DISTANCE MEASURING DEVICE AND METHOD FOR DETERMINING A DISTANCE

Abstract

A method for determining a distance between a distance measuring device and an object includes the steps of illuminating the object with a short light pulse and long light pulses, outputting a signal value Uref at the end of an integration gate with an invariable delay between the emission start point in time of the short light pulse and integration start point in time Δs, forming a convolution function fc:=U(τ) from the intensity of the light arriving on the photo element and Δs with a respective variable delay τ for each long light pulse between the emission start point in time of the long light pulses and the integration gate, the variable delays being different from each other to form the convolution function, identifying the delay τc in the convolution function which corresponds to Uref, and calculating the distance by using the delay τc in the convolution function.

Description

TECHNICAL FIELD

The invention relates to a distance measuring device and a method for determining a distance with the distance measuring device.

BACKGROUND

Distances can be measured between a measuring device and an object without a physical contact between the device and the object by optical methods. In these methods, the object is illuminated by the device and the light back-reflected from the object is then captured by a light detector of the device.

Distances can for example be determined by periodically modulating the light intensity which is emitted from the device and by measuring the phase difference between the emitted light and the back-reflected light arriving on the detector. However, due to the periodicity of the light intensity, this method results in an ambiguous distance measurement. Unambiguous distance measurements can be determined by measuring the time of flight between the emission of light and the arrival of the back-reflected light on the detector.

Conventional distance measurements are carried out by measuring a property of the light, in particular the intensity, as a function of time. Then a plot of the property versus the time is processed in order to obtain the time of flight. This processing can be computationally complicated and can therefore require a long time to be performed. If a distance measurement needs a long time to be performed, this can cause a reduction of the repetition rate for taking the distance measurements.

The precision of the conventional distance measurements is limited by the size of the time steps, with which the property of the light is measured. Also, for the conventional distance measurement, different reflectivities of the object can lead to different shapes of the plot. When processing a different plot, this can lead to a different distance, so that the distance depends on the reflectivity of the object, which further decreases the precision for the conventional distance measurements.

SUMMARY

It is an object of the invention to provide a distance measuring device and a method for measuring a distance with the distance measuring device, wherein the distance measurement is simple to perform whilst remaining precise.

The distance measuring device according to an aspect of the invention for measuring a distance between the distance measuring device and an object includes a light source configured to illuminate the object with light pulses having different durations, at least one photo element configured to capture the light pulses after being back-reflected from the object, a trigger generator for controlling the emission of the light pulses and for activating the photo element during a temporal integration gate having an integration start point in time Δ_s and an integration end point in time Δ_e, wherein the photo element is configured to output a signal value U at the end of the integration gate with the signal value U depending on the energy of the light arriving on the photo element during its activation, and wherein the trigger generator is configured to store a trigger scheme to activate the photo element and to control the emission of the light pulses such that at least one short light pulse with a duration T_p,s and a plurality of long light pulses with a duration T_p,l being longer than T_p,s are emitted, that an invariable delay between the emission start point in time of the short light pulse and the integration gate is such that Δ_tof and Δ_tof+T_p,s are between Δ_s and Δ_e to output a reference signal value U_ref, with Δ_tof being the first point in time when the light pulse arrives on the photo element, and that for each long light pulse a respective variable delay τ between the emission start point in time of the long light pulses and the integration gate is such that the variable delays τ are different from each other in order to form a convolution function f_c:=U(τ) out of the intensity of the light arriving on the photo element and the integration gate, and a processing unit configured to identify the delay τ_c in the convolution function which corresponds to U_ref and to calculate the distance by using the delay τ_c.

The method according to an aspect of the invention for determining a distance between the distance measuring device and an object by the distance measuring device includes the steps of: a) illuminating the object with at least one short light pulse with the duration T_p,s; b) illuminating the object with a plurality of long light pulses with the duration T_p,l; c) outputting a signal value U_ref at the end of the integration gate, wherein an invariable delay between the emission start point in time of the short light pulse and the integration gate is such that Δ_tof and Δ_tof+T_p,s are between Δ_s and Δ_e; d) forming a convolution function f_c:=U(τ) out of the intensity of the light arriving on the photo element and the integration gate with a respective variable delay τ for each long light pulse between the emission start point in time of the long light pulses and the integration gate, wherein the variable delays are different from each other in order to form the convolution function f_c; e) identifying the delay τ_c in the convolution function which corresponds to U_ref; and f) calculating the distance by using the delay τ_c in the convolution function as identified in step f).

The convolution function f_c can be described by the following equation:

f _c(τ)=∫_−∞^+∞I(t)*g(t−τ)dt  (equation 1),

wherein I(t) is the intensity of the light of the long light pulses arriving on the photo element and g(t) is the temporal integration gate. For early variable delays τ with no overlap of the integration gate and the long light pulses arriving on the photo element, the convolution function has a stationary value. The function value begins to change as soon as the delay τ is so long that the integration gate and the long light pulses begin to overlap. The convolution function includes an extreme value at delays τ with a maximum overlap of the integration gate and the long light pulses. The extreme value in the convolution function is a single point if the long light pulses and the integration gate have the same durations and is a plateau that becomes broader for an increasing difference in the durations of the long light pulses and the integration gate. By increasing the delay τ from the extreme value further, the function value develops back to the stationary value. The delay τ_c in convolution function f_c, which corresponds to the reference signal value U_ref, is the intersection of the convolution function f_c and the function U=U_ref. The intersection can, for example, be identified by forming the inverse function τ(U) of the convolution function f_c and then forming τ_c(U_ref), which is a mathematically simple method. Alternatively, the intersection can be identified by parametrizing the convolution function prior to measurement and by performing fits to the measured data before extracting the actual intersection analytically from the fitted convolution function and the function U=U_ref. By performing the fit, it is possible to assess time steps between the measured data points, which provides an increased precision in the measurement of the delay τ_c. By obtaining the increased precision for τ_c, one also obtains an increasing precision for the distance. By identifying the intersection of the function U=U_ref and the convolution function, it is also achieved that different reflectivities of the object are compensated.

The convolution function has two delays τ_c, at which f_c=U_ref, one on each side of the extreme value. It is conceivable to form the convolution function only on one side of the extreme value and to identify only one delay τ_c or it is conceivable to form the convolution function on both sides of the extreme value and to identify both delays τ_c. If both delays are identified, it is then possible to calculate a distance for each delay τ_c, and it is then possible to form the average of both distances, which increases the accuracy of the distance measurement.

In order to arrange the integration gates with respect to the emission start point in time a distance range in which the object can be located is predetermined. From the distance range, the invariable delay can be chosen such that Δ_tof and Δ_tof+T_p,s are between Δ_s and Δ_e for all possible distances of the distance range. Also, the invariable delays can be chosen such that the convolution function is formed.

According to an aspect of the invention, the light source includes light emitting diodes, VCSELs (vertical-cavity surface-emitting lasers) and/or lasers that are in particular configured to emit light in the visible and/or infrared spectral region. According to an aspect of the invention, the distance measuring device includes a CCD chip with an image intensifier and/or a CMOS chip that includes the at least one photo element.

According to a further aspect of the invention, the trigger scheme is arranged to control the emission of the light pulses such that the object is illuminated alternatingly with the short light pulses and the long light pulses. Since the short light pulses are used for the reference signal value U_ref, a possible long-time drift in laser intensity would affect both the convolution function f_c and U_ref in the same manner, so that the long-time drift would be compensated by the alternating short light pulses and long light pulses. According to an aspect of the invention, the ratio of the number of the short light pulses to the number of the long light pulses is in a range of from 0.2 to 0.4. Surprisingly, experimental results showed that this ratio resulted in the highest precision for the distances.

According to yet another aspect of the invention, the trigger scheme is configured to control the emission of the light pulses such that the intensity of the light pulses rises from an intensity I₁ to an intensity I₂ being higher than I₁ at the emission start point in time and drops back to I₁ after the durations T_p,s, and T_p,l from the emission start point in time, respectively, wherein T_p,s, and T_p,l are in the order of tens of nanoseconds. Here, the extreme value of the convolution function is a maximum. Alternatively, the trigger scheme is arranged to control the emission of the light pulses such that the intensity of the light pulses drops from an intensity I₂ to an intensity I₁ being lower than I₂ at the emission start point in time and rises back to I₂ after the durations T_p,s, and T_p,l from the emission start point in time, respectively, wherein T_p,s, and T_p,l are in the order of tens of nanoseconds. Here, the extreme value of the convolution function is a minimum. By using the light pulses that include the intensity drop at the emission start point in time, it is advantageously possible with the distance measuring device to both measure a distance and to illuminate the object. The illumination of the object can be such that the object becomes visible for a human eye or for another vision system. Furthermore, it is not required to use an additional illumination system that would interfere with the distance measurement, whereby the precision for the distance measurement is high.

According to an aspect of the invention, in steps a) and b) the object is illuminated alternatingly with the short light pulses and the long light pulses. According to another aspect of the invention, the ratio of the number of the short light pulses to the number of the long light pulses is in a range of from 0.2 to 0.4.

According to yet another aspect of the invention, in step d) the convolution function is fitted to the plot of the signal values U_n versus the variable delay τ, wherein the convolution function f_c includes a linear function. By using the fit, the convolution function f_c can be determined with an arbitrary step size, advantageously increasing the precision of the distance measurement independent from the number of different delays τ between the emission start point in time of the long light pulses and the integration gate. Therefore, the distance can also be determined with an arbitrary step size. Since the delay τ_c in the convolution function, which corresponds to U_ref, is identified, it is advantageously sufficient to fit only one linear function to the plot, which is computationally simple. This is not the case if for example an extreme value of the convolution function is identified. For identifying the extrema, a respective linear function on both sides of the extreme value has to be fitted to the plot and the intersection of both linear functions has to be calculated, which is computationally difficult.

According to an aspect of the invention, in step d) the convolution function f_c is formed by first forming a coarse convolution function f_c,coarse with coarse steps of the different variable delays τ_coarse, by subsequently identifying in the coarse convolution function f_c,coarse a coarse delay τ_c,coarse that corresponds to U_ref and the two variable delays τ_l,coarse and τ_r,coarse neighbouring τ_c,coarse, and by then forming the convolution function f_c between τ_l,coarse and τ_r,coarse with fine steps having a shorter step size than the coarse steps. This provides an efficient method for determining the distance with a high precision.

The intensity of the light pulses preferably rises from an intensity I₁ to an intensity I₂, the intensity I₂ being higher than I₁ at the emission start point in time and drops back to I₁ after the durations T_p,s, and T_p,l from the emission start point in time, respectively, wherein T_p,s, and T_p,l are in the order of tens of nanoseconds. Alternatively, the intensity of the light pulses preferably drops from an intensity I₂ to an intensity I₁, the intensity I₁ being lower than I₂ at the emission start point in time and the intensity rises back to I₂ after the durations T_p,s, and T_pl from the emission start point in time, respectively, wherein T_p,s, and T_p,l are in the order of tens of nanoseconds.

According to a further aspect of the invention, in step e) the average over a plurality of reference signal values U_ref is used for identifying τ_c, in particular over all the signal values U_ref. This results in a high precision determination for the signal values U_ref and therefore also in a high precision determination for the distance.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention will now be described with reference to the drawings wherein:

FIG. 1 shows a schematic cross section through a distance measuring device,

FIG. 2 shows temporal profile diagrams with integration gates and intensities of light pulses, and

FIG. 3 shows a section of a convolution function.

DESCRIPTION OF EXEMPLARY EMBODIMENTS

FIG. 1 shows a distance measuring device 1. The distance measuring device 1 includes a light source 2, a photo element 3, a trigger generator 4, a memory unit 5 and a processing unit 6. The light source 2 includes light emitting diodes, VCSELs (vertical-cavity surface-emitting lasers) and/or lasers, wherein the light emitting diodes, VCSELs and/or the lasers are configured to emit light in the visible and/or infrared spectral region. The distance measuring device 1 includes a CCD chip with an image intensifier and/or a CMOS chip that includes the at least one photo element 3 and at least one condenser that can be discharged via a photodiode. The trigger generator 4 provides an activation signal 12 for controlling the emission of the light source 2 and an activation signal 13 for activating the photo element 3 during a temporal integration gate 21. The CCD chip is activated by switching on the image intensifier and the CMOS chip is activated by closing a switch in the circuit of the condenser and the photodiode which allows that the condenser is discharged via the photodiode. The photo element 3 is configured to output a signal value U at the end of the integration gate 21, wherein the signal value U depends on the energy of the light arriving on the photo element during its activation. The signal value U is read out in a readout operation 14 and stored in the memory unit 5. The memory unit 5 is configured to store a multitude of signal values U. The multitude of the signal values U is then processed by the processing unit 6 in a processing operation 15 in order to determine a distance between the distance measuring device 1 and the object 9.

Detection optics 8 are arranged in front of the photo element 3 in order to image a field of view 11 onto the photo element 3. Illumination optics 7 are arranged in front of the light source 2 in order to shape the light emitted by the light source 2 such that an illumination area 10 can be illuminated by the light source 2. The illumination area 10 and the field of view 11 are shaped such that the field of view 11 is substantially completely covered by the illumination area 10. The distance measuring device 1 is configured such that the light emitted by the light source 2 impinges onto the object 9 located within the field of view 11, and arrives on the photo element 3 after being back-reflected from the object 9. The illumination optics 7 and the detection optics 8 are preferably respective lenses. It is also possible to use a single lens for both the illumination optics 7 and the detection optics 8.

In FIG. 2, three temporal profile diagrams are shown, wherein an intensity 16 and a gate 17 is plotted versus time 18. The first temporal profile diagram is a plot of the intensity of the emitted light pulses 19 versus the time 18, the second temporal profile time diagram is a plot of the intensity of the light pulses 20 arriving on the photo element 3 versus the time 18, and the third temporal profile diagram is a plot of the integration gate 21 versus the time 18. The trigger generator 4 controls the emission of the light source 2 such that a plurality of short light pulses 23 having a first duration T_p,s and a plurality of long light pulses 24 having a second duration T_p,l is emitted, wherein T_p,s<T_p,l. The light pulses 23, 24 in FIG. 2 are such that at an emission start point in time of the light pulses 23, 24, their intensity is switched from I₁ to I₂, wherein I₂>I₁. After the durations T_p,s, and T_p,l from the emission start point in time, respectively, the intensity of the light pulses 23, 24 is switched back to I₁. In another exemplary embodiment, the intensity of the light pulses 23, 24 is switched at the emission start point in time of the light pulses 23, 24 from I₂ to I₁ and after the durations T_p,s, and T_p,l from the emission start point in time, respectively, back to I₂, wherein I₂>I₁. In both exemplary embodiments, I₁, and I₂, respectively, are the same for the short light pulses 23 and the long light pulses 24.

FIG. 2 shows that one respective short light pulse 23 and one respective long light pulse 24 are emitted alternatingly. In another exemplary embodiment, one respective short light pulse 23 and three respective consecutive long light pulses 24 are emitted alternatingly, so that the ratio of the number of the short light pulses 23 to the number of the long light pulses 24 is ⅓. As shown in FIG. 2, after a duration Δ_tof from the emission start point in time, the light pulses 23, 24 begin to arrive on the photo element 3. The integration gates 21 have or add an invariable delay to each of the emission start points in time of the short light pulses 23, wherein the invariable delay is chosen such that the short light pulses 23 arriving on the photo element 3 are completely captured within the integration gate 21. The integration gates have or add a variable delay τ to each of the emission start points in time of the long light pulses 24, wherein the variable delay τ is varied such that a convolution function f_c:=U(τ) is formed out of the intensity of the light of the long light pulses 20, 24 arriving on the photo element 3 and the integration gate 21. The convolution function f_c can mathematically be described by equation 1.

In FIG. 2, the variable delay τ is varied by choosing an invariable integration start point in time Δ_s and an invariable integration end point in time Δ_e of the integration gates 21 from a start point in time 22 as well as by choosing a variable delay Δ_n of the emission start point in time of the long light pulses 24 to the start point in time 22, wherein Δ_n is the delay for the n-th light pulse 23, 24 and Δ_n is different for each long light pulse 24. It is also conceivable to leave the delay from the emission start point in time of the long light pulses 24 to the start point in time 22 constant as well as to vary the integration start point in time Δ_s and the integration end point in time Δ_e. The start point in time 22 is chosen such that it coincides with Δ_s of the preceding integration gate 21. But it is also conceivable to choose any other point in time for the start point in time 22.

In order to achieve that each short light pulse 23 is completely within the integration gates 21 the invariable delay Δ_r of the emission start point in time of the short light pulses 23 from the start point in time 22 is chosen such that Δ_r+Δ_tof and Δ_r+Δ_tof+T_p,s are between Δ_s and Δ_e. Furthermore, it is required that the duration of the short light pulses T_p,s are shorter than the duration |Δ_e-Δ_s| of the integration gates 21: T_p,s<|Δ_e-Δ_s|. The duration |Δ_s-Δ_e| of the integration gates 21 is the same for both the short light pulses 23 and the long light pulses 24.

The hatched areas in FIG. 2 are proportional to the energy of the light arriving on the photo element 3 during its activation. A reference signal value U_ref which is the average of all the signal values being output at the end of the integration gates 21 for the short light pulses 23 is determined. For each of the long light pulses 24 a respective signal value U is determined.

FIG. 3 illustrates the formation of the convolution function f_c and how the convolution function f_c is evaluated in order to determine the distance. For forming the convolution function f_c of FIG. 3 the light pulses 23, 24 and integrations gates 21 according to FIG. 2 were used. FIG. 3 shows a plot of the signal values U determined at the end of the integration gates 21 for the long light pulses 24 versus the variable delay τ. In this plot, the signal values U were taken only for delays τ that correspond to shorter delays than a delay τ_max, wherein τ_max corresponds to a delay having a maximum overlap of the long light pulses 24 and the integration gate 21 and corresponds to a maximum in convolution function f_c. The convolution function f_c includes a linear function 29 fitted to the plot of U versus τ. After fitting the linear function 29, a delay τ_c in the linear function 29 is identified which corresponds to U_ref. τ_c corresponds to the intersection 30 of the linear function 29 with the function U=U_ref. For τ_c in FIG. 3, it is: τ_c+T_p,s=Δ_tof+T_p,l, whereby:

Δ_tof=τ_c+T_p,s−T_p,l  (equation 2).

In case that the signal values U were taken for delays τ that correspond to longer delays, the delay τ_max is: τ_c+(Δ_e-Δ_s)=Δ_tof+T_p,s, whereby:

Δ_tof=τ_c+(Δ_e−Δ_s)−T_p,s  (equation 3).

For both cases, the distance r between the distance measuring device and the object is then calculated by:

r=0.5*c*Δ_tof  (equation 4),

wherein c is the speed of light in the medium in which the distance measurement is carried out.

It is conceivable that the convolution function f_c is formed by first forming a coarse convolution function f_c,coarse with coarse steps of the different variable delays τ_coarse, subsequently identifying in the coarse convolution function f_c,coarse a coarse delay τ_c,coarse that corresponds to U_ref and the two variable delays τ_l,coarse and τ_r,coarse neighbouring τ_c,coarse, and then forming the convolution function f_c between τ_l,coarse and τ_r,coarse with fine steps having a shorter step size than the coarse steps.

It is understood that the foregoing description is that of the exemplary embodiments of the invention and that various changes and modifications may be made thereto without departing from the spirit and scope of the invention as defined in the appended claims.

LIST OF REFERENCE NUMERALS

• 1 distance measuring device
• 2 light source
• 3 photo element
• 4 trigger generator
• 5 memory unit
• 6 processing unit
• 7 illumination optics
• 8 detection optics
• 9 object
• 10 illumination area
• 11 field of view
• 12 activation signal for light source
• 13 activation signal for photo element
• 14 readout operation
• 15 processing operation
• 16 intensity
• 17 gate
• 18 time
• 19 intensity of emitted light pulses
• 20 intensity of light pulses arriving on the photo element
• 21 temporal integration gates
• 22 start point in time
• 23 short light pulse
• 24 long light pulse
• 29 linear function
• 30 intersection
• Δ_r fixed delay
• Δ₀, Δ₂, Δ₄, Δ₆ variable delays
• Δ_tof time of flight
• T_p,s duration of short light pulse
• T_p,l duration of long light pulse
• Δ_s integration start point in time
• Δ_e integration end point in time
• U signal value
• U_ref reference signal value
• I₁ lower intensity
• I₂ higher intensity

Claims

1. A distance measuring device for measuring a distance between the distance measuring device and an object, the distance measuring device comprising: a light source configured to illuminate the object with light pulses, the light pulses having different durations, respectively;at least one photo element configured to capture the light pulses after being back-reflected from the object;a trigger generator configured for controlling an emission of the light pulses and for activating the at least one photo element during a temporal integration gate;the temporal integration gate having an integration start point in time Δs and an integration end point in time Δe;the at least one photo element being configured to output a signal value U at an end of the temporal integration gate;the signal value U depending on an energy of light arriving on the at least one photo element when the at least one photo element is activated;the trigger generator being configured to store a trigger scheme to control the emission of the light pulses and to activate the at least one photo element to: emit at least one short light pulse with a first duration Tp,s and a plurality of long light pulses with a second duration Tp,l, the second duration Tp,l being longer than the first duration Tp,s;define an invariable delay between an emission start point in time of the at least one short light pulse and the integration gate by a time of flight Δtof to output a reference signal value Uref, the time of flight Δtof being a first point in time when the at least one short light pulse arrives on the at least one photo element, and a sum of the time of flight and the first duration Δtof+Tp,s being a time between the integration start point in time Δs and the integration end point in time Δe; anddefine respective variable delays τ for each of the plurality of long light pulses between an emission start point in time of the long light pulses and the integration gate, the respective variable delays τ being different from each other to define a convolution function fc:=U(τ) from an intensity of the light arriving on the at least one photo element and the integration gate; anda processing unit configured to: identify a convolution delay τc in the convolution function which corresponds to the reference signal value Uref; andcalculate the distance based on the convolution delay τc.

2. The distance measuring device of claim 1, wherein the light source includes at least one of light emitting diodes, vertical-cavity surface-emitting lasers (VCSELs) and lasers that are configured to emit the light in at least one of a visible spectral region and an infrared spectral region.

3. The distance measuring device of claim 1, further comprising a CCD chip including at least one of an image intensifier and a CMOS chip, the CMOS chip including the at least one photo element.

4. The distance measuring device of claim 1, wherein the trigger scheme controls the emission of the light pulses to illuminate the object alternatingly with the short light pulses and the long light pulses.

5. The distance measuring device of claim 4, wherein a ratio of a number of the short light pulses to a number of the long light pulses is in a range of from 0.2 to 0.4.

6. The distance measuring device according of claim 1, wherein: the trigger scheme controls the emission of the light pulses to raise the intensity of the light pulses from a first intensity I1 to a second intensity I2, the second intensity I2 being higher than the first intensity I1 at the emission start point in time and to drop back to the first intensity I1 after the first duration Tp,s and the second duration Tp,l from the emission start point in time, respectively, andthe first duration Tp,s and the second duration Tp,l are in an order of tens of nanoseconds.

7. The distance measuring device of claim 1, wherein: the trigger scheme is configured to control the emission of the light pulses to drop the intensity of the light pulses from a second intensity I2 to a first intensity I1, the first intensity I1 being lower than the second intensity I2 at the emission start point in time, and to raise the intensity of the light pulses back to the second intensity I2 after the first duration Tp,s and the second duration Tp,l from the emission start point in time, respectively, andthe first duration Tp,s and the second duration Tp,l are in an order of tens of nanoseconds.

8. A method for determining a distance between a distance measuring device and an object, the distance measuring device including a light source configured to illuminate the object with light pulses, the light pulses having different durations, respectively, at least one photo element configured to capture the light pulses after being back-reflected from the object, a trigger generator configured for controlling an emission of the light pulses and for activating the at least one photo element during a temporal integration gate, the temporal integration gate having an integration start point in time Δs and an integration end point in time Δe, the at least one photo element being configured to output a signal value U at an end of the temporal integration gate, the signal value U depending on an energy of light arriving on the at least one photo element when the at least one photo element is activated, the trigger generator being configured to store a trigger scheme to control the emission of the light pulses and to activate the at least one photo element to: emit at least one short light pulse with a first duration Tp,s and a plurality of long light pulses with a second duration Tp,l, the second duration Tp,l being longer than the first duration Tp,s, define an invariable delay between an emission start point in time of the at least one short light pulse and the integration gate by a time of flight Δtof to output a reference signal value Uref, the time of flight Δtof being a first point in time when the at least one short light pulse arrives on the at least one photo element, and a sum of the time of flight and the first duration Δtof+Tp,s being a time between the integration start point in time Δs and the integration end point in time Δe, and define respective variable delays τ for each of the plurality of long light pulses between an emission start point in time of the long light pulses and the integration gate, the respective variable delays τ being different from each other to define a convolution function fc:=U(τ) from an intensity of the light arriving on the at least one photo element and the integration gate, and a processing unit configured to: identify a convolution delay τc in the convolution function which corresponds to the reference signal value Uref; and calculate the distance based on the convolution delay τc., the method comprising the steps of: a) illuminating the object with the at least one short light pulse having the first duration Tp,s;b) illuminating the object with the plurality of long light pulses having the second duration Tp,l;c) outputting the reference signal value Uref at the end of the integration gate, the invariable delay between the emission start point in time of the at least one short light pulse and the integration start point in time Δs being defined by the time of flight Δtof, and the sum of the time of flight and the first duration Δtof+Tp,s being the time between the integration start point in time Δs and the integration end point in time Δe;d) defining the convolution function fc:=U(τ) from the intensity of the light arriving on the at least one photo element and the integration gate with the respective variable delay τ for each of the long light pulses between the emission start point in time of the long light pulses and the integration end point in time Δs, the variable delays being different from each other to define the convolution function;e) identifying the convolution delay τc in the convolution function which corresponds to the reference signal value Uref; andf) calculating the distance by using the convolution delay τc in the convolution function as identified in step e).

9. The method of claim 8, wherein in steps a) and b), the object is illuminated alternatingly with the at least one short light pulse and the plurality of long light pulses.

10. The method of claim 9, wherein a ratio of a number of the short light pulses to a number of the long light pulses is in a range of from 0.2 to 0.4.

11. The method of claim 8, wherein: in step d), the convolution function is fitted to the plot of the signal values Un versus the variable delay τ, andthe convolution function fc is a linear function.

12. The method of claim 8, wherein in step d), the convolution function fc is defined by first forming a coarse convolution function fc,coarse with coarse steps of different variable delays τcoarse, subsequently identifying in the coarse convolution function fc,coarse, a coarse delay τc,coarse that corresponds to the reference signal value Uref and the two variable delays τl,coarse and τr,coarse neighbouring τc,coarse, and then forming the convolution function fc between τl,coarse and τr,coarse with fine steps having a step size that is shorter than a step size of the coarse steps.

13. The method of claim 8, further comprising the steps of: raising the intensity of the light pulses from a first intensity I1 to a second intensity I2, the second intensity I2 being higher than the first intensity I1 at the emission start point in time; anddropping back to the first intensity I1 after the first and second durations Tp,s, and Tp,lfrom the emission start point in time, respectively, the first and second durations Tp,s, and Tp,l being in an order of tens of nanoseconds.

14. The method of claim 8, further comprising the steps of: dropping the intensity of the light pulses from a second intensity I2 to a first intensity I1, the first intensity being lower than the second intensity I2 at the emission start point in time; andraising the intensity back to the second intensity I2 after the first and second durations Tp,s, and Tp,l from the emission start point in time, respectively,wherein the first and second durations Tp,s, and Tp,l are in an order of tens of nanoseconds.

15. The method of claim 8, wherein in step e), an average over a plurality of reference signal values Uref is utilized for identifying the convolution delay τc.

16. The method of claim 8, wherein in step e), an average over all of reference signal values Uref is utilized for identifying the convolution delay τc.