Claims
- 1. An apparatus for producing ions from a sample substance comprising:(a) an electrospray ion source, operated substantially at atmospheric pressure, a probe configured in said ion source, which produces ions from sample bearing solutions; (b) a sample holding tube comprising an electrospray tip, an inner bore and an exit end from which said sample substance is Electrosprayed, (c) said a sample holding tube comprising an electrospray tip is removably mounted in a holder, a. said a sample holding tube comprising an electrospray tip is clamped in said holder with a collet assembly, and b. a means for delivering ions into a vacuum region.
- 2. An apparatus for producing ions from a sample substance comprising:(a) an electrospray ion source, operated substantially at atmospheric pressure, a probe configured in said ion source, which produces ions from sample bearing solutions; (b) a sample holding tube comprising an electrospray tip, an inner bore and an exit end from which said sample substance is Electrosprayed, (c) said a sample holding tube comprising an electrospray tip is removably mounted in a holder, (d) said a sample holding tube comprising an electrospray tip and said holder assembly are configured to be removably mounted in said electrospray ion source, (e) said holder assembly can be installed into and removed from said electrospray ion source without turning off voltages applied to elements in said electrospray ion source, a. a user is not exposed to said voltages applied to elements in said electrospray ion source during said installation and removal of said holder assembly, and b. a means for delivering ions into a vacuum region.
- 3. An apparatus according to claim 2, wherein said electrospray tip is a disposable glass tip.
- 4. An apparatus according to claim 2, wherein said electrospray tip is a disposable glass tip with metal coating on the exterior.
- 5. An apparatus according to claim 2, wherein said electrospray tip is a disposable glass tip with wire for electrical contact in the interior.
- 6. An apparatus according to claim 2, wherein said electrospray tip is fused silica tube.
- 7. An apparatus according to claim 2, wherein said electrospray tip is fused silica tube with metal coating on the exterior.
- 8. An apparatus according to claim 2, wherein said electrospray tip is fused silica tube with wire for electrical contact in the interior.
- 9. An apparatus according to claim 2, wherein said electrospray tip is fused silica CE column tube.
- 10. An apparatus according to claim 2, wherein said electrospray tip is stainless steel tube.
- 11. An apparatus according to claim 2, means for delivering ions into a vacuum region is a capillary.
- 12. An apparatus for analyzing chemical species comprising:(a) an electrospray ion source, operated substantially at atmospheric pressure, a probe configured in said ion source, which produces ions from sample bearing solutions; (b) a sample holding tube comprising an electrospray tip, an inner bore and an exit end from which said sample substance is Electrosprayed, (c) said a sample holding tube comprising an electrospray tip is removably mounted in a holder, a. said a sample holding tube comprising an electrospray tip is clamped in said holder with a collet assembly, and b. a means for mass analyzing said ions produced.
- 13. An apparatus according to claim 12, wherein said means for mass analyzing said ions produced comprises a Time-Of-Flight mass spectrometer.
- 14. An apparatus according to claim 12, wherein said means for mass analyzing said ions produced comprises a Quadrupole mass spectrometer.
- 15. An apparatus according to claim 12, wherein said means for mass analyzing said ions produced comprises an Ion Trap mass spectrometer.
- 16. An apparatus according to claim 12, wherein said means for mass analyzing said ions produced comprises a Fourier Transform mass spectrometer.
- 17. An apparatus according to claim 12, wherein said means for mass analyzing said ions produced comprises a magnetic sector mass spectrometer.
- 18. An apparatus according to claim 12, wherein said means for mass analyzing said ions produced comprises a hybrid mass spectrometer.
- 19. An apparatus for analyzing chemical species comprising:(a) an electrospray ion source, operated substantially at atmospheric pressure, a probe configured in said ion source, which produces ions from sample bearing solutions; (b) a sample holding tube comprising an electrospray tip, an inner bore and an exit end from which said sample substance is Electrosprayed, (c) said sample holding tube comprising said electrospray tip is removably mounted in a holder, (d) said a sample holding tube comprising an electrospray tip is clamped in said holder with a collet assembly, a. said holder is configured with a seal so that gas pressure can be applied to said inner bore of said electrospray tip, and b. a means for mass analyzing said ions produced.
- 20. An apparatus according to claim 19, wherein said means for mass analyzing said ions produced comprises a Time-Of-Flight mass spectrometer.
- 21. An apparatus according to claim 19, wherein said means for mass analyzing said ions produced comprises a Quadrupole mass spectrometer.
- 22. An apparatus according to claim 19, wherein said means for mass analyzing said ions produced comprises an Ion Trap mass spectrometer.
- 23. An apparatus according to claim 19, wherein said means for mass analyzing said ions produced comprises a Fourier Transform mass spectrometer.
- 24. An apparatus according to claim 19, wherein said means for mass analyzing said ions produced comprises a magnetic sector mass spectrometer.
- 25. An apparatus according to claim 19, wherein said means for mass analyzing said ions produced comprises a hybrid mass spectrometer.
- 26. An apparatus for analyzing chemical species comprising:(a) an electrospray ion source, operated substantially at atmospheric pressure, a probe configured in said ion source, which produces ions from sample bearing solutions; (b) a sample holding tube comprising an electrospray tip, an inner bore and an exit end from which said sample substance is Electrosprayed, (c) said sample holding tube comprising said electrospray tip is removably mounted in a holder, (d) said a sample holding tube comprising an electrospray tip is clamped in said holder with a collet assembly, a. said holder is comprised of a means to supply gas through said collet assembly to said exit end of said electrospray tip, and b. a means for mass analyzing said ions produced.
- 27. An apparatus according to claim 26, wherein said means for mass analyzing said ions produced comprises a Time-Of-Flight mass spectrometer.
- 28. An apparatus according to claim 26, wherein said means for mass analyzing said ions produced comprises a Quadrupole mass spectrometer.
- 29. An apparatus according to claim 26, wherein said means for mass analyzing said ions produced comprises an Ion Trap mass spectrometer.
- 30. An apparatus according to claim 26, wherein said means for mass analyzing said ions produced comprises a Fourier Transform mass spectrometer.
- 31. An apparatus according to claim 26, wherein said means for mass analyzing said ions produced comprises a magnetic sector mass spectrometer.
- 32. An apparatus according to claim 26, wherein said means for mass analyzing said ions produced comprises a hybrid mass spectrometer.
- 33. An apparatus for analyzing chemical species comprising:(a) an electrospray ion source, operated substantially at atmospheric pressure, a probe configured in said ion source, which produces ions from sample bearing solutions; (b) a sample holding tube comprising an electrospray tip, an inner bore and an exit end from which said sample substance is Electrosprayed, (c) said a sample holding tube comprising an electrospray tip is removably mounted in a holder, (d) said a sample holding tube comprising an electrospray tip and said holder assembly are configured to be removably mounted in said electrospray ion source, (e) said holder assembly can be installed into and removed from said electrospray ion source without turning off voltages applied to elements in said electrospray ion source, a. a user is not exposed to said voltages applied to elements in said electrospray ion source during said installation and removal of said holder assembly, and b. a means for mass analyzing said ions produced.
- 34. An apparatus according to claim 33, wherein said means for mass analyzing said ions produced comprises a Time-Of-Flight mass spectrometer.
- 35. An apparatus according to claim 33, wherein said means for mass analyzing said ions produced comprises a Quadrupole mass spectrometer.
- 36. An apparatus according to claim 33, wherein said means for mass analyzing said ions produced comprises an Ion Trap mass spectrometer.
- 37. An apparatus according to claim 33, wherein said means for mass analyzing said ions produced comprises a Fourier Transform mass spectrometer.
- 38. An apparatus according to claim 33, wherein said means for mass analyzing said ions produced comprises a magnetic sector mass spectrometer.
- 39. An apparatus according to claim 33, wherein said means for mass analyzing said ions produced comprises a hybrid mass spectrometer.
- 40. A method for opening tips that are not pre-opened:a. pressuring closed tip with gas; b. immersing closed tip in vial of solution; c. pressing closed tip against vial bottom in a substantially perpendicular orientation until bubbles emanate from said tip.
- 41. A method according to claim 40, wherein said closed tip is glass closed tip.
- 42. A method according to claim 40, wherein said closed tip is metal coated.
- 43. A method according to claim 40, wherein said closed tip is un-coated.
- 44. A method for determining the quality of the tip prior to loading with sample:a. pressuring open tip with gas; b. immersing open tip in vial of solution; c. according to bubble size determine a qualitative size of tip opening.
- 45. A method according to claim 44, wherein said means open tip is glass open tip.
- 46. A method according to claim 44, wherein said means open tip is metal coated.
- 47. A method according to claim 44, wherein said means open tip is un-coated.
- 48. A method according to claim 44, wherein said means open tip is un-coated with wire inside.
- 49. A method for wetting the tips prior to loading sample:a. pressuring open tip with gas; b. immersing open tip in vial of solution.
- 50. A method according to claim 49, wherein said means open tip is glass open tip.
- 51. A method according to claim 49, wherein said means open tip is metal coated.
- 52. A method according to claim 49, wherein said means open tip is un-coated.
- 53. A method according to claim 49, wherein said means open tip is un-coated with wire inside.
- 54. An apparatus according to claim 2, wherein said electrospray tip is movable in the X, Y, and Z directions.
- 55. An apparatus according to claim 2, wherein said electrospray tip is directly inserted into said mounting without disrupting the voltage supplied to said electrospray ion source.
- 56. An apparatus according to claim 2, comprising means to prevent a user from being electrically harmed when said electrospray tip is removed.
RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser. No. 09/041,715 filed Mar. 13, 1998, now U.S. Pat. No. 6,127,680 which claims the priority of U.S. Provisional Application Ser. No. 60/040,599 filed Mar. 15, 1997. The present application claims all priority rights to those prior applications, whose disclosures are hereby fully incorporated herein by reference.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
5306412 |
Whitehouse et al. |
Apr 1994 |
A |
5788166 |
Valaskovic et al. |
Aug 1998 |
A |
6127680 |
Andrien, Jr. et al. |
Oct 2000 |
A |
Provisional Applications (1)
|
Number |
Date |
Country |
|
60/040599 |
Mar 1997 |
US |
Continuations (1)
|
Number |
Date |
Country |
Parent |
09/041715 |
Mar 1998 |
US |
Child |
09/632572 |
|
US |