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G01S7/4865
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PHYSICS
G01
Measuring instruments
G01S
RADIO DIRECTION-FINDING RADIO NAVIGATION DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES ANALOGOUS ARRANGEMENTS USING OTHER WAVES
G01S7/00
Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
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G01S7/4865
Details of time delay measurement
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Patents Grants
last 30 patents
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Patent Grant
Master-oscillator power-amplifier (MOPA) light source with optical...
Patent number
12,228,650
Issue date
Feb 18, 2025
Luminar Technologies, Inc.
Joseph G. LaChapelle
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method for processing data provided by a lidar and associated computer
Patent number
12,228,651
Issue date
Feb 18, 2025
CONTINENTAL AUTONOMOUS MOBILITY GERMANY GMBH
Alexandre Bourdeu
G01 - MEASURING TESTING
Information
Patent Grant
Rangefinder, rangefinding system, and rangefinding method
Patent number
12,228,684
Issue date
Feb 18, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Kensei Jo
G01 - MEASURING TESTING
Information
Patent Grant
Time of flight apparatus and method
Patent number
12,222,455
Issue date
Feb 11, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Manuel Amaya-Benitez
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR system design to mitigate LIDAR cross-talk
Patent number
12,222,457
Issue date
Feb 11, 2025
AURORA OPERATIONS, INC.
Soren Juelsgaard
G01 - MEASURING TESTING
Information
Patent Grant
LiDAR device
Patent number
12,210,125
Issue date
Jan 28, 2025
Samsung Electronics Co., Ltd.
Jungwoo Kim
G01 - MEASURING TESTING
Information
Patent Grant
System and method for entangled state identification using metadata
Patent number
12,206,459
Issue date
Jan 21, 2025
Qubit Moving and Storage, LLC
Gary Vacon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated device for temporal binning of received photons
Patent number
12,203,854
Issue date
Jan 21, 2025
Quantum-Si Incorporated
Jonathan M. Rothberg
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Detection device, detection system, detection method, and storage m...
Patent number
12,203,744
Issue date
Jan 21, 2025
Nikon Corporation
Yoshihiro Nakagawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light receiving device and distance measuring device
Patent number
12,204,024
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Yasuhiro Shinozuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Safety laser scanner and related method for adjusting distance meas...
Patent number
12,204,027
Issue date
Jan 21, 2025
Datalogic IP Tech S.r.l.
Salvatore Valerio Cani
G01 - MEASURING TESTING
Information
Patent Grant
Distance detection device
Patent number
12,196,855
Issue date
Jan 14, 2025
SZ DJI Technology Co., Ltd
Huai Huang
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR signal acquisition
Patent number
12,196,889
Issue date
Jan 14, 2025
VELODYNE LIDAR USA, INC.
David S. Hall
G01 - MEASURING TESTING
Information
Patent Grant
Underwater mono-static laser imaging
Patent number
12,196,861
Issue date
Jan 14, 2025
Raytheon Company
Matthew D. Thoren
G01 - MEASURING TESTING
Information
Patent Grant
Distance image acquisition apparatus and distance image acquisition...
Patent number
12,189,031
Issue date
Jan 7, 2025
FUJIFILM Corporation
Tomonori Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Processing system for LIDAR measurements
Patent number
12,189,038
Issue date
Jan 7, 2025
Ouster, Inc.
Angus Pacala
G01 - MEASURING TESTING
Information
Patent Grant
Optical distance measuring device
Patent number
12,189,057
Issue date
Jan 7, 2025
Denso Corporation
Noriyuki Ozaki
G01 - MEASURING TESTING
Information
Patent Grant
Stacked filter assembly for optical integrated circuit package with...
Patent number
12,189,064
Issue date
Jan 7, 2025
STMICROELECTRONICS INTERNATIONAL N.V.
Colin Campbell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Distance measuring device, camera, and method for adjusting drive o...
Patent number
12,181,609
Issue date
Dec 31, 2024
TOPPAN Holdings Inc.
Masanori Nagase
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight to distance calculator
Patent number
12,181,611
Issue date
Dec 31, 2024
ams International AG
Thomas Jessenig
G01 - MEASURING TESTING
Information
Patent Grant
High contrast grating for highly reflective mems surface for LiDAR
Patent number
12,174,316
Issue date
Dec 24, 2024
BEIJING VOYAGER TECHNOLOGY CO., LTD.
Yue Lu
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive coding for lidar systems
Patent number
12,169,254
Issue date
Dec 17, 2024
HESAI TECHNOLOGY CO., LTD.
Xuezhou Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive processing in time of flight imaging
Patent number
12,164,035
Issue date
Dec 10, 2024
Microsoft Technology Licensing, LLC
Sergio Ortiz Egea
G01 - MEASURING TESTING
Information
Patent Grant
Time of flight sensors with light directing elements
Patent number
12,164,062
Issue date
Dec 10, 2024
ams International AG
Miguel Bruno Vaello Paños
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Emitters behind display
Patent number
12,158,546
Issue date
Dec 3, 2024
Apple Inc.
Arnaud Laflaquiere
G01 - MEASURING TESTING
Information
Patent Grant
Light-receiving element, solid-state imaging device, and ranging de...
Patent number
12,159,888
Issue date
Dec 3, 2024
SONY SEMICONDCUTOR SOLUTIONS CORPORATION
Takeshi Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Accurate photo detector measurements for LIDAR
Patent number
12,153,134
Issue date
Nov 26, 2024
Ouster, Inc.
Angus Pacala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ranging systems of a dual optical frequency comb time-of-flight man...
Patent number
12,153,167
Issue date
Nov 26, 2024
University of Electronic Science and Technology of China
Teng Tan
G01 - MEASURING TESTING
Information
Patent Grant
Gated imaging apparatus, system and method
Patent number
12,146,960
Issue date
Nov 19, 2024
BRIGHTWAY VISION LTD.
Ezri Sonn
G01 - MEASURING TESTING
Information
Patent Grant
Space-based LiDAR system
Patent number
12,146,990
Issue date
Nov 19, 2024
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Nathaniel Gill
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LASER DISTANCE-MEASURING RECEIVING CHIP AND ITS CONFIGURATION METHO...
Publication number
20250060461
Publication date
Feb 20, 2025
SHENZHEN ADAPS PHOTONICS TECHNOLOGY CO., LTD.
Honggang LI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE IMAGE MEASURING DEVICE, AND DISTANCE IMAGE MEASURING METHOD
Publication number
20250060460
Publication date
Feb 20, 2025
NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
Shoji KAWAHITO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR FLUORESCENCE LIFETIME BASED SEQUENCING
Publication number
20250052681
Publication date
Feb 13, 2025
Illumina, Inc.
Hod Finkelstein
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
RANGING DEVICE
Publication number
20250052871
Publication date
Feb 13, 2025
Canon Kabushiki Kaisha
YUUTA OOSHIMA
G01 - MEASURING TESTING
Information
Patent Application
A SYSTEM AND METHOD FOR LIDAR BLOCKAGE DETECTION
Publication number
20250052872
Publication date
Feb 13, 2025
Innoviz Technologies Ltd.
Yuval Yifat
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASUREMENT APPARATUS AND DISTANCE MEASUREMENT METHOD
Publication number
20250052898
Publication date
Feb 13, 2025
PIONEER CORPORATION
Kenichiro HOSOI
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE
Publication number
20250052902
Publication date
Feb 13, 2025
Koito Manufacturing Co., Ltd.
Masayuki TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
DEPTH MAPPING SENSING APPARATUS
Publication number
20250052863
Publication date
Feb 13, 2025
Bandwidth10, LTD.
Carlos Fernando Rondina Mateus
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF THREE-DIMENSIONAL IMAGING
Publication number
20250047826
Publication date
Feb 6, 2025
nLIGHT, Inc.
Paul S. Banks
G01 - MEASURING TESTING
Information
Patent Application
WIDE-DYNAMIC-RANGE SPLIT-DETECTOR LIDAR PHOTORECEIVER
Publication number
20250044422
Publication date
Feb 6, 2025
ALLEGRO MICROSYSTEMS, LLC
Andrew S. Huntington
G01 - MEASURING TESTING
Information
Patent Application
CONTROL METHOD FOR LIDAR, COMPUTER STORAGE MEDIUM AND LIDAR
Publication number
20250044425
Publication date
Feb 6, 2025
Hesai Technology Co., Ltd.
Congbo SHI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASUREMENT APPARATUS, DETERMINATION APPARATUS, DETERMINAT...
Publication number
20250044430
Publication date
Feb 6, 2025
PIONEER CORPORATION
Kenichiro HOSOI
G01 - MEASURING TESTING
Information
Patent Application
ENHANCING DEPTH REPRESENTATIONS BASED ON AMPLITUDES OF TIME-OF-FLIG...
Publication number
20250044451
Publication date
Feb 6, 2025
QUALCOMM Incorporated
Li Hong
G01 - MEASURING TESTING
Information
Patent Application
PHOTODETECTION DEVICE AND DISTANCE MEASURING SYSTEM
Publication number
20250040269
Publication date
Jan 30, 2025
Sony Semiconductor Solutions Corporation
TATSUKI NISHINO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL RANGING DEVICE
Publication number
20250035757
Publication date
Jan 30, 2025
DENSO CORPORATION
Kosuke NIIMURA
G01 - MEASURING TESTING
Information
Patent Application
RANGE IMAGING APPARATUS AND RANGE IMAGING METHOD
Publication number
20250035790
Publication date
Jan 30, 2025
TOPPAN Holdings Inc.
Kunihiro HATAKEYAMA
G01 - MEASURING TESTING
Information
Patent Application
Optoelectronic sensor and method of detecting objects in a monitore...
Publication number
20250035785
Publication date
Jan 30, 2025
SICK AG
Gerold FEISE
G01 - MEASURING TESTING
Information
Patent Application
HISTOGRAM GENERATING CIRCUIT, OPTICAL RANGEFINDER, HISTOGRAM GENERA...
Publication number
20250028032
Publication date
Jan 23, 2025
HOKUYO AUTOMATIC CO., LTD.
Kunihiro YASUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFICATION OF A NOISE POINT USED FOR LIDAR, AND LIDA...
Publication number
20250028033
Publication date
Jan 23, 2025
Hesai Technology Co., Ltd.
Xiaotong ZHOU
G01 - MEASURING TESTING
Information
Patent Application
LIDAR System with Dynamic Resolution
Publication number
20250012903
Publication date
Jan 9, 2025
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Ivan KOUDAR
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM
Publication number
20250012907
Publication date
Jan 9, 2025
ams-OSRAM lnternational GmbH
Farhang GHASEMI AFSHAR
G01 - MEASURING TESTING
Information
Patent Application
DEPTH IMAGING DEVICE, PACKAGE, MODULE, AND DEPTH IMAGING SYSTEM
Publication number
20250012925
Publication date
Jan 9, 2025
NUVOTON TECHNOLOGY CORPORATION JAPAN
Hideki KAWAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT METHOD
Publication number
20250012902
Publication date
Jan 9, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Maarten KUIJK
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT RISING EDGE ADAPTIVE CROSS-TALK CORRECTION
Publication number
20250012901
Publication date
Jan 9, 2025
STMicroelectronics International N.V.
Andreas Assmann
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIAL CORRELATOR FILTER FOR EFFICIENT TOF PEAK FINDING
Publication number
20250012926
Publication date
Jan 9, 2025
STMicroelectroniics (Research & development) Limited
Andreas Assmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MULTISPECTRAL RANGING AND IMAGING SYSTEMS
Publication number
20250012629
Publication date
Jan 9, 2025
Ouster, Inc.
Angus Pacala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEPTH IMAGE SENSING DEVICE, IMAGE SIGNAL PROCESSOR AND IMAGE SIGNAL...
Publication number
20250008235
Publication date
Jan 2, 2025
SK HYNIX INC.
Toshiaki NAGAI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
LIDAR Systems with Improved Time-To-Digital Conversion Circuitry
Publication number
20250004110
Publication date
Jan 2, 2025
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Anthony Richard HUGGETT
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, CONTROL METHOD, PROGRAM, AND STORAGE...
Publication number
20250004138
Publication date
Jan 2, 2025
PIONEER CORPORATION
Makoto MATSUMARU
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION ELEMENT
Publication number
20250004111
Publication date
Jan 2, 2025
Sony Semiconductor Solutions Corporation
YASUNORI TSUKUDA
G01 - MEASURING TESTING