices in the display area DA of the display panel 110. This will be briefly described below with reference to
Referring to
Referring to
Referring to
As described above, when the three or more optical and electronic devices 1800 are present in several locations under, or at a lower portion of, the display panel 110, the real-time degradation compensation system 1000 can assess more accurately a degradation level in the display panel 110 by performing degradation monitoring using the three or more optical and electronic devices 1800. Accordingly, the performance of corresponding degradation compensation can be more improved.
According to the embodiments described herein, the display device 100 and the method of operating the display device 100 can be provided, the display device 100 being capable of monitoring the degradation of a subpixel in real time using one or more optical elements or devices (11, 12, 1800) even in a situation where the display device is used by a user, and capable of compensating for the degradation in real time in accordance with the result of the monitoring.
According to the embodiments described herein, the display device 100 and the method of operating the display device 100 can be provided, the display device 100 being capable of accurately compensating for the degradation of a subpixel in real time by performing degradation monitoring in real time using one or more optical electronic devices (11, 12, 1800) located under, or at a lower portion of, the display panel 110 and partially overlapping one or more optical areas (OA1, OA2, OA) included in the display area of the display panel 110.
The above description has been presented to enable any person skilled in the art to make and use the technical idea of the present invention, and has been provided in the context of a particular application and its requirements. Various modifications, additions and substitutions to the described embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other embodiments and applications without departing from the spirit and scope of the present invention. The above description and the accompanying drawings provide an example of the technical idea of the present invention for illustrative purposes only. That is, the disclosed embodiments are intended to illustrate the scope of the technical idea of the present invention. Thus, the scope of the present invention is not limited to the embodiments shown, but is to be accorded the widest scope consistent with the claims. The scope of protection of the present invention should be construed based on the following claims, and all technical ideas within the scope of equivalents thereof should be construed as being included within the scope of the present invention.
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