The invention relates to a distance measuring device and a method for determining a distance with the distance measuring device.
Distances can be measured between a measuring device and an object without a physical contact between the device and the object by optical methods. In these methods, the object is illuminated by the device and the light back-reflected from the object is then captured by a light detector of the device.
Distances can for example be determined by periodically modulating the light intensity which is emitted from the device and by measuring the phase difference between the emitted light and the back-reflected light arriving on the detector. However, due to the periodicity of the light intensity, this method results in an ambiguous distance measurement. Unambiguous distance measurements can be determined by measuring the time of flight between the emission of light and the arrival of the back-reflected light on the detector.
Conventional distance measurements are carried out by measuring a property of the light, in particular the intensity, as a function of time. Then a plot of the property versus the time is processed in order to obtain the time of flight. This processing can be computationally complicated and can therefore require a long time to be performed. If a distance measurement needs a long time to be performed, this can cause a reduction of the repetition rate for taking the distance measurements.
The precision of the conventional distance measurements is limited by the size of the time steps, with which the property of the light is measured. Also, for the conventional distance measurement, different reflectivities of the object can lead to different shapes of the plot. When processing a different plot, this can lead to a different distance, so that the distance depends on the reflectivity of the object, which further decreases the precision for the conventional distance measurements.
It is an object of the invention to provide a distance measuring device and a method for measuring a distance with the distance measuring device, wherein the distance measurement is simple to perform whilst remaining precise.
The distance measuring device according to an aspect of the invention for measuring a distance between the distance measuring device and an object includes a light source configured to illuminate the object with light pulses having different durations, at least one photo element configured to capture the light pulses after being back-reflected from the object, a trigger generator for controlling the emission of the light pulses and for activating the photo element during a temporal integration gate having an integration start point in time Δs and an integration end point in time Δe, wherein the photo element is configured to output a signal value U at the end of the integration gate with the signal value U depending on the energy of the light arriving on the photo element during its activation, and wherein the trigger generator is configured to store a trigger scheme to activate the photo element and to control the emission of the light pulses such that at least one short light pulse with a duration Tp,s and a plurality of long light pulses with a duration Tp,l being longer than Tp,s are emitted, that an invariable delay between the emission start point in time of the short light pulse and the integration gate is such that Δtof and Δtof+Tp,s are between Δs and Δe to output a reference signal value Uref, with Δtof being the first point in time when the light pulse arrives on the photo element, and that for each long light pulse a respective variable delay τ between the emission start point in time of the long light pulses and the integration gate is such that the variable delays τ are different from each other in order to form a convolution function fc:=U(τ) out of the intensity of the light arriving on the photo element and the integration gate, and a processing unit configured to identify the delay τc in the convolution function which corresponds to Uref and to calculate the distance by using the delay τc.
The method according to an aspect of the invention for determining a distance between the distance measuring device and an object by the distance measuring device includes the steps of: a) illuminating the object with at least one short light pulse with the duration Tp,s; b) illuminating the object with a plurality of long light pulses with the duration Tp,l; c) outputting a signal value Uref at the end of the integration gate, wherein an invariable delay between the emission start point in time of the short light pulse and the integration gate is such that Δtof and Δtof+Tp,s are between Δs and Δe; d) forming a convolution function fc:=U(τ) out of the intensity of the light arriving on the photo element and the integration gate with a respective variable delay τ for each long light pulse between the emission start point in time of the long light pulses and the integration gate, wherein the variable delays are different from each other in order to form the convolution function fc; e) identifying the delay τc in the convolution function which corresponds to Uref; and f) calculating the distance by using the delay τc in the convolution function as identified in step f).
The convolution function fc can be described by the following equation:
fc(τ)=∫−∞+∞I(t)*g(t−τ)dt (equation 1),
wherein I(t) is the intensity of the light of the long light pulses arriving on the photo element and g(t) is the temporal integration gate. For early variable delays τ with no overlap of the integration gate and the long light pulses arriving on the photo element, the convolution function has a stationary value. The function value begins to change as soon as the delay τ is so long that the integration gate and the long light pulses begin to overlap. The convolution function includes an extreme value at delays τ with a maximum overlap of the integration gate and the long light pulses. The extreme value in the convolution function is a single point if the long light pulses and the integration gate have the same durations and is a plateau that becomes broader for an increasing difference in the durations of the long light pulses and the integration gate. By increasing the delay τ from the extreme value further, the function value develops back to the stationary value. The delay τc in convolution function fc, which corresponds to the reference signal value Uref, is the intersection of the convolution function fc and the function U=Uref. The intersection can, for example, be identified by forming the inverse function τ(U) of the convolution function fc and then forming τc(Uref), which is a mathematically simple method. Alternatively, the intersection can be identified by parametrizing the convolution function prior to measurement and by performing fits to the measured data before extracting the actual intersection analytically from the fitted convolution function and the function U=Uref. By performing the fit, it is possible to assess time steps between the measured data points, which provides an increased precision in the measurement of the delay τc. By obtaining the increased precision for τc, one also obtains an increasing precision for the distance. By identifying the intersection of the function U=Uref and the convolution function, it is also achieved that different reflectivities of the object are compensated.
The convolution function has two delays τc, at which fc=Uref, one on each side of the extreme value. It is conceivable to form the convolution function only on one side of the extreme value and to identify only one delay τc or it is conceivable to form the convolution function on both sides of the extreme value and to identify both delays τc. If both delays are identified, it is then possible to calculate a distance for each delay τc, and it is then possible to form the average of both distances, which increases the accuracy of the distance measurement.
In order to arrange the integration gates with respect to the emission start point in time a distance range in which the object can be located is predetermined. From the distance range, the invariable delay can be chosen such that Δtof and Δtof+Tp,s are between Δs and Δe for all possible distances of the distance range. Also, the invariable delays can be chosen such that the convolution function is formed.
According to an aspect of the invention, the light source includes light emitting diodes, VCSELs (vertical-cavity surface-emitting lasers) and/or lasers that are in particular configured to emit light in the visible and/or infrared spectral region. According to an aspect of the invention, the distance measuring device includes a CCD chip with an image intensifier and/or a CMOS chip that includes the at least one photo element.
According to a further aspect of the invention, the trigger scheme is arranged to control the emission of the light pulses such that the object is illuminated alternatingly with the short light pulses and the long light pulses. Since the short light pulses are used for the reference signal value Uref, a possible long-time drift in laser intensity would affect both the convolution function fc and Uref in the same manner, so that the long-time drift would be compensated by the alternating short light pulses and long light pulses. According to an aspect of the invention, the ratio of the number of the short light pulses to the number of the long light pulses is in a range of from 0.2 to 0.4. Surprisingly, experimental results showed that this ratio resulted in the highest precision for the distances.
According to yet another aspect of the invention, the trigger scheme is configured to control the emission of the light pulses such that the intensity of the light pulses rises from an intensity I1 to an intensity I2 being higher than I1 at the emission start point in time and drops back to I1 after the durations Tp,s, and Tp,l from the emission start point in time, respectively, wherein Tp,s, and Tp,l are in the order of tens of nanoseconds. Here, the extreme value of the convolution function is a maximum. Alternatively, the trigger scheme is arranged to control the emission of the light pulses such that the intensity of the light pulses drops from an intensity I2 to an intensity I1 being lower than I2 at the emission start point in time and rises back to I2 after the durations Tp,s, and Tp,l from the emission start point in time, respectively, wherein Tp,s, and Tp,l are in the order of tens of nanoseconds. Here, the extreme value of the convolution function is a minimum. By using the light pulses that include the intensity drop at the emission start point in time, it is advantageously possible with the distance measuring device to both measure a distance and to illuminate the object. The illumination of the object can be such that the object becomes visible for a human eye or for another vision system. Furthermore, it is not required to use an additional illumination system that would interfere with the distance measurement, whereby the precision for the distance measurement is high.
According to an aspect of the invention, in steps a) and b) the object is illuminated alternatingly with the short light pulses and the long light pulses. According to another aspect of the invention, the ratio of the number of the short light pulses to the number of the long light pulses is in a range of from 0.2 to 0.4.
According to yet another aspect of the invention, in step d) the convolution function is fitted to the plot of the signal values Un versus the variable delay τ, wherein the convolution function fc includes a linear function. By using the fit, the convolution function fc can be determined with an arbitrary step size, advantageously increasing the precision of the distance measurement independent from the number of different delays τ between the emission start point in time of the long light pulses and the integration gate. Therefore, the distance can also be determined with an arbitrary step size. Since the delay τc in the convolution function, which corresponds to Uref, is identified, it is advantageously sufficient to fit only one linear function to the plot, which is computationally simple. This is not the case if for example an extreme value of the convolution function is identified. For identifying the extrema, a respective linear function on both sides of the extreme value has to be fitted to the plot and the intersection of both linear functions has to be calculated, which is computationally difficult.
According to an aspect of the invention, in step d) the convolution function fc is formed by first forming a coarse convolution function fc,coarse with coarse steps of the different variable delays τcoarse, by subsequently identifying in the coarse convolution function fc,coarse a coarse delay τc,coarse that corresponds to Uref and the two variable delays τl,coarse and τr,coarse neighbouring τc,coarse, and by then forming the convolution function fc between τl,coarse and τr,coarse with fine steps having a shorter step size than the coarse steps. This provides an efficient method for determining the distance with a high precision.
The intensity of the light pulses preferably rises from an intensity I1 to an intensity I2, the intensity I2 being higher than I1 at the emission start point in time and drops back to I1 after the durations Tp,s, and Tp,l from the emission start point in time, respectively, wherein Tp,s, and Tp,l are in the order of tens of nanoseconds. Alternatively, the intensity of the light pulses preferably drops from an intensity I2 to an intensity I1, the intensity I1 being lower than I2 at the emission start point in time and the intensity rises back to I2 after the durations Tp,s, and Tpl from the emission start point in time, respectively, wherein Tp,s, and Tp,l are in the order of tens of nanoseconds.
According to a further aspect of the invention, in step e) the average over a plurality of reference signal values Uref is used for identifying τc, in particular over all the signal values Uref. This results in a high precision determination for the signal values Uref and therefore also in a high precision determination for the distance.
The invention will now be described with reference to the drawings wherein:
Detection optics 8 are arranged in front of the photo element 3 in order to image a field of view 11 onto the photo element 3. Illumination optics 7 are arranged in front of the light source 2 in order to shape the light emitted by the light source 2 such that an illumination area 10 can be illuminated by the light source 2. The illumination area 10 and the field of view 11 are shaped such that the field of view 11 is substantially completely covered by the illumination area 10. The distance measuring device 1 is configured such that the light emitted by the light source 2 impinges onto the object 9 located within the field of view 11, and arrives on the photo element 3 after being back-reflected from the object 9. The illumination optics 7 and the detection optics 8 are preferably respective lenses. It is also possible to use a single lens for both the illumination optics 7 and the detection optics 8.
In
In
In order to achieve that each short light pulse 23 is completely within the integration gates 21 the invariable delay Δr of the emission start point in time of the short light pulses 23 from the start point in time 22 is chosen such that Δr+Δtof and Δr+Δtof+Tp,s are between Δs and Δe. Furthermore, it is required that the duration of the short light pulses Tp,s are shorter than the duration |Δe-Δs| of the integration gates 21: Tp,s<|Δe-Δs|. The duration |Δs-Δe| of the integration gates 21 is the same for both the short light pulses 23 and the long light pulses 24.
The hatched areas in
Δtof=τc+Tp,s−Tp,l (equation 2).
In case that the signal values U were taken for delays τ that correspond to longer delays, the delay τmax is: τc+(Δe-Δs)=Δtof+Tp,s, whereby:
Δtof=τc+(Δe−Δs)−Tp,s (equation 3).
For both cases, the distance r between the distance measuring device and the object is then calculated by:
r=0.5*c*Δtof (equation 4),
wherein c is the speed of light in the medium in which the distance measurement is carried out.
It is conceivable that the convolution function fc is formed by first forming a coarse convolution function fc,coarse with coarse steps of the different variable delays τcoarse, subsequently identifying in the coarse convolution function fc,coarse a coarse delay τc,coarse that corresponds to Uref and the two variable delays τl,coarse and τr,coarse neighbouring τc,coarse, and then forming the convolution function fc between τl,coarse and τr,coarse with fine steps having a shorter step size than the coarse steps.
It is understood that the foregoing description is that of the exemplary embodiments of the invention and that various changes and modifications may be made thereto without departing from the spirit and scope of the invention as defined in the appended claims.
Number | Date | Country | Kind |
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10 2014 117 705 | Dec 2014 | DE | national |
This application is a continuation application of international patent application PCT/EP2015/076797, filed Nov. 17, 2015, designating the United States and claiming priority to German application 10 2014 117 705.3, filed Dec. 2, 2014, and the entire content of both applications is incorporated herein by reference.
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Number | Date | Country | |
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Parent | PCT/EP2015/076797 | Nov 2015 | US |
Child | 15611749 | US |