This application claims the priority benefits of Japanese application no. 2023-047906, filed on Mar. 24, 2023, and Japanese application no. 2024-007649, filed on Jan. 22, 2024. The entirety of the above-mentioned patent applications is hereby incorporated by reference herein and made a part of this specification.
The present disclosure relates to a driver circuit (driver IC) for driving a liquid crystal display device such as an LCD (Liquid Crystal Display).
In recent years, a liquid crystal display device such as an LCD has been used as a display device in various information processing devices such as personal computers and mobile phone devices. In order to display display data on such a liquid crystal display device, a driver circuit (driver IC) for driving the liquid crystal display device is used (see, for example, Patent Document 1 (Japanese Patent Laid-Open No. 2009-145492)).
In the driver IC for driving the above-described liquid crystal display device, in addition to the display data that is written for each line, setting data for performing various settings such as gamma curve settings necessary for image display and setting data necessary for maintaining a display system are written and held in internal registers.
However, when the setting data written in the internal register of the driver IC is changed or destroyed due to the occurrence of ESD (Electro Static Discharge) noise or the like, the displayed image may be affected and normal image display may be prevented.
Therefore, in order to prevent such image display abnormalities, a method is used in some cases in which an external device that transmits display data to the driver IC reads and checks the setting data stored in the driver IC and rewrites the setting data to the driver IC when the setting data has changed from the one that was supposed to be written.
However, when such a method is used, a system for reading and checking the setting data is required not only on the driver IC side but also on the external device side, which has the disadvantage of increasing the size of the system.
Further, a method may be used in which a flip-flop circuit for abnormality detection is installed in the driver IC and the values held in this flip-flop circuit for abnormality detection are monitored to ensure that the setting data is not destroyed due to ESD noise or the like. In such a method, when an abnormality is detected, the external device is notified of the occurrence of the abnormality, and the external device rewrites the setting data to the driver IC.
However, when using such a method, in order to increase the probability of detecting an abnormality, it is necessary to increase the number of flip-flop circuits for abnormality detection, which has the disadvantage of increasing the circuit scale of the driver IC.
Therefore, the disclosure provides a driver circuit and an image display system capable of detecting the possibility of an abnormality occurred in stored setting data without providing a register for detecting the abnormality when display data is displayed on a display panel on the basis of the setting data stored in the register.
A driver circuit according to an embodiment is a driver circuit configured to receive a display command containing setting data and display data and display the display data on a display panel based on the setting data and including: a setting processing part that includes a temporary storage section temporarily storing the setting data contained in the display command until next setting data is transmitted and a reflection stage storage section storing the setting data stored in the temporary storage section; and an output circuit that displays the display data contained in the display command on the display panel based on the setting data stored in the reflection stage storage section, wherein the temporary storage section is divided into a first area storing a part of the setting data and a second area storing a part other than the setting data stored in the first area, wherein the second area stores the transmitted setting data during a period in which the setting data is being transmitted in the display command and copies and stores data stored in the first area during a period in which the display data is being transmitted in the display command, and wherein the setting processing part further includes a comparison circuit that compares the data stored in the first area with data stored in the second area during a period in which the display data is being transmitted in the display command and outputs an abnormality detection signal indicating a possibility of an abnormality in the stored setting data when the data do not match.
Next, embodiments of the present disclosure will be described in detail with reference to the drawings.
The image display system of this embodiment is configured to display an image on a display panel 100 and includes a source driver 10, a gate driver 30, and a timing controller 20.
The display panel 100 is, for example, an active matrix liquid crystal display device in which display pixels 90 each including a pixel transistor such as a thin film transistor are arranged in a matrix. The display panel 100 includes a scanning line that connects each display pixel 90 in the row direction and a signal line that connects the display pixels 90 in the column direction. The gate driver 30 is configured to control the alignment state of liquid crystal in each display pixel 90 to display a desired image by sequentially setting each scanning line in a selected state, applying a predetermined signal voltage to each signal line by the source driver 10, and writing a signal voltage according to the display data to the display pixel 90 in the selected state.
Here, the operation timings of the source driver 10 and the gate driver 30 are controlled by the timing controller 20. The timing controller 20 performs control of applying a predetermined voltage to a pixel electrode of the display pixel 90 at a predetermined timing to display an image based on video signal on the display panel 100 by supplying a control signal for displaying a predetermined image on the display panel 100 to each of the source driver 10 and the gate driver 30 on the basis of the video signal supplied from the outside.
Here, the source driver 10 is composed of a driver IC (driver circuit) that receives a display command including setting data and display data (RGB data) from the timing controller 20 and displays the display data on the display panel 100 on the basis of the setting data. Accordingly, in the following description of this embodiment, the source driver 10 will be described as the driver IC 10.
Before describing the driver IC 10 of this embodiment, a driver IC 10A to which the present disclosure is not applied will be described as a comparative example with reference to
The driver IC 10A is a driver circuit that receives a display command 103 including setting data and display data from the timing controller 20 and displays the display data on the display panel 100 on the basis of the setting data in the display command 103.
As illustrated in
The interface circuit 11 receives the display command 103 from the timing controller 20 and transmits the received display command 103 to each of the command analysis part 12 and the switching circuit 13.
Here, as illustrated in
Specifically, as illustrated in
Furthermore, the display command 103 illustrated in
The switching circuit 13 is composed of, for example, a multiplexer, and outputs the display command 103 transmitted from the interface circuit 11 to the setting processing part 15A when the switching signal 101 output from the command analysis part 12 is at L level. Further, the switching circuit 13 outputs the display command 103 transmitted from the interface circuit 11 to the RGB processing part 14 when the switching signal 101 output from the command analysis part 12 is at H level.
The RGB processing part 14 performs image processing on the RGB data output from the switching circuit 13 and transmits the processed data to the output circuit 16. The setting processing part 15A includes a temporary storage section 21A which temporarily stores the setting data contained in the display command 103 until the next setting data is transmitted and a reflection stage storage section 22 which stores the setting data stored in the temporary storage section 21A. In the setting processing part 15A, the setting data output from the switching circuit 13 is first stored in the temporary storage section 21A and then is stored in the reflection stage storage section 22 after the timing of one line of the display command 103.
The output circuit 16 displays the RGB data transmitted from the RGB processing part 14 on the display panel 100 on the basis of the setting data stored in the reflection stage storage section 22.
Referring to the timing chart of
After that, when the setting data “EFGH” is transmitted from the display command 103, similarly, this setting data “EFGH” is first stored in the temporary storage section 21A, and is also stored in the reflection stage storage section 22 at the timing when the switching signal 101 becomes H level at time T2. Then, the output circuit 16 performs an operation to display the RGB data from the RGB processing part 14 on the display panel 100 on the basis of the setting data “EFGH” stored in the reflection stage storage section 22.
The reason why the setting processing part 15A stores the setting data in the temporary storage section 21A and then stores the setting data in the reflection stage storage section 22 is because the setting data stored in the reflection stage storage section 22 cannot be immediately changed even when new setting data is transmitted from the display command 103. This is because the output circuit 16 performs image display processing on the display panel 100 on the basis of the previous RGB data even at the timing when new setting data is transmitted from the display command 103. Thus, this is because the image display processing needs to be performed on the basis of previous setting data.
Specifically, this is because the setting data “ABCD” still needs to be stored in the reflection stage storage section 22 even at the timing when the setting data “EFGH” is transmitted from the display command 103 illustrated in
Therefore, even when new setting data is transmitted from the display command 103, the setting data is not immediately stored in the reflection stage storage section 22, but first stored in the temporary storage section 21A and then stored in the reflection stage storage section 22.
As described above, in the setting processing part 15A, the temporary storage section 21A temporarily stores the setting data, but after the setting data is stored in the reflection stage storage section 22, the setting data is not used until the next setting data is transmitted from the display command 103. Therefore, in this embodiment, as illustrated in
The configuration of the driver IC 10 in the first embodiment of the present disclosure is illustrated in the block diagram of
The driver IC 10 of this embodiment illustrated in
Furthermore, since the components having the same reference numerals as the components illustrated in
In the driver IC 10 of this embodiment, an abnormality detection signal 104 is output from the comparison circuit 23 of the setting processing part 15 to the timing controller 20. The timing controller 20 performs processing such as rewriting the setting data to the driver IC 10 by inputting the abnormality detection signal 104 to understand the possibility of an abnormality occurred in the setting data stored in the setting processing part 15 due to noise such as ESD noise.
In other words, the abnormality detection signal 104 is a signal indicating the possibility of an abnormality occurred in the setting data stored in the setting processing part 15 due to the occurrence of noise such as ESD noise.
In this way, the timing controller 20 functions as a control circuit that transmits a display command containing the setting data and the display data to the driver IC 10 and receives the abnormality detection signal 104 on the basis of the data comparison result in the temporary storage section 21 from the driver IC 10.
The details of the configuration of the temporary storage section 21 in the driver IC 10 of this embodiment illustrated in
The temporary storage section 21 of this embodiment is divided into a first area 31 that stores a part of setting data and a second area 32 that stores a part other than the setting data stored in the first area 31.
For example, the first area 31 stores the first 10 bytes of 20 bytes of setting data, and the second area 32 stores the latter 10 bytes of 20 bytes of setting data.
Then, the second area 32 stores the transmitted setting data during a period in which the setting data is being transmitted in the display command 103 and copies and stores the data stored in the first area 31 during a period in which RGB data is being transmitted in the display command 103.
Then, the comparison circuit 23 compares the data stored in the first area 31 and the data stored in the second area 32 during a period in which RGB data is being transmitted in the display command 103 and outputs the abnormality detection signal 104 to the timing controller 20 when they do not match.
Here, the period during which RGB data is being transmitted in the display command 103 means the period during which the switching signal 101 is at H level. Further, the period during which setting data is being transmitted in the display command 103 means the period during which the switching signal 101 is at L level.
Furthermore, the temporary storage section 21 is provided with an AND circuit 33 that calculates the logical product of the switching signal 101 and the EOL signal 102. The output of the AND circuit 33 is output to the first area 31 and the second area 32 as a clock signal. Next, the operation of the setting processing part 15 of this embodiment illustrated in
First, as illustrated in
Then, as illustrated in
Then, when the switching signal 101 becomes H level, the comparison circuit 23 compares the data stored in the first area 31 and the data stored in the second area 32. Then, the comparison circuit 23 does not output the abnormality detection signal 104 when the two compared data match, and outputs the abnormality detection signal 104 when the two compared data do not match.
Next, the timing charts of
In a normal state when noise such as ESD noise does not occur, as illustrated in
Then, when the switching signal 101 becomes H level at time T3, the setting data “AB” stored in the first area 31 and the setting data “CD” stored in the second area 32 are stored in the reflection stage storage section 22. Then, at that timing, the setting data “AB” stored in the first area 31 is copied and stored in the second area 32. As a result, the stored content of the first area 31 and the stored content of the second area 32 become the same.
Then, the second area 32 continues to copy and store the data stored in the first area 31 until new setting data “EFGH” is transmitted from the display command 103.
Then, when the switching signal 101 becomes H level, the comparison circuit 23 compares the stored content of the first area 31 and the stored content of the second area 32, but in
Next, the operation in an abnormal state when noise such as ESD noise occurs will be described with reference to the timing chart of
In the timing chart illustrated in
Similarly,
Next, a specific circuit configuration example of the first area 31 and the second area 32 illustrated in
Referring to
The plurality of flip-flop circuits 41 and 43 are connected in parallel to hold setting data. Then, the plurality of flip-flop circuits 41 are provided to hold the first half of the setting data, and the plurality of flip-flop circuits 43 are provided to hold the second half of the setting data.
For example, when the setting data is 20 bytes, that is, 160 bits, 80 flip-flop circuits 41 and 43 are each provided.
Then, the plurality of switching circuits 42 and 44 output the transmitted setting data to the input terminals of the plurality of flip-flop circuits 41 and 43, respectively, during a period in which the setting data is being transmitted in the display command 103. Further, the plurality of switching circuits 42 and 44 directly output the values of the output terminals of the plurality of flip-flop circuits 41 and 43 to their input terminals, respectively, during a period in which RGB data is being transmitted in the display command 103.
That is, when the switching signal 101 is at L level, the switching circuits 42 and 44 output the transmitted setting data to the input terminals of the plurality of flip-flop circuits 41 and 43, respectively. Then, when the switching signal 101 is at H level, the switching circuits 42 and 44 directly output the values of the output terminals of the flip-flop circuits 41 and 43 to the input terminals.
Then, as illustrated in
The plurality of flip-flop circuits 51 and 53 are connected in parallel to hold setting data.
Then, the plurality of flip-flop circuits 51 are provided to hold the first half of the setting data, and the plurality of flip-flop circuits 53 are provided to hold the second half of the setting data.
Then, the plurality of switching circuits 52 and 54 output the transmitted setting data to the input terminals of the flip-flop circuits 51 and 53, respectively, during a period in which the setting data is being transmitted in the display command 103. Further, the plurality of switching circuits 52 and 54 output the values of the output terminals of the plurality of flip-flop circuits 41 and 43 in the first area 31 to the input terminals of the plurality of flip-flop circuits 51 and 53, respectively, during a period in which RGB data is being transmitted in the display command 103.
That is, when the switching signal 101 is at L level, the switching circuits 52 and 54 output the transmitted setting data to the input terminals of the plurality of flip-flop circuits 51 and 53, respectively. Then, when the switching signal 101 is at H level, the switching circuits 52 and 54 output the values of the output terminals of the flip-flop circuits 41 and 43 to the input terminals of the plurality of flip-flop circuits 51 and 53, respectively.
Since the first area 31 and the second area 32 are configured as described above, Data “A” among the setting data “ABCD” is held in the plurality of flip-flop circuits 41 when the switching signal 101 is at the L level as illustrated in
Then, the data “A”, “B”, “C”, and “D” held in the plurality of flip-flop circuits 41, 43, 51, and 53, respectively, are also output to the reflection stage storage section 22.
Next,
As the switching signal 101 changes from L level to H level, in the first area 31, the switching circuits 42 and 44 directly output the values of the output terminals of the flip-flop circuits 41 and 43 to the input terminals. As a result, the plurality of flip-flop circuits 41 continue to hold data “A”, and the plurality of flip-flop circuits 43 continue to hold data “B”.
Then, as the switching signal 101 changes from L level to H level, in the second area 32, the switching circuits 52 and 54 output the values of the output terminals of the flip-flop circuits 41 and 43 to the input terminals of the plurality of flip-flop circuits 51 and 53, respectively. As a result, data “A” is copied to the plurality of flip-flop circuits 51, and data “B” is copied to the plurality of flip-flop circuits 53.
Furthermore, as the switching signal 101 changes from L level to H level, the comparison circuit 23 compares data “A” and “B” output from the flip-flop circuits 41 and 43 in the first area 31 and data “A” and “B” output from the flip-flop circuits 51 and 53 in the second area 32 and outputs the abnormality detection signal 104 when the data do not match.
Next, another specific circuit configuration example of the first area 31 and the second area 32 illustrated in
Referring to
The plurality of flip-flop circuits 41 and 43 are connected in series to hold setting data. Then, the plurality of flip-flop circuits 41 are provided to hold the first half of the setting data, and the plurality of flip-flop circuits 43 are provided to hold the second half of the setting data.
The switching circuit 42 sequentially outputs the transmitted setting data to the plurality of flip-flop circuits 41 and 43 during a period in which the setting data is being transmitted in the display command 103. Further, the switching circuit 42 directly sequentially outputs the values output from the plurality of flip-flop circuits 41 and 43 to the plurality of flip-flop circuits 41 and 43 during a period in which RGB data is being transmitted in the display command 103.
Then, as illustrated in
The plurality of flip-flop circuits 51 and 53 are connected in series to hold setting data. Then, the plurality of flip-flop circuits 51 are provided to hold the first half of the setting data, and the plurality of flip-flop circuits 53 are provided to hold the second half of the setting data.
The switching circuit 52 sequentially outputs the transmitted setting data to the plurality of flip-flop circuits 51 and 53 during a period in which the setting data is being transmitted in the display command 103. Further, the switching circuit 52 sequentially outputs the values output from the plurality of flip-flop circuits 41 and 43 of the first area 31A to the plurality of flip-flop circuits 51 and 53 during a period in which RGB data is being transmitted in the display command 103.
According to the circuit configuration of the first area 31A and the second area 32A illustrated in
Furthermore, in the above-described embodiment, although the first areas 31 and 31A and the second areas 32 and 32A are configured using flip-flop circuits, they may also be configured using a memory element such as a RAM.
Then, in this embodiment, since the temporary storage section 21 used in the original system operation is used to detect the occurrence of noise such as ESD noise, there is no need to provide a register such as a flip-flop circuit to detect the occurrence of noise. Therefore, according to this embodiment, it is possible to detect the possibility of an abnormality occurred in the stored setting data without providing a register for abnormality detection. In other words, noise detection is possible without significantly increasing the circuit configuration and circuit area.
Further, according to this embodiment, since noise detection is originally performed using the temporary storage section 21 located close to the reflection stage storage section 22, it is possible to detect with higher accuracy that the setting data stored in the reflection stage storage section 22 has changed due to the influence of noise.
Next, an image display system of a second embodiment of the present disclosure will be described.
An image display system of this embodiment is different from the first embodiment described above only in that the circuit configuration in the temporary storage section 21 is as illustrated in
In the image display system of the first embodiment described above, during a period in which the display data is being transmitted in the display command, the data stored in the first area 31 is copied and stored in the second area 32 and the abnormality detection signal 104 is output by determining that an abnormality has occurred when the data stored in the first area 31 and the data stored in the second area 32 do not match.
However, when the setting data transmitted from the display command is all data “1” such as “1111 . . . 1”, the data stored in the first area 31 and the second area 32 are also all “1111 . . . 1”. Therefore, even when an abnormality occurs in which the data in the storage area changes from “0” to “1” due to the occurrence of noise such as ESD noise, the occurrence of such an abnormality cannot be detected. Similarly, when the setting data transmitted from the display command is all data “0” such as “0000 . . . 0”, the data stored in the first area 31 and the second area 32 are also all “0000 . . . 0”. Therefore, even when an abnormality occurs in which the data in the storage area changes from “1” to “0” due to the occurrence of noise such as ESD noise, the occurrence of such an abnormality cannot be detected.
Therefore, in this embodiment, in the temporary storage section 21, the data stored in the first area 31 is not simply copied and stored in the second area 32, but the second area 32 stores the data stored in the first area 31 in a logically inverted manner during a period in which display data is being transmitted in the display command.
Then, the comparison circuit 23 compares the data stored in the first area 31 and the data obtained by logically inverting the data stored in the second area 32 during a period in which display data is being transmitted in the display command and outputs the abnormality detection signal 104 indicating the possibility of an abnormality occurred in the stored setting data when they do not match.
The circuit configuration illustrated in
The plurality of inverter circuits 61 and 62 logically invert the data read from the first area 31 and output the inverted data to the second area 32. Further, the plurality of inverter circuits 63 and 64 logically invert the data read from the second area 32 and output the inverted data to the comparison circuit 23.
Then, during a period in which RGB data is being transmitted in the display command 103, the plurality of switching circuits 52 and 54 respectively output the values obtained by logically inverting the values of the output terminals of the plurality of flip-flop circuits 41 and 43 of the first area 31 using the plurality of inverter circuits 61 and 62 to the input terminals of the plurality of flip-flop circuits 51 and 53.
Even in the first area 31 of this embodiment, the plurality of flip-flop circuits 41 continue to hold data “A”, and the plurality of flip-flop circuits 43 continue to hold data “B”. However, in the second area 32, data obtained by logically inverting “A” is copied to the plurality of flip-flop circuits 51 and data obtained by logically inverting “B” is copied to the plurality of flip-flop circuits 53. Furthermore, in
With such a circuit configuration, according to the image display system of this embodiment, even when the setting data is “111 . . . 1” or “0000 . . . 0”, the data for abnormality detection will always contain both values of “1” and “0”. As a result, according to this embodiment, even when an abnormality occurs in which the data in the storage area changes from “1” to “0” due to the occurrence of noise such as ESD noise, it is possible to detect abnormalities in any case where an abnormality changes from “0” to “1”. Therefore, according to this embodiment, it is possible to improve the detection accuracy during abnormality detection compared to the first embodiment described above.
Furthermore,
The circuit configuration illustrated in
The inverter circuit 65 logically inverts the data read from the first area 31A and outputs the inverted data to the second area 32A. Further, the plurality of inverter circuits 63 and 64 logically invert the data read from the second area 32A and output the inverted data to the comparison circuit 23.
Further, during a period in which RGB data is being transmitted in the display command 103, the switching circuit 52 in the circuit illustrated in
Even in such a circuit configuration, according to the image display system of this embodiment, even when the setting data is “111 . . . 1” or “0000 . . . 0”, the data for abnormality detection will always contain both values of “1” and “0”. As a result, according to this embodiment, even when an abnormality occurs in which the data in the storage area changes from “1” to “0” due to the occurrence of noise such as ESD noise, it is possible to detect abnormalities in any case where an abnormality changes from “0” to “1”. Therefore, according to this embodiment, it is possible to improve the detection accuracy during abnormality detection compared to the first embodiment described above.
Number | Date | Country | Kind |
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2023-047906 | Mar 2023 | JP | national |
2024-007649 | Jan 2024 | JP | national |